• Proceedings of the KIEE Conference
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• 1995.07c
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• pp.1013-1015
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• 1995

The electrical properties of Al/TiN/Ti contact according to post anneal ins conditions are investigated at submicron contacts. $N^+$ contact resistance increases with increasing alloy temperature while $P^+$ contact resistance slightly decreases. The contact tentage current increases wi th increasing alloy temperature for both $N^+$ and $P^+$ contacts. The contact resistance and leakage current of $N^+$ contact increases with increasing alloy tide. $P^+$ contact resistance decreases with increasing alloy time but $P^+$ contact tentage current increases. The contact resistance and contact leakage current increases with increasing alloy cycles for both $N^+$ and $P^+$ contacts.

• Tribology and Lubricants
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• v.12 no.4
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• pp.52-59
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• 1996

The results of the electrical contact conductivity of multi-contact spots accounting the surface roughness and the non-conductive films of different origins such as air, water, cutting oil, and machining oil are presented. The array of metal spheres compressed between two flat plates has been used for simulation of the contact behavior of multiple contact of solids, under normal loading. Measurement of electrical contact resistance has been made using the equipment providing the adequate accuracy in the range of micro Ohms. The data on electrical contact resistance have been compared with theoretical predictions using the multiple contact model of constriction resistance. The effect of single spot number and array on conductivity of contact has been evaluated. The results of the experiments show that the contact resistance are closely related to the number of loading cycles, form of surface roughness, and presence of non-conductive films that reduce the size of the real electrical contact spots.

• Proceedings of the KIEE Conference
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• 1995.07c
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• pp.1069-1071
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• 1995

The electrical properties of Al/TiN/Ti contact are investigated at submicron contacts. The contact resistance and contact leakage current are dependent on metallization, surface dopant concentration, semiconductor surface treatment and contact plug ion implantation. In this paper, the contact resistance and contact leakage current are studied according to surface dopant concentration, semiconductor surface treatment and contact plug ion implantation at 0.8 micron contact. The contact resistance and contact leakage current increases with increasing substrate ion concentration. HF cleaning represents high contact resistance but low contact leakage current while CDE cleaning represents low contact resistance but high contact leakage current. Contact plug ion implantation decreases contact resistance but increases contact leakage current. Specially, RTA represents good electrical properties.

• International Journal of Korean Welding Society
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• v.2 no.1
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• pp.1-10
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• 2002

The thermal contact conductance at different temperatures and with different electrode forces and zinc coating morphology was measured by monitoring the infrared emissions from the one dimensionally simulated contact heat transfer experiments. The contact heat transfer coefficients were presented as a function of the harmonic mean temperature of the two contacting surfaces. Using these contact heat transfer coefficients and experimentally measured temperature profiles, the electrical contact resistivities both for the faying interface and electrode-workpiece interface were deduced from the numerical analyses of the one dimension simulation welding. It was found that the average value of the contact heat transfer coefficients for the material with zinc coating (coating weight from 0 g/$mm^2$to 100 g/$mm^2$) ranges from 0.05 W/$mm^2$$^{\circ}C$ to 2.0 W/$mm^2$$^{\circ}C$ in the temperature range above 5$0^{\circ}C$ harmonic mean temperature of the two contacting surfaces. The electrical contact resistivity deduced from the one dimension simulation welding and numerical analyses showed that the ratio of electrical contact resistivity at the laying interface to the electrical contact resistivity at the electrode interface is smaller than one far both bare steel and zinc coated steel.

• Proceedings of the KIEE Conference
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• 2011.07a
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• pp.2215-2216
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• 2011

In this study, the dynamic characteristic of a contact wire and pantograph suppling electrical power to electrical railway vehicle is investigated from an electrical response point of view. To analysis voltage and current waveforms by induced contact loss phenomenon on driving electrical railway vehicle, a hardware Simulator which considered contact loss between contact wire and the pantograph as well as contact wire deviation is developed. It is confirmed that a contact wire and pantograph model are necessary for studying the dynamic behavior of the pantograph system. Throughout prototype simulator and contact wire and catenary wire experiments, it is confirmed that current waveforms is distorted by contact loss phenomenon and in case of driving electrical railway vehicle.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.65 no.8
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• pp.1442-1449
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• 2016

This paper proposes a diagnosis to detecting poor contact fault and fault location. Electrical fire by poor contact fault of power cable occupied a large proportion in the total electrical installations. The proposed method has an object to prevent electrical fault in advance. But detecting poor contact fault is difficult to detect fault type and fault location by using conventional reflectometry due to faults generated intermittently and repeatedly on the time change. Therefore, in this paper poor contact fault and fault conditions were defined. System generating poor contact fault produced for the experimental setup. SSTDR and algorithm of reference signal elimination heighten performance detecting poor contact fault on live power cable. The diagnosis methods of signal process and analysis of reflected signal was proposed for detecting poor contact fault and fault location. The poor contact fault and location had been detected through proposed diagnosis methods. The fault location and error rate of detection were verified detecting accuracy by experiment results.

• Proceedings of the KSME Conference
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• 2004.11a
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• pp.404-409
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• 2004

The electrical contact resistance is here estimated using the multiscale microcontact distribution of elastic contact between rough surfaces, simulated from the Archard's model, and the electrical contact conduction theory suggested by Greenwood. These analysis confirms that the electrical contact resistance is converged to a values, larger than would be obtained if the contact spots were widely separated and hence independent. In multiscale process, the base potential is close to the value of the potential difference between the contact surface and the extremity of body, suggesting a possibility to obtain the multiscale electrical contact resistance relations.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.146-147
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• 2007

A universal four-point contact measurement method, has an advantage of non-existence of contact resistance, is demonstrated by the experiments with carbon nanotubes and ZnO nanowire. Ti/Au and Pt are tried to compare the influence of contact resistance between two different metals. These metals are selected to make Ohmic contact and Schottky contact originated from their different work functions. For precise experiments, Ti/Au and Pt are separately evaporated to form double 'four-point contact electrodes' on CNTs or ZnO, and the voltage-current characteristics are measured. This method can be applied to universal resistivity measurement for nanotubes and nanowires.

• Proceedings of the KIEE Conference
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• 1991.07a
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• pp.178-182
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• 1991

Contact resistance and contact leakage current of the $Al/TiSi_2/Si$ system are investigated for $N^+\;and\;P^+$ junctions. Titanium disilicide is one of the most common silicides because of its thermal stability, ability, to form selective formation and low resistivity. In this paper, the effect of RTA temperature and Junction implant dose are characterized. The $TiSi_2$ contact resistance to $N^+$ silicon is lower than that of Al to $N^+$ silicon, but $TiSi_2$ of contact resistance to $P^+$ silicon is higher than that of Al to $P^+$ silicon. The $TiSi_2$ of contact leakage current to $N^+\;and\;P^+$ silicon is similar to that of Al contact.

• Journal of Electrical Engineering and Technology
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• v.8 no.3
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• pp.595-602
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• 2013

An air circuit breaker (ACB) with novel double-breaker contact and permanent magnet actuator (PMA) is presented. Three-dimensional (3-D) finite element method (FEM) is employed to compute the electro-dynamic repulsion forces, including the Holm force and Lorentz force, which are acting on the static and movable contacts. The electro-dynamic repulsion forces of different contact pieces are computed, illustrating there is an optimal number of contact pieces for the ACB being studied. The electro-dynamic repulsion force of each contact, which varies from the outer position to the inner position, is also computed. Finally, the contacts of the double-breaker are manufactured according to the analyzed results to validate the simulations.