• Title/Summary/Keyword: Edge Orientation

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Chain code based New Decision Technique of Edge Orientation (체인코드를 이용한 새로운 에지 방향 결정 기법)

  • Sung, Min-Chul;Lee, Sang-Hwa;Cho, Nam-Ik
    • Journal of the Korea Institute of Military Science and Technology
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    • v.10 no.1
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    • pp.101-106
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    • 2007
  • In this paper, we propose chain code based decision technique of edge orientation. Edge Information is one of the most important information for handling image signals, and is applied to various civilian and military area, such as image surveillance for military reconnaissance, restoration of noised image signal, fingerprint recognition, and so on. The conventional methods to find edge orientations exploit a certain size of mask which weights for a certain direction, so they showed limitations in the case of diagonal edges except 45 degrees. We find edge orientations using chain code. According to the experiments, the proposed method shows better performance than the conventional approaches. The exact edge orientations including diagonal directions are well found.

Face Detection Using Edge Orientation Map and Local Color Information (에지 방향 지도와 영역 컬러 정보를 이용한 얼굴 추출 기법)

  • Kim, Jae-Hyup;Moon, Young-Shik
    • Proceedings of the IEEK Conference
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    • 2005.11a
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    • pp.987-990
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    • 2005
  • An important issue in the field of face recognitions and man-machine interfaces is an automatic detection of faces in visual scenes. it should be computationally fast enough to allow an online detection. In this paper we describe our ongoing work on face detection that models the face appearance by edge orientation and color distribution. We show that edge orientation is a powerful feature to describe objects like faces. We present a method for face region detection using edge orientation and a method for face feature detection using local color information. We demonstrate the capability of our detection method on an image database of 1877 images taken from more than 700 people. The variations in head size, lighting and background are considerable, and all images are taken using low-end cameras. Experimental results show that the proposed scheme achieves 94% detection rate with a resonable amount of computation time.

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Line feature extraction in a noisy image

  • Lee, Joon-Woong;Oh, Hak-Seo;Kweon, In-So
    • 제어로봇시스템학회:학술대회논문집
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    • 1996.10a
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    • pp.137-140
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    • 1996
  • Finding line segments in an intensity image has been one of the most fundamental issues in computer vision. In complex scenes, it is hard to detect the locations of point features. Line features are more robust in providing greater positional accuracy. In this paper we present a robust "line features extraction" algorithm which extracts line feature in a single pass without using any assumptions and constraints. Our algorithm consists of five steps: (1) edge scanning, (2) edge normalization, (3) line-blob extraction, (4) line-feature computation, and (5) line linking. By using edge scanning, the computational complexity due to too many edge pixels is drastically reduced. Edge normalization improves the local quantization error induced from the gradient space partitioning and minimizes perturbations on edge orientation. We also analyze the effects of edge processing, and the least squares-based method and the principal axis-based method on the computation of line orientation. We show its efficiency with some real images.al images.

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Edge Map-Based Fingerprint Reference-Point Detection (에지맵 기반 지문 기준점 검출)

  • Song, Young-Chul
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.7
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    • pp.1321-1323
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    • 2007
  • A new reference point location method based on an edge map is proposed, where an orientation map is defined and used to find the edge map. Experimental results show that the proposed method can effectively detect the core point in poor quality and arch-type fingerprint images and produces better results in terms of the detection rate and accuracy than the sine map-based method.

Properties of YBCO Step-edge Junction Fabricated on Different Crystal Orientation of Sapphire Substrate (사파이어 기판의 다른 결정방향 위에 제작된 YBCO step-edge 접합의 특성)

  • H. R. Lim;I-S Kim;Y. K. Park;J. C. Park
    • Progress in Superconductivity
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    • v.3 no.1
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    • pp.60-64
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    • 2001
  • We have studied properties of step-edge Junction prepared with crystal orientation of sapphire substrate. The Step on sapphire substrates fabricated by conventional photolithography method and Ar ion milling method. $CeO_2$ buffer layer and in-situ YBCO thin film were deposited on the stepped sapphire substrates by a pulsed laser deposition method with the predetermined optimized condition. The step angle was centre fled low angle of about $25^{\circ}$. The YBCO film thickness was varied to obtain various thickness ratios of the film to the step height in a range from 0.7 to 1.2. I-V curves of junction were showed RSJ-behavior, double junction structure, and hysteresis due to the crystal orientation of substrate.

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Text Region Detection using Adaptive Character-Edge Map From Natural Image (자연영상에서 적응적 문자-에지 맵을 이용한 텍스트 영역 검출)

  • Park, Jong-Cheon;Hwang, Dong-Guk;Jun, Byoung-Min
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.8 no.5
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    • pp.1135-1140
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    • 2007
  • This paper proposes an edge-based text region detection algorithm using the adaptive character-edge maps which are independent of the size of characters and the orientation of character string in natural images. First, labeled images are obtained from edge images and in order to search for characters, adaptive character-edge maps by way grammar are applied to labeled images. Next, selected label images are clustered as for distance of its neighbors. And then, text region candidates are obtained. Finally, text region candidates are verified by using the empirical rules and horizontal/vertical projection profiles based on the orientation of text region. As the results of experiments, a text region detection algorithm turned out to be robust in the matter of various character size, orientation, and the complexity of the background.

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Estimation of Real Boundary with Subpixel Accuracy in Digital Imagery (디지털 영상에서 부화소 정밀도의 실제 경계 추정)

  • Kim, Tae-Hyeon;Moon, Young-Shik;Han, Chang-Soo
    • Journal of the Korean Society for Precision Engineering
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    • v.16 no.8
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    • pp.16-22
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    • 1999
  • In this paper, an efficient algorithm for estimating real edge locations to subpixel values is described. Digital images are acquired by projection into image plane and sampling process. However, most of real edge locations are lost in this process, which causes low measurement accuracy. For accurate measurement, we propose an algorithm which estimates the real boundary between two adjacent pixels in digital imagery, with subpixel accuracy. We first define 1D edge operator based on the moment invariant. To extend it to 2D data, the edge orientation of each pixel is estimated by the LSE(Least Squares Error)line/circle fitting of a set of pixels around edge boundary. Then, using the pixels along the line perpendicular to the estimated edge orientation the real boundary is calculated with subpixel accuracy. Experimental results using real images show that the proposed method is robust in local noise, while maintaining low measurement error.

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Influence of stiffener edge on the buckling load of holed composite plates

  • Zakeri, Mahnaz;Mozaffari, Ali;Katirae, Mohamad A.
    • Steel and Composite Structures
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    • v.29 no.5
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    • pp.681-688
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    • 2018
  • In this paper, buckling load of edge stiffened composite plates is assessed. The effect of stiffener edge size, circular hole, and the fiber orientation angle on buckling behavior of composite plates under uni-axial compressive load is investigated. This paper includes two parts as experimental and numerical studies. L-shape composite plates are manufactured in three different layups. Then the buckling loads are experimentally determined. Subsequently, by using the numerical simulation, the size variation effects of stiffener edge and circular cutout on the plate buckling loads are analyzed in five different layups. The results show that cutout size, stiffener edge height and fiber orientation angle have important effects on buckling load. In addition, there is an optimum height for stiffener edge during different conditions.

A Study on Feature Extraction of Linear Image (선형적 영상의 특징 추출에 관한 연구)

  • 김춘영;한백룡;이대영
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.13 no.1
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    • pp.74-84
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    • 1988
  • This paper presents feature extraction technique for linear image using edge detection algorithms. The process of edge finding consists of determining edge magnitud and direction by convolution of an image with a number of edge masks, of thinning and ghresholding these edge magnitudes, of linking the edge elemtnts based on proximity ans orientation, and finally, of approximating the linked elements by piede-wise linear segmentss. These techniques are intened to be general and opplications to terminal detection and road recognition tasks are described. The presentation will be helpful to other researchers attempting to implement similar algorithms.

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A Wafer Alignment Method and Accuracy Evaluation (웨이퍼 정렬법과 정밀도 평가)

  • Park, Hong-Lae;Lyou, Joon
    • Journal of Institute of Control, Robotics and Systems
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    • v.8 no.9
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    • pp.812-817
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    • 2002
  • This paper presents a development of high accuracy aligner and describes a method to find the orientation of a substantially circular disk shaped wafer with at least one flat region on an edge thereof. In the developed system, the wafer is spun one 360 degree turn on a chuck and the edge position is measured by a linear array to obtain a set of data points at various wafer orientation. The rotation axis may differ from wafer center by an unknown eccentricity. The flat angle is found by fitting a cosine curve to the actual data to obtain a deviation. The maximum deviation is then corrected for errors due to a finite number of data points and wafer eccentricity by calculating an adjustment angle from data points on the wafer fiat. After determining the flat angle the wafer is spun to the desired orientation. The wafer eccentricity can be calculated from four of the data points located away from the flat edge region. and the wafer is then centered.