• Title/Summary/Keyword: Electro-annealing

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Microstructure and Electrical Resistivity of Ink-Jet Printed Nanoparticle Silver Films under Isothermal Annealing (잉크젯 프린팅된 은(Ag) 박막의 등온 열처리에 따른 미세조직과 전기 비저항 특성 평가)

  • Choi, Soo-Hong;Jung, Jung-Kyu;Kim, In-Young;Jung, Hyun-Chul;Joung, Jae-Woo;Joo, Young-Chang
    • Korean Journal of Materials Research
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    • v.17 no.9
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    • pp.453-457
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    • 2007
  • Interest in use of ink-jet printing for pattern-on-demand fabrication of metal interconnects without complicated and wasteful etching process has been on rapid increase. However, ink-jet printing is a wet process and needs an additional thermal treatment such as an annealing process. Since a metal ink is a suspension containing metal nanoparticles and organic capping molecules to prevent aggregation of them, the microstructure of an ink-jet printed metal interconnect 'as dried' can be characterized as a stack of loosely packed nanoparticles. Therefore, during being treated thermally, an inkjet-printed interconnect is likely to evolve a characteristic microstructure, different from that of the conventionally vacuum-deposited metal films. Microstructure characteristics can significantly affect the corresponding electrical and mechanical properties. The characteristics of change in microstructure and electrical resistivity of inkjet-printed silver (Ag) films when annealed isothermally at a temperature between 170 and $240^{\circ}C$ were analyzed. The change in electrical resistivity was described using the first-order exponential decay kinetics. The corresponding activation energy of 0.44 eV was explained in terms of a thermally-activated mechanism, i.e., migration of point defects such as vacancy-oxygen pairs, rather than microstructure evolution such as grain growth or change in porosity.

A Study of Annealing Heat-treatment for Ti(Grade 2) by Electrochemical Methods (전기화학적 방법을 이용한 Ti(Grade 2)재의 최적 어닐링 열처리에 대한 연구)

  • 백신영
    • Journal of Advanced Marine Engineering and Technology
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    • v.26 no.1
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    • pp.90-98
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    • 2002
  • In this paper, the annealing heat treatments for the best corrosion resistant of Ti(Grade 2) were studied in a 3.5% NaCl solution by electrochemical methods. The annealing heat treatments were accomplished at 650, 700 and $750^{\circ}C$ with different time of 30min., 1hour and 2 hours in a vacuum condition. The obtained results are: 1) in the case of solution heat treated $930^{\circ}C$ for 2 hours in a vacuum and air, the corrosion potentials were -348.7 and -567. 1mV, and current densities 2.32 and $22.62\mu\textrm{A}$, respectively, 2) as increase both annealing heat treatment temperature 650, 700, $750^{\circ}C$ and time 30min., 1 hour, 2 hours, the corrosion potential were decreased, whereas corrosion current density increased, 3) in the case of cyclic polarization, the measured charges were increased as increasing solution heat treatment temperature and time, 4) on the bases of corrosion potential, current density and charge, the best annealing temperature and time were measured as $700^{\circ}C$ and 30min. for Ti(Grade 2) material.

Annealing Effects of Laser Ablated PZT Films

  • Rhie, Dong-Hee;Jung, Jin-Hwee;Cho, Bong-Hee;Ryutaro Maeda
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.528-531
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    • 2000
  • Deposition of PZT with UV laser ablatio was applied for realization of thin film sensors and actuators. Deposition rate of more than 20nm/min was attained by pulsed KrF excimer laser deposition, which is fairly better than those obtained by the other methods. Perovskite phase was obtained at room temperature deposition with Fast Atom Beam(FAB) treatment and annealing. Smart MEMS(Micro electro-mechanical system) is now a suject of interest in the field of micro optical devices, micro pumps, AFM cantilever devices etc. It can be fabricated by deposition of PZT thin films and micromachining. PZT films of more than 1 micron thickness is difficult to obtain by conventional methods. This is the reason why we applied excimer laser ablation for thin film deposition. The remanent polarization Pr of 700nm PZT thin film was measured, and the relative dielectric constant was determined to about 900 and the dielectric loss tangent was also measured to be about 0.04. XRD analysis shows that, after annealing at 650 degrees C in 1 hour, the perovskite structure would be formed with some amount of pyrochlore phase, as is the case of the annealing at 750 degrees C in 1 hour.

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Cruciform Thiophene-based Molecules as Organic Semiconductors for Field Effect Transistor Applications

  • Choi, Dong-Hoon;Kim, Dae-Chul;Kim, Kyung-Hwan;Cho, Min-Ju;Jin, Jung-Il
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.170-173
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    • 2007
  • Cruciform conjugated molecule, 4(DP3T)-benzene bearing terthiophene moieties has been synthesized through Horner-Emmons Reaction using 5-dodecyl-5"-aldehyde-[2,2';5',2"] terthiophene as dendrons and octaethyl benzene- 1,2,4,5-tetrayltetrakis(methylene)tetraphosphonate as the core unit; this molecule has been fully characterized. The terthiophene-based molecule exhibits good solubility in common organic solvents and good self-film forming property. They are intrinsically crystalline as they exhibit well-defined X-ray diffraction patterns from uniform orientations of molecules. Thus, intermolecular interaction can be enhanced to affect the carrier transport phenomena after annealing at $148^{\circ}C$. The semiconducting property of 4(DP3T)-benzene have been evaluated in organic field-effect transistors. 4(DP3T)-benzene exhibit carrier mobility as high as $(6.6{\pm}0.5)$ ${\times}$ $10^{-6}cm^2V^{-1}s^{-1}$.

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Fabrication and characterization of X-cut LiNbO$_3$optical modulator using self-aligned method (자기정열 방식을 이용한 X-cut LiNbO$_3$ 광 변조기 제작과 특성)

  • 강기성;채기병;소대화
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1992.05a
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    • pp.54-57
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    • 1992
  • An electro-optical single modulator is fabricated in X-cut LiNbO$_3$by the annealed proton exchange and self-aligned method. First, the effect of annealing is characterized by examining single optical modulator. It is found that by controlling the annealing time, the single optical modulator can be made widely variable. The on-off state of modulator is performed by annealing process and self-aligned electrodes are used in fabricating the single modulator. The optical single modulator has very good figures of merits : the measured on-off switching voltage of about 2.7V.

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Magnetic Properties of NiZnCu Ferrite for Multilayer Chip Inductors (칩인덕터용 NiZnCu Ferrite의 자기적 특성 연구)

  • An, Sung-Yong;Moon, Byeong-Chol;Jung, Hyun-Chul;Jung, Hyun-Jin;Kim, Ic-Seob;Hahn, Jin-Woo;Wi, Sung-Kwon
    • Journal of the Korean Magnetics Society
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    • v.18 no.2
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    • pp.58-62
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    • 2008
  • $Ni_{0.4}Zn_{0.4}Cu_{0.2}Fe_2O_4$ ferrite was fabricated by solid stat reaction method and sol-gel method. Because of the drawbacks of each method, we combined these two methods together. We proposed and experimentally verified that nanocrystalline ferrite additive was effective on improving the densification behavior and magnetic properties of NiZnCu ferrites for multilayer chip inductors. The initial permeability of the toroidal core Sample with 20 wt% nanocrystalline ferrite increased from 78.1 to 178.2 as annealing temperature is increased from $880^{\circ}C$ to $920^{\circ}C$. The density, shrinkage and saturation magnetization were increased with increasing annealing temperature, which was attributed to the decrease of additive grain size and increase of sintering density.

A Study on Properties of $MgF_2$ antireflection film for solar cell (태양전지용 $MgF_2$ 반사방지막 특성연구)

  • Park, Gye-Choon;Yang, Hyeon-Hun;Baek, Su-Ung;Na, Kil-Ju;So, Soon-Youl;Lee, Jin;Chung, Hae-Deok
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.11a
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    • pp.378-380
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    • 2009
  • $MgF_2$ is a current material for the optical applications in the UV and deep UV range. Process variables for manufacturing the $MgF_2$ thin film were established in order to clarify optimum conditions for growth of the thin film depending upon process conditions, and then by changing a number of vapor deposition conditions and substrate temperature, Annealing conditions variously, structural and Optical characteristics were measured. Thereby, optimum process variables were derived. Nevertheless, modern applications still require improvement of the optical and structural quality of the deposited layers. In the present work, the composition and microstructure of $MgF_2$ single layers grown on slide glass substrate by Electro beam Evaporator(KV-660) processes, were analyzed and compared. The surface Substrate temperature having an effect on the quality of the thin film was changed from $200[^{\circ}C]$ to $350[^{\circ}C]$ at intervals of $50[^{\circ}C]$. and annealing temperature an effect on the thin film was changed from $200[^{\circ}C]$ to $400[^{\circ}C]$ at intervals of $50[^{\circ}C]$. Physical properties of the thin film were investigated at various fabrication conditions substrate temperature, annealing and temperature, annealing time by XRD, FE-SEM.

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Preparation of ${K_3}{Li_2}{Nb_5}{O_{15}}$(KLN) Thin Films by Heat Treatment Methods (열처리방법에 따른 ${K_3}{Li_2}{Nb_5}{O_{15}}$(KLN)박막의 제작)

  • 김광태;박명식;이동욱;조상희
    • Journal of the Korean Ceramic Society
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    • v.37 no.8
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    • pp.731-738
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    • 2000
  • KLN(K3Li2Nb5O15) has attracted a great deal of attention for their potential usefulness in piezoelectric, electro-optic, nonlinear optic, and pyroelectirc devices. Especially, the KLN single crystal has been studied in the field of optics and electronics. However it is hard to produce good quality single crystals due to the crack propagation during crystal growing. One of the solutions of this problem is prepartion of thin film. But the intensive study has not been conducted so far. In this study, after the KLN thin film were prepared by R.F. magnetron Sputtering method on SiO2/Si substrate, the post-annealing methods of RTA(rapid thermal annealin) and IPA(insitu post annealing) were employed. The deposition condition of KLN thin film was RF power(100 W), Working pressure(100 mtorr). The commonness of both RAT and IPA was that the higher were deposition and post annealing temperature, the higher was the intensity of XRD but the less surface roughness. The difference of post-annealing methods affected XRD phase and surface condition very much. And in IPA process, the influence of O2 had much effect on the formation of KLN phase.

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Cu Diffusion Behavior of Ni-B Diffusion Barrier Fabricated by Electroless Deposition (무전해 도금법으로 제조된 Ni-B 확산 방지막의 Cu 확산 거동)

  • Choi, Jae-Woong;Hwang, Gil-Ho;Han, Won-Kyu;Lee, Wan-Hee;Kang, Sung-Goon
    • Korean Journal of Materials Research
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    • v.15 no.9
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    • pp.577-584
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    • 2005
  • Thin Ni-B layer, $1{\mu}m$ thick, was electrolessly deposited on Cu electrode fabricated by electro-deposition. The purpose of the layer is to encapsulate Cu electrodes for preventing Cu oxidation and to serve as a diffusion barrier. The layers were annealed at $580^{\circ}C$ with and without pre-annealing at $300^{\circ}C$ for . 30minutes. In the layer with pre-annealing, the amount of Cu diffusion was lower about 5 times than the layer without pre-annealing. The difference in Cu concentration may be attributed to $Ni_3B$ formation prior to Cu diffusion. However, the difference in Cu concentration decreased during the annealing time of 5 h due to the grain growth of Ni.

A study on characterization of directional coupler using LiNbO$_3$ (LiNbO$_3$ 기판을 이용한 방향성결합형 광 변조기 특성 연구)

  • 강기성;김창원;소대화
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1995.05a
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    • pp.81-85
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    • 1995
  • A guide-wave electro-optical modulatored direct-ional coupler 1X2 was fabricated on LiNbO$_3$ by proton exchange with self-aligned method After proton exchange process, the waveguide is formed by annealing process, The relationship between refractive index change of waveguide and maximun output was studied a long the annealing time. A self-alinged method was used to simplify the fabrication process of the waveguide and the maximize the efficiency of electric field. The modulatored directional coupler 1${\times}$2 has very good figures of merits; The measured crosstalk was -29.5[dB] and the modulating voltage of 8.0[V].

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