[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.5391/IJFIS.2002.2.3.191

Design of Intelligent Insulation Degradation Sensor

Kim, Yi-Gon (Dept. of Electrical and Semiconductor Engineering, Yosu National University)

Publication Information

International Journal of Fuzzy Logic and Intelligent Systems / v.2, no.3, 2002 , pp. 191-193 More about this Journal

Abstract

Insulation aging diagnosis system provides early warning in regard to electrical equipment defects. Early warning is very important in that it can avoid great losses resulting from unexpected shutdown of the production line. For solving this problem, many researchers proposed a method that diagnose power plant by using partial discharge. In this paper, we design the intelligent sensor to diagnose insulation degradation state that uses a Microprocessor and Al. Proposed sensor has MCU that is used to diagnose insulation degradation and communicate with main IDD system. And we use a fuzzy model to diagnose insulation degradation.

Keywords

Fuzzy Model; MCU; lIDS(Intelligent Insulation Degradation Sensor),IDDS(Insulation degradation diagnosis System); IDD(Insulation Degradation Diagnosis);

Citations & Related Records

Reference

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