Study of the Reliability Characteristics of the ONON(oxide-nitride-oxide-nitride) Inter-Poly Dielectrics in the Flash EEPROM cells (플래시 EEPROM 셀에서 ONON(oxide-nitride-oxide-nitride) Inter-Poly 유전체막의 신뢰성 연구)
-
- Journal of the Korean Institute of Telematics and Electronics D
- /
- v.36D no.10
- /
- pp.17-22
- /
- 1999