• 대한수학회논문집
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• 제19권2호
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• pp.293-305
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• 2004

Trotter-Kato type approximations of the convoluted solution operator families for the Volterra integral equations (V $E_n$): v(t)=$A_{n} \int_0^t v(t-s) d\mu_n(s) + f_n(t), t \geq 0$ and the convergence of the solutions to the equations (V $E_n$) are studied.

• 대한전자공학회논문지
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• 제22권4호
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• pp.51-58
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• 1985

Ion-implanted E-IGFET의 도핑 profile을 임의로 가정하여 threshold 전압을 구하였고. short-channoel에 적용할 때 correction factor K의 개념을 사용하였다. Threshold전압의 이론치는 실험치와 잘 일치하였고, 또한 I-V특성도 실험치와 잘 일치하였다. 아울러 이 program을 package화 하여 실용화시켰다.

• Bulletin of the Korean Chemical Society
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• 제18권9호
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• pp.916-922
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• 1997

A superconducting phase La2CuO4+δ (Tc=44 K) has been prepared by electrochemical oxidation which allows the oxygen to intercalat into the La2O2 layers. According to the Cu K-edge X-ray absorption near edge structure spectroscopic analysis, the oxidized phase shows an overall spectra shift of about 0.5 eV to a higher energy region compared to the as sintered one with the occurrence of an additional peak corresponding to the transition to the |1s13dn+1L-14pσ1 > final state, indicating the oxidation of CuO2 layer. From the X-ray photoelectron spectroscopic studies, it is found that the binding energy of La 3d5/2 is significantly shifted from 834.3 eV (as sintered La2CuO4) to 833.6 eV (as electrochemically oxidized La2CuO4+δ), implying that the covalency of the (La-O) bond is decreased due to the oxygen intercalation. The O 1s spectra do not provide an evidence of the superoxide or peroxide, but the oxide (O2-) with the contaminated carbonate (CO32-) based on the peaks at 529 eV and 532 eV, respectively, which is clearly confirmed by the Auger spectroscopic analysis. Oxygen contents determined by iodometric titration (δ=0.07) and thermogravimetry (δ=0.09) show good coincidence each other, also giving an evidence for the "O2-" nature of excess oxygen. From the above results, it is concluded that "O2-" appeared as O 1s peak at 528.6 eV is responsible for superconductivity of La2CuO4+δ.

• 한국결정성장학회지
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• 제13권3호
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• pp.105-110
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• 2003

The ZnSe epilayers were grown on the GaAs substrate by hot wall epitaxy. After the ZnSe epilayers treated in the vacuum-, Zn-, and Se-atmosphere, respectively, the defects of the epilayer were investigated by means of the low-temperature photoluminescence measurement. The dominant peaks at 2.7988 eV and 2.7937 eV obtained from the PL spectrum of the as-grown ZnSe epilayer were found to be consistent with the upper and the lower polariton peak of the exciton, $I_{2}$ ($D^{\circ}$, X), bounded to the neutral donor associated with the Se-vacancy. This donor-impurity binding energy was calculated to be 25.3 meV, The exciton peak, $I_{1}^{d}$ at 2.7812 eV was confirmed to be bound to the neutral acceptor corresponded with the Zn-vacancy. The $I_{1}^{d}$ peak was dominantly observed in the ZnSe/GaAs : Se epilayer treated in the Se-atmosphere. This Se-atmosphere treatment may convert the ZnSe/GaAs : Se epilayer into the p-type. The SA peak was found to be related to a complex donor like a $(V_{se}-V_{zn})-V_{zn}$.

• 한국전기전자재료학회논문지
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• 제13권5호
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• pp.365-370
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• 2000

Schottky contacts on n-In$\_$0.53//Ga$\_$0.47//As have been made by metal deposition on substrates cooled to a temperature of 77K. The current-voltage and capacitance-voltage characteristics showed that the Schottky diodes formed at low temperature had a much improved barrier height compared to those formed at room temperature. The Schottky barrier height ø$\_$B/ was found to be increased from 0.2eV to 0.6eV with Ag metal. The saturation current density of the low temperature diode was about 4 orders smaller than for the room temperature diode. A current transport mechanism dominated by thermionic emission over the barrier for the low temperature diode was found from current-voltage-temperature measurement. Deep level transient spectroscopy studies exhibited a bulk electron trap at E$\_$c/-0.23eV. The low temperature process appears to reduce metal induced surface damage and may form an MIS (metal-insulator-semiconductor)-like structure at the interface.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2003년도 춘계학술발표강연 및 논문개요집
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• pp.82-82
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• 2003

p-CdI $n_2$T $e_4$ 단결정을 Bridgeman법으로 3단 수직 전기로에서 성장하였다. 성장된 결정의 결정성은 X선 회절과 광발광 측정으로 조사하였다 막 성장된(as-grown) 결정과 여러 열처리 CdI $n_2$T $e_4$ 결정들의 광발광 스펙트럼 측정으로부터 CdI $n_2$T $e_4$:Cd 광발광에서는 중성 주개 bound 엑시톤 ( $D^{\circ}$,X)가 우세함을 발견하였고 반면에 CdI $n_2$T $e_4$:Cd 광발광에서는 중성 받개 bound 엑시톤 ( $A^{\circ}$,X)가 완전히 사라졌다. 더우기, CdI $n_2$T $e_4$:Te의 광발광 스펙트럼에서 중성 받개 bound 엑시톤 ( $A^{\circ}$,X) 발광은 막 성장된 CdI $n_2$T $e_4$결정에서처럼 우세하였다. 이러한 결과들은 ( $D^{\circ}$,X)가 주개로써 작용하는 $V_{Te}$ ,와 관련이 있고, ( $A^{\circ}$,X)는 받개로 작용하는 $V_{cd}$와 관련이 있음을 가리킨다. p-CdI $n_2$T $e_4$ 결정은 Cd 증기 분위기에서 열처리한 후에는 n형으로 type conversion이 된다는 것을 알았다. 중성 주개-받개 bound 엑시톤 ( $D^{\circ}$, $A^{\circ}$)과 이들의 TO 포논 복제의 발광은 $V_{Te}$ 나 C $d_{int}$와 같은 주개들과 $V_{cd}$ 또는 T $e_{int}$와 같은 받개들 사이의 상호 작용과 관련이 있다. 또한, CdI $n_2$T $e_4$에서 In은 안정된 결합의 형태로 있기 때문에 자연 결함의 형성에는 관련이 없음을 알았다 알았다았다았다

• 한국어병학회지
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• 제32권2호
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• pp.97-104
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• 2019

본 연구에서는 2017년 4월부터 12월 사이에 여수수산시장에서 구입한 수산물로부터 분리된 Vibrio parahaemolyticus와 Morganella morganii의 내성특성을 알아보고 장내세균인 Escherichia coli와 어류 병원균인 Edwardsiella tarda와의 내성전이 가능성을 알아보았다. Broth mating 법으로 실시한 conjugation에서 형성된 transconjugants를 분리하기 위하여 ampicillin(AMP) 50 ㎍/ml와 streptomycin (SM) 150 ㎍/ml 또는 oxytetracycline(OT) 30 ㎍/ml이 첨가된 TSA배지를 사용하였다. AMP, amoxicillin (AML), colistin(CT)에 낮은 감수성을 보였던 V. parahaemolyticus와 달리 M. morganii는 AMP, AML, CT, erythromycin, OT, tetracyclin등에 감수성이 낮았다. V. parahaemolyticus와 M. morganii를 E. coli와 conjugation을 실시한 결과 transconjugants인 E. coli는 분리되지 않은 반면 SM내성을 획득한 V. parahaemolyticus와 M. morganii가 분리되었다. 한편 V. parahaemolyticus와 E. tarda의 broth mating에서는 AMP와 AML 내성을 획득한 E. tarda transconjugant가 분리되었다. 그러나 V. parahaemolyticus의 β-lactamase 유전자인 VPA 0477의 전이는 확인되지 않았으며, E. tarda의 내성이 전달된 V. parahaemolyticus나 M. morganii는 검출되지 않았다. 이와 같은 결과는 생물 위해성 세균들 간의 내성전이가 양방향성이며 매우 다양한 패턴으로 진행되고 있음을 시사한다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.230-233
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• 2004

The stochiometric mix of evaporating materials for the $CuInS_2$ single crystal thin films was prepared from horizontal furnance. Using extrapolation method of X-ray diffraction patterns for the $CuInS_2$ polycrystal, it was found tetragonal structure whose lattice constant $a_0$ and $c_0$ were $5.524\;{\AA}$ and $11.142\;{\AA}$, respectively. To obtain the single crystal thin films, $CuInS_2$ mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperature were 640 t and 430 t, respectively and the thickness of the single crystal thin films was $2{\mu}m$. Hall effect on this sample was measured by the method of van dot Pauw and studied on carrier density and temperature dependence of mobility. The carrier density and mobility deduced from Hall data are $9.64{\times}10^{22}/m^3,\;2.95{\times}10^{-2}\;m^2/V{\cdot}s$ at 293 K, respectively The optical energy gaps were found to be 1.53 eV at room temperature. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the thin film, we have found that the values of spin orbit coupling splitting ${\Delta}So$ and the crystal field splitting ${\Delta}Cr$ were 0.0211 eV and 0.0045 eV at 10 K, respectively. From PL peaks measured at 10K, 807.7nm (1.5350ev) mean Ex peak of the free exciton emission, also 810.3nm (1.5301eV) expresses $I_2$ peak of donor-bound exciton emission and 815.6nm (1.5201eV) emerges $I_1$ peak of acceptor-bound exciton emission. In addition, the peak observed at 862.0nm (1.4383eV) was analyzed to be PL peak due to donor-acceptor pair(DAP).

• Bulletin of the Korean Chemical Society
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• 제25권11호
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• pp.1645-1647
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• 2004

Potential energy surfaces for the reaction Al + $O_2{\to}$AlO + O have been calculated with the multireference configuration interaction (MRCI) method using molecular orbitals derived from the complete active space selfconsistent field (CASSCF) calculations. The end-on geometry is the most favourable for the reaction to take place. The small reaction barrier in the present calculation (0.11 eV) is probably an artefact related to the ionicneutral avoided crossing. The charge analysis implies that the title oxidation reaction occurs through a harpooning mechanism. Along the potential energy surface of the reaction, there are two stable intermediates of $AlO_2(C_{{\infty}v}$ and $C_{2v}$) at least 2.74 eV below the energy of reactants. The calculated enthalpy of the reaction (-0.07 eV) is in excellent agreement with the experimental value (-0.155 eV) in part due to the fortuitous cancellation of errors in AlO and $O_2$ calculations.

• 한국전기전자재료학회논문지
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• 제15권5호
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• pp.435-440
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• 2002

In this study, we have investigated photo-induced changes of optical energy gap( $E_{OP)}$ and photoluminescence (PL) in amorphous ($\alpha$-) S $e_{100-x}$G $e_{x}$ (x=5, 25 and 33) thin films prepared by conventional thermal evaporation method. In the $\alpha$-S $e_{100-x}$G $e_{x}$ thin film, the $E_{OP}$ is obtained by a linear extrapolation of the ($\alpha$hν)$^{\frac{1}{2}}$ versus hν plot to the energy axis using the optical absorption coefficient ($\alpha$) calculated from the extinction coefficient k measured in the wavelength range of 290~900nm. Although the values of $\Delta$ $E_{OP}$ are very different, all films exhibit photo-induced photo-darkening (PD) effect that is a red shift of $E_{OP}$ . In particular, $\Delta$ $E_{OP}$ in $\alpha$-S $e_{75}$ G $e_{25}$ thin film exhibits the largest value (i, e., $\Delta$ $E^{OP}$ ~40meV for $\alpha$-S $e_{95}$ G $e_{5}$ , $\Delta$ $E_{OP}$ ~200meV for $\alpha$-S $e_{75}$ G $e_{25}$ , $\Delta$ $E_{OP}$ ~130meV for $\alpha$-S $e_{67}$ G $e_{33}$ ). PL spectra in $\alpha$-SeGe by hν$_{HeCd}$ have no-Stokes shift (SS) and show a tendency dependent on both composition and illumination time. We explain the energy-induced phenomena such as the PD and thermal bleaching, the native charged-defect generation and the no-SS PL, etc..the PD and thermal bleaching, the native charged-defect generation and the no-SS PL, etc..tc..