• Journal of the Korea Society of Computer and Information
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• v.23 no.9
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• pp.81-86
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• 2018

Software defect severity is very important in projects with limited historical data or new projects. But general software defect prediction is very difficult to collect the label information of the training set and cross-project defect prediction must have a lot of data. In this paper, an unclassified data set with defect severity is clustered according to the distribution ratio. And defect severity-based prediction model is proposed by way of labeling. Proposed model is applied CLAMI in JM1, PC4 with the least ambiguity of defect severity-based NASA dataset. And it is evaluated the value of ACC compared to original data. In this study experiment result, proposed model is improved JM1 0.15 (15%), PC4 0.12(12%) than existing defect severity-based prediction models.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.27 no.2
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• pp.10-16
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• 2004

Data mining technique is the exploration and analysis, by automatic or semiautomatic means, of large quantities of data in order to discover meaningful patterns and rules. This paper uses a data mining technique for the prediction of defect types in manufacturing Process. The Purpose of this Paper is to model the recognition of defect type Patterns and Prediction of each defect type before it occurs in manufacturing process. The proposed model consists of data handling, defect type analysis, and defect type prediction stages. The performance measurement shows that it is higher in prediction accuracy than logistic regression model.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.15 no.11
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• pp.4028-4042
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• 2021

Aiming at the problem of software defect prediction difficulty caused by insufficient software defect marker samples and unbalanced classification, a semi-supervised software defect prediction model based on a tri-training algorithm was proposed by combining feature normalization, over-sampling technology, and a Tri-training algorithm. First, the feature normalization method is used to smooth the feature data to eliminate the influence of too large or too small feature values on the model's classification performance. Secondly, the oversampling method is used to expand and sample the data, which solves the unbalanced classification of labelled samples. Finally, the Tri-training algorithm performs machine learning on the training samples and establishes a defect prediction model. The novelty of this model is that it can effectively combine feature normalization, oversampling techniques, and the Tri-training algorithm to solve both the under-labelled sample and class imbalance problems. Simulation experiments using the NASA software defect prediction dataset show that the proposed method outperforms four existing supervised and semi-supervised learning in terms of Precision, Recall, and F-Measure values.

• Journal of the Semiconductor & Display Technology
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• v.19 no.2
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• pp.26-30
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• 2020

In this paper, we studied the problem if the experiment number occurring in order to identify defect in scaffold. We need to change each of the 5 print factor to predict defect when printing disk type scaffold using FDM 3d printer. So then the number of scaffold print will be more than 100,000 times. This experiment number is difficult to perform in the field. In order to solve this problem, we have produced a prediction model based on machine learning multiple linear regression using print conditions and defect scaffold data for print conditions. The prediction model produced was verified through experiments. The verification confirmed that the error was less than 0.5 %. We have confirmed that satisfied within the target margin of error 5 %.

• Journal of the Semiconductor & Display Technology
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• v.19 no.4
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• pp.59-64
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• 2020

In this paper, we found the solution using data based machine learning regression method to check the pore shape, to solve the problem of the experiment quantity occurring when producing scaffold with the 3d printer. Through experiments, we learned secured each print condition and pore shape. We have produced the scaffold from scaffold pore shape defect prediction model using multiple linear regression method. We predicted scaffold pore shapes of unsecured print condition using the manufactured scaffold pore shape defect prediction model. We randomly selected 20 print conditions from various predicted print conditions. We print scaffold five times under same print condition. We measured the pore shape of scaffold. We compared printed average pore shape with predicted pore shape. We have confirmed the prediction model precision is 99 %.

• The Transactions of the Korea Information Processing Society
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• v.13 no.5
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• pp.236-242
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• 2024

Software Defect Prediction (SDP) enhances the efficiency of software development by proactively identifying modules likely to contain errors. A major challenge in SDP is improving prediction performance. Recent research has applied deep learning techniques to the field of SDP, with the SAINT model particularly gaining attention for its outstanding performance in analyzing structured data. This study compares the SAINT model with other leading models (XGBoost, Random Forest, CatBoost) and investigates the latest deep learning techniques applicable to SDP. SAINT consistently demonstrated superior performance, proving effective in improving defect prediction accuracy. These findings highlight the potential of the SAINT model to advance defect prediction methodologies in practical software development scenarios, and were achieved through a rigorous methodology including cross-validation, feature scaling, and comparative analysis.

• Journal of KIISE:Computing Practices and Letters
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• v.15 no.12
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• pp.943-947
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• 2009

To support an efficient management of software verification and validation activities, many defect prediction models have been proposed based on object oriented metrics. In order to apply defect prediction models, we need to determine a threshold value. Because we cannot know actually where defects are, it is difficult to determine threshold. Therefore, we performed a series of experiments to explore the issue of determining a threshold. In the experiments, we applied defect prediction models to other systems different from the system used in building the prediction model. Specifically, we have applied three models - Olague model, Zhou model, and Gyimothy model - to four different systems. As a result, we found that the prediction capabilities varied considerably with a chosen threshold value. Therefore, we need to perform a study on the determination of an appropriate threshold value to improve the applicably of defect prediction models.

• Journal of Korean Institute of Industrial Engineers
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• v.21 no.3
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• pp.371-385
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• 1995

The yield of semiconductor chips is dependent not only on the average defect density but also on the distribution of defects over a wafer. The distribution of defects leads to consider a cluster index. This paper briefly reviews the existing yield prediction models ad proposes a new cluster index, which utilizes the information about the defect location on a wafer in terms of the coefficient of variation. An extensive simulation is performed under a variety of defect distributions and a yield prediction model is derived through the regression analysis to relate the yield with the proposed cluster index and the average number of defects per chip. The performance of the proposed simulation-based yield prediction model is compared with that of the well-known negative binomial model.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2009.05a
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• pp.94-97
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• 2009

Cast defect in large steel ingots are estimated in quality and compared each other cast conditions on simulation results by now. The cast defects, micro-crack, shrinkage, pin hole which are predictable in simulation with a reasonable accuracy. In this study, 15 ton steel ingot casting was simulated for solidification model and cast defect prediction. And the real cast was carried out in a foundry for the compeer to the simulation results, the cast defect prediction. Also, the quantity of predicted defect was tried to measuring with the defect mach counting for the various simulated cast conditions. The defect quantity work was used to find the optimized cast condition in DOE(design of experiment) procedure.

• Proceedings of the Korean Institute of Building Construction Conference
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• 2022.11a
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• pp.223-224
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• 2022

The occurrence of defect, one of the major risk elements, gives rise to construction delays and additional costs. Although construction companies generally prefer to use a method of identifying and classifying the causes of defects, a system for predicting the rise of defects becomes important matter to reduce this harmful issue. However, the currently used methods are kinds of reactive systems that are focused on the defects which occurred already, and there are few studies on the occurrence of defects with prediction systems. This paper is about preliminary study on the development of judgemental algorithm that informs us whether additional works related to defect issue are needed or not. Among machine learning techniques, deep neural network was utilized as prediction model which is a major component of algorithm. It is the most suitable model to be applied to the algorithm when there are 8 hidden layers and the average number of nodes in each hidden layer is 70. Ultimately, the algorithm can identify and defects that may arise in later and contribute to minimize defect frequency.