• Title/Summary/Keyword: Device Switching

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Effect of P-Base Region on the Transient Characteristics of 4H-SiC DMOSFETs (P형 우물 영역에 따른 4H-SiC DMOSFETs의 스위칭 특성 분석)

  • Kang, Min-Seok;Ahn, Jung-Jun;Sung, Bum-Sik;Jung, Ji-Hwan;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.352-352
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    • 2010
  • Silicon Carbide (SiC) power device possesses attractive features, such as high breakdown voltage, high-speed switching capability, and high temperature operation. In general, device design has a significant effect on the switching characteristics. In this paper, we report the effect of the P-base doping concentration ($N_{PBASE}$) on the transient characteristics of 4H-SiC DMOSFETs. By reducing $N_{PBASE}$, switching time also decreases, primarily due to the lowered channel resistance. It is found that improvement of switching speed in 4H-SiC DMOSFETs is essential to reduce the and channel resistance. Therefore, accurate modeling of the operating conditions are essential for the optimization of superior switching performance.

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A study of the effect of the temperature on the As Te Ge Si amorphous semiconductor (As Te Ge Si 무정형 반도체의 온도영향)

  • 박창엽
    • 전기의세계
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    • v.23 no.6
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    • pp.49-55
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    • 1974
  • Amorphous semiconductor from As 30 Te 48 Ge 10 Si 12 was prepared, and studied electron microscopy, X-ray analysis and resistivity measurement. It's resistivity is 1.56*10$^{6}$ .ohm.-cm when small ampule is used for preparing sample it is found that no phase separation has occurced by electron microscopy, and that phase transition temperature is 232.deg. C by differential Thermal Analysis. The specimen showed threshold switching that the low resistance state occur at critical electric field and the resistance recover at low applied field. Critical electric field of the switching is 10$^{5}$ V/cm at room temperature. Threshold voltage secreace exponentially with increasing ambient temperature and at that each voltage resistance of the switching device increase exponentially. According to the series resistance and applied vottage current slope on the V-I curve is varied. When applied voltage is decreased after switching, the resistance of the switching device is increased. By this result the origin of the switching is the Joule's heating.

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Study on changes in electrical and switching characteristics of NPT-IGBT devices by fast neutron irradiation

  • Hani Baek;Byung Gun Park;Chaeho Shin;Gwang Min Sun
    • Nuclear Engineering and Technology
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    • v.55 no.9
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    • pp.3334-3341
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    • 2023
  • We studied the irradiation effects of fast neutron generated by a 30 MeV cyclotron on the electrical and switching characteristics of NPT-IGBT devices. Fast neutron fluence ranges from 2.7 × 109 to 1.82 × 1013 n/cm2. Electrical characteristics of the IGBT device such as I-V, forward voltage drop and additionally switching characteristics of turn-on and -off were measured. As the neutron fluence increased, the device's threshold voltage decreased, the forward voltage drop increased significantly, and the turn-on and turn-off time became faster. In particular, the delay time of turn-on switching was improved by about 35% to a maximum of about 39.68 ns, and that of turn-off switching was also reduced by about 40%-84.89 ns, showing a faster switching.

Development of the Controlled Switching Device for a Cirrcuit Breaker

  • Kim, Ik-Mo;Kim, Myung-Chan;Choi, Young-Chan;Ryu, Sung-Sic;Kim, Dong-Hyun
    • 제어로봇시스템학회:학술대회논문집
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    • 2004.08a
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    • pp.558-560
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    • 2004
  • Studies on the controlled switching method have been done to prevent the power system surges which cause the insulation deterioration and electro magnetic compatibility (EMC) problems during closing and opening of a circuit breaker. The controlled switching method controls the closing and tripping time in coincidence with the voltage or current to suppress switching surge. It is used to switch condenser bank, no load transformer, and shunt reactor. In this study, basic concept of the controlled switching is introduced, and also the test is performed to find parameters of the controlled switching in a 24kV vacuum circuit. And then, the control device hardware using TMS320C31 DSP has been designed and manufactured. It has been found that the application of IT technology to a circuit breaker is very effective to depress the switching surge.

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The Study on the Characteristics of the Load Sharing in SRM with the Parallel Operation of Phase Winding (병렬권선 운전시 SRM의 부하분담 특성에 관한 연구)

  • Lee, Sang-Hun;Park, Sung-Jun;Choi, Cheol;Ahn, Jin-Woo;Kim, Cheul-U
    • The Transactions of the Korean Institute of Power Electronics
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    • v.8 no.1
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    • pp.30-39
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    • 2003
  • In SRM driving, the current rate is directly related to the rate of switching device and in cost reduction, the Parallel switching operation is the alternatives because it has the smaller current rate through current division. There ire many investigations for the parallel switching operations to equaling the current division. However it remains many problems for practical usage. The reason Is that the switching characteristics are mainly relied on the different saturation voltage of each device etc. and these factors are not altered by a circuit designer. In order to compensate this problem, a proper resistance is experimently inserted to the switching device. But this method can not be the optimal solution. Therefore this paper propose a new parallel operation of SRM which uses a parallel phase winding to remove the traditional effect of switching device such as saturation voltage according to the division of current. Also the reliable and stable driving is improved through experiments and the detailed principles.

A Study on the Auxiliary Power Supply for the Railway Vehicle by Using Wide Band Gap Device (Wide Band Gap 소자를 적용한 철도차량용 보조전원장치에 관한 연구)

  • Choi, Yeon-Woo;Lee, Byoung-Hee
    • The Transactions of the Korean Institute of Power Electronics
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    • v.23 no.3
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    • pp.168-173
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    • 2018
  • In this paper, an auxiliary power supply (APS) for railroad cars is proposed. The APS can reduce the number of devices required to supply power through structural modification and operates at a high switching frequency by application of a SiC device. The voltage stress on the device in the proposed circuit can be reduced to less than half of the input voltage of the system; thus, a device with low breakdown voltage can be designed. By adapting a SiC device instead of an IGBT device, the proposed circuit can reduce switching and conduction losses and operate at a high switching frequency, thereby reducing output voltage and inductor current ripples in the proposed circuit. The theoretical analysis results of the proposed APS are verified with a 40 kW computer-based simulation and a 2 kW experiment.

Bi-directional Two Terminal Switching Device based on SiGe for Spin Transfer Torque (STT) MRAM

  • Yang, Hyung-Jun;Kil, Gyu-Hyun;Lee, Sung-Hyun;Song, Yun-Heub
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.385-385
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    • 2012
  • A two terminal N+/P/N+ junction device to replace the conventional selective transistor was studied as a bilateral switching device for spin transfer torque (STT) MRAM based on 3D device simulation. An N+/P/N+ junction structure with $30{\times}30nm$ area requires bi-directional current flow enough to write a data by a drain induced barrier lowering (DIBL) under a reverse bias at N+/P (or P/N+ junction), and high current on/off ratio of 106. The SiGe materials are widely used in hetero-junction bipolar transistors, bipolar compensation metal-oxide semiconductors (BiCMOS) since the band gap of SiGe materials can be controlled by changing the fraction and the strain epilayers, and the drift mobility is increased with the increasing Ge content. In this work, N+/P/N+ SiGe material based junction provides that drive current is increased from 40 to $130{\mu}A$ by increased Ge content from 10~80%. When Ge content is about 20%, the drive current density of SiGe device substantially increased to 2~3 times better than Si-based junction device in case of 28 nm P length, which is sufficient current to operation of STT-MRAM.

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Device Suitability Analysis by Comparing Performance of SiC MOSFET and GaN Transistor in Induction Heating System (유도 가열 시스템에서 SiC MOSFET과 GaN Transistor의 성능 비교를 통한 소자 적합성 분석)

  • Cha, Kwang-Hyung;Ju, Chang-Tae;Min, Sung-Soo;Kim, Rae-Young
    • The Transactions of the Korean Institute of Power Electronics
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    • v.25 no.3
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    • pp.204-212
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    • 2020
  • In this study, device suitability analysis is performed by comparing the performance of SiC MOSFET and GaN Transistor, which are WBG power semiconductor devices in the induction heating (IH) system. WBG devices have the advantages of low conduction resistance, switching losses, and fast switching due to their excellent physical properties, which can achieve high output power and efficiency in IH systems. In this study, SiC and GaN are applied to a general half-bridge series resonant converter topology to compare the conduction loss, switching loss, reverse conduction loss, and thermal performance of the device in consideration of device characteristics and circuit conditions. On this basis, device suitability in the IH system is analyzed. A half-bridge series resonant converter prototype using the SiC and GaN of a 650-V rating is constructed to verify device suitability through performance comparison and verified through an experimental comparison of power loss and thermal performance.

A study on the switching character and loss of power semiconductor device (전력용 반도체 디바이스의 스위칭 특성과 손실에 관한 연구)

  • Kim, Yong-Ju;Han, Suk-Woo;Ma, Young-Ho;Kim, Han-Sung;Yu, Gwon-Jong
    • Proceedings of the KIEE Conference
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    • 1990.11a
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    • pp.263-266
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    • 1990
  • In order to high-respone and high-reliability of devices, it depended upon how we can increase the high-frequency of the Inverter, UPS and it's application. but using high-frequency of self turn-off devices, it is important to reduce switching device loss and spike voltage of turn off. This paper proposed new methode about computer simulation of device loss also experimental results with switching device characteristic are presented.

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Device Characteristics of MFSFET with the Fatigue of the Ferroelectric Thin Film (강유전박막의 피로현상을 고려한 MFSFET 소자의 특성)

  • 이국표;강성준;윤영섭
    • Proceedings of the IEEK Conference
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    • 1999.11a
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    • pp.191-194
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    • 1999
  • Switching behaviour of the ferroelectric thin film and device characteristics of the MFSFET (Metal-Ferroelectric-Semiconductor FET) are simulated with taking into account the accumulation of oxygen vacancies near interface between the ferroelectric thin film and the bottom electrode caused by the progress of fatigue. We show net switching current decreases due fatigue in the switching model. It indicates that oxygen vacancy strongly suppresses polarization reversal. The difference of saturation drain current of the device before fatigue is shown by the dual threshold voltages in I$_{D}$-V$_{D}$ curve as 6㎃/$\textrm{cm}^2$ and decreases as much as 50% after fatigue. Our simulation model is expected to play an important role in estimation of the behavior of MFSFET device with various ferroelectric thin films.lms.

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