• Title/Summary/Keyword: Electrical properties and measurements

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Optical and electrical properties of $C_{22}$-quinolinium(TCNQ) langmuir-glodgett films depending on the annealing temperatures ($C_{22}$-quinolinium(TCNQ) langmuir-blodgett 박막의 열처리 온도에 따른 광학적 및 유전특성)

  • 홍언식;유덕선;김태완
    • Electrical & Electronic Materials
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    • v.8 no.4
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    • pp.458-463
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    • 1995
  • The optical and electrical properties of $C_{22}$-Quinolinium(TCNQ) Langmuir-Blodgett films have been studied depending on the annealing temperatures. The optimal properties were investigated using UV/visible(300-800[nm]) absorption spectra and FTIR(Fourier-transformed- infrared) absorption measurements. The electrical properties were investigated in a frequency range of 10[Hz]-13[MHz]. The UV/visible absorption spectra at room temperature show that there are four characteristic peaks at 320, 380, 494 and 678[nm]. These absorption peaks decrease very rapidly above the annealing temperature of 180[.deg. C], which is due to a structural change of TCNQ. The FTIR absorption measurements strongly support the result of the UV/visible absorption spectra, because the absorption peak of TCNQ- at 2181[$cm^{-1}$ /] also decreases above 140[.deg. C]. The frequency-dependent dielectric constant shows that there is a dielectric dispersion near 1[MHz] which is due to an orientational polarization of the molecules inside the film. The overall frequency-dependent dielectric constant is higher near 80[.deg. C]. It may be due to a softness of the alkyl chains.s.

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Growth and properties of LCMO/YBCO heterostructure

  • Kumar, Manish;Lee, Hyun Hwi
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.151.1-151.1
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    • 2016
  • Complex oxide heterointerfaces have been extensively explored in the past due to the novel phenomenon emerging at such interfaces that differ from their individual bulk counterparts. The integration of a ferromagnetic (FM) material with the superconducting (SC) material leading to proximity effect is one of the commonly studied phenomenon in these heterostructures. In continuation, we have stabilized the FM layer La0.7Ca0.3MnO3 (LCMO) on SC material YBa2Cu3O7-${\delta}$ (YBCO) using pulsed laser deposition technique and explored the structural, magnetic, electrical and magneto-transport properties of this heterostructure. ${\Phi}$-scan measurements confirm the epitaxial nature of LCMO/YBCO heterostructure grown on single crystalline SrTiO3 substrate. The FM transition of LCMO and SC transition of YBCO are observed in the magnetization measurements of the bilayer structure. Through electrical measurements, we understood that the proximity effect leads to lowering of the SC transition of YBCO. The role of interface in the bilayer structure is also realized through electrical transport measurements.

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Effects of Vacuum Annealing on the Electrical Properties of Sputtered Vanadium Oxide Thin Films (스퍼터된 바나듐 산화막의 전기적 특성에 미치는 진공 어닐링의 효과)

  • Hwang, In-Soo;Lee, Seung-Chul;Choi, Bok-Gil;Choi, Chang-Kyu;Kim, Nam-Chul
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.435-438
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    • 2003
  • The effects of oxygen partial pressure and vacuum annealing on the electrical properties of sputtered vanadium oxide($VO_x$) thin films were investigated. The thin films were prepared by r.f. magnetron sputtering from $V_2O_5$ target in a gas mixture of argon and oxygen. The oxygen/(oxygen+argon) partial pressure ratio of 0% and 8% is adopted. Electrical properties of films sputter-deposited under different oxygen gas pressures and in situ annealed in vacuum at $400^{\circ}C$ for 1h and 4h are characterized through electrical conductivity measurements. I-V characteristics were distinguished between linear and nonlinear region. In the low field region the conduction is due to Schottky emission, while at high fields it changes to Fowler-Nordheim tunneling type conduction. The conductivity measurements have shown an Arrhenius dependence of the conductivity on the temperature.

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A study on the electrical and magnetic properties of Viologen-TCNQ(2:2) LB films (Viologen-TCNQ(2:2) LB막의 전기 및 자기적 특성에 관한 연구)

  • 이용수;신동명;김태완;강도열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1996.11a
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    • pp.195-198
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    • 1996
  • In conducting systems based on LB films, TCNQ derivatives have been extensively studied as electron acceptor molecules. We have investigated the optical, electrical, and magnetic properties of Viologen-(TCNQ ̄)$_2$LB films. In UV/visible absorption measurements, we have observed TCNQ ̄ peak at 380 nm and dimer peak at 620 nm. The electron spin resonance measurements infer that Viologen-(TCNQ ̄)$_2$LB film exhibits anisotropic properly. In other words, the LB film shows angular dependence. Iodine doping affects the degree of charge transfer and the conductivity of the films. The UV/visible absorption spectra of the LB film doped with I$_2$show peaks at near 400~430 nm and there is no dimer absorption peak. The in-plane electrical conductivity of the undoped film is approximately 4.2$\times$10$^{-6}$ S/cm.

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Interfacial Properties and Residual Stress of Carbon Fiber/Epoxy-AT PEI Composite with Matrix Fracture Toughness using Microdroplet Test and Electrical Resistance Measurements (Microdroplet 시험법과 전기저항 측정을 이용한 탄소섬유 강화 Epoxy-AT PEI 복합재료의 수지파괴인성에 따른 잔류응력 및 계면물성)

  • Kim, Dae-Sik;Kong, Jin-Woo;Park, Joung-Man;Kim, Minyoung;Kim, Wonho;Ahn, Byung-Hyun;Park, In-Seo
    • Proceedings of the Korean Society For Composite Materials Conference
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    • 2002.05a
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    • pp.109-113
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    • 2002
  • Interfacial and electrical properties for the carbon fiber reinforced epoxy-amine terminated (AT) PEI composites were performed using microdroplet test and electrical resistance measurements. As AT PEI content increased, the fracture toughness of epoxy-AT PEI matrix increased, and IFSS was improved due to the improved toughness and energy absorption mechanisms of AT PEI. The microdroplet in the carbon fiber/neat epoxy composite showed brittle microfailure mode. At 15 wt% AT PEI content, ductile microfailure mode appeared because of improved fracture toughness. After curing, the changes of electrical resistance (ΔR) with increasing AT PEI content increased gradually because of thermal shrinkage. The matrix fracture toughness was correlated to IFSS, TEC and electrical resistance. In cyclic strain test, the maximum stress and their slope of the neat epoxy case were higher than those of 15 wt% AT PEI. The results obtained from electrical resistance measurements under curing process and reversible stress and strain were consistent well with matrix toughness properties.

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Effect of Film Thickness on Structural, Electrical, and Optical Properties of Sol-Gel Deposited Layer-by-layer ZnO Nanoparticles

  • Shariffudin, S.S.;Salina, M.;Herman, S.H.;Rusop, M.
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.2
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    • pp.102-105
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    • 2012
  • The structural, electrical, and optical properties of layer-by-layer ZnO nanoparticles deposited using sol-gel spin coating technique were studied and now presented. Thicknesses of the thin films were varied by increasing the number of deposited layers. As part of our characterization process, XRD and FE-SEM were used to characterize the structural properties, current-voltage measurements for the electrical properties, and UV-Vis spectra and photoluminescence spectra for the optical properties of the ZnO thin films. ZnO thin films with thicknesses ranging from 14.2 nm to 62.7 nm were used in this work. Film with thickness of 42.7 nm gave the lowest resistivity among all, $1.39{\times}10^{-2}{\Omega}{\cdot}cm$. Photoluminescence spectra showed two peaks which were in the UV emission centered at 380 nm, and visible emission centered at 590 nm. Optical transmittance spectra of the samples indicated that all films were transparent (>88%) in the visible-NIR range. The optical band gap energy was estimated to be 3.21~3.26 eV, with band gap increased with the thin film thickness.

Material Properties Characterization Based on Measurements of Reflection Coefficient and Bandwidth

  • Nguyen, Phuong Minh;Chung, Jae-Young
    • Journal of electromagnetic engineering and science
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    • v.14 no.4
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    • pp.382-386
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    • 2014
  • The knowledge of substrate material properties is important in antenna design. We present a technique to accurately characterize the dielectric constant and loss tangent of an antenna substrate based on the measurements of antenna's reflection coefficient and bandwidth. In this technique, an error function is formulated by combinations of the reflection coefficient and bandwidth of measured and simulated data, and then an optimization technique is used to efficiently search for the substrate properties that minimize the error function. The results show that the method is effective in retrieving the dielectric constant and loss tangent of the antenna substrate without the need of additional test fixtures as in conventional substrate characterization methods.

Prediction of Mechanical and Electrical Properties of NiO-YSZ Anode Support for SOFC from Quantitative Analysis of Its Microstructure (미세조직 정량 분석을 통한 고체산화물연료전지용 NiO-YSZ 연료극 지지체의 기계적/전기적 성능 예측)

  • WAHYUDI, WANDI;KHAN, MUHAMMAD SHIRJEEL;SONG, RAK-HYUN;LEE, JONG-WON;LIM, TAK-HYOUNG;PARK, SEOK-JOO;LEE, SEUNG-BOK
    • Transactions of the Korean hydrogen and new energy society
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    • v.28 no.5
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    • pp.521-530
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    • 2017
  • Improving the microstructure of NiO/YSZ is one of several approaches used to enhance the electrical and mechanical properties of an anode support in Solid Oxide Fuel Cells (SOFCs). The aim of the work reported in this paper was to predict the relationship between these microstructural changes and the resulting properties. To this end, modification of the anode microstructure was carried out using different sizes of Poly (Methyl Methacrylate) (PMMA) beads as a pore former. The electrical conductivity and mechanical strength of these samples were measured using four-probe DC, and three-point bend-test methods, respectively. Thermal etching followed by high resolution SEM imaging was performed for sintered samples to distinguish between the three phases (NiO, YSZ, and pores). Recently developed image analysis techniques were modified and used to calculate the porosity and the contiguity of different phases of the anode support. Image analysis results were verified by comparison with the porosity values determined from mercury porosimetry measurements. Contiguity of the three phases was then compared with data from electrical and mechanical measurements. A linear relationship was obtained between the contiguity data determined from image analysis, and the electrical and mechanical properties found experimentally. Based upon these relationships we can predict the electrical and mechanical properties of SOFC support from the SEM images.

Electrical and optical studies of organic light emitting devices using Ag and $SiO_2$ / poly(p-phenylene vinylene)(PPV) nanocomposites

  • Lee, Cho-Young;Park, Hyung-Ho
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.367-367
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    • 2007
  • Polymer/nanoparticle hybrids have been increasingly studied because of their enhanced properties for organic light emitting devices (OLEDs). In this study, we made poly(p-phenylene vinylene) (PPV) nanohybrid films by incorporation of Ag and $SiO_2$ nanoparticles into the PPV. A possible interaction between nanoparticles was investigated and especially we focused whether there is a change in the interaction between $SiO_2$ or Ag nanoparticles and matrix or not. The current characteristics of PPV nanohybrid films were analyzed by I-V and EL measurements. The optical properties were also investigated by UV-Vis spectroscopy and photoluminescence measurements.

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Effects of Post-Annealing on Crystallization and Electrical Behaviors of ITO Thin Films Sputtered on PES Substrates (PES 필름상에 스퍼터링한 ITO 박막의 열처리에 따른 결정화 거동 및 전기적 특성 변화)

  • So, Byung-Soo;Kim, Young-Hwan
    • Journal of the Korean Ceramic Society
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    • v.43 no.3 s.286
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    • pp.185-192
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    • 2006
  • The effects of annealing on structural and electrical properties of ITO/PES (Indium Tin Oxide/Polyethersulfone) films was investigated. Amorphous ITO thin films were grown on plastic substrates, PES using low temperature DC magnetron sputtering. Various post annealing techniques were attempted to research variations of microstructure and electrical properties: i) conventional thermal annealing, ii) excimer laser annealing, iii) UV irradiation. The electrical properties were obtained using Hall effect measurements and DC 4-point resistance measurement. The microstructural features were characterized by FESEM, XRD, Raman spectroscopy in terms of morphology and crystallinity. Optimized UV treatment exhibits the enhanced conductivity and crystallinity, compared to those of conventional thermal annealing.