• Title/Summary/Keyword: Dithering Process

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The Improved Error Diffusion Method Using Compensating Value Depending on Edge Information and Linear Gain (선형이득과 경계 영역 보정 값을 이용한 개선된 오차확산 방법)

  • 양운모;곽내정;윤태승;안재형
    • Journal of Korea Multimedia Society
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    • v.7 no.2
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    • pp.164-172
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    • 2004
  • Halftoning of gray-scale image is a process to produce a binary image. The error diffusion halftoning method produces high qualify binary image but that has some defects such as sharpening and directional artifacts. We propose the threshold modulation to reduce such defects. The proposed algorithm uses thresholds reflecting local characteristic of image. We calculate thresholds which minimize errors of flat region of each gray-scale level by using a linear gain between original image and error-diffused image and then represent edge by compensating thresholds in proportion to edge information. The proposed method improves on halftone quality by minimizing an error which cause sharpening and directional artifact.

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A Digital DLL with 4-Cycle Lock Time and 1/4 NAND-Delay Accuracy

  • Kim, Sung-Yong;Jin, Xuefan;Chun, Jung-Hoon;Kwon, Kee-Won
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.4
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    • pp.387-394
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    • 2016
  • This paper presents a fully digital delay locked loop (DLL) that can acquire lock in four clock cycles with a resolution of a 1/4 NAND-delay. The proposed DLL with a multi-dither-free phase detector acquires the initial lock in four clock cycles with 1/2 NAND-delay. Then, it utilizes a multi-dither-free phase detector, a region accumulator, and phase blenders, to improve the resolution to a 1/4 NAND-delay. The region accumulator which continuously steers the control registers and the phase blender, adaptively controls the tracking bandwidth depending on the amount of jitter, and effectively suppresses the dithering jitter. Fabricated in a 65 nm CMOS process, the proposed DLL occupies $0.0432mm^2$, and consumes 3.7 mW from a 1.2-V supply at 2 GHz.

0.11-2.5 GHz All-digital DLL for Mobile Memory Interface with Phase Sampling Window Adaptation to Reduce Jitter Accumulation

  • Chae, Joo-Hyung;Kim, Mino;Hong, Gi-Moon;Park, Jihwan;Ko, Hyeongjun;Shin, Woo-Yeol;Chi, Hankyu;Jeong, Deog-Kyoon;Kim, Suhwan
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.3
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    • pp.411-424
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    • 2017
  • An all-digital delay-locked loop (DLL) for a mobile memory interface, which runs at 0.11-2.5 GHz with a phase-shift capability of $180^{\circ}$, has two internal DLLs: a global DLL which uses a time-to-digital converter to assist fast locking, and shuts down after locking to save power; and a local DLL which uses a phase detector with an adaptive phase sampling window (WPD) to reduce jitter accumulation. The WPD in the local DLL adjusts the width of its sampling window adaptively to control the loop bandwidth, thus reducing jitter induced by UP/DN dithering, input clock jitter, and supply/ground noise. Implemented in a 65 nm CMOS process, the DLL operates over 0.11-2.5 GHz. It locks within 6 clock cycles at 0.11 GHz, and within 17 clock cycles at 2.5 GHz. At 2.5 GHz, the integrated jitter is $954fs_{rms}$, and the long-term jitter is $2.33ps_{rms}/23.10ps_{pp}$. The ratio of the RMS jitter at the output to that at the input is about 1.17 at 2.5 GHz, when the sampling window of the WPD is being adjusted adaptively. The DLL consumes 1.77 mW/GHz and occupies $0.075mm^2$.