• Management Science and Financial Engineering
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• v.13 no.2
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• pp.141-157
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• 2007

In this paper, we address a design problem and a case study of a K-stage back-light-unit(BLU) inspection system, which is composed of K stages, each of which includes an inspection process and a rework process. Assuming the type I, II errors and the inspection-free policy for items classified as good, we determine the smallest integer of K which can achieve a given target defective rate. If K does not exist, holding the current values of the type I, II errors, we search reversely the defective rate of an assembly line and the defective rate of a rework process, to meet the target defective rate. Our formulae and methodology based on a K-stage inspection system could be applied and extended to similar situations with slight modification.

• The Journal of the Korea institute of electronic communication sciences
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• v.6 no.4
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• pp.517-522
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• 2011

Conventional projection welding systems suffer from lots of defective products caused by manual handling. In this paper, we introduce a projection welding system that performs automatic identification, welding and counting of components and products. The proposed system checks the existence and identifies placement of components to be welded by a vision camera. After welding of the components, it automatically updates product counts and dressing items. We show that the proposed welding system can reduce the defect rate and improve the productivity through experimental test with a existing system.

• Journal of the Korean Society for Nondestructive Testing
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• v.21 no.6
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• pp.618-629
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• 2001

This paper presents a result of failure analysis and reliability evaluation for high voltage ceramic capacitors. The failure modes and failure mechanisms were studied in two ways in order to estimate component life and failure rate. The causes of failure mechanisms for zero resistance phenomena under withstanding voltage test in high voltage ceramic capacitors molded by epoxy resin were studied by establishing an effective root cause failure analysis. Particular emphasis was placed on breakdown phenomena at the ceramic-epoxy interface. The validity of the results in this study was confirmed by the results of accelerated testing. Thermal cycling test for high voltage ceramic capacitor mounted on a magnetron were implemented. Delamination between ceramic and epoxy, which might cause electrical short in underlying circuitry, can occur during curing or thermal cycle. The results can be conveniently used to quickly identify defective lots, determine $B_{10}$ life estimation each lot at the level of inspection, and detect major changes in the vendors processes. Also, the condition for dielectric breakdown was investigated for the estimation of failure rate with load-strength interference model.