• Title/Summary/Keyword: Electron contamination

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Measurement of Bremsstrahlung Radiation with Electron Beam Energy

  • Srivastava, R.P.;Chaurasia, P.P.;Prasiko, G.;Jha, A.K.
    • Proceedings of the Korean Society of Medical Physics Conference
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    • 2002.09a
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    • pp.235-236
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    • 2002
  • A Klystron powered dual photon energy electron linear accelerator 2300 C/D from Varian Associates has been installed in our center. From the radiological safety view as well as treatment planning, the output (contamination) of Bremsstrahlung Radiation with electron beam energy determined accurately. It has been found 0.5% to 4.7% with increasing the electron beam energy which is the clinically not much significant in the treatment of the malignant diseases with the treatment of electron beam.

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Damage of Minerals in the Preparation of Thin Slice Using Focused Ion Beam for Transmission Electron Microscopy (투과전자현미경분석용 박편 제작 시 집속이온빔에 의한 광물 손상)

  • Jeong, Gi Young
    • Journal of the Mineralogical Society of Korea
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    • v.28 no.4
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    • pp.293-297
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    • 2015
  • Focused ion beam (FIB) technique is widely used in the precise preparation of thin slices for the transmission electron microscopic (TEM) observation of target area of the minerals and geological materials. However, structural damages and artifacts by the Ga ion beam as well as electron beam damage are major difficulties in the TEM analyses. TEM analyses of the mineral samples showed the amorphization of quartz and feldspar, curtain effect, and Ga contamination, particularly near the grain edges and relatively thin regions. Although the ion beam damage could be much reduced by the improved procedures including the adjustment of the acceleration voltage and current, the ion beam damage and contamination are likely inevitable, thus requiring careful interpretation of the micro-structural and micro-chemical features observed by TEM analyses.

Defect evaluation of Fe metallic contamination in silicon wafers (Si 웨이퍼의 내부 금속 불순물 Fe의 결함분석)

  • 오민환;남효덕;김흥락;김동수;김영덕;김광일
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.578-581
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    • 2001
  • Silicon wafers using DRAM devices required for high cleaning technology and this cleaning technology was evaluated by defect level or electron life time. This paper examined the correlation of SPV(Surface Photo Voltaic Analyzer) which analyzes diffusion length of minority carriers and DLTS(Deep level Transient Spectroscope) which analyzes defect level.

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EFFECTS OF SALIVA AND BLOOD CONTAMINATION ON DENTIN BONDING (타액 및 혈액 오염이 상아질접착에 미치는 영향)

  • Kim, Ki-Ok;Ahn, Sik-Hwan;Kim, Sung-Kyo;Jo, Kwang-Hun;Park, Jin-Hoon
    • Restorative Dentistry and Endodontics
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    • v.21 no.2
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    • pp.585-601
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    • 1996
  • The purpose of this study was to elucidate the effect of blood-and saliva-contamination during dentin pretreatment procedure on tensile bond strength, and to investigate the effect of contaminant-removing treatments on the recovery of bond strength of dentin bonding agents. Dentin specimens prepared from freshly extracted bovine mandibular anterior teeth were divided into non-contaminated control and contaminated experimental groups. The specimens of the contaminated group were contaminated with saliva or blood after etching or priming procedure, followed by contaminant-removing treatments. All the specimens were bonded with All Bond$^{(R)}$ 2 dentin bonding agent and Bisfil$^{TM}$ composite resin or Scotchbond$^{TM}$ Multipurpose and Z100. After all the bonded specimens were stored in $37^{\circ}C$ distilled water for 24 hours, tensile bond strengths were measured. The contaminated dentin and fractured dentin surfaces were examined under the scanning electron microscope. The results were as follows : Contaminated specimens showed lower bond strength than non-contaminated ones regardless of the kind of contaminant, contamination time and contaminant-removing treatments, except specimens which were acid-etched following saliva contamination after etching in All Bond$^{(R)}$ 2 groups (p<0.05). Blood contaminant resulted in much bond strength decrease than saliva ones (p<0.01), and contamination after priming resulted in much decrease in bond strength than after etching (p<0.01). Re-etching resulted in increase of bond strength in the specimens contaminated with saliva after etching but not in blood contaminated ones. Re-priming resulted in increase of bond strength in the specimens contaminated after priming regardless of the kind of contaminant.

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Reduction of Electron Contamination in Photon Beam by electron Filter in 6MV Linear Accelerator (6MV 선형가속기에서 Al/Cu에 관한 여과판 사용시 전자오염 감소에 관한 연구)

  • Lee, Cheol-Su
    • The Journal of Korean Society for Radiation Therapy
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    • v.8 no.1
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    • pp.41-54
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    • 1996
  • The secondary electrons developed by interaction between primary beam and a tray mounted for blocks in Megavoltage irradiation result in excess soft radiation dose to the surface layer. To reduce this electron contamination, electron filters have been used to be attached under a tray. Various filters with Cu and Al plates in six different thickness and Cu/Al combined plates in 3 different thickness were tested to measure the reduction rate of secondary electron contamination to the surface layer. The measurement to find optimal filter was performed on 6MV linear accelerator in $10 cm{\times}10 cm$ field size and fixed 78.5cm source to measurement points distance from surface to maximum build up point in 2mm intervals. The result was analyzed as the ratio of measured doses with using filters, to standard doses of measured open beam. The result of this study was fellowing : 1. The contaminated low energy radiation were mainly produced by blocking tray. 2. The surface absorbed dose was slowly increased by increasing irradiation field size but rapidly increased at field size above $15cm{\times}15cm$. 3. Al plate upto 2.5mm thickness used as a filter was found to be inadequate due to the failure of reduction of the surface absorbed dose below doses of the under surface upto the maximal build up. Cu 0.5mm plate and Cu 0.28mm/A1 1.5mm compound plate were found to be optimal filters. 4. By using these 2 filters, the absorbed dose to the surface were effectively reduced $5.5\%$ in field size $4cm{\times}4cm,\;11.3\%$ in field size $10cm{\times}10cm,\;22.3\%$ in field size $25cm{\times}25cm$. 5. In field size $10cm{\times}10cm$, the absorbed dose to the surface of irradiation was reduced by setting TSD 20cm at least,. but effective and enough dose reduction could be achieved by setting TSD 30cm as 2 optimal filters used. 6. More surface dose absorbed at TSD less than 7.4cm with a tray and filters together indicated that soft radiation was also developed by filters. 7. The variation of PDD by the different size of irradiation field was minimal as 2 optimal filters used. There was also not different in variation of PDD according to using any of two different filters. 8. PDD was not effected either by various TSD or by using the different filter among two.

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Influence of Metallic Contamination on Photovoltaic Characteristics of n-type Silicon Solar-cells (중금속 오염이 n형 실리콘 태양전지의 전기적 특성에 미치는 영향에 대한 연구)

  • Kim, Il-Hwan;Park, Jun-Seong;Park, Jea-Gun
    • Current Photovoltaic Research
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    • v.6 no.1
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    • pp.17-20
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    • 2018
  • The dependency of the photovoltaic performance of p-/n-type silicon solar-cells on the metallic contaminant type (Fe, Cu, and Ni) and concentration was investigated. The minority-carrier recombination lifetime was degraded with increasing metallic contaminant concentration, however, the degradation sensitivity of recombination lifetime was lower at n-type than p-type silicon wafer, which means n-type silicon wafer have an immunity to the effect of metallic contamination. This is because heavy metal ions with positive charge have a much larger capture cross section of electron than hole, so that reaction with electrons occurs much more easily. The power conversion efficiency of n-type solar-cells was degraded by 9.73% when metallic impurities were introduced in the silicon bulk, which is lower degradation compared to p-type solar-cells (15.61% of efficiency degradation). Therefore, n-type silicon solar-cells have a potential to achieve high efficiency of the solar-cell in the future with a merit of immunity against metal contamination.

혐기성 슬러지를 첨가한 오염 토양에서 저자 수용체 조건에 따른 디젤 분해 및 미생물 군집 변화

  • 이태호;최선열;박태주
    • Proceedings of the Korean Society of Soil and Groundwater Environment Conference
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    • 2004.09a
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    • pp.207-210
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    • 2004
  • Effect of electron accepters on anaerobic degradation of petroleum hydrocarbons by an anaerobic sludge taken from a sludge digestion tank in a soil artificially contaminated with 10,000 mg/kg soil of diesel fuel was tested. Treatments of soil with 30 mL of the digestion sludge (2,000 mg/L of vss (volatile suspended solids)) were incubated under several anaerobic conditions including nitrate reducing, sulfate reducing, methanogenic, and mixed electron accepters conditions for 120 days. Treatments with the digested sludge showed significant degradation of diesel fuel under all anaerobic conditions compare to control treatments with an autoclaved sludge and without the sludge. The amount of TPH degradation after 120days incubation was the largest in the treatment with the sludge and mixed electron accepters (75% removal of TPH) followed in order by sulfate reducing, nitrate reducing, methanegenic condition as 67%, 53%, 43%, respectively. However, the rate of TPH degradation in the nitrate- and sulfate reducing condition within 105 days were comparable with that of the mixed electron accepters condition. Microorganisms in each electron acceptor condition were plated on solid mediums containing nitrate or sulfate as sole electron acceptor and several nitrate- and sulfate reducing bacteria showed effective degradation of diesel fuel within 30 days incubations. These results suggest that anaerobic degradation of diesel fuel in soil with digested sludge is effective for practical remediation of soil contaminated with petroleum hydrocarbons.

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Microscopical and chemical surface characterization of CAD/CAM zircona abutments after different cleaning procedures. A qualitative analysis

  • Gehrke, Peter;Tabellion, Astrid;Fischer, Carsten
    • The Journal of Advanced Prosthodontics
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    • v.7 no.2
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    • pp.151-159
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    • 2015
  • PURPOSE. To describe and characterize the surface topography and cleanliness of CAD/CAM manufactured zirconia abutments after steaming and ultrasonic cleaning. MATERIALS AND METHODS. A total of 12 ceramic CAD/CAM implant abutments of various manufacturers were produced and randomly divided into two groups of six samples each (control and test group). Four two-piece hybrid abutments and two one-piece abutments made of zirconium-dioxide were assessed per each group. In the control group, cleaning by steam was performed. The test group underwent an ultrasonic cleaning procedure with acetone, ethyl alcohol and antibacterial solution. Groups were subjected to scanning electron microscope (SEM) analysis and Energy-dispersive X-ray spectroscopy (EDX) to verify and characterize contaminant chemical characterization non- quantitatively. RESULTS. All zirconia CAD/CAM abutments in the present study displayed production-induced wear particles, debris as well as organic and inorganic contaminants. The abutments of the test group showed reduction of surface contamination after undergoing an ultrasonic cleaning procedure. However, an absolute removal of pollutants could not be achieved. CONCLUSION. The presence of debris on the transmucosal surface of CAD/CAM zirconia abutments of various manufacturers was confirmed. Within the limits of the study design, the results suggest that a defined ultrasonic cleaning process can be advantageously employed to reduce such debris, thus, supposedly enhancing soft tissue healing. Although the adverse long-term influence of abutment contamination on the biological stability of peri-implant tissues has been evidenced, a standardized and validated polishing and cleaning protocol still has to be implemented.

Review of Analytical and Assessment Techniques of Terminal Electron Accepting Processes (TEAPs) for Site Characterization and Natural Attenuation in Contaminated Subsurface Environments (오염 지중환경 특성화와 자연저감평가를 위한 말단전자수용과정(TEAPs) 분석 및 평가기술 소개)

  • Song, Yun Sun;Kim, Han-Suk;Kwon, Man Jae
    • Journal of Soil and Groundwater Environment
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    • v.25 no.2_spc
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    • pp.1-15
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    • 2020
  • Monitoring and assessing terminal electron accepting processes (TEAPs) are one of the most important steps to remediate contaminated sites via various in-situ techniques. TEAPs are a part of the microbial respiration reactions. Microorganisms gain energy from these reactions and reduces pollutants. Monitoring TEAPs enables us to predict degradability of contaminants and degradation rates. In many countries, TEAPs have been used for characterization of field sites and management of groundwater wells. For instance, US Environmental Protection Agency (EPA) provided strategies for groundwater quality and well management by applying TEAPs monitoring. Denmark has also constructed TEAPs map of local unit area to develop effective groundwater managing system, particularly to predict and assess nitrogen contamination. In case of Korea, although detailed soil survey and groundwater contamination assessment have been employed, site investigation guidelines using TEAPs have not been established yet. To better define TEAPs in subsurface environments, multiple indicators including ion concentrations, isotope compositions and contaminant degradation byproducts must be assessed. Furthermore, dissolved hydrogen concentrations are regarded as significant evidence of TEAPs occurring in subsurface environment. This review study introduces optimal sampling techniques of groundwater and dissolved hydrogen, and further discuss how to assess TEAPs in contaminated subsurface environments according to several contamination scenarios.

Comparative study on the specimen thickness measurement using EELS and CBED methods

  • Yoon-Uk Heo
    • Applied Microscopy
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    • v.50
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    • pp.8.1-8.7
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    • 2020
  • Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-Möllenstedt (K-M) fringe of the $13{\ba{1}}$ diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72 ~ 113 nm with a difference of less than 5%.