• Title/Summary/Keyword: Dielectric microstrip Lines

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Quasi-static Analysis on the Effect of the Finite Metal with the Anisotropic Grooved Dielectric in Microstrip Lines

  • Hong Ic-Pyo
    • Journal of the Microelectronics and Packaging Society
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    • v.12 no.1 s.34
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    • pp.17-20
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    • 2005
  • In this paper, we presented the quasi-static characteristics of novel microstrip lines with anisotropic grooved dielectric in finite metal. A quasi-static mode-matching method has been used to analyze this new structure and the simulation results are validated through comparison with other available results. The results in this paper show that it is possible to control the propagation characteristics of microstrip lines with the use of anisotropic grooved dielectric in finite metal. Also anisotropic grooved dielectric in microstrip line can be newly added to the design parameters of high performance three dimensional monolithic microwave circuits and other microwave applications.

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Study of transient response in dielectric microstrip line with opto-microwave pulses

  • Wang, Xue;Kim, Ji-Hyoung;Yun, Ji-Hun
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.2 no.2
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    • pp.63-68
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    • 2009
  • We study on the transient response in non-uniform microstrip lines with optically controlled microwave pulses. The transient response of the microwave pulses in plasma layer has been evaluated by reflection function of dielectric microstrip lines. The variation of characteristic response in plasma layer with localized pulses has been evaluated analytically. Reflection the change of the reflection amplitude has been observed.

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Fabrication of novel micromachined microstrip transmission line for millimeter wave applications (마이크로머시닝 기술을 이용한 새로운 형태의 고주파 저손실 Microstrip 전송선의 제작)

  • 이한신;김성찬;임병옥;신동훈;김순구;박현창;이진구
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.41 no.8
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    • pp.37-44
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    • 2004
  • This paper describes a new GaAs-based surface-micromachined microstrip line supported by dielectric post and air-gapped signal line with ground metal. This new type of dielectric-supported air-gapped microstripline(DAML) structure is developed using surface micromachining techniques to provide easy means of airbridge connection between the signal lines and to archive low losses at millimeter-wave frequency band with wide impedance range. Each DAMLs with the length of 5 mm are fabricated and the measured characteristics are compared with those of the conventional microstrip transmission line. These transmission lines are composed of 10 ${\mu}{\textrm}{m}$ height of signal line, post size of 10 ${\mu}{\textrm}{m}$ ${\times}$ 10 ${\mu}{\textrm}{m}$ and post height of 9 ${\mu}{\textrm}{m}$. By elevating the signal lines from the substrate using the micromachining technology, the substrate dielectric loss can be reduced Compared with of the conventional microstrip transmission line showing 7.5 dB/cm loss at 50 GHz, the loss can be reduced to 1.1 dB/cm loss at 50 GHz.

Design of Asymmetrical Coupled Microstrip BandPass Filter on Composite Dielectric Substrate (복합 유전체기판상에 비대칭 결합 마이크로스트립 대역통과필터의 설계)

  • Kim Ik-Soo;Moon Seung-Chan
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.29 no.1A
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    • pp.77-83
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    • 2004
  • Parallel coupled microstrip bandpass filter is widely used in microwave circuits. But this filter limits the filter applications because of the narrow bandwidth and the spurious passband at twice the basic passband frequency. In order to solve this problem, a method of the asymmetrical coupled microstrip lines on composite dielectric substrate is presented. Closed form method is used to analyze the asymmetrical coupled microstrip lines on composite dielectric substrate. An experimental filter is fabricated over $33\%$ bandwidth centered at 9GHz. Compared with the filter on a single substrate, this filter on composite substrate shows improvement of the spurious passband.

A Study on Dielectric Properties of Printed Circuit Board(PCB) Materials with Variation of Frequency and Temperature (온도 및 주파수 변화에 따른 프린트 배선기판의 유전특성 연구)

  • 박종성;김종헌;이준웅
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1998.06a
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    • pp.135-138
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    • 1998
  • This paper presents the results of measured permittivity of PCB sheet material in the frequency range of 0.1[GHz] - 2[GHz] and temperature range of $25[^{\circ}C]$ - $85[^{\circ}C]$. Microstrip lines with different physical length are implemented to measure the attenuation and phase shift of the signals though these lines. The loss factor of these materials could be obtained with the dielectric constant and the attenuation of the microstrip lines.

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Variation of Transient-response in Open-ended Microstrip Lines with Optically-controlled Microwave Pulses

  • Wang, Xue;Kim, Kwan-Woong;Kim, Yong-K.
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.2
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    • pp.53-57
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    • 2009
  • In this paper we develop a method to observe faults in semiconductor devices and transmission lines by calculating the variation of the reflection function in a dielectric microstrip line that has an open-ended termination containing an optically induced plasma region. It is analyzed with the assumption that the plasma is distributed homogeneously in laser illumination. With the non linear material of degradation, the concentration of the carrier in the part of the material has changed. Since the input wave has produced the phenomenon of reflection, the input signal to the open-ended microstrip lines can be observed on reflection to identify the location of the fault. The characteristic impedances resulting from the presence of plasma are evaluated by the transmission line model. The variation of the reflection wave in the microwave system has been calculated by using an equivalent circuit model. The transient response has been also evaluated theoretically for changing the phase of the variation in the reflection. The variation of characteristic response in differentially localized has been also evaluated analytically.

A Study on a New Measurement Method of the Microstrip Parallel Coupled Lne Parameters (마이크로스트립 평행 결합선로 파라미터의 새로운 측정방법에 관한 연구)

  • Chang, Ik-Soo;Yoon, Young-Chul;Ahn, Dal
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.25 no.2
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    • pp.139-143
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    • 1988
  • A new measurement method of coupled transmission line characteristics is described. This method presents precision values of even-and odd-mode impedances as well as effective dielectric constants of symmetric parallel coupled microstrip lines from the scalar quantities obtained by transmission coefficients at two different resonance frequencies. Especially these values include dispersion effects in the measured frequency band. The measured impedances and effective dielectric constants of actually fabricated coupled lines on the Teflon substrates with low dielectric constants are good agreement with predicted values. And the experimental pass band characteristics of single section resonator by using previously designed coupled lines agree well with theoretical values.

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Analysis of Phase Velocity Matching in Coupled Microstrip Lines with Dielectric Overlay

  • Lee, Yong K.;Seung Y. Rhee;Kim, Nam;Park, Han K.
    • Journal of Electrical Engineering and information Science
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    • v.1 no.2
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    • pp.96-100
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    • 1996
  • This paper describes a concrete method for computing characteristic impedances and effective dielectric constants of the microstrip coupled lines without and with a dielectric overlay. The frequency-independent spectral domain method is used for the analysis of these lines. This method is a powerful, accurate, and numerically efficient approach for planar transmission line structure. For designing the optimal directional coupler, the velocities of even and odd mode must be equal but velocities of these two modes are different in the conventional coupled line which is inhomogeneous. The results show that these two velocities can be almost same according to variations of structural and material parameters in terms of the overlay(superstrate).

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Simulation for characterization of high speed probe for measurement of single flux quantum circuits (단자속양자 회로 측정프로브의 특성 분석을 위한 시뮬레이션)

  • 김상문;김영환;최종현;조운조;윤기현
    • Progress in Superconductivity and Cryogenics
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    • v.4 no.2
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    • pp.11-15
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    • 2002
  • High speed probe for measurement of sin91e flux quantum circuits is comprised of coaxial cables and microstrip lines in order to carry high speed signals without loss. For the impedance matching between coaxial cable and microstrip line, we have determined the dimension of the microstrip line with 50${\Omega}$ impedance by simulation and then have investigated the effect of line width and cross-sectional shape of signal line, dielectric material, thickness of soldering lead at the coaxial-to-microstrip transition Point, and the an91c between dielectric material and end part of the signal line on the characteristics of signal transmission of the microstrip line. From the simulation, we have found that these all parameter's had influenced on the characteristic of signal transmission on the microstrip line and should be reflected in fabricating high speed probe, We have also determined the dimension of coplanar waveguide to fabricate testing sample for performance test of high speed probe.

Characteristic Analysis of the Asymmetric Coupled microstrip Lines with finite Metalization Thickness in the Multilayered Structure (다층구조에서 도체 두께를 고려한 비대칭 결합선로의 특성해석)

  • 윤남일;홍익표;박한규
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.25 no.3A
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    • pp.424-429
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    • 2000
  • In this paper, the characteristics of the asymmetric coupled microstrip(ACM) lines with finite metalization thickness are investigated using the quasi-static analysis in the multilayered structure. By mode-matching method as the quasi-static analysis. the characteristic impedances and effective dielectric constants in ACM lines are obtained as a function of metalization thickness. The numerical results show that the propagation characteristics of ACM lines in the single and multilayered structure will be changed by the variation of metalization thickness.

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