• Title/Summary/Keyword: Electron Cyclotron Resonance

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Growth and Electrical Characteristics of Ultrathin $SiO_2$ Film Formed in an Electron Cyclotron Resonance Oxygen Plasma (ECR 산소 플라즈마에 의한 $SiO_2$ 박막의 성장 거동 및 전기적 특성)

  • 안성덕;이원종
    • Journal of the Korean Ceramic Society
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    • v.32 no.3
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    • pp.371-377
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    • 1995
  • Silicon oxide films were grown on single-crystal silicon substrates at low temperatures (25~205$^{\circ}C$) in a low pressure electron cyclotron resonance (ECR) oxygen plasma. The growth rate of the silicon oxide film increased as the temperature increased or the pressure decreased. Also, the thickness of the silicon oxide film increased at negative bias voltage, but not changed at positive bias voltage. The growth law of the silicon oxide film was approximated to the parabolic form. Capacitance-voltage (C-V) and current density-electric field (J-E) characteristics were studied using Al/SiO2/p-Si MOS structures. For a 10.2 nm thick silicon oxide film, the leakage current density at the electric field of 1 MVcm-1 was less than 1.0$\times$10-8Acm-2 and the breakdown field was higher than 10 MVcm-1. The flat band voltage of Al/SiO2/p-Si MOS capacitor was varied in the range of -2~-3 V and the effective dielectric constant was 3.85. These results indicate that high quality oxide films with properties that are similar to those of thermal oxide film can be fastly grown at low temperature using the ECR oxygen plasma.

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Study on the Etching Characteristics of $0.2\mu\textrm{m}$ fine Pattern of Ta Thin film for Next Generation Lithography Mask (차세대 노광공정용 Ta박막의 $0.2\mu\textrm{m}$ 미세패턴 식각특성 연구)

  • Woo, Sang-Gyun;Kim, Sang-Hoon;Ju, Sup-Youl;Ahn, Jin-Ho
    • Korean Journal of Materials Research
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    • v.10 no.12
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    • pp.819-824
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    • 2000
  • In this research, the etching characteristics of Ta thin film with chlorine plsama have been studied by Electron Cyclotron Resonance (ECR) plasma etching system. The effects of microwave power, RF bias power, working pressure and gas chemistry on the etching profiles have been investigated. The microloading effect, which was observed at fine pattern formation, was effectively suppressed by double step etching, and anisotropic $0.2{\mu\textrm{m}}$ L&S patterns were successfully generated.

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Effects of electrode configurations on uniformity of copper films on flexible polymer substrate prepared by ECR-MOCVD (ECR-MOCVD에 의해 연성 고분자 기판에 제조된 구리막의 균일도에 전극의 형태가 미치는 영향)

  • 전법주;이중기
    • Journal of the Korea Institute of Military Science and Technology
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    • v.7 no.1
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    • pp.34-46
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    • 2004
  • Copper films were prepared by using ECR-MOCVD(Electron Cyclotron Resonance Metal Organic Chemical Vapor Deposition) coupled with a DC bias system. The DC bias is connected to the electrode which placed 1∼3cm above the polymer substrate. The pulse electrical field around the electrode attracts the positive charged copper ions generated from the dissociation of copper precursor, $Cu(hfac)_2$, under ECR plasma. Condensation of supersaturated copper ions in the space between the electrode and substrate, makes it possible to deposit copper film on the polymer substrate even at room temperature. In this study, optimization of the electrode configuration was carried out in order to obtain the uniform films. The uniformity of the deposited films were closely related to the parameters of electrode geometry such as electrode shape, thickness, grid size and the spacing between electrodes. The most uniform copper film was observed with the electrode that enabled uniform electrical field distribution across the whole dimension of electrode.

Recent progress in the theoretical understanding of relativistic electron scattering and precipitation by electromagnetic ion cyclotron waves in the Earth's inner magnetosphere

  • Lee, Dae-Young
    • Journal of Astronomy and Space Sciences
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    • v.36 no.2
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    • pp.45-60
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    • 2019
  • The Earth's outer radiation belt has long received considerable attention mainly because the MeV electron flux in the belt varies often dramatically and at various time scales. It is now widely accepted that the wave-particle interaction is one of the major mechanisms responsible for such flux variations. The wave-particle interaction can accelerate electrons to MeV energies, explaining the observed flux increase events, and can also scatter the electrons' motion into the loss cone, resulting in atmospheric precipitation and thus contributing to flux dropouts. In this paper, we provide a review of the current state of research on relativistic electron scattering and precipitation due to the interaction with electromagnetic ion cyclotron (EMIC) waves in the inner magnetosphere. The review is intended to cover progress made over the last ~15 years in the theory and simulations of various issues, including quasilinear resonance diffusion, nonlinear interactions, nonresonant interactions, effects of finite normal angle on pitch angle scattering, effects due to rising tone emission, and ways to scatter near-equatorial pitch angle electrons. The review concludes with suggestions of a few promising topics for future research.

A Study on the Optimal Magnet for ECR (ECR 용 최적 마그네트에 관한 연구)

  • Kim, Y.T.;Kim, Y.J.;Kim, K.S.;Lee, Y.J.;Son, M.H.
    • Proceedings of the KIEE Conference
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    • 1992.07b
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    • pp.649-652
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    • 1992
  • ECR(Electron Cyclotron Resonance) occure at ${\omega}_c$=${\omega}$, ${\omega}_c$:electron cycltron frequency, ${\omega}$:electromagnetic wave frequency. ECR system have several merit, 1) power transefer efficiency 2) low neutral gas pressure (below 1 mTorr) 3) high plasma density($10^{12}$ $cm^{-3}$). It is applicated variously in the field of semiconductor and new materials as the manufacturing equipment. Magnetic field in ECR system contruct resonance layer (${\omega}$=2.45GHz, $B_z$=875 Gauss) and control plasma. Plasma is almost generated at resonance layer. If the distance between substrate and resonance layer is short, uniformity of plasma is related with profile of resonance layer. Plasma have the property "Cold in Field", so directonality of magnetic field is one of the control factors of anisotropic etching. In this study, we calculate B field and flux line distribution, optimize geometry and submagnet current and improve of magnetic field directionality (99.9%) near substrate. For the purpose of calculation, vector potential A(r,z) and magnetic field B(r,z), green function and numerical integration is used. Object function for submagnet optimization is magnetic field directionality on the substrate and Powell method is used as optimization skim.

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Hydration Effect on the Intrinsic Magnetism of Natural Deoxyribonucleic Acid as Studied by EMR Spectroscopy and SQUID Measurements

  • Kwon, Young-Wan;Lee, Chang-Hoon;Do, Eui-Doo;Choi, Dong-Hoon;Jin, Jung-Il;Kang, Jun-Sung;Koh, Eui-Kwan
    • Bulletin of the Korean Chemical Society
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    • v.29 no.6
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    • pp.1233-1242
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    • 2008
  • The hydration effect on the intrinsic magnetism of natural salmon double-strand DNA was explored using electron magnetic resonance (EMR) spectroscopy and superconducting quantum interference device (SQUID) magnetic measurements. We learned from this study that the magnetic properties of DNA are roughly classified into two distinct groups depending on their water content: One group is of higher water content in the range of 2.6-24 water molecules per nucleotide (wpn), where all the EMR parameters and SQUID susceptibilities are dominated by spin species experiencing quasi one-dimensional diffusive motion and are independent of the water content. The other group is of lower water content in the range of 1.4-0.5 wpn. In this group, the magnetic properties are most probably dominated by cyclotron motion of spin species along the helical π -way, which is possible when the momentum scattering time (${\tau}_k$) is long enough not only to satisfy the cyclotron resonance condition (${\omega}_c{\tau}_k$ > 1) but also to induce a constructive interference between the neighboring double helices. The same effect is reflected in the S-shaped magnetization-magnetic field strength (M-H) curves superimposed with the linear background obtained by SQUID measurements, which leads to larger susceptibilities at 1000 G when compared with the values at 10,000 G. In particular, we propose that the spin-orbital coupling and Faraday's mutual inductive effect can be utilized to interpret the dimensional crossover of spin motions from quasi 1D in the hydrate state to 3D in the dry state of dsDNA.

Electrical Properties of Al2O3 Films Grown by the Electron Cyclotron Resonance Plasma-Enhanced Atomic Layer Deposition (ECR-PEALD) and Thermal ALD Methods (전자 사이클로트론 공명 플라즈마와 열 원자층 증착법으로 제조된 Al2O3 박막의 물리적·전기적 특성 비교)

  • Yang, Dae-Gyu;Kim, Yang-Soo;Kim, Jong-Heon;Kim, Hyoung-Do;Kim, Hyun-Suk
    • Korean Journal of Materials Research
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    • v.27 no.6
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    • pp.295-300
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    • 2017
  • Aluminum-oxide($Al_2O_3$) thin films were deposited by electron cyclotron resonance plasma-enhanced atomic layer deposition at room temperature using trimethylaluminum(TMA) as the Al source and $O_2$ plasma as the oxidant. In order to compare our results with those obtained using the conventional thermal ALD method, $Al_2O_3$ films were also deposited with TMA and $H_2O$ as reactants at $280^{\circ}C$. The chemical composition and microstructure of the as-deposited $Al_2O_3$ films were characterized by X-ray diffraction(XRD), X-ray photo-electric spectroscopy(XPS), atomic force microscopy(AFM) and transmission electron microscopy(TEM). Optical properties of the $Al_2O_3$ films were characterized using UV-vis and ellipsometry measurements. Electrical properties were characterized by capacitance-frequency and current-voltage measurements. Using the ECR method, a growth rate of 0.18 nm/cycle was achieved, which is much higher than the growth rate of 0.14 nm/cycle obtained using thermal ALD. Excellent dielectric and insulating properties were demonstrated for both $Al_2O_3$ films.

Study on the Fabrication and Characterization of Compact ECR Plasma System (Compact ECR plasma장치의 제작 및 특성 연구)

  • 윤민기;박원일;남기석;이기방
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.4
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    • pp.84-91
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    • 1994
  • A compact electron cyclotron resonance(ECR) plasma system composed of a microwave generator and a magnet coil was fabricated. A Langmuir single probe was used to investigate the plasma characteristics of the system through I-V measurements. The performance of the compact ECR plasma system was tested for the case of silicon etching reaction with $CF_{4}/O_{2}$(30%) mixed gas. Electron density and etch rate increased to maximum values and then decreased with increasing argon gas pressure, but electron temperature changed in the opposite way. The electron density and the electron temperature of argon gas plasma were 0.85${\times}~5.5{\times}10^{10}cm^{-3}$ and 4.5~6.0 eV, respectively, in the pressure range from $3{\times}10^{4}$ to 0.05Torr. The etch rate reached a maximum value at the position of 2.5cm from the bottom of plasma cavity. Etch rate uniformity was $\pm$6% across 6cm wafer. Anisotropic index was 0.75 at 1.5${\times}10^{-4}$Torr.

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Properties of Exchange Bias Coupling Field and Coercivity Using the Micron-size Holes Formation Inside GMR-SV Film (GMR-SV 박막내 미크론 크기의 홀 형성을 이용한 교환결합세기와 보자력 특성연구)

  • Bolormaa, Munkhbat;Khajidmaa, Purevdorj;Hwang, Do-Guwn;Lee, Sang-Suk;Lee, Won-Hyung;Rhee, Jang-Roh
    • Journal of the Korean Magnetics Society
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    • v.25 no.4
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    • pp.117-122
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    • 2015
  • The holes with a diameter of $35{\mu}m$ inside the GMR-SV (giant magnetoresistance-spin valve) film were patterned by using the photolithography process and ECR (electron cyclotron resonance) Ar-ion milling. From the magnetoresistance curves of the GMR-SV film with holes measuring by 4-electrode method, the MR (magnetoresistance ratio) and MS (magnetic sensitivity) are almost same as the values of initial states. On other side hand, the $H_{ex}$ (exchange bias coupling field) and $H_c$ (coercivity) dominantly increased from 120 Oe and 10 Oe to 190 Oe and 41 Oe as increment of the number of holes inside GMR-SV film respectively. These results were shown to be attributed to major effect of EMD (easy magnetic domian) having a region positioned between two holes perpendicular to the sensing current. On the basis of this study, the fabrication of GMR-SV applying to the hole formation improved the magnetoresistance properties having the thermal stability and durability of bio-device.

A Study on SiC Buffer Layer Prepared by Ultra High Vacuum Electron Cyclotron Resonance CVD (초고진공 전자공명 플라즈마를 이용한 SiC buffer layer 형성에 관한 연구)

  • Joen, Woo-Gon;Pyo, Jae-Hwak;Whang, Ki-Woong
    • Proceedings of the KIEE Conference
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    • 1995.11a
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    • pp.326-328
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    • 1995
  • SiC buffer layers were grown on Si(100) substrates by ultra-high-vacuum electron cryclotron resonance plasma (UHV ECR plasma) from $CH_4/H_2$ mixture at 700$^{\circ}C$. The electron densities and temperature were measured by single probe. The axial plasma potentials measured by emissive probe had the double layer structure at positive substrate bias. Piranha cleaning was carried out as ex-situ wet cleaning. Clean and smooth silicon surface were prepared by in-situ hydrogen plasma cleaning at 540$^{\circ}C$. A short exposure to hydrogen plasma transforms the Si surface from 1$\times$1 to 2$\times$1 reconstruction. It was monitored by reflection high energy electron diffraction (RHEED). The defect densities were analysed by the dilute Schimmel etching. The results showed that the substrate bias is important factor in hydrogen plasma cleaning. The low base pressure ($5\times10^{-10}$ torr) restrains the $SiO_2$ growth on silicon surface. The grown layers showed different characteristics at various substrate bias. RHEED and K-ray Photoelectron spectroscopy study showed that grown layer was SiC.

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