• 제목/요약/키워드: Electrostatic force

검색결과 278건 처리시간 0.022초

헤드/디스크 인터페이스 내에서 오염 입자의 거동에 관한 수치적 연구 (Numerical Investigation of Contamination Particle's Trajectory in a Head/slider Disk Interface)

  • 박희성;황정호;좌성훈
    • 대한기계학회논문집B
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    • 제24권3호
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    • pp.477-484
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    • 2000
  • Microcontamination caused by particle deposition on the head disk interface threatens the reliability of hard disk drive. Design of slider rail to control contamination becomes an important issue in magnetic recording. In this paper, how particles adhere to the slider and the disk is examined. To investigate accumulation mechanism of the particles, trajectory of the particles in a slider/disk interface is simulated with considering various forces including drag force, gravitational force, Saffman lift force, and electrostatic force. It is found that the charged particles can easily adhere to the slider or disk surface, if an electric field exists between the slider and the disk. It is supposed that the vertical motion of the particles should be related with not only Saffman force but also electrostatic force.

탄소나노튜브를 포함한 마이크로 액적의 정전기적 토출 (Electrostatic Ejection of Micro-droplets Containing Carbon Nanotubes)

  • 김용재;이석한;고한서;변도영;한상준;양지혜;백승현
    • 대한기계학회논문집B
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    • 제30권1호
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    • pp.82-86
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    • 2006
  • Carbon nanotubes have attracted much attention as future mechanical and electronic materials. However, manipulating techniques are not well developed yet. Here we propose to use electrostatic drop-on-demand devices to eject micro-droplets containing micelle-suspended single-walled carbon nanotubes. A simple electrostatic force analysis and photographic studies of droplet ejection process are presented. The analytical analysis shows that semiconducting species have higher electrostatic force density. However, enrichment of specific electronic types is not clear at large size droplets produced in this study. A micro-scale jetting device is being produced to prove the suggested behavior.

Probing of Surface Potential Using Atomic Force Microscopy

  • Kwon, Owoong;Kim, Yunseok
    • Applied Microscopy
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    • 제44권3호
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    • pp.100-104
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    • 2014
  • As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including electrostatic force microscopy and Kelvin probe force microscopy, for measuring surface potential at the nanoscale. The review could provide fundamental information on the probing method of surface potential using atomic force microscopy.

Improved electrode pattern design for lateral force increase in electrostatic levitation system

  • Woo, Shao-Ju;Jeon, Jong-Up;higuchi, Toshiro
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1996년도 Proceedings of the Korea Automatic Control Conference, 11th (KACC); Pohang, Korea; 24-26 Oct. 1996
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    • pp.311-314
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    • 1996
  • In contactless disk handling systems based on electrostatic suspension in which the stator is to be transferred, the limited stiffness in lateral direction severely restricts the achievable translational acceleration. In existing stator electrode pattern designs, the magnitude of the lateral force is determined by the magnitude of the control voltages which are applied to the individual electrodes to levitate the disk stably. As a result, the lateral force cannot be set arbitrarily. A new stator electrode pattern is presented for the electrostatic levitation of disk-shaped objects, in particular silicon wafers and aluminum hard disks, which allows the lateral forces to be controlled independently from the levitation voltages. Therefore, greater lateral forces can be obtained, compared with the existing stator designs. Experimental results will be presented for a 4-inch silicon wafer that clearly reveal the increased lateral stiffness by using the proposed stator electrode compared to the conventional electrode pattern.

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실리콘웨이퍼 공정용 알루미나 정전척의 제작과 특성에 관한 연구 (A study on the Fabrication and Characterization of Alumina Electrostatic Chuck for Silicon Wafer Processing)

  • 정광진;박용균;이영섭;조동율;천희곤
    • 센서학회지
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    • 제8권6호
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    • pp.481-486
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    • 1999
  • Alumina electrostatic chucks for silicon wafer process with wide range of electrical resistivity were fabricated by controlling the amount of $TiO_2$ addition(0, 1.3, 2.0, 2.8 wt%). The dependence of electrostatic force on applied voltage, temperature and humidity was investigated. In addition, response characteristics on applied voltage and relationship between electrical resistivity and electrostatic force characteristics such as Coulomb force and Johnsen-Rahbeck force were discussed.

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정전기력을 이용한 미소기전 구동기의 고유치 변화 해석에 관한 연구 (Numerical Approach for Frequency-Shifting Analysis of Electrostatic Micro-Mechanial Actuator)

  • 이완술;권기찬;김봉규;조지현;윤성기
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2001년도 춘계학술대회논문집A
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    • pp.854-859
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    • 2001
  • An eigenvalue analysis of a tunable micro-mechanical actuator is presented. The actuator is modeled as a continuum structure. The eigenvalue modified by the tuning voltage is computed through the linearization of the relation between the electrostatic force and the displacement at the equilibrium. A staggered algorithm is employed to perform the coupled analysis of the electrostatic and elastic fields. The stiffness matrix of the actuator is modified at this equilibrium state. The displacement field is perturbed using an eigenmode profile of the actuator. The configuration change of the actuator due to perturbation modifies the electrostatic field and thus the electrostatic force. The equivalent stiffness matrix corresponding to the perturbation and the change in the electrostatic force is then added to stiffness matrix in order to explain natural frequency shifting. The numerical examples are presented and compared with the experiments in the literatures.

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반도체 제조용 사일렌 플라즈마 반응기 내에서의 입자 오염에 관한 이론적 연구 (Theoretical study on the particle contamination in silane plasma reactor for semiconductor processing)

  • 김동주;김교선
    • 한국진공학회지
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    • 제9권2호
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    • pp.172-178
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    • 2000
  • 반도체 제조공정 중 플라즈마 반응기 내에서 입자오염을 유발하는 입자들의 거동과 성장을 모델식을 사용하여 이론적으로 고찰하였다. 플라즈마 반응기 내에서 입자 거동에 영향을 미치는 힘들로 유체 대류, 입자 확산 및 외부힘 (ion drag force, electrostatic force, 중력) 등을 고려하였다. 플라즈마 벌크 영역에서 전하를 가진 입자들간의 충돌에 의한 입자 성장을 고려하기 위해 모델식에 입자 전하 분포를 고려하였다. 대부분의 입자들은 ion drag force와 electrostatic force가 균형을 이루고 있는 두 sheath 경계 영역에 존재하였으며 두 sheath 영역과 벌크 플라즈마에서의 입자 농도는 0에 접근하였다. 시간이 지남에 따라 입자 충돌로 인한 입자들의 크기는 증가하였으며 입자가 성장함에 따라 입자 표면적의 증가와 더불어 입자가 가지는 평균 전하량도 증가하였다.

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정전부상체에 작용하는 횡방향 복원력 측정장치 (A Measurement Apparatus of Lateral Restoring Force Exerted on Electrostatically Suspended Object)

  • 전종업;박기태;박규열
    • 한국정밀공학회지
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    • 제22권2호
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    • pp.60-69
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    • 2005
  • In electrostatic suspension system of thin plates like a silicon wafer or an aluminum disk for hard disk applications, the lateral restoring force exerted on a suspended object plays an important role since the lateral motion of the suspended object, owing to the inherently stable restoring forces, can be passively stabilized without any active control of it. This paper reports about the measurement apparatus of the lateral restoring force originating from a relative translation of the suspended object with respect to the electrodes-for-suspension. An approximate calculation of the lateral force in disk-shaped objects, the structure of the measurement apparatus, a measurement method, stabilization condition and the guideline in designing the measurement apparatus are described. Experimental results obtained by using a 3.5-inch aluminum disk as a suspended object are presented as well in order to assess the magnitude of lateral force and stiffness, and also verify the usefulness of the measurement apparatus.

계단식 정전빗살구조물을 이용한 수평구동형 미소공진기의 주파수 조정 (Tuning of a Laterally Driven Microresonator using Electrostatic Comb Step Array)

  • 이기방;서영호;조영호
    • 대한기계학회논문집A
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    • 제27권8호
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    • pp.1259-1265
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    • 2003
  • We present a new post-fabrication frequency tuning method for laterally driven electrostatic microresonators using a DC-biased electrostatic comb array of linearly varied finger-length. The electrostatic tuning force and the equivalent stiffness, adjusted by the DC-biased tuning-comb array, have been formulated as functions of geometry and DC tuning voltage. A set of frequency-turnable microresonators has been designed and fabricated by 4-mask surface-micromachining process. The resonant frequency of the microfabricated microresonator has been measured for a varying tuning voltage at the reduced pressure of 1 torr. The maximum 3.3% reduction of the resonant frequency is achieved at the tuning voltage increase of 20V.

경사 전극 배열을 이용한 각도방향 마이크로 구동부 제작 (Skewed Electrode Array(SEA) and Its Application as an Angular Microactuator)

  • 최석문;박성준
    • 융복합기술연구소 논문집
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    • 제1권2호
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    • pp.16-24
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    • 2011
  • The angular electrostatic microactuator using skewed electrode array (SEA) scheme was proposed. The moving and fixed electrodes are arranged to make the driving force perpendicular to the rotating moment of arm. By changing the electrode overlap length, the magnitude of electrostatic force and stable displacement will be changed. In order to optimize the design, electrostatic FE analysis were carried out and the empirical force model was established for SEA. Simulation was performed to make the comparison between conventional actuators and SEA. The proposed SEA generates actuating torque 2 times greater than a comb-drive and stable actuator displacement 40% greater than a parallel plate type actuator. The angular electrostatic microactuator using skewed SEA scheme was designed and fabricated using SoG process.

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