• Journal of Sensor Science and Technology
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• v.21 no.1
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• pp.1-6
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• 2012

Using a current-mode multiple reset, a current-to-voltage(I-V) converter with a wide dynamic range was produced. The converter consists of a trans-impedance amplifier(TIA), an analog-to-digital converter(ADC), and an N-bit counter. The digital output of the I-V converter is composed of higher N bits and lower bits, obtained from the N-bit counter and the ADC, respectively. For an input current that has departed from the linear region of the TIA, the counter increases its digital output, this determines a reset current which is subtracted from the input current of the I-V converter. This current-mode reset is repeated until the input current of the TIA lies in the linear region. This I-V converter is realized using 0.35 ${\mu}m$ LSI technology. It is shown that the proposed I-V converter can increase the maximum input current by a factor of $2^N$ and widen the dynamic range by $6^N$. Additionally, the I-V converter is successfully applied to a photometric sensor.

• Current Optics and Photonics
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• v.4 no.5
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• pp.405-410
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• 2020

A new all-optical flip-flop (AOFF) method based on the absorption nulls of an injection-locked Fabry-Perot laser diode (FP-LD) in transverse magnetic (TM) mode is proposed and experimentally demonstrated. For the set and reset operations of the AOFF, injection locking and the destructive minus of beating in transverse electric (TE) mode are used. The absorption nulls on the TM mode are modulated according to the operations, and then non-inverted (Q) and inverted (${\bar{Q}}$) outputs can be obtained simultaneously. Thanks to the use of several absorption nulls, the proposed AOFF can achieve multiple outputs with extinction ratios of more than 15 dB. Even though the experiment is demonstrated at 100 Mbit/s, the results of previous experiments using the injection of a CW holding beam imply that the operation speed can increase to 10 Gbit/s.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.18 no.7
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• pp.1657-1662
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• 2014

In this paper, the impact of substrate bias($V_{BS}$) on the zero capacitor RAM(Z-RAM) in n-channel junctionless multiple gate MOSFET(MuGFET) has been analyzed experimentally. Junctionless transistors with fin width of 50nm and 1 fin exhibits a memory window of 0.34V and a sensing margin of $1.8{\times}10^4$ at $V_{DS}=3.5V$ and $V_{BS}=0V$. As the positive $V_{BS}$ is applied, the memory window and sensing margin were improved due to an increase of impact ionization. When $V_{BS}$ is increased from 0V to 10V, not only the memory window is increased from 0.34V to 0.96V but also sensing margin is increased slightly. The sensitivity of memory window with different $V_{BS}$ in junctionless transistor was larger than that of inversion-mode transistor. A retention time of junctionless transistor is better than that of inversion-mode transistor due to low Gate Induced Drain Leakage(GIDL) current. To evaluate the device reliability of Z-RAM, the shifts in the Set/Reset voltages and current were measured.