• Journal of the Korea Institute of Building Construction
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• v.20 no.6
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• pp.567-576
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• 2020

This study proposes additional items to be recognized as defects in a defect lawsuit through a case analysis of lawsuit cases in apartment housing. Identifying these defects prevents an unexpected increase in litigation costs, delays in the date of litigation, and emotion repercussions or additional lawsuits. In this study, the defects that were not discovered by the existing occupants and construction companies, but were newly discovered in litigation, were defined as defects in lawsuits. Fifteen cases of lawsuits were analyzed and a total of 77 defects were derived. Each item was then reviewed for location, work type, number of occurrences, and cost. The results were yielded 23 defect items, which were validated by appraisers who directly appraised the cases. In addition, the derived defect factors were analyzed. Finally, the 23 defect items were categorized into 10 main factors which include attributes such as causes of occurrence and characteristics. This can provide an overall area of defects to be considered in addition to existing defect items in the life cycle of the housing. The results of this study can contribute to reducing the actual occurrence of defects and minimizing the disputes in the case of defect lawsuits.

• Journal of Korean Society of Water and Wastewater
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• v.31 no.1
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• pp.21-28
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• 2017

This study was performed to propose the sewer defect scoring, and grading protocols for sewer condition assessment. For this, sewer defect scoring methods were comparatively analyzed and reviewed for four international condition assessment protocols, which are established based on WRc manual. As a result, we proposed a new protocol for sewer condition assessment, in which characteristics of sewer pipes are considered by segment. In reference to the PIM-3, the extent of ground subsidence was adopted to be of importance, and renewal scores increased in accordance with weighting of defects causing structural backfill materials. Also, defect grades of 'Hole' were extended to 5 levels of the grading, and 'Surface Damage' was excluded in defect assessment. The addition of 'Buckling' resulted in reduction of weights in 'Surface Damage' and 'Lining Defects'.

• 한국IT서비스학회:학술대회논문집
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• 2003.11a
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• pp.713-721
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• 2003

The time to market and productivity of embedded system needs a quality measurement process management of embedded software. But, defect management without preemptive analysis or prediction is not useful for quality measurement process management. This subject is focused on the defect that is one of the most important attributes of software measure in the process. Defining of defect attribute and quality measurement process management is according to understanding of embedded sw characteristics and defect data. So, this study contributes to propose the good method of the quantitative based on defect management in the test phase of sw lifecycle.

• Proceedings of the KIEE Conference
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• 1999.07e
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• pp.2411-2413
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• 1999

Regarding the application of diagnistic technology using PD signal to power apparatus, it is necessary to discriminate the type of defect as well as to determine whether the PD occurs or not. In this research, PD characteristics of multi-defects insulating system were presented, the PD signals were detected from three kinds of electrode systems, IEC(b), needle-plane and CIGRE method II. To make multi-defect systems artificially, we combined three electrode systems and applied same test voltage simultaneously.

• Transactions on Electrical and Electronic Materials
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• v.3 no.3
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• pp.18-20
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• 2002

In sub-l/4 ${\mu}{\textrm}{m}$ NMOSFET with STI (Shallow Trench Isolation), the anomalous hump phenomenon of subthreshold region, due to capped p-TEOS/SiN induced defect, is reported. The hump effect was significantly observed as channel length is reduced, which is completely different from previous reports. Channel boron dopant redistribution due to the defect should be considered to improve hump characteristics besides considerations of STI comer and recess. 130

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.10a
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• pp.529-530
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• 2009

• Journal of Electrical Engineering and Technology
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• v.10 no.1
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• pp.344-354
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• 2015

In order to study the development of partial discharge (PD) under typical protrusion defects in gas-insulated switchgear, we applied step voltages on the defect and obtained the ${\varphi}-u$ and ${\varphi}-n$ spectrograms of ultra-high frequency (UHF) PD signals in various PD stages. Furthermore, we extracted seven kinds of features to characterize the degree of deterioration of insulation and analyzed their values, variation trends, and change rates. These characteristics were inconsistent with the development of PD. Hence, the differences of these features could describe the severity of PD. In addition, these characteristics could provide integrated characteristics regarding PD development and improve the reliability of PD severity assessment because these characteristics were extracted from different angles. To explain the variation laws of these seven kinds of parameters, we analyzed the relevant physical mechanism by considering the microphysical process of PD formation and development as well as the distortion effect generated by the space charges on the initial field. The relevant physical mechanism effectively allocated PD severity among these features for assessment, and the effectiveness and reliability of using these features to assess PD severity were proved by testing a large number of PD samples.

• Journal of Ocean Engineering and Technology
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• v.28 no.4
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• pp.268-273
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• 2014

To investigate the turbulence characteristics within the boundary layer over a flat plate, an experimental study was performed using a PIV technique in a circular water channel. For two water velocities, 0.92 and 1.99 m/s, the water velocity profiles were taken and analyzed to determine turbulent characteristics such as the Reynolds stress, Taylor micro-length scale, and Kolmogorov length scale within the defect law region of the boundary layer. These analysis methods may be applied to research on the friction drag reduction technology using micro-bubbles or an air sheet over the surface of a ship's hull, because the physical reason for the friction drag reduction could be found by understanding the variation of the turbulence characteristics and structures in the boundary layer.

• Proceedings of the KWS Conference
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• 1995.10a
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• pp.214-217
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• 1995

In order to investigate characteristics of surface fatigue crack propagation from a pit shaped surface defect which frequently exists near weld joints, SS400 steel with thickness of 12mm, which generally used for structure members, was submerged-arc welded with butt type and machined for both surface. The weld joints were devided into 5 regions, weld metal, boundary between heat affected zone (HAZ), HAZ, boundary between HAZ and base metal, and base metal. Specimens from each region were machined for a pit shaped initial surface defect with aspect ratio of 2. characteristics of surface fatigue crack por pagation from the defect under the same loading condition were compared and discussed.

• Vacuum Magazine
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• v.1 no.3
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• pp.21-27
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• 2014

Advanced process and integration for future semiconductor devices is approaching the physical limit. The new materials with low dimensional structure have recently attracted great attention due to its expandability for the future electronic devices. In order to apply the materials to future semiconductor devices, the control of carrier scattering is critical issue. That is, the carrier scattering with physical quantity in low dimensional structure significantly modulates the device characteristics. We introduce the role of defect in several future semiconductor materials and devices. The analysis of defect in the structure becomes the most important techniques. In particular, surface defect in nano structures totally controls the device characteristics. The changes imply that the metrology field is leading the future industry for semiconductor.