• Title/Summary/Keyword: Diffraction efficiency

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Ultrasonic Synthesis of CoSe2-Graphene-TiO2 Ternary Composites for High Photocatalytic Degradation Performance

  • Ali, Asghar;Oh, Won-Chun
    • Journal of the Korean Ceramic Society
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    • v.54 no.3
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    • pp.205-210
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    • 2017
  • In this study, we examined the photo-degradation efficiency of $CoSe_2$-Graphene-$TiO_2$ ($CoSe_2-G-TiO_2$) nanocomposites under visible light irradiation using rhodamine B (RhB) as standard dye. $CoSe_2-G-TiO_2$ nanocomposites were synthesized by ultrasonication and characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopic analysis and UV-Vis absorbance spectra analysis. Our results show that the $CoSe_2-G-TiO_2$ nanocomposite exhibited significant photo degradation efficiency compared to pure $TiO_2$ and $CoSe_2-G$, approximately 85.2% of the rhodamine (Rh B) degraded after 2.5 h. It is concluded that the $CoSe_2-G-TiO_2$ nanocomposite is a promising candidate for use in dye pollutants.

Development of Control Technology of Phosphorus in Water (수중의 인 제어기술 개발)

  • Kim, Kyoung Tae;Kang, Seon Hong
    • Journal of Korean Society of Water and Wastewater
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    • v.13 no.3
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    • pp.56-60
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    • 1999
  • In this study the feasibility of usage of raw sludge (sludge from water treatment plant) and chalk from schools and institutes was investigated to remove the phosphorus in water and wastewater. In this study phosphorus removal efficiencies of sludge and chalk were investigated by changing various factors. The time to reach the equilibrium using chalk and raw sludge under different pHs was obtained. Based on this result, Freudlich adsorption isotherm was applied. Results showed that a portion of phosphorus was removed by adsorption to chalk and raw sludge. The phosphorus removal efficiency using calcinated chalk was about three times higher than that of chalk. It means that some portion of $CaCO_3$ contained in chalk was converted to CaO by calcination and this was proved by X-ray diffraction experiment. About 90% phosphorus removal was observed using sludge and calcinated chalk respectively while about 20% phosphorus removal efficiency was achieved using chalk from the water sample in Lake Sihwa.

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The Analysis of the Discharging Characteristics and MgO protective layer by MgO Evaporation Rates for High-Efficiency PDP (MgO 증착률에 따른 PDP 보호막 물성 및 방전 특성 분석)

  • Kim, Yong-Jae;Kwon, Sang-Jik
    • Journal of the Korean Vacuum Society
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    • v.16 no.3
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    • pp.181-186
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    • 2007
  • We have investigated and analyzed the effects of the evaporation rate of MgO films on the MgO properties and the discharge characteristics of a plasma display panel(PDP). The MgO properties such as the crystal orientation, the surface roughness, the film structure, and cathode-luminescence (CL) spectra were inspected using XRD (X-ray diffraction), AFM(atomic force microscopy). And the discharging characteristics of the PDP such as the firing voltage, discharging current, and luminescence were measured using a vacuum chamber with oscilloscope (TDS 540C), current probe (TCP-312A), color meter (CS-100A) and etc. From the experiments results we confirmed the optimum evaporation rate at $5{\AA}/sec$, the MgO properties were shown to be strongly dependent on the evaporation rate, and the MgO properties had an effecton the optical and electrical characteristics. In other words, if the evaporation rates increase than $5{\AA}/sec$, the intensity of (200) orientation and cathode-luminescence (CL) spectra reduce, and the firing vlotage was increased. So the luminuous efficiency grows worse.

Design of pixelated phase gratings for optical image generation (광영상 발생을 위한 화소형 위상격자의 설계 및 제작)

  • Lee, Deug-Ju;Kim, Nam;Lee, Kwon-Yeon;Eun, Jae-Jeong
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.5
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    • pp.132-141
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    • 1996
  • The pixelated phase grating has been studied as a kind of diffraction gratings splitting and input beam into multiple spots. It consists of regular size cells which produce phase delays, and each cell provokes the phase delay up to sixteen levels. We have compared and analyzed the characteristics of multi-level phase gratings, laying streess on efficiency and resulted pattern. Experimental resutls obtained form fabricated grating have been presented, and the real-time method using a liquid-crystal spatial light modulator has been demonstrated through experiments. Gratings making meams with specific intensities have been designed and optical images have been generated by them. In order to specific intensities have been designed and optical images have been genrated by them. In order to decide the phase delay of each cell, optimization conditon consists of diffraction efficiency and target values. One period of phase gratings fabricated with surface relief was less than 256${\mu}m{\times}256{\mu}m$ and size of each cell was 1${\mu}m{\times}1{\mu}m$ surface relief grating has been made by coating photoresist on the glass plate, writing information pattern by Ar laser and developing it. in the experiment for real-tiem processing liquid-crystal display of epson video projector has been used.

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Photodissolution, photodiffusion characteristics and holographic grating formation on Ag-doped $As_{40}Ge_{10}Se_{15}S_{35}$ chalcogenide thin film (Ag가 도핑된 칼코게나이드 $As_{40}Ge_{10}Se_{15}S_{35}$ 박막의 광분해, 광확산특성 및 홀로그래픽 격자형성)

  • Chung, Hong-Bay
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.55 no.10
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    • pp.461-466
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    • 2006
  • In the present work, we investigated the photodissolution and photodiffusion effect on the interface of Ag/chalcogenide $As_{40}Ge_{10}Se_{15}S_{35}$ thin film by measuring the absorption coefficient, the optical density, the resistance change of Ag layer. It was found that the photodissolutioniphotodiffution ratio depends on the magnitude of photon energy absorbed in the chalcogenide thin film and the depth of photodiffution was proportional to the square root of the exposed time. Also, we have investigated the holographic grating formation with P-polarization states on chalcogenide $As_{40}Ge_{10}Se_{15}S_{35}$ thin film and $As_{40}Ge_{10}Se_{15}S_{35}/Ag$ double layer structure thin film. Holographic gratings have been formed using He-Ne laser (632.8 nm) which have a smaller energy than the optical energy gap, $E_g\;_{opt}$ of the film, i. e., an exposure of sub-bandgap light $(h{\upsilon} under P-polarization. As the results, we found that the diffraction efficiency on $As_{40}Ge_{10}Se_{15}S_{35}/Ag$ double layer structure thin film was more higher than that on single $As_{40}Ge_{10}Se_{15}S_{35}$ thin film. Also, we obtained that the maximum diffraction efficiency was 0.27 %, 1,000 sec on $As_{40}Ge_{10}Se_{15}S_{35}\;(1{\mu}m)/Ag$ (10 nm) double layer structure thin film by (P: P) polarized recording beam. It will offer lots of information for the photodoping mechanism and the analyses of chalcogenide thin films.

1$\times$16 DMUX Using Holographic Volume Gratings (홀로그래픽 부피격자를 이용한 1$\times$16 DMUX)

  • Lee, Kwon-Yeon;An, Jun-Won;Kim, Nam;Lee, Hyun-Jae;Seo, Wan-Seok
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.37 no.5
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    • pp.31-38
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    • 2000
  • We propose a new photorefractive demultiplexer(DMUX) which can select the 16 channel signal in WDM optical communication system using the wavelength selectivity and the demultiplexing property through multiple recording of holographic volume grating in photorefractive Fe-LiNbO$_{3}$ crystal. For the multiple writing of the 16 channels having uniform diffraction efficiency, the rotation multiplexing technique and the exposure time schedule are used. Designed DMUX has the 16 channels with 0.5nm spacing between 670nm and 677.5nm and the bandwidth of 0.16nm. From the experimental results, the diffraction efficiency of each channel is 8.3 $\pm$0.62%, the optical loss from fresnel reflection and absorption on the crystal is 0.4cm-1, the 3㏈ bandwidth is 0.16 $\pm$0.005nm and the channel spacing is 0.46~0.5nm.

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Analysis of Surface Plasmon Resonance on Periodic Metal Hole Array by Diffraction Orders

  • Hwang, Jeong-U;Yun, Su-Jin;Gang, Sang-U;No, Sam-Gyu;Lee, Sang-Jun;Urbas, Augustine;Ku, Zahyun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.176-177
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    • 2013
  • Surface plasmon polaritons (SPPs) have attracted the attention of scientists and engineers involved in a wide area of research, microscopy, diagnostics and sensing. SPPs are waves that propagate along the surface of a conductor, usually metals. These are essentially light waves that are trapped on the surface because of their interaction with the free electrons of conductor. In this interaction, the free electrons respond collectively by oscillating in resonance with the light wave. The resonant interaction between the surface charge oscillation and the electromagnetic field of the light constitutes the SPPs and gives rise to its unique properties. In this papers, we studied theoretical and experimental extraordinary transmittance (T) and reflectance (R) of 2 dimensional metal hole array (2D-MHA) on GaAs in consideration of the diffraction orders. The 2d-MHAs was fabricated using ultra-violet photolithography, electron-beam evaporation and standard lift-off process with pitches ranging from 1.8 to $3.2{\mu}m$ and diameter of half of pitch, and was deposited 5-nm thick layer of titanium (Ti) as an adhesion layer and 50-nm thick layer of gold (Au) on the semiinsulating GaAs substrate. We employed both the commercial software (CST Microwave Studio: Computer Simulation Technology GmbH, Darmstadt, Germany) based on a finite integration technique (FIT) and a rigorous coupled wave analysis (RCWA) to calculate transmittance and reflectance. The transmittance was measured at a normal incident, and the reflectance was measured at variable incident angle of range between $30^{\circ}{\sim}80^{\circ}$ with a Nicolet Fourier transmission infrared (FTIR) spectrometer with a KBr beam splitter and a MCT detector. For MHAs of pitch (P), the peaks ${\lambda}$ max in the normal incidence transmittance spectra can be indentified approximately from SP dispersion relation, that is frequency-dependent SP wave vector (ksp). Shown in Fig. 1 is the transmission of P=2.2 um sample at normal incidence. We attribute the observation to be a result of FTIR system may be able to collect the transmitted light with higher diffraction order than 0th order. This is confirmed by calculations: for the MHAs, diffraction efficiency in (0, 0) diffracted orders is lower than in the (${\pm}x$, ${\pm}y$) diffracted orders. To further investigate the result, we calculated the angular dependent transmission of P=2.2 um sample (Fig. 2). The incident angle varies from 30o to 70o with a 10o increment. We also found the splitting character on reflectance measurement. The splitting effect is considered a results of SPPs assisted diffraction process by oblique incidence.

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Characterization of few-layered reduced graphene oxide (rGO) for standardization (소수의 층을 갖는 환원 graphene oxide(rGO) 표준화를 위한 물성분석)

  • Ahn, Hae Jun;Huh, Seung Hun;Jee, Youngho;Lee, Byeong Woo
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.32 no.6
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    • pp.239-245
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    • 2022
  • Reduced graphene oxide (rGO) has attracted many attention and applications due to its excellent electrochemical ability. Therefore, standardization of rGO through structural and thermal analysis facilitates quality improvement and management, enabling users to increase efficiency and reduce relevant costs. For rGO and graphene-related materials, it is very important to determine the number of layers and define the resulting difference in physical properties. In this study, 3~4 layers of rGO-1 and 9~10 layers of rGO-2 were obtained from graphene oxide (GO) through a hydrazine reduction process. For the prepared rGOs, X-ray diffraction (XRD) pattern obtained a diffraction peak at 2θ≈25° related to (002) reflection was used to calculate the layer numbers by determining interlayer distance and FWHM value. To reduce the angular uncertainty, XRD data analysis was performed with angle correction using standard reference materials for X-ray powder diffraction analysis. Precise interlayer distance and number of layers were determined using OriginLab and open-source XRD diffraction analysis programs using the angle-corrected diffraction data. TG-DSC thermal analysis was performed to further standardize the physical properties of rGO samples.

Analysis of a flat-field soft x-ray spectrometer using a 2400-grooves/mm varied line-spacing concave grating (2400 grooves/mm 비등간격 오목에돌이발을 이용하는 평면결상형 연엑스선 분광기의 특성 해석)

  • 최일우;남창희
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.189-196
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    • 2002
  • The components and alignment parameters of a flat-field soft x-ray spectrometer used in the wavelength range below 50 $\AA$ are determined, and the characteristics of the spectrometer are analyzed. It consists of a toroidal mirror, a slit, a varied line-spacing concave grating, and a soft x-ray detector. The space-resolved spectral image of a source is formed on a single plane using the tordidal mirror and the 2400-grooves/mm varied line-spacing concave grating. The former is used to compensate for the astigmatism caused by the grazing incidence of soft x-ray light on the concave grating. The spectral and spatial resolutions of the spectrometer are calculated by applying the wave front aberration theory, and the diffraction efficiency is calculated by applying the scalar diffraction theory.

Design and Analysis of an Optical System for an Uncooled Thermal-imaging Camera Using a Hybrid Lens (Hybrid 렌즈를 이용한 비냉각 열상장비 광학계 설계 및 분석)

  • Ok, Chang-Min;Kong, Hyun-Bae;Park, Hyun-Woo
    • Korean Journal of Optics and Photonics
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    • v.28 no.5
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    • pp.241-249
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    • 2017
  • This paper presents the design and evaluation of the optical system for an uncooled thermal-imaging camera. The operating wavelength range of this system is from $7.7{\mu}m$ to $12.8{\mu}m$. Through optimization, we have obtained a LWIR (Long Wave Infrared) optical system with a focal length of 5.44 mm, which consists of four aspheric surfaces and two diffractive surfaces. The f-number of the optical system is F/1.2, and its field of view is $90^{\circ}{\times}67.5^{\circ}$. The hybrid lens was used to balance the higher-order aberrations, and its diffraction properties were evaluated by scalar diffraction theory. We calculated the polychromatic integrated diffraction efficiency, and the MTF drop generated by background noise. We have evaluated the thermal compensation of a LWIR fixed optical system, which is optically passively athermalized to maintain MTF performance in the focal depth. In conclusion, these design results are useful for an uncooled thermal-imaging camera.