• Proceedings of the Korean Statistical Society Conference
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• 2005.05a
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• pp.197-201
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• 2005

In this article, we will compare the performance of the mean control chart, the median control chart, the transformed mean control chart, the transformed median control chart, and the precedence control chart by simulation study. For control charts with transformed data, Yeo-Johnson transformation is used. Under the in-control condition, ARL's in all control charts coincide with the designed ARL in the normal distribution, but in the other distributions, only the precedence control chart provides the in-control ARL as designed. Under the out-of-control condition, the mean control chart is preferred in the normal distribution and the median control chart is preferred in the heavy-tailed distribution and the precedence control chart outperforms in the short-tailed distribution.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.29 no.2
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• pp.97-103
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• 2006

Recently, the control chart is developed for monitoring processes with normal short production runs by the coefficient of variation(CV) characteristic for a normal distribution. This control chart does not work well in non-normal short production runs. And most of industrial processes are known to follow the non-normal distribution. Therefore, the control chart is required to be developed for monitoring the processes with non-normal short production runs by the CV characteristics for a non-normal distribution. In this paper, we suggest the control chart for monitoring the processes with a gamma short runs by the CV characteristics for a gamma distribution. This control chart is denoted by the gamma CV control chart. Futhermore evaluated the performance of the gamma CV control chart by average run length(ARL).

• Journal of Korean Society for Quality Management
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• v.38 no.2
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• pp.171-179
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• 2010

Pearn et al.(2002) supposed the $C_{pp}$ multiple process performance analysis chart. This chart displays multiple processes with the process variation and process departure on one single chart. But, this chart can not display the distribution of the process variation and process departure and is inappropriate for processes with non-normal distributions. With bootstrapping method, we can display the distribution of the process variation and process departure on the $C_{pp}$ multiple process performance analysis chart.

• Industrial Engineering and Management Systems
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• v.16 no.1
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• pp.109-117
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• 2017

In this article, a control chart based on multiple dependent (or deferred) state sampling for the gamma distributed quality characteristic is proposed using the gamma to normal transformation. The proposed control chart has two pairs of control limits, which can be determined by considering the in-control average run length (ARL). The shift in the scale parameter of a gamma distribution is considered and the out-of-control ARL is evaluated. The performance of the proposed chart has been shown for different levels of the parameters of the proposed control chart. It is also shown that the proposed chart is better than the Shewhart chart in terms of ARLs. A case study with a real data has been included for the practical usage of the proposed scheme.

• Journal of the Korean Professional Engineers Association
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• v.20 no.3
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• pp.15-25
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the X-chart, X-chart, X-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart X-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for tile more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the X-chart, the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the X-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based on a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $X^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the propose4 median chart and the X chart was also performed with these examples and the median chart turned out to be superior to the X-chart.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.10 no.16
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• pp.101-106
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\bar{X}$-chart, $\bar{X}$-chart, $\bar{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart $\bar{X}$-chart. which is the most widely used one in Kora, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the $\bar{X}$-chart; the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the $\bar{X}$-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based oh a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $\chi$$^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the proposed median chart and the $\bar{X}$ chart was also performed with these examples and the median chart turned out to be superior to the $\bar{X}$-chart.

• Journal of the Korean Operations Research and Management Science Society
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• v.39 no.1
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• pp.1-12
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• 2014

This article proposes a variable sampling interval (VSI) $\bar{X}$ control chart using weighted standard deviation (WSD) method for skewed populations. The WSD method decomposes the standard deviation of a quality characteristic into upper and lower deviations and adjusts control limits and warning limits of a control chart in accordance with the direction and degree of skewness. A control chart constant is derived for estimating the standard deviation of skewed distributions with the mean of sample standard deviations. The proposed chart is compared with the conventional VSI $\bar{X}$ control chart under some skewed distributions. Simulation study shows that the proposed WSD VSI chart can control the in-control average time to signal (ATS) as an adequate level better than the conventional VSI chart, and the proposed chart can detect a decrease in the process mean of a quality characteristic following a positively skewed distribution more quickly than the standard VSI chart.

• Journal of Korean Society for Quality Management
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• v.44 no.1
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• pp.167-180
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• 2016

Purpose: The problem for the traditional control chart is that it is unable to monitor the very small fraction of nonconforming and the underlying distribution is the normal distribution. $Z_p$ control chart is useful where it controls the vert small fraction on nonconforming. In this study, we will design the $Z_p$ control chart in order to use under non-normal process. Methods: $Z_p$ is calculated not by failure rate based on attribute data but using variable data. Control limit for non-normal $Z_p$ control chart is designed based on ${\alpha}$-risk calculated by cumulative distribution function of Burr distribution. ${\beta}$-risk, which is for performance evaluation, obtains in the Burr distribution's cumulative distribution function and control limit. Results: The control limit for non-normal $Z_p$ control chart is designed based on Burr distribution. The sensitivity can be checked through ARL table and OC curve. Conclusion: Non-normal $Z_p$ control chart is able to control not only the very small fraction of nonconforming, but it is also useful when $Z_p$ distribution is non-normal distribution.

• Proceedings of the Korean Society for Quality Management Conference
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• 1998.11a
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• pp.198-207
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• 1998

The p chart approximate to the normal distribution has a difficulty to analyze the process condition precisely when the negative LCL is occurred. Furthermore, the probability of Type I error increases compared with using its original binomial distribution. For a long time the p chart has been used as approximated to the normal distribution because of its easy use. However, it becomes rapid and convenient to calculate the binomial distribution through the development of computer and software, so it is strongly suggested to use the binomial distribution determining control limits to reduce the probability of Type I error. In this study, I suggest that the control limits can be designed in use of binomial distribution and they can be utilized without special software by illustrating the certain work for establishing p-chart with the commercial one(EXCEL).

• Journal of Korean Society for Quality Management
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• v.14 no.1
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• pp.11-18
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• 1986

Whereas in non-symmetrical distribution manufacturing process they are not plotted relatively on the centeral line but plotted on the skew of right-hand side or left-hand side. That is to say, for the prupose of producing either upper-specification-oriented items or lower-specification-oriented items, and when we carry out tighter control so as to have them pass only its specifications, the distribution shape naturally has a non-normal distribution. In these cases, we could use either compressed control limits or variable transformed logarithm control charts. It the above mentioned methods were not available, we should use special purpose control chart-Mode control chart or Gram-Charlier control chart. These are proper methods for manufacturing process control which uses control chart method. In spite of these methods, domestic manufacturing and mining companies are utterly ignorant about these methods. That invites practical problems in their companies. To enhance this improvements, I proved the property of practical applications of control chart method by comparing and analyzing the case studies of practical application of speical purpose control chart method, and also by introducing the application methods.