• Title/Summary/Keyword: Electronic devices

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Aspects of a head-mounted eye-tracker based on a bidirectional OLED microdisplay

  • Baumgarten, Judith;Schuchert, Tobias;Voth, Sascha;Wartenberg, Philipp;Richter, Bernd;Vogel, Uwe
    • Journal of Information Display
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    • v.13 no.2
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    • pp.67-71
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    • 2012
  • In today's mobile world, small and lightweight information systems are becoming increasingly important. Microdisplays are the base for several near-to-eye display devices. The addition of an integrated image sensor significantly boosts the range of applications. This paper describes the base-building block for these systems: the bidirectional organic light-emitting diode microdisplay. A small and lightweight optic design, an eye-tracking algorithm, and interaction concepts are also presented.

Various Dielectric Thick Films for Co-Integration of Passive and Active Devices by Aerosol Deposition Method (Aerosol Deposition Method에 의한 수동소자와 능동소자의 동시 직접화를 위한 다양한 유전체 후막)

  • Nam, Song-Min
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.348-348
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    • 2008
  • In recent, the concept of system-on-package (SOP) for highly integrated multifunctional systems has been paid attention to for the miniaturization and high frequency of electronic devices. In order to realize SOP, co-integration of passive devices, such as capacitors, resistors and inductors, and active devices should be achieved. If ceramic thick films can be grown at room temperature, we expect to be able to overcome many problems in conventional fabrication processes. So, we focused on the aerosol deposition method (ADM) as room temperature fabrication technology. ADM is a novel ceramic coating method based on the Room Temperature Impact Consolidation (RTIC) phenomena. This method has a wide range potential for fabrication of co-integration of passive and active devices. In this paper, I will present the future potential of ADM introducing various ceramic dielectric thick films for the integration of electronic ceramics.

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A Study on PCB's Latch-up Phenomenon by External Electrical Surge (외부 전기서지에 의한 전자회로기판 Latch-up 현상 고찰)

  • Ji, Yeong-Hwa;Jo, Sung-Han;Jung, Chang-Gyu
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.59 no.11
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    • pp.2089-2092
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    • 2010
  • There are many cases that interrupt the production process because of malfunctions caused by electronic circuit boards which control equipment, but it is difficult to distinctly identify the causes in many cases. Especially, CMOS devices with the control logic circuit return automatically to normal state after their own faults. Therefore it is not easy to analyze the problems with electronic circuit boards. Recently, nuclear power plant experienced a failure due to the malfunction of electronic circuit boards and it was identified that the reason of the malfunction was because of latch-up phenomenon caused by external surge in electronic devices. This paper presents the causes and the phenomenon of latch-up by experiment and also a way using counter EMF diodes, noise filters and surge protective devices to prevent latch-up phenomenon from electronic circuit boards, finally confirms the effectiveness of the result by experiment.

The Effect of H content in Si Precursor on the Performance of Poly-Si Crystallized by Pulsed YAG2${\omega}$ Laser on Soft Substrate

  • Li, Juan;Ying, Yao;Meng, Zhiguo;Chunya, Wu;Xiong, Shaozhen;Kwok, Hoi-Sing
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.1604-1607
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    • 2009
  • YAG laser crystallization of Si-based thin film deposited on plastic substrate has been studied. The Si-based thin films as crystallization precursor are with varied hydrogen (H) content. The effect of the H content on the crystallinity of the resulted poly-Si film has been investigated. The experimental results of the poly-Si crystallized by doublefrequency YAG laser shows that the initial dehydrogenation process could be left out if ${\mu}c$-Si was adopted as the crystallization precursor. The YAG laser annealing condition on plastic substrate and the crystallization results have been discussed in the paper.

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Analysis of Reliability for Different Device Type in 65 nm CMOS Technology (65 nm CMOS 기술에서 소자 종류에 따른 신뢰성 특성 분석)

  • Kim, Chang Su;Kwon, Sung-Kyu;Yu, Jae-Nam;Oh, Sun-Ho;Jang, Seong-Yong;Lee, Hi-Deok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.12
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    • pp.792-796
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    • 2014
  • In this paper, we investigated the hot carrier reliability of two kinds of device with low threshold voltage (LVT) and regular threshold voltage (RVT) in 65 nm CMOS technology. Contrary to the previous report that devices beyond $0.18{\mu}m$ CMOS technology is dominated by channel hot carrier(CHC) stress rather than drain avalanche hot carrier(DAHC) stress, both of LVT and RVT devices showed that their degradation is dominated by DAHC stress. It is also shown that in case of LVT devices, contribution of interface trap generation to the device degradation is greater under DAHC stress than CHC stress, while there is little difference for RVT devices.

Graphene Based Nano-electronic and Nano-electromechanical Devices

  • Lee, Sang-Wook
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.13-13
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    • 2011
  • Graphene based nano-electronic and nano-electromechanical devices will be introduced in this presentation. The first part of the presentation will be covered by our recent results on the fabrication and physical properties of artificially twisted bilayer graphene. Thanks to the recently developed contact transfer printing method, a single layer graphene sheet is stacked on various substrates/nano-structures in a controlled manner for fabricating e.g. a suspended graphene device, and single-bilayer hybrid junction. The Raman and electrical transport results of the artificially twisted bilayer indicates the decoupling of the two graphene sheets. The graphene based electromechanical devices will be presented in the second part of the presentation. Carbon nanotube based nanorelay and A new concept of non-volatile memory based on the carbon nanotube field effect transistor together with microelectromechanical switch will be briefly introduced at first. Recent progress on the graphene based nano structures of our group will be presented. The array of graphene resonators was fabricated and their mechanical resonance properties are discussed. A novel device structures using carbon nanotube field effect transistor combined with suspended graphene gate will be introduced in the end of this presentation.

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Properties Optimization for Perovskite Oxide Thin Films by Formation of Desired Microstructure

  • Liu, Xingzhao;Tao, Bowan;Wu, Chuangui;Zhang, Wanli;Li, Yanrong
    • Journal of the Korean Ceramic Society
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    • v.43 no.11 s.294
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    • pp.715-723
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    • 2006
  • Perovskite oxide materials are very important for the electronics industry, because they exhibit promising properties. With an interest in the obvious applications, significant effort has been invested in the growth of highly crystalline epitaxial perovskite oxide thin films in our laboratory. And the desired structure of films was formed to achieve excellent properties. $Y_1Ba_2Cu_3O_{7-x}$ (YBCO) superconducting thin films were simultaneously deposited on both sides of 3 inch wafer by inverted cylindrical sputtering. Values of microwave surface resistance R$_2$ (75 K, 145 GHz, 0 T) smaller than 100 m$\Omega$ were reached over the whole area of YBCO thin films by pre-seeded a self-template layer. For implementation of voltage tunable high-quality varactor, A tri-layer structured SrTiO$_3$ (STO) thin films with different tetragonal distortion degree was prepared in order to simultaneously achieve a large relative capacitance change and a small dielectric loss. Highly a-axis textured $Ba_{0.65}Sr_{0.35}TiO_3$ (BST65/35) thin films was grown on Pt/Ti/SiO$_2$/Si substrate for monolithic bolometers by introducing $Ba_{0.65}Sr_{0.35}RuO_3$ (BSR65/35) thin films as buffer layer. With the buffer layer, the leakage current density of BST65/35 thin films were greatly reduced, and the pyroelectric coefficient of $7.6\times10_{-7}$ C $cm^{-2}$ $K^{-1}$ was achieved at 6 V/$\mu$m bias and room temperature.

Effect of Microstructure on Piezoelectric Properties and TCC Behavior in PZT-PZN Ceramics (PZT-PZN 세라믹의 미세구조가 압전 특성 및 TCC 거동에 미치는 영향)

  • Seo, Intae;Choi, Yongsu;Cho, Yuri;Kang, Hyung-Won;Kim, Kang San;Cheon, Chae Il;Han, Seung Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.35 no.5
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    • pp.445-451
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    • 2022
  • Ultrasonic sensor is suitable as a next-generation autonomous driving assist device because its lower price compared to that of other sensors and its sensing stability in the external environment. Although Pb(Zr, Ti)O3 (PZT)-relaxor ferroelectric system has excellent piezoelectric properties, the change in capacitance is large in the daily operating temperature range due to the low phase transition temperature. Recently, many studies have been conducted to improve the temperature stability of ferroelectric ceramics by controlling the grain size and crystal structure, so it is necessary to study the effect of the grain size on the piezoelectric properties and the temperature stability of PZT-relaxor ferroelectric system. In this study, the piezoelectric properties, phase transition temperature, and temperature coefficient of capacitance (TCC) of 0.9 Pb(Zr1-xTix)O3-0.1 Pb(Zn1/3Nb2/3)O3 (PZTx-PZN) ceramics with various grain sizes were investigated. PZTx-PZN ceramics with larger grain size showed higher piezoelectric properties and temperature stability, and are expected to be suitable for ultrasonic devices in the future.

Fabrication of Micro-Vacuum Sensor using Surface-Macromachined Lateral-type Field Emitter Device (표면 미세 가공된 측면형 전계 방출 소자를 이용한 초소형 진공 센서의 제작)

  • Park, Heung-Woo;Ju, Byeong-Kwon;Lee, Yun-Hi;Park, Jung-Ho;Oh, Myung-Hwan
    • Journal of Sensor Science and Technology
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    • v.9 no.3
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    • pp.182-189
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    • 2000
  • A micro-vacuum sensor was fabricated for the measurement of the vacuum level in micro-space. The fact that the field emission current was dependent on the environmental vacuum level was employed as an operating principle. The fabricated lateral-type field emitter triode with a cathode, a gate and a anode separated by using the surface micromachining process showed the emission current variation in the range of $1.20{\sim}2.42\;{\mu}A$ for the vacuum range of $10^{-5}{\sim}10^{-8}\;Torr$.

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