• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.17 no.4 s.107
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• pp.393-399
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• 2006

In this paper we applied a ray tracing method to estimate the scattering characteristics from large scale random rough surfaces. For the electromagnetic field evaluation, we have used the diffracted coefficient of the knife edge diffraction for the diffracted rays and Fresnel's reflection coefficients in connection with reflected rays. In addition, we examine to search for the traced rays using the imaging method which can be obtained all rays to arrived at receivers accurately and the diffracted field from rough surfaces is considered. Numerical examples have been carried out for the scattering characteristics of an ocean wave-like rough surface and delay spread characteristics of a building-like surface. In the present work we have demonstrated that the ray tracing method is effective to numerical analysis of a rough surface scattering.

• Earthquakes and Structures
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• v.8 no.4
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• pp.821-841
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• 2015

This paper proposes a two-stage imaging approach for quantitative inspection of damages in metallic plates using the fundamental anti-symmetric mode of ($A_0$) Lamb wave. The proposed approach employs a number of transducers to transmit and receive $A_0$ Lamb wave pulses, and hence, to sequentially scan the plate structures before and after the presence of damage. The approach is applied to image the corrosion damages, which are simplified as a reduction of plate thickness in this study. In stage-one of the proposed approach a damage location image is reconstructed by analyzing the cross-correlation of the wavelet coefficient calculated from the excitation pulse and scattered wave signals for each transducer pairs to determine the damage location. In stage-two the Lamb wave diffraction tomography is then used to reconstruct a thickness reduction image for evaluating the size and depth of the damage. Finite element simulations are carried out to provide a comprehensive verification of the proposed imaging approach. A number of numerical case studies considering a circular transducer network with eight transducers are used to identify the damages with different locations, sizes and thicknesses. The results show that the proposed methodology is able to accurately identify the damage locations with inaccuracy of the order of few millimeters of a circular inspection area of $100mm^2$ and provide a reasonable estimation of the size and depth of the damages.

• Proceedings of the KIEE Conference
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• 2003.07c
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• pp.1541-1543
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• 2003

The microwave dielectric properties of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were investigated. All sample of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were prepared by the conventional mixed oxide method, and sintered in the temperature of $1350^{\circ}C{\sim}1450^{\circ}C$. The structural properties of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were investigated by the X-ray diffraction meter. According to the X-ray diffraction patterns of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics, the major phase of the hexagonal $0.6Mg_4Ta_2O_9-0.4TiO_2$ were presented, In the case of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics sintered at $1400^{\circ}C$ for 5hr., the dielectric constant, quality factor and temperature coefficient of resonant frequency were 12.19, 109.411GHz, -17.21ppm/$^{\circ}C$, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.358-360
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• 2007

For large scaled solar cells and photosensors CdS thin films of $2{\mu}m$ thickness have deposited on ITO glass substrate by chemical bath deposition methode in $300^{\circ}C$ electric furnace. The surface roughness and resistance of cadmium sulphide(CdS) thin films with different microstructures and morphologies was investigated by using a x-ray diffraction (XRD), a scanning electron microscope (SEM), an atomic force microscope (AFM), and a near-field scanning microwave microscope (NFMM). As the different substrate heat temperatures, the microwave reflection coefficient $S_{11}$ and intensity of the (002) diffraction peak was changed, and the surface morphology also has shown differently.

• Journal of Korea Water Resources Association
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• v.32 no.6
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• pp.675-683
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• 1999

The reflection coefficients of monochromatic waves propagating over a shelf with varying dimensions are theoretically calculated. The diffraction of waves by an abrupt depth change is formulated by the eigenfunction expansion method. Not only propagating mode but also evanescent modes are considered in formulation. The role of evanescent modes in reflection coefficients is investigated in detail. Water waves are obliquely as well as normally incident to the region. The obtained reflection coefficients are verified by checking conservation of wave energy.

• Journal of the Korean Society of Safety
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• v.32 no.4
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• pp.16-21
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• 2017

The sprinkler system is a basic fire extinguishing system that uses water as an extinguishing agent. In order to evaluate the fire extinguishing performance of the sprinkler system, information such as the discharge angle, discharge speed, discharge pressure, flow rate, and water droplet size of the installed head are required. However, there is a lack of research on droplets size compared to other requirements. In this study, to evaluate the extinguishing characteristics of sprinkler system, the droplet size distribution was measured for various types of sprinkler heads actually used. The size of the droplet was measured using laser diffraction method. The 50% cumulative volume distribution ($D_{v50}$) according to discharge coefficient(K factor) was $540{\mu}m{\sim}695{\mu}m$ for K50, $542{\mu}m{\sim}1,192{\mu}m$ for K80, $980{\mu}m{\sim}1,223{\mu}m$ for K115 and $1,188{\mu}m{\sim}1,234{\mu}m$ for K202. Based on the measured results, the vaeiance of the droplet particle distribution and the distribution ($D_{v50}$) according to discharge coefficient(K factor) was $540{\mu}m{\sim}695{\mu}m$ for K50, $542{\mu}m{\sim}1,192{\mu}m$ for K80, $980{\mu}m{\sim}1,223{\mu}m$ for K115 and $1,188{\mu}m{\sim}1,234{\mu}m$ for K202. Based on the measured results, the vaeiance of the droplet particle distribution and the Rosin-Rammler index value are presented. As a result of the fire simulation with FDS, it was confirmed that the performance difference occurs according to the water droplet size distribution even when the same amount of water is used. Therefore, the extinguishing performance of the sprinkler system should be evaluated considering the droplet size distribution according to the sprinkler head type.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2009.05a
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• pp.355-356
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• 2009

The change of thermal expansion and mechanical behaviors by cold working has been investigated in Fe-29%Ni-17%Co low thermal expansion Kovar alloy. Fe-29%Ni-17%Co alloy was cold rolled gradually and prepared to plates having reduction ratio of 0%, 20%, 40%, 60%, and 80%. Annealing effect on the properties was also studied. Thermal expansion was measured from $25^{\circ}C$ to $600^{\circ}C$ with a heating rate of $5^{\circ}C$/min by using vacuum differential dilatometer. It was found that thermal expansion coefficient ($\alpha_{30{\sim}400}$) slightly decreased (reduction ration of 20%) and then remarkably increased (above reduction ration of 40%) with increasing reduction ratio of cold rolling. Thermal expansion coefficient ($\alpha_{30{\sim}400}$) was sharply decreased after annealing heat-treatment. Yield and tensile strengths were continuously increased and elongation was decreased by cold roiling. Microstructural observation and X-ray diffraction analysis results showed that the $\alpha$ phase significantly increased as the reduction ratio increased. The slight decrease of thermal expansion coefficient bellow reduction ration of 20% could be explained by the destroying short-range ordering and the decreasing of grain size. The significant increase of thermal expansion coefficient with cold rolling mainly attributed to the appearance of $\alpha$ phase. The correlation between the microstructural cause and invar phenomena for the low thermal expansion behavior was also discussed.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.13 no.12
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• pp.1011-1016
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• 2000

The (1-x)MgTi $O_3$-xSrTi $O_3$(x=0.02~0.08) ceramics were fabricated by the conventional mixed oxide method. The sintering temperature and time were 125$0^{\circ}C$~1375$^{\circ}C$ and 2hours. The structure and microwave dielectric properties were investigated with sintering temperature and composition ratio. From the X-ray diffraction patterns, the cubic SrTi $O_3$and hexagonal MgTi $O_3$structures were coexisted in the (1-x)MgTi $O_3$-xSrTi $O_3$(x=0.02~0.08) ceramics. The dielectric constant($\varepsilon$$_{r}$) was increased and the temperature coefficient of resonant frequency($\tau$$_{f}$)was decreased with addition of SrTi $O_3$. The temperature coefficient of resonant frequency($\tau$$_{f}$) was gradually varied from negative value to positive value with increasing SrTi $O_3$. In the case of 0.96MgTi $O_3$-0.04SrTi $O_3$ceramics sintered at 130$0^{\circ}C$, the dielectric constant, quality factor and temperature coefficient of resonant frequency were 20.5, 5918(at 7.33GHz) and +10ppm/$^{\circ}C$, respectively.y.y.y.

• Proceedings of the KIEE Conference
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• 1995.07c
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• pp.1098-1101
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• 1995

NbTi thin films were prepared on Si wafer and Cu substrate by rf magnetron sputtering in the range of sputtering pressure $3{\times}10^{-2}$torr to $3{\times}10^{-4}$torr at room temperature. The influence of sputtering pressure and substrate type on crystallographic orientation and morphology of NbTi thin films was investigated by using X-ray diffraction(XRD) and scanning electron microscopy(SEM), respectively. And the effect of crystallographic orientation and morphology of NbTi film on electromagnetic behaviors was estimated by measuring critical current in various applied magnetic field. The film morphology changed from porous structure consisting of tapered crystallites to densely deposited film decreasing with sputtering pressure. The change of crystallographic orientation with the sputtering pressure and rf power was calculated from the texture coefficient of(002) plane based on XRD patterns. It was found that a change of texture coefficient of(002) plane increased with decreasing sputtering pressure. From observation of critical current in various applied magnetic field, we have identified that the change of critical current abruptly decrease applying with magnetic field and NbTi film produced at high sputtering pressure does not exhibit superconductivity but at low sputtering pressure shows superconductivity.

• Korean Journal of Materials Research
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• v.27 no.8
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• pp.416-421
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• 2017

V-substituted $SrTiO_3$ thermoelectric oxide materials were fabricated by the conventional solid state reaction method. From X-ray diffraction pattern analysis, it can be clearly seen that almost every vanadium atom incorporated into the $SrTiO_3$ provided charge carriers. The electrical conductivity ${\sigma}$, Seebeck coefficient S, and thermal conductivity k were investigated in a high temperature regime above 1000 K. The addition of vanadium significantly reduced the thermal conductivity and enhanced the Seebeck coefficient, as well as the electrical conductivity, thus enhancing the ZT value. A maximum ZT value of 0.084 at 673 K was observed for the sample with 1.0 mole% of vanadium substitution. In this study, the reason for the enhanced thermoelectric properties via vanadium addition was also investigated.