• Nuclear Engineering and Technology
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• v.54 no.11
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• pp.4111-4124
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• 2022

The control rod drive system is critical to the reactor's reliable operation. The performance of its control system and mechanical system will gradually deteriorate because of operational and environmental stresses, thus increasing the reactor's operational risk. Currently there are few researches on the aging-related degradation of the entire control rod drive system. Because it is difficult to quantify the effect of various environmental stresses and establish an accurate physical model when multiple mechanisms superimposed in the degradation process. Therefore, this paper investigates the aging-related degradation of a control rod drive system by integrating Dynamic Object-Oriented Bayesian Network and Hidden Markov Model. Uncertainties in the degradation of the control system and mechanical system are addressed by using fuzzy theory and the Hidden Markov Model respectively. A system which consists of eight control rod drive mechanisms divided into two groups is used to demonstrate the method. The aging-related degradation of the control rod drive system is analyzed by the Bayesian inference algorithm based on the accelerated life test data, and the impact of different operating schemes on the system performance is also investigated. Meanwhile, the components or units that have major impact on the system's performance are identified at different operational phases. Finally, several essential safety measures are suggested to mitigate the risk caused by the system degradation.

• Journal of Korean Society for Quality Management
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• v.34 no.3
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• pp.19-30
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• 2006

For highly reliable products, it is difficult to assess the lifetime of the products with traditional life tests. Accordingly, a recent approach is to observe the performance degradation of product during the test rather than regular failure time. This study compares performances of three methods(i.e. the approximation, analytical and numerical methods) to estimate the parameters and quantiles of the lifetime when the time-to-failure distribution follows Weibull and lognormal distributions under a random coefficient degradation rate model. Numerical experiments are also conducted to investigate the effects of model error such as measurements in a random coefficient model.

• Steel and Composite Structures
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• v.19 no.5
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• pp.1055-1075
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• 2015

In order to investigate the accuracy and applicability of steel equivalent constitutive model, the calculated results were compared with typical tests of steel frames under static and dynamic loading patterns firstly. Secondly, four widely used models for time history analysis of steel frames were compared to discuss the applicability and efficiency of different methods, including shell element model, multi-scale model, equivalent constitutive model (ECM) and traditional beam element model (especially bilinear model). Four-story steel frame models of above-mentioned finite element methods were established. The structural deformation, failure modes and the computational efficiency of different models were compared. Finally, the equivalent constitutive model was applied in seismic incremental dynamic analysis of a ten-floor steel frame and compared with the cyclic hardening model without considering damage and degradation. Meanwhile, the effects of damage and degradation on the seismic performance of steel frame were discussed in depth. The analysis results showed that: damages would lead to larger deformations. Therefore, when the calculated results of steel structures subjected to rare earthquake without considering damage were close to the collapse limit, the actual story drift of structure might already exceed the limit, leading to a certain security risk. ECM could simulate the damage and degradation behaviors of steel structures more accurately, and improve the calculation accuracy of traditional beam element model with acceptable computational efficiency.

• Fibers and Polymers
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• v.2 no.2
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• pp.75-80
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• 2001

The thermal degradation of poly(ethylene terephthalate-co-isophthalate)s (PETIs) is investigated by using isothermal thermogravimetric analysis at the temperature range of 280-31$0^{\circ}C$. The degradation rate of PETIs is increased as the mole ratio of ethylene isophthaloyl (EI) units in PETIs increases. The activation energies for the thermal degradation of poly(ethylene terephthalate), PETI(5/5), and poly(ethylene isophthalate) are 33.4, 16.6, and 8.9 kcal/mole, respectively. The degradation rate of PETIs is influenced by their volatile cyclic oligomer components formed during the polymerization and the thermal degradation. It is simulated by the rotational isomeric state model that the content of cyclic dimer in PETIs, which is the most volatile cyclic oligomer component, increases with the EI units in PETIs.

• International Journal of Fuzzy Logic and Intelligent Systems
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• v.2 no.3
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• pp.191-193
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• 2002

Insulation aging diagnosis system provides early warning in regard to electrical equipment defects. Early warning is very important in that it can avoid great losses resulting from unexpected shutdown of the production line. For solving this problem, many researchers proposed a method that diagnose power plant by using partial discharge. In this paper, we design the intelligent sensor to diagnose insulation degradation state that uses a Microprocessor and Al. Proposed sensor has MCU that is used to diagnose insulation degradation and communicate with main IDD system. And we use a fuzzy model to diagnose insulation degradation.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.193-200
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• 2004

Determination of sample sizes and the inspection intervals for degradation tests is considered. The cases of degradation rate model and degradation path model are analyzed with some examples. Tightened critical value tests are also considered that are shown to be advantageous over non-tightened ones.

• Proceedings of the Korean Institute of Intelligent Systems Conference
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• 2002.12a
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• pp.158-161
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• 2002

Many methods were proposed for insulation degradation diagnosis to High voltage and capacity Transformer in live. IDD is difficult by those methods because insulation degradation circumstances and characteristics of electrical plant are different with other Therefore, it is necessary to design diagnosis algorithms fitting for each. In this paper, We develop IIDS that used diagnosis algorithm with fuzzy model and hardware with MCU.

• Proceedings of the Korean Vacuum Society Conference
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• 2015.08a
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• pp.120.1-120.1
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• 2015

We investigate the degradation pattern of Black phosphorus (BP) field effect transistor (FETs) investigated by using an mechanically exfoliated BP that react O2 and water vapor in ambient condition, degradation. The BP FETs was electrically measured every 20 minutes (1cycle) in the air, the total cycle is 100. We show electrical changes with Mobility, On/off ratio, Current and a significant positive shift in the threshold voltage. We extracted the current level at Vgs-Vth = 0, -10, -20 and fitting with Swiss-cheese model. This model suggested that Swiss-cheese model is well fitted with degradation pattern of BP FETs.

• Proceedings of the Korean Vacuum Society Conference
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• 2015.08a
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• pp.167.1-167.1
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• 2015

We investigate the degradation pattern of Black phosphorus (BP) field effect transistor (FETs) was investigated by using an mechanically exfoliated BP that react O2 and water vapor in ambient condition, degradation. The BP FETs was electrically measured every 20 minutes (1cycle) in the air, the total cycle is 100. We show electrical changes with Mobility, On/off ratio, Current and a significant positive shift in the threshold voltage. We extracted the current level at Vgs-Vth = 0, -10, -20 and fitting with Swiss-cheese model. This model suggested that Swiss-cheese model is well fitted with degradation pattern of BP FETs.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.11
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• pp.62-69
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• 1998

The general degradation model has been applied to analyze the hot carrier induced degradation of the DC and RF characteristics of RF-nMOSFET. The degradation of cut-off frequency has been severer than the degradation of bulk MOSFET drain current. The value of the degradation rate n and the degradation parameter m for RF-nMOSFET has been equal to those for bulk MOSFET. The decrease of device degradation with the increase of fingers could be explained by the large source/drain parasitic resistance and drain saturation voltage. It has been also found that the RF performance degradation could be explained by the decrease of $g_{m}$ and $C_{gd}$ and the increase of $g_{ds}$ after stress. The degradation of the DC and RF characteristics of RF-nMOSFET could be predicted by the measurement of the substrate current.t.