• Title/Summary/Keyword: Electron Diffraction

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Principles and Analysis of Electron Diffraction Patterns in Transmission Electron Microscopy : Utilization of Microcomputers (전자회절도형의 원리와 분석 : Microcomputer의 이용)

  • Sung, Chang-Mo
    • Applied Microscopy
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    • v.21 no.1
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    • pp.108-120
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    • 1991
  • Principles of electron diffraction patterns in transmission electron microscope are described for beginners in terms of reciprocal lattices and Ewald sphere. Analysis of both ring patterns and spot patterns are illustrated with practical examples as well as basic calibrations of TEM. Especially convergent beam electron diffraction method is emphasized for the determination of lattice parameters, microstrains, and thickness of thin foil followed by a review of microcomputer programs for the electron diffraction analyses explained in this paper.

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Crystal Structure Analysis by Texture Electron Diffraction Pattern (Texture Electron Diffraction Pattern에 의한 결정구조 해석)

  • Lee, Su-Jeong;Jou, Hyeong-Tae;Kim, Youn-Joong;Moon, Hi-Soo
    • Applied Microscopy
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    • v.32 no.3
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    • pp.185-193
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    • 2002
  • The works of texture electron diffraction patterns for crystal structure analysis are written in Russian or introduced briefly in books written in English, which makes it difficult to be understood. In addition to working out the equations, vector theory corrects some errors included in the established formulas for texture electron diffraction patterns.

Toward High-Resolution Cryo-Electron Microscopy: Technical Review on Microcrystal-Electron Diffraction

  • Lee, Sangmin;Chung, Jeong Min;Jung, Hyun Suk
    • Applied Microscopy
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    • v.47 no.4
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    • pp.223-225
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    • 2017
  • Cryo-electron microscopy (cryo-EM) is arguably the most powerful tool used in structural biology. It is an important analytical technique that is used for gaining insight into the functional and molecular mechanisms of biomolecules involved in several physiological processes. Cryo-EM can be separated into the following three groups according to the analytical purposes and the features of the biological samples: cryo-electron tomography (cryo-ET), cryo-single-particle reconstruction, and cryo-electron crystallography. Cryo-tomography is a unique EM technique that is used to study intact biomolecular complexes within their original environments; it can provide mechanistic insights that are challenging for other EM-methods. However, the resolution of reconstructed three-dimensional (3D) models generated by cryo-ET is relatively low, while single-particle reconstruction can reproduce biomolecular structures having near-atomic resolution without the need for crystallization unless the samples are large (>200 kDa) and highly symmetrical. Cryo-electron crystallography is subdivided into the following two categories according to the types of samples: one category that deals with two-dimensional (2D) crystalline arrays and the other category that uses 3D crystals. These two categories of electron-crystallographic techniques use different diffraction data obtained from still diffraction and continuous-rotation diffraction. In this paper, we review crystal-based cryo-EM techniques and focus on the recently developed 3D electron-crystallographic technique called microcrystal-electron diffraction.

Development of Dark Field image Processing Technique for the Investigation of Nanostructures

  • Jeon, Jongchul;Kim, Kyou-Hyun
    • Journal of Powder Materials
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    • v.24 no.4
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    • pp.285-291
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    • 2017
  • We propose a custom analysis technique for the dark field (DF) image based on transmission electron microscopy (TEM). The custom analysis technique is developed based on the $DigitalMicrograph^{(R)}$ (DM) script language embedded in the Gatan digital microscopy software, which is used as the operational software for most TEM instruments. The developed software automatically scans an electron beam across a TEM sample and records a series of electron diffraction patterns. The recorded electron diffraction patterns provide DF and ADF images based on digital image processing. An experimental electron diffraction pattern is recorded from a IrMn polycrystal consisting of fine nanograins in order to test the proposed software. We demonstrate that the developed image processing technique well resolves nanograins of ~ 5 nm in diameter.

Accuracy Improvement of Lattice Parameters Measured from Electron Diffraction Data (전자회절을 이용한 격자상수의 측정 정확도 향상)

  • Lee, Sang-Gil;Song, Kyung;Kim, Jin-Gyu
    • Applied Microscopy
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    • v.41 no.1
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    • pp.75-79
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    • 2011
  • For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to $10^{-4}$ order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.

Rietveld Analysis of Nano-crystalline MnFe2O4 with Electron Powder Diffraction

  • Kim, Jin-Gyu;Seo, Jung-Wook;Cheon, Jin-Woo;Kim, Youn-Joong
    • Bulletin of the Korean Chemical Society
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    • v.30 no.1
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    • pp.183-187
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    • 2009
  • The structure of nano-crystalline $MnFe_2O_4$ was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) $\AA$. The reliability factors of the refinement are $R_F$=7.98% and $R_B$=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.

Structure Determination of Nano-crystalline, $BaTiO_3$, using Precession Electron Diffraction (세차전자회절을 이용한 $BaTiO_3$ 나노 결정의 구조분석)

  • Song, Kyung;Kim, Youn-Joong;Kwon, Ki-Hyun;Kim, Jin-Gyu;Moon, Sun-Min;Cho, Nam-Hee
    • Applied Microscopy
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    • v.39 no.4
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    • pp.341-348
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    • 2009
  • The crystal structure of nano-crystalline, $BaTiO_3$, with the average particle size of 100 nm was investigated using electron diffraction techniques. We characterized the precession electron diffraction system and then carried out the structure determination using precession electron diffraction and conventional selected area electron diffraction. As a result, it was revealed that $BaTiO_3$ nano-crystalline exist as a mixture of tetragonal structure and cubic structure by precession electron diffraction technique. In addition, it could be turned out that $BaTiO_3$ nano-crystalline is a core-shell structure consisted of a tetragonal phased core and a cubic phased surface layer by theoretical calculation. The thickness of the cubic surface layer was approximately 8.5 nm and the lattice parameters of cubic and tetragonal phases were a=3.999${\AA}$ and a=3.999${\AA}$, c=4.022${\AA}$, respectively. Finally, it is expected that precession electron diffraction is more useful technique for structure determination of complicated nano-crystalline materials because of its higher spatial resolution and minimization of dynamical scattering effect.

A Study of the Crystal Structure of the Fine S-Phase Precipitate in Al-Cu-Mg Alloy by Electron Diffraction Experiments (전자회절실험에 의한 알루미늄 합금 (Al-Cu-Mg)의 미세 S-상 석출입자에 대한 결정구조 연구)

  • Kim, Hwang-Su
    • Applied Microscopy
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    • v.35 no.4
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    • pp.1-9
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    • 2005
  • In this paper it is reported that a comprehensive study of the crystal structure of the fine size S-phase ($Al_2CuMg$) precipitate in Al-Cu-Mg alloy by electron diffraction experiments. The experiments involve taking the selected area diffraction pattern for a S-phase particle, simulations of the pattern based on the kinematical diffraction theory and quantitative data collection from the zone axis diffraction patterns for the comparison with calculated diffraction intensity using both the kinematical and the dynamical diffraction theory. As a result, a good fitting model of the S-phase structure turns out to be the model reported early by X-ray methods (Perlitz & Westgren, 1943), not the new model determined by HRTEM methods (Radmilovic et al., 1999).

The specimen preparation for the high energy electron diffraction and reflection electron microscopy observation (고에너지 회절무늬 및 반사전자현미경 관찰을 위한 시편준비)

  • 김유택
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.6 no.4
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    • pp.543-551
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    • 1996
  • The use of reflection high energy electron diffraction and reflection electron microscopy technique has been increased with increasing number of studieds on surfaces of single crystals and epitaxial growth layers. Here, the speciment preparation techniques are summerized for these two techniques which are not so polular in the country. The panoramic reflection high energy electron diffraction maps have been completed and an example of Pt(111) surface was demonstrated.

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