• Title/Summary/Keyword: Dielectric breakdown

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Fabrication of High Density BZN-PVDF Composite Film by Aerosol Deposition for High Energy Storage Properties (상온분말분사공정을 이용한 고밀도 폴리머-세라믹 혼합 코팅층 제조 및 에너지 저장 특성 향상)

  • Lim, Ji-Ho;Kim, Jin-Woo;Lee, Seung Hee;Park, Chun-kil;Ryu, Jungho;Choi, Doo hyun;Jeong, Dae-Yong
    • Korean Journal of Materials Research
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    • v.29 no.3
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    • pp.175-182
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    • 2019
  • This study examines paraelectric $Bi_{1.5}Zn_{1.0}Nb_{1.5}O_7$ (BZN), which has no hysteresis and high dielectric strength, for energy density capacitor applications. To increase the breakdown dielectric strength of the BZN film further, poly(vinylidene fluoride) BZN-PVDF composite film is fabricated by aerosol deposition. The volume ratio of each composition is calculated using dielectric constant of each composition, and we find that it was 12:88 vol% (BZN:PVDF). To modulate the structure and dielectric properties of the ferroelectric polymer PVDF, the composite film is heat-treated at $200^{\circ}C$ for 5 and 30 minutes following quenching. The amount of ${\alpha}-phase$ in the PVDF increases with an increasing annealing time, which in turn decreases the dielectric constant and dielectric loss. The breakdown dielectric strength of the BZN film increases by mixing PVDF. However, the breakdown field decreases with an increasing annealing time. The BZN-PVDF composite film has the energy density of $4.9J/cm^3$, which is larger than that of the pure BZN film of $3.6J/cm^3$.

Enhancing Breakdown Strength and Energy Storage Efficiency of Glass-Pb(Zr,Ti)O3 Composite Film (유리-PZT 혼합 후막의 절연 파괴 전압 및 에너지 저장 효율 향상)

  • Kim, Samjeong;Lim, Ji-Ho;Jeong, Dae-Yong
    • Korean Journal of Materials Research
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    • v.31 no.10
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    • pp.546-551
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    • 2021
  • To improve ferroelectric properties of PZT, many studies have attempted to fabricate dense PZT films. The AD process has an advantage for forming dense ceramic films at room temperature without any additional heat treatment in low vacuum. Thick films coated by AD have a higher dielectric breakdown strength due to their higher density than those coated using conventional methods. To improve the breakdown strength, glass (SiO2-Al2O3-Y2O3, SAY) is mixed with PZT powder at various volume ratios (PZT-xSAY, x = 0, 5, 10 vol%) and coating films are produced on silicon wafers by AD method. Depending on the ratio of PZT to glass, dielectric breakdown strength and energy storage efficiency characteristics change. Mechanical impact in the AD process makes the SAY glass more viscous and fills the film densely. Compared to pure PZT film, PZT-SAY film shows an 87.5 % increase in breakdown strength and a 35.3 % increase in energy storage efficiency.

Improving Lifetime Prediction Modeling for SiON Dielectric nMOSFETs with Time-Dependent Dielectric Breakdown Degradation (SiON 절연층 nMOSFET의 Time Dependent Dielectric Breakdown 열화 수명 예측 모델링 개선)

  • Yeohyeok Yun
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.16 no.4
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    • pp.173-179
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    • 2023
  • This paper analyzes the time-dependent dielectric breakdown(TDDB) degradation mechanism for each stress region of Peri devices manufactured by 4th generation VNAND process, and presents a complementary lifetime prediction model that improves speed and accuracy in a wider reliability evaluation region compared to the conventional model presented. SiON dielectric nMOSFETs were measured 10 times each under 5 constant voltage stress(CVS) conditions. The analysis of stress-induced leakage current(SILC) confirmed the significance of the field-based degradation mechanism in the low electric field region and the current-based degradation mechanism in the high field region. Time-to-failure(TF) was extracted from Weibull distribution to ascertain the lifetime prediction limitations of the conventional E-model and 1/E-model, and a parallel complementary model including both electric field and current based degradation mechanisms was proposed by extracting and combining the thermal bond breakage rate constant(k) of each model. Finally, when predicting the lifetime of the measured TDDB data, the proposed complementary model predicts lifetime faster and more accurately, even in the wider electric field region, compared to the conventional E-model and 1/E-model.

A study on the insulation detection for electrical machnes by corona pulse technique (Corona pulse 검출에 의한 전력기기절연진단에 대한-고찰)

  • 성영권;정성계;김왕곤
    • 전기의세계
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    • v.16 no.5
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    • pp.15-18
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    • 1967
  • This paper shows the analysis for mechanisms of corona pulse caused by dielectric breakdown, and for the results of observed values on an actual machines with the this corona pulse technique. Although the above results are not directly related with the generation, numbers or wave of the corona pulse, it may possibly be chanced a judgement of dielectric breakdown and one of better synthetic judgement methods for actual electrical machines.

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A Study on Insulation Design of HTS Transformer (초전도 변압기의 절연 설계에 관한 연구)

  • 정종만;백승명;김영석;곽동순;김상현
    • Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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    • 2003.02a
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    • pp.232-235
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    • 2003
  • To realize the development of HTS power apparatus, various breakdown test of L$N_2$ should be carried out and the mechanism should be understood more. Moreover the dielectric design technology that the basic dielectric experimental data applied to the HTS power system should be developed. In this paper, the electric fields for the insulation design were calculated for example with the analysis of Weibull distribution. And V-t characteristics of L$N_2$ were discussed. Around the breakdown voltage the n values were less than 1.

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Dielectric Breakdown Characteristics in LDPE with Semiconductive Electrodes

  • Kang, Tae-O;Lee, Yoon-Seok;Kim, Hwa-Jong;Kim, Kwan-Sung;Cheon, Chan-O;Park, Dae-Hee
    • Proceedings of the KIEE Conference
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    • 1993.07b
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    • pp.1171-1173
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    • 1993
  • Dielectric breakdown strength of LDPE films was investigated using metal electrodes and semiconductive electrodes respectively. In both of two cases, the results show that there are characteristics of dependence on thickness and dependence on temperature. However, there are some differences in both cases.

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A Study on Phenomena of Watertree and Dielectric Breakdown in XLPE (XLPE의 수트리와 절연파괴 현상에 관한 연구)

  • 이성일
    • Journal of the Korea Safety Management & Science
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    • v.3 no.4
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    • pp.45-52
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    • 2001
  • In order to Investigate water tree degradation behavior on XLPE cable, direct voltage of 200 to 800V has been applied to the material at 5$0^{\circ}C$~10$0^{\circ}C$, and the water tree property has been correlated with voltage and temperature. The leakage current was increase as temperature increased and the Ohm's law was generally satisfied in this experiment though some experimental errors were found. The leakage current was decreased and reached to the stable state with time. It was also shown that the time for the stabilization of leakage current was lessened as voltage increased

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Effect of Heat-treatment on the Electrical Properties of Polyurethane Resin (열처리조건이 폴리우레탄수지의 전기적 특성에 미치는 영향에 관한 연구)

  • Cho, Jung-Soo;Kwak, Young-Soon;Lee, Jong-Ho;Kwak, Byung-Ku
    • Proceedings of the KIEE Conference
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    • 1987.11a
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    • pp.293-295
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    • 1987
  • This paper deals with the dielectric properties dielectric breakdown strength and mechanical tensile properties according to heat - treatment condition of polyurethane resin. This resin is heat - treated over a range of temperature from $50^{\circ}C$ to $150^{\circ}C$. It is shown that the dielectric dissipation factor decreases with increase of heat - treatment temperature of the sample exept for the sample heat - treated at $150^{\circ}C$. The maximum dielectric breakdown strength is appeared for the sample heat - treated for 10 hours at $100^{\circ}C$, after curing for 24 hours at room temperature. The optimal heat - treatment condition in the view point of the electrical and mechanical properties is appeared for the sample heat - treated for 10 hours at $100^{\circ}C$, after curing for 24 hours at room temperature.

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Electrical Properties of the Epoxy Nano-composites according to Additive

  • Shin, Jong-Yeol;Park, Hee-Doo;Choi, Kwang-Jin;Lee, Kang-Won;Lee, Jong-Yong;Hong, Jin-Woong
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.3
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    • pp.97-101
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    • 2009
  • The use of a filler material in epoxy composite materials is an essential condition for reducing the unit cost of production and reinforcing mechanical strength. However, the dielectric strength of insulators decreases rapidly due to interactions between the epoxy resin and filler particles. In contrast to existing composite materials, nano-composite materials have superior dielectric strength, mechanical strength, and enduring chemical properties due to an increase in the bond strength of the polymer and nano material, It is reported that nano-fillers provide new characteristics different from the properties of the polymer material. This study is to improve the insulation capability of epoxy resins used in the insulation of a power transformer apparatus and many electronic devices mold. To accomplish this, the additional amount of nano-$SiO_2$ to epoxy resin was changed and the epoxy/$SiO_2$ nano composite materials were made, and the fundamental electrical properties were investigated using a physical properties and an analysis breakdown test. Using allowable breakdown probability, the optimum breakdown strength for designing an electrical apparatus was determined. The results found that the electrical characteristics of the nano-$SiO_2$ content specimens were superior to the virgin specimens. The 0.4 wt% specimens showed the highest electrical properties among the specimens examined with an allowable breakdown probability of 20 %, which indicates stable breakdown strength in insulating machinery design.