• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.80-81
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• 2012

Recently, one of the critical issues in the etching processes of the nanoscale devices is to achieve ultra-high aspect ratio contact (UHARC) profile without anomalous behaviors such as sidewall bowing, and twisting profile. To achieve this goal, the fluorocarbon plasmas with major advantage of the sidewall passivation have been used commonly with numerous additives to obtain the ideal etch profiles. However, they still suffer from formidable challenges such as tight limits of sidewall bowing and controlling the randomly distorted features in nanoscale etching profile. Furthermore, the absence of the available plasma simulation tools has made it difficult to develop revolutionary technologies to overcome these process limitations, including novel plasma chemistries, and plasma sources. As an effort to address these issues, we performed a fluorocarbon surface kinetic modeling based on the experimental plasma diagnostic data for silicon dioxide etching process under inductively coupled C4F6/Ar/O2 plasmas. For this work, the SiO2 etch rates were investigated with bulk plasma diagnostics tools such as Langmuir probe, cutoff probe and Quadruple Mass Spectrometer (QMS). The surface chemistries of the etched samples were measured by X-ray Photoelectron Spectrometer. To measure plasma parameters, the self-cleaned RF Langmuir probe was used for polymer deposition environment on the probe tip and double-checked by the cutoff probe which was known to be a precise plasma diagnostic tool for the electron density measurement. In addition, neutral and ion fluxes from bulk plasma were monitored with appearance methods using QMS signal. Based on these experimental data, we proposed a phenomenological, and realistic two-layer surface reaction model of SiO2 etch process under the overlying polymer passivation layer, considering material balance of deposition and etching through steady-state fluorocarbon layer. The predicted surface reaction modeling results showed good agreement with the experimental data. With the above studies of plasma surface reaction, we have developed a 3D topography simulator using the multi-layer level set algorithm and new memory saving technique, which is suitable in 3D UHARC etch simulation. Ballistic transports of neutral and ion species inside feature profile was considered by deterministic and Monte Carlo methods, respectively. In case of ultra-high aspect ratio contact hole etching, it is already well-known that the huge computational burden is required for realistic consideration of these ballistic transports. To address this issue, the related computational codes were efficiently parallelized for GPU (Graphic Processing Unit) computing, so that the total computation time could be improved more than few hundred times compared to the serial version. Finally, the 3D topography simulator was integrated with ballistic transport module and etch reaction model. Realistic etch-profile simulations with consideration of the sidewall polymer passivation layer were demonstrated.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.349-349
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• 2012

산화제를 이용 기상중합법을 통해 합성되는 고전도도 Poly (3,4-Ethylenedioxythiophene)(PEDOT) 박막은 OTFT, RFID tag, 또는 연성 디스플레이 같은 분야에 다양한 응용 가능성을 가지고 있으며 이로 인해 최근에 연구가 활발히 진행되고 있다. PEDOT박막의 전극소재로써 가능성은 박막의 중합 정도와 표면 형상에 크게 좌우된다. 특히, Si-웨이퍼 기판 위에 산화제의 균일한 도포 및 산화제 자체의 높은 산도 ($pH{\leq}2$)에 따른 부반응의 억제는 기상중합법을 이용한 PEDOT박막의 합성에 있어 매우 중요하다. PEDOT의 효율적인 중합과 균일한 성장을 위해 산화제에 DUDO 와 PEG-PPG-PEG를 첨가한 혼합 산화제 용액을 제조 기상중합 방법을 통해 PEDOT박막을 제작하였다. 그 결과 산화제만을 사용하여 제작된 박막에 비해 전도도가 최대 3,660 S/cm로 향상된 PEDOT 박막이 합성되었다. 이러한 결과는 PEG-PPG-PEG가 산화제 용액의 균일 도포를 향상시키고 Base Inhibitor로 작용하는 DUDO는 PEDOT 성장 시 중합속도를 조절하고 부반응을 최소화 하여 효율적인 공액 이중 결합의 생성을 촉진한데 주로 기인한다. 따라서 그로인해 조밀하며 마이크로 스케일의 기공이 최소화된 PEDOT박막의 합성이 가능하였다. PEDOT박막의 특성 평가에는 4-point probe, optical microscopy, Field Emission-Scanning Electron Microscope, 등이 사용되었으며 또한 전도도의 향상 원인을 분석하고자 ATR-IR Spectrophotometer를 이용하여 합성된 박막의 작용기를 분석하였다. 이러한 고전도도의 PEDOT 박막이 OTFT의 전극소재로 사용된다면 OTFT소자의 성능 향상에 크게 기여 할 것으로 기대된다.

• 한국신재생에너지학회:학술대회논문집
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• 2010.11a
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• pp.41.2-41.2
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• 2010

최근 태양전지 제조비용 절감을 위해 초박형 실리콘 태양전지 개발이 활발히 이루어지고 있다. 이에 따라 후면전계(Back Surface Field, BSF) 특성에 대한 관심이 높아지는 추세이다. 이에 본 연구에서는 후면의 결정방향 및 표면구조에 따라 형성되는 후면전계(BSF)의 특성에 대해 알아보고자 하였다. 후면이 절삭손상층 식각(Saw damage etching) 후 (100)면이 드러난 실리콘 기판과 텍스쳐링(Texturing) 후 (111)면이 드러난 실리콘 기판에 후면 전극을 스크린 인쇄 후 Ramp up rate을 달리 하여 소성 공정(RTP system)을 통해 후면전계(BSF)를 형성하여 비교하였다. 후면전계(BSF)의 형상과 특성만을 평가하기 위하여 염산을 이용하여 후면 전극층을 제거하였다. 후면 전극 제거 후 주사전자현미경(Scanning Electron Microscopy)과 3차원 미세형상측정기(Non-contacting optical profiler)로 후면전계(BSF)의 형상을 비교하였다. 또한 후면전계(BSF)의 특성을 평가하고자 Quasi-Steady-State Photo Conductance(QSSPC)를 사용하여 포화전류(Saturation current, $J_0$)을 측정하였고, 면저항 측정기(4-point probe)로 면저항을 측정하여 비교하였다. 후면 전계(BSF)는 (100)면과 (111)면에서 모두 Ramp up rate이 빠를수록 향상된 특성을 보였고, (111)면에서 더 큰 차이를 보였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.50-50
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• 2009

In this paper, the plasma doping is performed on p-type wafers using $PH_3$ gas(10 %) diluted with He gas(90 %). The wafer is placed in the plasma generated with 200 W and a negative DC bias (1 kV) is applied to the substrate for 60 sec under no substrate heating. the flow rate of the diluted $PH_3$ gas and the process pressure are 100 sccm and 10 mTorr, respectively. In order to diffuse and activate the dopant, annealing process such as rapid thermal annealing (RTA) is performed. RTA process is performed either in $N_2$, $O_2$ or $O_2+N_2$ ambient at $900{\sim}950^{\circ}C$ for 10 sec. The sheet resistance is measured using four point probe. The shallow n+/p doping profiles are investigated using secondary ion mass spectromtry (SIMS). The analysis of crystalline defect is also done using transmission electron microscopy (TEM) and double crystal X-ray diffraction (DXRD).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.17-17
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• 2009

Single-walled carbon nanotubes (SWCNTs) have attracted much attention as promising materials for transparent conducting films (TCFs), thanks to their superior electrical conductivity, high mechanical strength, and complete flexibility. The CNT-based TCFs can be used in a variety of application fields as flexible, transparent electrodes, including touch panel screens, flexible electronics, transparent heaters, etc. First of all, this study investigated the effect of a variety of surfactants on the dispersion of SWCNTs in an aqueous solution. Following the optimization of the dispersion by surfactants, flexible TCFs were fabricated by spraying the CNT suspension onto poly(ethylene terephthalate) (PET) substrates. The sheet resistances of the TCFs having different surfactants were investigated with treatment in nitric acid ($HNO_3$) whose concentration and period of treatment time were varied. It seems that the $HNO_3$ removes the surfactants from and is simultaneously doped into the SWCNT network, reducing the contact resistance between CNTs. TCFs were characterized by UV-VIS spectroscopy, thermogravimetric analyzer (TGA), scanning electron microscopy (SEM), and four-point probe.

• Bulletin of the Korean Chemical Society
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• v.32 no.5
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• pp.1630-1634
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• 2011

Electroless plating of metallic nickel on carbon fiber surfaces was carried out to control specific electric resistivity of the fibers, and the effects of the nickel content and coating thickness on the electric properties were studied. The structural and surface properties of the carbon fibers were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), and X-ray photoelectron spectroscopy (XPS). The specific resistivity of the fibers was measured using a four-point probe testing method. From the XPS results, the oxygen and Ni atomic ratio of the fibers was greatly enhanced as the plating time increased. Additionally, it was observed that the specific electric resistivity decreased considerably in the presence of metallic nickel particles and with the formation of nickel layers on carbon fibers.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.390.1-390.1
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• 2016

The present work explains the interfacial energetics of all oxide transparent photodiodes. The optical, structural and morphological of copper oxides were systematically analyse by UV-Visible spectrometer, X-Ray diffraction, Raman spectroscopy, Scanning electron microscopy (SEM) and Atomic force microscopy measurements (AFM). The UV-Visible result exhibits optical bandgap of Cu2O and CuO as 2.2 and 2.05 eV respectively. SEM and AFM result shows a uniform grain size distribution in Cu2O and CuO thin films with the average grain size of 45 and 40 nm respectively. The results of Current-Voltage and Kelvin probe force microscope characteristics describe the electrical responses of the Cu2O/ZnO and CuO/ZnO heterojunctions photodiodes. The obtained electrical response depicts the approximately same knee voltages with a measurable difference in the absolute value of net terminal current. More over the present study realizes the all oxide transparent photodiode with zero bias photocurrent. The presented results lay the template for fabricating and analysing the self-bias all oxide transparent photodetector.

• Advances in materials Research
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• v.3 no.4
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• pp.233-242
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• 2014

Magnetic and conducting aniline sulfide resin cross-linked (ASC-Fe3O4) nanocomposite has been prepared in the presence of aniline sulfide resin (ASR), aniline, $Fe_3O_4$ coated by polyethylene glycol (PEG) and initiator. The magnetic properties of the resulting composites showed ferromagnetic behavior, such as high-saturated magnetization (Ms= 41 emu/g), and coercive force (Hc=1.5 Oe). The saturated magnetization was increased by increasing of $Fe_3O_4$ content and decreased by increasing aniline ratio. The transmission electron micrograph (TEM) and X-ray diffraction proved that nanometer-sized about 20-30 nm $Fe_3O_4$ in the composite. The average size of ASC-$Fe_3O_4$ nanocomposite with core-shell structure was about 50-60 nm, and polydisperse. This approach may also be extended to the synthesis and modification of other polymers. Electrical conductivity of aniline sulfide resin cross-linked (ASC) nanocomposite has been studied by four-point probe method and produced $3.3{\times}10^{-4}S/cm$ conductivity for it. The conductivity of the composites at room temperature depended on the $Fe_3O_4$, aniline ratio and doping degree. The thermogravimetry analysis (TGA) results showed that this resin is thermal resistance near of $500^{\circ}C$. So, It can be used for resistance thermal coating for military applications. $Fe_3O_4$-PASC nanocomposite has been flexible structure with electrical and magnetic properties.

• Korean Journal of Materials Research
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• v.20 no.6
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• pp.338-343
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• 2010

As an alternative to the W plug used in MOSFETs, a Cu plug with a NiSi contact using Ta / TaN as a diffusion barrier is currently being considered. Conventionally, Ni was first deposited and then NiSi was formed, followed by the barrier and Cu deposition. In this study, Ti was employed as a barrier material and simultaneous formation of the NiSi contact and Cu plug / Ti barrier was attempted. Cu(100 nm) / Ti / Ni(20 nm) with varying Ti thicknesses were deposited on a Si substrate and annealed at $4000^{\circ}C$ for 30 min. For comparison, Cu/Ti/NiSi thin films were also formed by the conventional method. Optical Microscopy (OM), Scanning Probe Microscopy (SPM), X-Ray Diffractometry (XRD), and Auger Electron Microscopy (AES) analysis were performed to characterize the inter-diffusion properties. For a Ti interlayer thicker than 50 nm, the NiSi formation was incomplete, although Cu diffusion was inhibited by the Ti barrier. For a Ti thickness of 20 nm and less, an almost stoichiometric NiSi contact along with the Cu plug and Ti barrier layers was formed. The results were comparable to that formed by the conventional method and showed that this alternative process has potential as a formation process for the Cu plug/Ti barrier/NiSi contact system.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.417-417
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• 2009

Although a transparent conductive film (TCF) belongs to essential supporting materials for many device applications such as touch screens, flat panel displays, and sensors, a conventional transparent conductive material, indium-tin oxide (ITO), suffers from considerable drawback because the price of indium has soared since 2001. Despite a recent falloff, a demand of ITO is expected to increase sharply in the future due to the trend of flat panel display technologies toward flexible, paper-like features. There have been recently extensive studies to replace ITO with new materials, in particular, carbon nanotubes (CNTs) since CNTs possess excellent properties such as flexibility, electrical conductivity, optical transparency, mechanical strength, etc., which are prerequisite to TCFs. This study fabricated TCFs with single-walled carbon nanotubes (SWCNTs) produced by arc discharge. The SWCNTs were dispersed in water with a surfactant of sodium dodecyl benzene sulfonate (NaDDBS) under sonication. Carbon black and fullerene nanoparticles were added to the SWCNT-dispersed solution to enhance contact resistance between CNTs. TCFs were manufactured by a filtration and transfer method. TCFs added with carbon black and fullerene nanoparticles were characterized by scanning electron microscopy (SEM), UV-vis spectroscopy (optical transmittance), and four-point probe measurement (sheet resistance).