• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2005.07a
• /
• pp.26-28
• /
• 2005

In this paper, degradation in field-aged PV modules including degradation of interconnect, discoloration of encapsulant and hot spot have been observed and analyzed. From the results, photovoltaic module installed for 15 years shows around 13~20% drop of electrical properties due to the interconnect degradation and PV module passed 19 years has been found to drop of around 20% mainly by the encapsulant discoloration. Fill factor of the electrode oxidized photovoltaic module has been dropped by the amount of 6~10% due to the change of irradiance. It is because maximum voltage(Vmp) decreases according to the increase of irradiance.

• The Transactions of The Korean Institute of Electrical Engineers
• /
• v.65 no.9
• /
• pp.1518-1523
• /
• 2016

In this study, in order to understand the degradation characteristics of oil-paper insulation for power transformers and OF cables, tan delta was measured using cable model specimens with long-term accelerated thermal and electrical aging. In addition, to find out the degradation level due to the accelerated aging, tensile strengths of aged papers were measured. As a result, tan ${\delta}$ showed the characteristics of slight decrease at the first stage and then increase with the aging time, which could be analyzed due to the evaporation of remaining moisture and the change of aging rate with time. Also, the trend of tensile strengths with aging temperature and time was appeared to be exponentially decreased and by use of these data equivalent calculated lifetimes and accelerated aging factors were derived for each aging temperatures. After then, tan ${\delta}$ was analyzed with the equivalent operating years. For all different aging temperatures, the aged data were very well fit to the equivalent operating years and it is shown that tan ${\delta}$ was increased with the decrease of tensile strength.

• Current Photovoltaic Research
• /
• v.11 no.4
• /
• pp.108-113
• /
• 2023

Pressure to reduce costs in the current solar market is driving the development and implementation of new module designs and prompting the use of new materials and components. In order to utilize the variability of each material that makes up the module, it is essential to understand the basic characteristics of the material. In this article, we evaluate light degradation after UV irradiation as an encapsulation material. Measure and analyze the results of various characteristic tests for discoloration, optical and electrical property degradation before and after UV accelerated testing. To evaluate weathering stability, UV tests were performed comparing existing EVA and UVT-EVA, POE and improved low-cost POE. Even in the weather resistance test with a total UV exposure of 60 kW/m², the properties of the encapsulants were mostly stable. EVA and POE-based encapsulants showed slight differences, and these slight differences are believed to pose a threat to long-term stability. This study is a basic analysis of encapsulation research for PV modules and will be helpful in understanding future development and encapsulant properties.

• Journal of Electrical Engineering and Technology
• /
• v.12 no.2
• /
• pp.840-845
• /
• 2017

In this paper, in order to investigate the lifetime of oil-paper insulation, specimens were artificially aged with thermal and electrical multiple stresses. Accelerated ageing factors and equivalent operating years for each aging temperatures were derived from results of tensile strengths for the aged paper specimens. Also, the evaluation for the multi-stress aged specimens were carried out through the measurement of impulse breakdown voltage at high temperature of $85^{\circ}C$. The lifetimes of the oil-paper insulations were calculated with the value of 66.7 for 1.0 mm thickness specimens and 69.7 for 1.25 mm thickness specimens throughout the analysis of impulse BD voltages using equivalent operating years, which means that dielectric strengths would not be severely decreased until the mechanical lifetime limit. Therefore, for the lifetime evaluation of the oil-paper insulation, thermal aging would be considered as a dominant factor whereas electrical degradation would be less effective.

• Proceedings of the KIEE Conference
• /
• 1994.07b
• /
• pp.1442-1444
• /
• 1994

The short channel poly-Si TFT is important in aspect of transistor characteristics, packing density and aperture ratio. In this paper, we have reported the degradation phenomena of short channel poly-Si TFT's which had significantly degraded device parameters, such as threshold voltage shift and a great asymmetric degradation, due to gate and drain electrical stress. The reduced effective channel length and expanded depletion region may be the main reason of these significant device parameters.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.07a
• /
• pp.157-160
• /
• 2001

Three sets of ZnO ceramic devices (reference samples with Matsuoka\`s composition; added 7o MgO, A1$_2$O$_3$, SiO$_2$) have been prepared by the conventional mixed oxide route. These additives were determined by the factors of valences and ionic radiuses. DC accelerated degradation test was performed for analysis of degradation characteristics versus the various additives. The conditions of DC degradation test were 115${\pm}$2$^{\circ}C$ for 12h. Using XRD and SEM, the Phase and microstructure of samples were analyzed respectively. E-J analysis was used to determine ${\alpha}$. Frequency analysis was accomplished to understand the relationship between R$\sub$g/ and $R_{b}$ with the electric stress at the equivalent circuit.

• Proceedings of the IEEK Conference
• /
• 2008.06a
• /
• pp.863-864
• /
• 2008

To predict the iris matching performance and guarantee its reliability, image quality measure prior to matching is desired. An analysis on iris image degradation factors which deteriorate matching performance is a basic step for iris image quality measure. We considered five degradation factors-white-out, black-out, noise, blur, and occlusion by specular reflection-which happen generally during the iris image acquisition process. Experimental results show that noise and white-out degraded the EER most significantly, while others on EER were either insignificant or degradation images resulted in even better performance in some cases of blur. This means that degradation factors that affect the performance can be different from those based on human perception or image degradation evaluation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2000.10a
• /
• pp.25-28
• /
• 2000

In this paper, the technology for accelerating degradation & life estimation on the traction motor was introduced with the stator form-winding sample coils of the 200 Class insulation system The accelerative degradation was performed in 10 cycles, which were composed of thermal stress, fast rising surge voltage, vibration, water immersion and overvoltage applying. After aging of 10 cycles, condition diagnosis test such as insulation resistance & polarization index, capacitance & dielectric loss and partial discharge properties were investigated in the temperature range of $20{\sim}160^{\circ}C$. Relationship between degradation conditions and diagnosis results were analyzed to find an dominative degradation factor at the end-life point

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.21 no.9
• /
• pp.859-862
• /
• 2008

We have realized static image on organic light emitting diodes (OLEDs) using photoluminescence degradation. Ultraviolet (UV) was irradiated to the glass side of device. UV power was 350 Wand the wavelength was 365 nm. The UV irradiation gives rise to the degradation of photoluminescence. Due to the degradation, the current density-voltage curve was shifted to the higher voltage side and the luminescence was also degraded by the current and photoluminescence drop. The negative imaged films were prepared to control the transmittance of UV. The UV light was passed through the film. By this method, the film image was transferred to the device with reversed image and the static image was realized on the OLED.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
• /
• 2009.05a
• /
• pp.149-152
• /
• 2009

In this paper, We has been studied the lifetime degradation of LED lighting system compared to MH lighting. Especially the effect of temperature level on the lifetime degradation has been investigated. The results show that temperature plays a role in the lifetime degradation and slope of degradation line represent as temperature level differently. However, It is possible to estimate the lifetime of LED lighting system using equation induced the slope of degradation line.