Browse > Article
http://dx.doi.org/10.9727/jmsk.2015.28.4.293

Damage of Minerals in the Preparation of Thin Slice Using Focused Ion Beam for Transmission Electron Microscopy  

Jeong, Gi Young (Department of Earth and Environmental Sciences, Andong National University)
Publication Information
Journal of the Mineralogical Society of Korea / v.28, no.4, 2015 , pp. 293-297 More about this Journal
Abstract
Focused ion beam (FIB) technique is widely used in the precise preparation of thin slices for the transmission electron microscopic (TEM) observation of target area of the minerals and geological materials. However, structural damages and artifacts by the Ga ion beam as well as electron beam damage are major difficulties in the TEM analyses. TEM analyses of the mineral samples showed the amorphization of quartz and feldspar, curtain effect, and Ga contamination, particularly near the grain edges and relatively thin regions. Although the ion beam damage could be much reduced by the improved procedures including the adjustment of the acceleration voltage and current, the ion beam damage and contamination are likely inevitable, thus requiring careful interpretation of the micro-structural and micro-chemical features observed by TEM analyses.
Keywords
Focused ion beam (FIB); transmission electron microscopy; mineral; beam damage; amorphous;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Giannuzzi, L.A. and Stevie, F.A. (1999) A review of focused ion beam milling techniques for TEM specimen preparation. Micron, 30, 197-204.   DOI
2 Giannuzzi, L.A. (2005) Introduction to focuse dion beams, Instrumentation, theory, techniques, and practice. Springer, 358 p.
3 Heaney, P.J., Vicenzi, E.P., Giannuzzi, L.A., and Livi, K.J.T. (2001), Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials. Amer. Mineral., 86, 1094-1099.   DOI
4 Ishitani, T., Umemura, K., Ohnishi, T., Yaguchi, T., and Kamino, T. (2004) Improvements in performance of focused ion beam cross sectioning: aspects of ion-sample interaction. J. Electron Microsc., 53, 443-449.   DOI
5 Jeong, G.Y. and Achterberg, E.P. (2014) Chemistry and mineralogy of clay minerals in Asian and Saharan dusts and the implications for iron supply to the oceans. Atmos. Chem. Phys., 14, 12415-12428, 2014, doi:10.5194/acp-14-12415-2014.   DOI
6 Jeong, G.Y. and Nousiainen, T. (2014) TEM analysis of the internal structures and mineralogy of Asian dust particles and the implications for optical modeling. Atmos. Chem. Phys., 14, 7233-7254, doi:10.5194/acp-14-7233-2014.   DOI
7 Jeong, G.Y. and Sohn, Y.K. (2011) Microtextures, microchemistry, and mineralogy of basaltic glass alteration, Jeju Island, Korea, with implications for elemental behavior. Amer. Mineral., 96, 1129-1147.   DOI
8 Jeong, G.Y., Kim, J.Y., Seo, J., Kim, G.M., Jin, H.C., and Chun, Y. (2014) Long-range transport of giant particles in Asian dust identified by physical, mineralogical, and meteorological analysis. Atmos. Chem. Phys., 14, 505-521, doi:10.5194/acp-14-505-2014.   DOI
9 Kato, N.I. (2004) Reducing focused ion beam damage to transmission electron microscopy samples. J. Electron Microsc., 53, 451-458.   DOI
10 Mayer, J., Giannuzzi, L.A., Kamino, T., and Michael, J. (2007) TEM sample preparation and FIB-induced damage. MRS Bull., 32, 400-407.   DOI