• Title/Summary/Keyword: Defect State

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주조공정 설비에 대한 실시간 모니터링을 통한 불량예측에 대한 연구 (A Study on Defect Prediction through Real-time Monitoring of Die-Casting Process Equipment)

  • 박철순;김흥섭
    • 산업경영시스템학회지
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    • 제45권4호
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    • pp.157-166
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    • 2022
  • In the case of a die-casting process, defects that are difficult to confirm by visual inspection, such as shrinkage bubbles, may occur due to an error in maintaining a vacuum state. Since these casting defects are discovered during post-processing operations such as heat treatment or finishing work, they cannot be taken in advance at the casting time, which can cause a large number of defects. In this study, we propose an approach that can predict the occurrence of casting defects by defect type using machine learning technology based on casting parameter data collected from equipment in the die casting process in real time. Die-casting parameter data can basically be collected through the casting equipment controller. In order to perform classification analysis for predicting defects by defect type, labeling of casting parameters must be performed. In this study, first, the defective data set is separated by performing the primary clustering based on the total defect rate obtained during the post-processing. Second, the secondary cluster analysis is performed using the defect rate by type for the separated defect data set, and the labeling task is performed by defect type using the cluster analysis result. Finally, a classification learning model is created by collecting the entire labeled data set, and a real-time monitoring system for defect prediction using LabView and Python was implemented. When a defect is predicted, notification is performed so that the operator can cope with it, such as displaying on the monitoring screen and alarm notification.

The Oxygen Potential of Urania Nuclear Fuel During Irradiation

  • Park, Kwang-Heon
    • The Korean Journal of Ceramics
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    • 제4권2호
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    • pp.72-77
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    • 1998
  • A defect model for UO$_2$ fuel containing soluble fission products was devised based on the defect structure of pure and doped uranias. Using the equilibrium between fuel solid-solution and fission-products and the material balance within the fuel, a tracing method to get the stoichiometry change of urania fuel with burnup was made. This tracing method was applied to high burnup urania fuel and DUPIC fuel. The oxygen potential of urania fuel turned out to increase slightly with burnup. The stoichiometry change was calculated to be negligible due to the buffering role f Mo. The oxygen potential of DUPIC fuel out to be sensitive to the initial chemical state of Mo in the fuel.

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InSe 단일층의 vacancy 결함 특성 연구

  • 이서윤
    • EDISON SW 활용 경진대회 논문집
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    • 제6회(2017년)
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    • pp.468-472
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    • 2017
  • 2차원 InSe 단일층에 존재할 수 있는 vacancy defect인 In vacancy, Se vacancy의 원자구조 및 전자구조 특성을 제일원리계산을 이용해 살펴보았다. InSe $5{\times}5$ supercell을 이용하였으며 total energy를 구해 어떤 구조가 가장 안정한지 찾았다. Relax된 결함구조들을 clean InSe와 비교하여 어떤 변화가 있었는지 특징을 분석하였다. 이러한 intrinsic 결함들이 각각 어떤 구조로 relaxation되는지 살펴보고 clean InSe와 비교해보았다. 또한 각 결함구조의 density of states (DOS), projected density of states (PDOS)와 band structure를 clean InSe와 비교해봄으로써 defect state가 어떻게 나타나는지를 찾아보았다.

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단결정 실리콘 잉곳 결정성장 속도에 따른 고-액 경계면 형성 및 Defect 최적화 (Melt-Crystal Interface Shape Formation by Crystal Growth Rate and Defect Optimization in Single Crystal Silicon Ingot)

  • 전혜준;박주홍;블라디미르 아르테미예프;정재학
    • Current Photovoltaic Research
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    • 제8권1호
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    • pp.17-26
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    • 2020
  • It is clear that monocrystalline Silicon (Si) ingots are the key raw material for semiconductors devices. In the present industries markets, most of monocrystalline Silicon (Si) ingots are made by Czochralski Process due to their advantages with low production cost and the big crystal diameters in comparison with other manufacturing process such as Float-Zone technique. However, the disadvantage of Czochralski Process is the presence of impurities such as oxygen or carbon from the quartz and graphite crucible which later will resulted in defects and then lowering the efficiency of Si wafer. The heat transfer plays an important role in the formation of Si ingots. However, the heat transfer generates convection in Si molten state which induces the defects in Si crystal. In this study, a crystal growth simulation software was used to optimize the Si crystal growth process. The furnace and system design were modified. The results showed the melt-crystal interface shape can affect the Si crystal growth rate and defect points. In this study, the defect points and desired interface shape were controlled by specific crystal growth rate condition.

Partial Conductivities, Nonstoichiometry and Defect Structure of a New Cathode Candidate $Y_{1-x}Ca_xFeO_{3-\delta}$

  • Kim, Chan-Soo;Yoo, Han-Ill
    • The Korean Journal of Ceramics
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    • 제4권2호
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    • pp.151-155
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    • 1998
  • The total electrical conductivity, ionic conductivity, and nonstoichimetry of a new cathode material $Y_{1-x}Ca_xFeO_{3-\delta}$ (x=0.1) were measured as functions of temperature ($900\leqT/^{\circ}C\leq1100$) and oxygen partial pressure $(10^{-6}\leqPo_2/atm\leq0.21$). Isothermal variations of these properties with $Po_2$ support that the majority type of ionic defects are anti-Frenkel disorder which, however, has seldom been considered for perovskite-based oxides. The results are discussed in comparison with those reported on similar oxides.

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국내 철도차량 감속기 진동특성분석 (Vibration Characteristics Analysis of Reduction Unit for Railway Vehicles)

  • 지해영;김재철;이동형;문경호;이강호
    • 한국소음진동공학회:학술대회논문집
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    • 한국소음진동공학회 2012년도 추계학술대회 논문집
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    • pp.169-174
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    • 2012
  • Reduction unit is one of the most important components for railway vehicle because torque of motor must be transmitted to wheels of vehicle by reduction unit. However, According to advanced studies, it has been often broke down due to the damage, fatigue and wear of gear. To solve this problem, defect diagnosis methods of gear have been mainly using the vibration diagnosis technology through vibration waveform and frequency analysis. However, We should know vibration characteristics of normal state reduction unit prior to defect diagnosis. So in this paper, We had analyzed vibration characteristics of reduction unit in order to utilize monitoring system development. Comparison of targets is the vibration characteristics of normal state reduction unit about Electric Multiple Unit(EMU) and the High-speed trains(KTX, KTX II).

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Cr을 첨가한 ZnO의 결함과 입계 특성 (Defects and Grain Boundary Properties of Cr-doped ZnO)

  • 홍연우;신효순;여동훈;김종희;김진호
    • 한국전기전자재료학회논문지
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    • 제22권11호
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    • pp.949-955
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    • 2009
  • In this study, we investigated the effects of Cr dopant (1.0 at% $Cr_2O_3$ sintered at $1000^{\circ}C$ for 1 h in air) on the bulk trap (i.e. defect) and interface state levels of ZnO using dielectric functions ($Z^*$, $M^*$, $Y^*$, $\varepsilon^*$, and $tan{\delta}$), admittance spectroscopy (AS), and impedance-modulus spectroscopy (IS & MS). For the identification of the bulk trap levels, we examine the zero-biased admittance spectroscopy and dielectric functions as a function of frequency and temperature. Impedance and electric modulus spectroscopy is a powerful technique to characterize grain boundaries of electronic ceramic materials as well. As a result, three kinds of bulk defect trap levels were found below the conduction band edge of ZnO in 1.0 at% Cr-doped ZnO (Cr-ZnO) as 0.11 eV, 0.21 eV, and 0.31 eV. The overlapped defect levels ($Zn^{..}_i$ and $V^{\cdot}_0$) in admittance spectra were successfully separated by the combination of dielectric function such as $M^*$, $\varepsilon^*$, and $tan{\delta}$. In Cr-ZnO, the interfacial state level was about 1.17 eV by IS and MS. Also we measured the resistance ($R_{gb}$) and capacitance ($C_{gb}$) of grain boundaries with temperature using impedance-modulus spectroscopy. It have discussed about the stability and homogeneity of grain boundaries using distribution parameter ($\alpha$) simulated with the Z"-logf plots with temperature.

플래시 메모리 상에서 불량률 개선 및 수명 연장을 위한 효율적인 단일 비트 셀 전환 기법 (An Efficient SLC Transition Method for Improving Defect Rate and Longer Lifetime on Flash Memory)

  • 이현섭
    • 사물인터넷융복합논문지
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    • 제9권3호
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    • pp.81-86
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    • 2023
  • 플래시 메모리 기반 저장장치인 SSD(solid state disk)는 높은 집적도와 빠른 데이터 처리가 가능한 장점을 가지고 있다. 따라서 급격하게 증가하고 있는 빅데이터를 관리하는 고용량 데이터 저장 시스템의 저장장치로 활용되고 있다. 그러나 저장 미디어인 플래시 메모리에 일정 횟수 이상 반복해서 쓰기/지우기 동작을 반복하면 셀이 마모되어 사용하지 못하는 물리적 한계가 있다. 본 논문에서는 플래시 메모리의 불량률을 줄이고 수명을 연장하기 위해 불량이 발생한 다중 비트 셀을 단일 비트 셀로 변환하여 사용하는 방법을 제안한다. 제안하는 아이디어는 물리적 특징이 다르지만 동일하게 불량으로 처리되고 있는 다중 비트 셀과 단일 비트 셀의 불량 및 처리 방법을 구분하였다. 그리고 불량이 예상되는 다중 비트 셀을 단일 비트 셀로 변환하여 불량률을 개선하고 전체적인 수명을 연장하였다. 마지막으로 시뮬레이션을 통해 SSD의 증가한 수명을 측정하여 제안하는 아이디어의 효과를 증명하였다.

Part tolerancing through multicale defect analysis

  • Petitcuenot, Mathieu;Anselmetti, Bernard
    • International Journal of Aeronautical and Space Sciences
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    • 제17권1호
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    • pp.109-119
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    • 2016
  • When manufactured parts undergo large deformations during the manufacturing process, the global specifications of a part based on the concept of tolerance zone defined in the ISO 1101 standard [1] enable one to control the part's global defects. However, the extent of this tolerance zone is too large when the objective is to minimize local defects, such as hollows and bumps. Therefore, it is necessary to address local defects and global defects separately. This paper refers to the ISO 10579 standard [2] for flexible parts, which enables us to define a stressed state in order to measure the part by straightening it to simulate its position in the mechanism. The originality of this approach is that the straightening operation is performed numerically by calculating the displacement of a cloud of points. The results lead to a quantification of the global defects through various simple models and enable us to extract local defects. The outcome is an acceptable tolerance solution. The procedure is first developed for the simple example of a steel bar with a rectangular cross section, then applied to an industrial case involving a complex 3D surface of a turbine blade. The specification is described through ISO standards both in the free state and in the straightened state.

Structural characteristics and electronic properties of GaN with $N_V,\;O_N,\;and\;N_V-O_N$: first-principles calculations

  • Lee, Sung-Ho;Chung, Yong-Chae
    • 한국결정성장학회지
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    • 제17권5호
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    • pp.192-195
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    • 2007
  • Structural and electronic properties of bulk GaN with nitrogen vacancy($V_N$), oxygen substitution on nitrogen site($O_N$), and complex of nitrogen vacancy and oxygen substitution on nitrogen site($V_N-O_N$) were investigated using the first principle calculations. It was found that stability of defect formation is dependent on the epilayer growth conditions. The complex of $V_N-O_N$ is energetically the most favorable state in a condition of Ga-rich, however, oxygen substitution in nitrogen site is the most favorable state in N-rich condition. The electronic property of complex with negative charge states at $\Gamma$ point was changed from semiconductor to metal. On the contrary, the properties of nitrogen vacancy except for neutral charge state have shown the semiconductor characteristics at $\Gamma$ point. In the oxygen substitution on nitrogen site, the energy differences between conduction band minimum and Fermi level were smaller than that of defect-free GaN.