• Journal of the Microelectronics and Packaging Society
• /
• v.13 no.1 s.38
• /
• pp.23-29
• /
• 2006

Ultrasonic soldering of Si-wafer to FR-4 PCB at ambient temperature was investigated. The UBM of Si-substrate was Cu/ Ni/ Al from top to bottom with thickness of $0.4{\mu}m,\;0.4{\mu}m$, and $0.3{\mu}m$ respectively. The pad on FR-4 PCB comprised of Au/ Ni/ Cu from top to bottom with thickness of $0.05{\mu}m,\;5{\mu}m$, and $18{\mu}m$ respectively. Sn-3.5wt%Ag foil rolled to $100{\mu}m$ was used for solder. The ultrasonic soldering time was varied from 0.5 s to 3.0 s and the ultrasonic power was 1,400 W. The experimental results show that a reliable bond by ultrasonic soldering at ambient temperature was obtained. The shear strength increased with soldering time up to a maximum of 65 N at 2.5 s. The strength decreased to 34 N at 3.0 s because cracks were generated along the intermetallic compound between Si-wafer and Sn-3.5wt%Ag solder. The Intermetallic compound produced by ultrasonic soldering between the Si-wafer and the solder was $(Cu,Ni)_{6}Sn_{5}$.

• Journal of Welding and Joining
• /
• v.24 no.6
• /
• pp.21-27
• /
• 2006

This study was focused on the evaluation of the thermo-mechanical board-level reliability of Pb-bearing and Pb-free surface mount assemblies. The composition of Pb-bearing solder was a typical Sn-37Pb and that of Pb-free solder used in this study was a representative Sn-3.0Ag-0.5Cu in mass %. Thermal shock test was chosen for the reliability evaluation of the solder joints. Typical $Cu_6Sn_5$ intermetallic compound (IMC) layer was formed between both solders and Cu lead frame at the as-reflowed state, while a layer of $Cu_3Sn$ was additionally formed between the $Cu_6Sn_5$ and Cu lead frame during the thermal shock testing. Thickness of the IMC layers increased with increasing thermal shock cycles, and this is very similar result with that of isothermal aging study of solder joints. Shear test of the multi layer ceramic capacitor(MLCC) joints was also performed to investigate the degradation of mechanical bonding strength of solder joints during the thermal shock testing. Failure mode of the joints after shear testing revealed that the degradation was mainly due to the excessive growth of the IMC layers during the thermal shock testing.

• Proceedings of the Materials Research Society of Korea Conference
• /
• 2003.03a
• /
• pp.68-68
• /
• 2003

최근의 전자부품은 고밀도 고집적화 됨에 따라 여러 가지 문제점들이 발생되고 있다. 그 중 부품이 실장되는 부분에 사용되는 솔더나 전기적 회로를 구성하는 패턴간에 금속 이온 마이그레이션(Metallic Ion Migration)이 발생하여 전기적 단락(Short)를 유발함으로써 전자제품의 치명적 고장을 유발한다. 본 연구는 이온 마이그레이션 현상을 물방울시험(Water Drop Test)을 통하여 재현함으로써 발생 메카니즘을 확인하여 발생원인을 직접적으로 관찰하고, 각 종 패턴의 거리 및 전압에 따른 발생속도의 차이를 조사하기 위하여 수행되었다. 이러한 실험을 위하여 콤 패턴(Comb Pattern)의 FR-4 재질 인쇄회로기판(PCB : Printed Circuit Board)을 사용하였으며, 사용된 전극재질로는 Cu, SnPb, Au를 사용하였고, 패턴간 거리는 0.5, 1.0, 2.0mm의 3가지 종류로 구분하였다. 또한 패턴간에 인간 된 전압은 6.5V, 15V를 인가한 후 마이그레이션이 발생되는 시간을 측정하였다. 이러한 실험으로부터 다음과 같은 결론을 얻었다. (1) 6.5V의 인가전압에서는 Cu 패턴이 대체적으로 가장 빠르게 마이그레이션이 발생하였으며, 다음으로 Au가 발생하였고, Cu와 SnPb의 발생시간은 대체적으로 근사한 값을 나타내었다. 이것은 비슷한 평형전위를 갖는 재료는 마이그레이션 발생시간이 유사하게 나타나며, 높은 (+)전위를 갖을수록 발생시간이 지연됨을 알 수 있다. (2) 15V를 인가하였을 때 패턴간격이 0.5mm인 경우 Cu, Au, SnPb의 순으로 나타났으며, 1.0mm는 SnPb, Cu, Au, 2.0mm인 경우는 SnPb, Au, Cu의 순으로 마이그레이션이 발생하였다. 인가전압이 높은 경우 초기 발생에는 큰 차이가 없지만 수지상이 발생 후 성장하는데 많은 영향을 미치는 것으로 보인다. 이것은 초기 수지상의 형성에 큰 영향을 미치는 것은 재료의 평형전위에 의한 값이 좌우하지만, 수지상이 일정길이 이상 형성된 이후에는 성장속도가 평형전위에 따른 값과는 다소 다르게 나타남을 알 수 있다.

• Resources Recycling
• /
• v.14 no.5 s.67
• /
• pp.24-31
• /
• 2005

In order to recover valuable metals from fine-grained electronic waste, bioleaching of Cu, Zn, Al, Co, Ni, Fe, Sn and Pb were carried out using Aspergillus niger as a leaching microorganism in a shaking flask. Aspergillus niger was able to grow in the presence of electronic scrap. The formation of organic acids(citric and oxalic acid) from Aspergillus niger caused the mobilization of metals from waste electronic scrap. In a preliminary study, in order to obtain the data on the leaching of Cu, Zn, Al, Fe, Co and Ni from electronic scrap, chemical leaching using organic acid(Citric acid and Oxalic acid) was accomplished. At the electronic scrap concentration of 50 g/L, Aspergillus niger were able to leach more than 95% of the available Cu, Co. But Al, Zn, Pb and Sn were leached about 15-35%. Ni and Fe were detected in the leachate less than 10%.

• Journal of the Korean Ceramic Society
• /
• v.50 no.1
• /
• pp.87-91
• /
• 2013

The doping effect of Sn on the microstructure evolution and dielectric properties was studied in $CaCu_3Ti_{4-x}Sn_xO_{12}$ polycrystals. Samples were produced by a conventional solid-state reaction method. Sintering was carried out at $1115^{\circ}C$ for 2-16 h in air. The dielectric constant and loss were examined at room temperature over a frequency range between $10^2$ and $10^6$ Hz. The microstructure was found to evolve into three stages. Addition of $SnO_2$ led to an increase in density and advanced formation of abnormal grains. The formation of coarse grains with a reduced thickness of the boundary brought about an enhanced dielectric constant and a lower dielectric loss below ~1 kHz. EDS data showed the Cu-rich phase along the grain boundary, which should contribute to the improved dielectric constant according to the internal barrier layer capacitor model. After all, $SnO_2$ was an effective dopant to elevate the dielectric characteristics of $CaCu_3Ti_{4-x}Sn_xO_{12}$ polycrystals as a promoter for abnormal grain growth.

• Korean Journal of Materials Research
• /
• v.15 no.8
• /
• pp.528-535
• /
• 2005

It is inclined to increase that use of hazardous substances such as lead(Pb), mercury (Hg), cadmium(Cd) etc. are prohibited in the electronics according to environmental friendly policies of an advanced nation for protecting environment of earth. As this reasons, many researches for ensuring the reliability were proceeding in Pb free soldering process. n the flux remains on the PCB(printed circuit board) in the soldering process or the electronics exposed to corrosive environment, it becomes the reasons of breakdown or malfunction of the electronics caused by corrosion. Therefore in this studies we researched the polarization and Tafel properties of Sn40Pb and SnCu system solders based on the electrochemical theory. The experimental polarization curves were measured in distilled ionized water and 1 mole $3.5 wt\%$ NaCl electrolyte of $40^{\circ}C$, pH 7.5. Ag/AgCl and graphite were utilized by reference and counter electrodes, respectively. To observe the electrochemical reaction, polarization test was conducted from -250mV to +250mV. From the polarization curves composed of anodic and cathodic curves, we obtained Tafel slop, reversible electrode potential(Ecorr) and exchange current density((cow). In these results, we compared the corrosion rate of SnPb and SnCu solders.

• Proceedings of the KWS Conference
• /
• 2005.06a
• /
• pp.54-56
• /
• 2005

Ultrasonic soldering using of Si-wafer to FR-4 PCB atroom temperature was investigated. Sn3.5Ag foil rolled $100{\mu}m$ was used for solder. The UBM of Si-die was Cu/ Ni/ Al from top to bottom and its thickness was $0.4{\mu}m$, $0.4{\mu}m$, $0.3{\mu}m$ respectively. Pad on FR-4 PCB comprised of Au/ Ni/ Cu from top to bottom and its thickness was $0.05{\mu}m$, $5{\mu}m$, $18{\mu}m$ respectively. The ultrasonic soldering time was changed from 0.5sec to 3.0sec and its power 1400W. As experimental result, reliable bond joint by ultrasonic at room temperature was obtained. The shear strength increased with soldering time up to 2.5 sec. That means at 2.5sec, the shear strength showed maximum rate of 65.23N. The strength decreased to 33.90N at 3.0 sec because the cracks generated along the intermetallic compound between Si-wafer and Sn-3.5mass%Ag solder. intermetallic compound produced by ultrasonic between the solder and the Si-die was $(Cu, Ni)_{6}Sn_{5}$ and the intermetallic compound between solder and pad on FR-4 was $(Ni, Cu)_{3}Sn_{4}$.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
• /
• 1987.11a
• /
• pp.47-74
• /
• 1987

현재 엘리베이터용 worm gear의 wheel로써 가장 많이 사용되고 있는 것은 인청동이다. 일반적으로 청동에 인의 함량이 0.05% - 0.5% 정도 잔류하는 인청동은 용탕의 유동성이 좋아지고, 합금의 강도, 경도가 증가하며 내마모성, 탄성이 증가한다. 또한 P는 극소량 Cu 중에 고용하나 그 외에는 경하고 취약한 $Cu_3P$상으로 존재하고, P의 함유에 따라 Sn의 고용도가 저하하므로 주조 조직중에 $\delta$상($Cu_{31}Sn_8$)이 증가하여 Sn을 증가한 때와 같이 경도가 커지는 효과가 있다. 이같이 기지상 중에 간단한 3원 공정부 ($\alpha + \delta + Cu_3P$)상이 산재하여 있어 이것이 마찰상대면을 지탱하여 내마모 역할을 하기 때문에 인청동이 내마모 재료로써 많이 쓰이고 있는 것이다.

• Progress in Superconductivity
• /
• v.6 no.1
• /
• pp.37-40
• /
• 2004

We investigated the effects of impurity doping on the electrical transport and magnetic properties of TEX>$(Ru, Sn)(Sr, La)<_2$$EuCeCu_2$$O_{z}$ samples. We found that Sn substitution fur Ru causes a significant decrease of the volume fraction of ferromagnetic phase, as well as a decrease of the temperature where the ferromagnetic component is observed. La substitution for Sr leads to an increase of the magnetic ordering temperature with a moderate change of ferromagnetic component. The experimental results are discussed in conjunction with the structural data, transport properties and a possible change of oxygen content.

• Proceedings of the Korean Powder Metallurgy Institute Conference
• /
• 2006.09b
• /
• pp.722-723
• /
• 2006

A new method has been developed to fabricate microcomponents by a combination of photolithography and sintering of metallic powder mixtures, without the need for compression and the addition of Mg. This involves (1) the fabrication of a micromould, (2) mould filling of the powder/binder mixture, (3) debinding and (3) sintering. The starting powdered materials consisted of a mixture of aluminium powder(average size of 2.5 um) and alloying elemental powder of Cu and Sn(less than 70nm), at appropriate proportions to achieve nominal compositions of Al-6wt%Cu, Al-6wt%Cu-3wt%Sn. This paper presents detailed investigation of debinding behaviour and microstructural development.