• 한국세라믹학회지
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• 제44권12호
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• pp.660-682
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• 2007

An SOFC consists of all ceramic complex oxides each with different electrochemical-property requirements. These requirements, in principle, can be made met to a great extent by controlling or tailoring the defect structure of the oxide. This paper reviews the defect structure, nonstoichiometry as a measure of the total defect concentration, and the defect relaxation kinetics of complex oxides that are currently involved in a variety of growing applications today.

• 한국건축시공학회지
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• 제13권5호
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• pp.498-505
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• 2013

The main processes involved in a defect dispute are consulting, reviewing, and finally judging as an arbiter. This process of defect consulting produces a defect consulting report, but business practices and standards of judgment will differ among consultants, and have many problems. This study reviews the structure of a defect consulting report and considers the structure's problem, which is that it is not standardized. To achieve this, data of sixteen defect consulting report were collected involving defect lawsuit cases before or after 2010. The structure and index of the defect consulting reports were then reviewed, and the results are as follows. As for a structure based on fourteen index, there are suitable that judge a outline, a cost estimate data and a consulting work item by a consulting standard. Furthermore, analysis by each common parts and private parts is considered as appropriate about consulting items and estimate by standard. However, consulting item in construction progress and responsibility period for security that related on a cause and a responsibility of defect need to complement. Meanwhile, the first thing of issues are connected a defect consulting is urgent a standardization for a defect type.

• 한국건축시공학회:학술대회논문집
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• 한국건축시공학회 2013년도 춘계 학술논문 발표대회
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• pp.166-167
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• 2013

There has been a defect dispute of apartment building in Korea. The defect dispute is complicated by main issues and details of dispute. It is yet to be solved. Meanwhile, a judge does not a inspection and analysis, but, related field expert who contracted professional engineer does. As a result, defect consulting report that an important judgment is used in a defect dispute. Therefore, this study does research on structure of defect consulting report. A defect consulting report has same items, irrespective of a defect consultant as a result that check 7 indexes about 10 cases. It has different structure's details depending on each defect consultants. And, it inserts new detail or deletes existing detail, does not show clear distinction.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 1997년도 한국자동제어학술회의논문집; 한국전력공사 서울연수원; 17-18 Oct. 1997
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• pp.365-370
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• 1997

In this paper we suggest a development of surface defect inspection algorithms for cold mill strip using tree structure. The defects which exist in a surface of cold mill strip have a scattering or singular distribution. This paper consists of preprocessing, feature extraction and defect classification. By preprocessing, the binarized defect image is achieved. In this procedure, Top-hit transform, adaptive thresholding, thinning and noise rejection are used. Especially, Top-hit transform using local min/max operation diminishes the effect of bad lighting. In feature extraction, geometric, moment, co-occurrence matrix, histogram-ratio features are calculated. The histogram-ratio feature is taken from the gray-level image. For the defect classification, we suggest a tree structure of which nodes are multilayer neural network clasifiers. The proposed algorithm reduced error rate comparing to one stage structure.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.128.1-128.1
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• 2016

Nitrided-metal gates on the high-${\kappa}$ dielectric material are widely studied because of their use for sub-20nm semiconductor devices and the academic interest for the evanescent states at the Si/insulator interface. Issues in these systems with the Si substrate are the electron mobility degradation and the reliability problems caused from N defects that permeates between the Si and the $SiO_2$ buffer layer interface from the nitrided-gate during the gate deposition process. Previous studies proposed the N defect structures with the gap states at the Si band gap region. However, recent experimental data shows the possibility of the most stable structure without any N defect state between the bulk Si valence band maximum (VBM) and conduction band minimum (CBM). In this talk, we present a new type of the N defect structure and the electronic structure of the proposed structure by using the first-principles calculation. We find that the pair structure of N atoms at the $Si/SiO_2$ interface has the lowest energy among the structures considered. In the electronic structure, the N pair changes the eigenvalue of the silicon-induced gap state (SIGS) that is spatially localized at the interface and energetically located just above the bulk VBM. With increase of the number of N defects, the SIGS gradually disappears in the bulk Si gap region, as a result, the system gap is increased by the N defect. We find that the SIGS shift with the N defect mainly originates from the change of the kinetic energy part of the eigenstate by the reduction of the SIGS modulation for the incorporated N defect.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.88-89
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• 2009

In this paper, we investigated about wet cleaning effect as deep trench formation methods for Power chip devices. Deep trench structure was classified by two methods, PSU (Poly Stick Up) and Non-PSU structure. In this paper, we could remove residue defect during wet. cleaning after deep trench etch process for non-PSU structure device as to change wet cleaning process condition. V-SEM result showed void image at the trench bottom site due to residue defect and residue component was oxide by EDS analysis. In order to find the reason of happening residue defect, we experimented about various process conditions. So, defect source was that oxide film was re-deposited at trench bottom by changed to hydrophobic property at substrate during hard mask removal process. Therefore, in order to removal residue defect, we added in-situ SCI during hard mask removal process, and defect was removed perfectly. And WLR (Wafer Level Reliability) test result was no difference between normal and optimized process condition.

• 한국결정학회지
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• 제11권3호
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• pp.176-181
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• 2000

Computer-based atomistic simulation methods are applied to address quantitatively the crystal defect chemistry of strontium hexaaluminate, SrAl/sub 12/O/sub 19/. Our calculations show that oxygen Frenkel disorder is the dominant intrinsic defect mode to be expected in the multi-component oxide, though Schottky disorder may also exist. When La and Mg enter into SrAl/sub 12/O/sub 19/. Mg prefers to occupy Al(3)4f tetrahedral sites in the magnetoplumbite structure. Our calculations also indicate that O/sub Sr/ defect is improbable in the structure.

• 한국생산제조학회지
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• 제6권1호
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• pp.45-50
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• 1997

It is not clearly known how surface defects or inclusions of a medium carbon steel affect a fatigue strength. In this study, we used SM35C specimens with spheroidized cementite structure to eliminate dependence of micro structure of fatigue crack. The investigation was carried out by behavior of crack closure at non-propagation crack and effect of the fatigue limit according to the artificial defects size. Experimental findings are obtained as follows : (1) Fatigue crack initiation point of medium carbon steel with spheroidized cementite structure is at the surface defects. (2) Non-propagating crack length of smooth specimen is equal to the critical size of defect. (3) Considering the opening and closure behavior of fatigue crack, the defect shape results in various crack opening displacement, while it does not affects the fatigue limit level of medium carbon steel with spheroidized cementite structure. (4) The critical length of the non-propagation crack of smooth specimen is the same as critical size of defect in transient area which determines threshold condition in steel with spheroidized cementite structure.

• 한국압력기기공학회 논문집
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• 제16권2호
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• pp.1-9
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• 2020

Large-scale industrial facility structures continue to deteriorate due to the effects of operating and environmental conditions. The problems of these industrial facilities are potentially causing economic losses, environmental pollution, casualties, and national losses. Accordingly, in order to prevent disaster accidents of large structures in advance, the necessity of diagnosing structures using non-destructive inspection techniques is being highlighted. The defect occurrence, location and defect type of the structure are important parameters for predicting the remaining life of the structure, so continuous defect observation is very important. Recently, many researchers have been actively researching real-time monitoring technology to solve these problems. Structure Health Monitoring Inspection is a technology that can identify and respond to the occurrence of defects in real time, but there is a limit to check the degree of defects and the direction of growth of defects. In order to compensate for the shortcomings of these technologies, the importance of defect imaging techniques is emerging, and in order to find defects in large structures, a method of inspecting a wide range using guided ultrasonic is effective. The work presented here introduces a calculation for the shape factor for evaluation of the damaged area, as well as a variable β parameter technique to correct a damaged shape. Also, we perform research in modeling simulation and an experiment for comparison with a suggested inspection method and verify its validity. The curved structure image obtained by the advanced RAPID algorithm showed a good match between the defect area and the shape.

• 조명전기설비학회논문지
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• 제24권1호
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• pp.63-70
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• 2010

본 논문에서는 원자력발전소 증기세관 크기 예측을 위한 신경회로망 구조에 대해서 연구한다. 와류탐상 시험(ECT) 신호로부터 특징을 추출한 후, 결함크기 예측을 위해서 다층퍼셉트론 신경회로망을 이용한다. 결함크기 예측성능을 최대화하기 위해서는 신경회로망의 구조, 특히 은닉층 내의 뉴런의 개수를 신중히 결정하여야 한다. 본 논문에서는, 결함크기 예측을 위한 은닉층 내의 뉴런의 개수를 교차검증을 이용하여 매우 효과적으로 결정할 수 있음을 보인다.