• 제목/요약/키워드: Cu wire

검색결과 204건 처리시간 0.027초

NiZn 페라이트코어를 이용하여 제작한 직교형 플럭스게이트 센서의 출력에 미치는 바이어스전류의 영향 (DC Bias Current Influence to the Sensitivity of Orthogonal Fluxgate Sensor Fabricated with NiZn Ferrite Core)

  • 신광호
    • 한국자기학회지
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    • 제23권3호
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    • pp.94-97
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    • 2013
  • 본 연구에서는 원통형 페라이트 코어와 페라이트코어를 관통하는 구리선, 그리고 검출 코일을 이용하여서 직교형 플럭스게이트 센서를 제작하고, 직류 바이어스 전류가 출력 감도에 미치는 영향에 대해서 조사하였다. 제작한 직교형 플럭스게이트 센서의 출력 및 감도는 구동주파수에 의존하였으며, 이는 검출코일 임피던스의 주파수특성이 나타내는 경향과 유사하였다. 직류 바이어스 전류가 교류 구동전류의 크기에 비해서 대략 50% 이상일 때 출력감도가 최대가 되었으며, 그 보다 큰 직류 바이어스 전류에 의해서는 출력감도가 포화되는 경향을 나타내었다.

[$SF_6$] 가스 절연기기내에 도전성 금속이물 존재시 섬락전압에 미치는 영향 (Influence of Conducting Particle on the Breakdown Phenomena of $SF_6$ gas in Gas Insulated System)

  • 이방욱;함길호;김익수;구자윤
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1998년도 하계학술대회 논문집 E
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    • pp.1687-1689
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    • 1998
  • In this work, the behaviours of conducting wire type particles within the coaxial electrode gap energized with high ac voltage have been systematically investigated using charge simulation method. For this, spheroidal charge is adopted as a image charge for the CSM analysis in order to calculate the acquired charge of the particles which are erected on the surface of the outer electrode. For this purpose, the effects of the lengths and diameters of Cu, Al particles in gas insulated system have been studied by a numerical computation and particle lifting voltage, lifting field, breakdown voltage, acquired charge and travelling distance have been considered. From this, we understand that the particle behaviours have different characteristics according to the particle lengths and diameters. And a possible countermeasure, based on the proposed simulation, has been provided with a view to estimating the flashover voltage of $SF_6$ gas under the 1 atm.

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솔레노이드 형태의 RF 칩 인덕터에 대한 연구 (A Study for Solenoid-Type RF Chip Inductors)

  • 김재욱;윤의중;정여창;홍철호
    • 한국전기전자재료학회논문지
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    • 제13권10호
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    • pp.840-846
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    • 2000
  • In this work, small-size, high-performance solenoid-type RF chip inductors utilizing a low-loss Al$_2$O$_3$core material were investigated. The size of the chip inductors fabricated in this work were 15$\times$10$\times$0.7㎣, 2.1$\times$1.5$\times$10㎣, and 2.4$\times$2.0$\times$1.4㎣ and copper (Cu) wire with 40 ㎛ diameter was used as the coils. High frequency characteristics of the inductance, quality factor, and impedance of developed inductors were measured suing an RF Impedance/Material Analyzer (HP4291B with HP16193A test fixture). It was observed that the developed inductors with the number of turns of 7 have the inductance of 33 to 100nH and exhibit the self-resonant frequency (SRF) of .26 to 1.1 GHz. The SRF of inductors decreases with increasing the inductance and the inductors have the quality factor of 60 to 80 in the frequency range of 300 MHz to 1.1 GHz. In this study, small-size solenoid-type RF chip inductors with high inductance and high quality factor were fabricated successfully. It is suggested that the thin film-type inductor is necessary to fabricate the smaller size inductors at the expence of inductance and quality factor values.

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전기폭발방식을 이용한 동(Cu) 미분 제조 및 인가전압의 영향 (The effects of applied voltage on copper powder manufactured by electric explosion)

  • 이후인;김원백;서창열;손정수
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 추계학술대회 논문집
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    • pp.474-475
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    • 2007
  • Wire electrical explosion(WEE) has been used for the production of fine metal particles. In WEE, electrical powder was stored and compressed into capacitor and released to produce fine particles through evaporation and condensation. In this study, the effect of applied voltage on the size of copper powders was investigated. High tension was added up to the explosion device by dividing 4 steps. At voltages lower than 5.2 kV, the fraction of powders finer than $44{\mu}m$ was almost negligible. The effectiveness of explosion increased sharply with increased voltage over 5.8 kV. At the highest voltage of 6.4 kV, more than 80% of explosion products were finer than $44{\mu}m$.

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스테인레스 강 안정화 YBCO 초전도선재의 접합 특성에 관한 연구 (A study on the bonding properties of YBCO coated conductors with stainless steel stabilizer)

  • 김태형;오상수;송규정;김호섭;고락길;신형섭
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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    • pp.262-263
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    • 2005
  • For mechanical and electrical stability and environment protection, Cu and stainless steel stabilizer is laminated to Ag layer to produce a composite neutral-axis(N-A) architecture in which the YBCO layer is centered between the oxide buffered metallic substrate and stabilizer strip lamination. this architecture allows the wire to meet operational requirements including stresses at cryogenic temperature, winding tensions, mechanical bending requirements thermal and electrical stability under fault conditions. we have experimentally studied mechanical properties of laminated stainless steel stabilizer on YBCO coated conductors. we have laminated YBCO coated conductors by continuous dipping soldering process. we have investigated lamination interface between solder and stabilizer, YBCO coated conductor. we evaluated bonding properties tensile / shear bonding strength, peeling strength laminated YBCO coated conductors.

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접합 소재에 따른 고출력 플립칩 LED 패키지 특성 연구 (Properties of High Power Flip Chip LED Package with Bonding Materials)

  • 이태영;김미송;고은수;최종현;장명기;김목순;유세훈
    • 마이크로전자및패키징학회지
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    • 제21권1호
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    • pp.1-6
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    • 2014
  • 고출력 LED 패키지의 열적 경로(thermal path)를 줄이기 위해 플립칩 본딩법에 대한 연구가 활발히 진행되고 있다. 본 연구에서는 Au-Sn 열압착 본딩 및 Sn-Ag-Cu(SAC) 리플로우 본딩을 이용하여 본딩 특성 및 열적특성을 비교 평가 하였다. Au-Sn 열압착 본딩은 50 N에서 $300^{\circ}C$의 접합온도로 본딩하였고, SAC 솔더는 솔더페이스트를 인쇄한 후 리플로우법으로 피크온도 $255^{\circ}C$에서 30 sec에서 본딩하였다. SAC 솔더를 사용한 LED 패키지의 전단강도는 $5798.5gf/mm^2$로 Au-Sn 열압착 본딩의 $3508.5gf/mm^2$에 비해 1.6배 높았다. 파단면과 단면분석 결과 Au-Sn, SAC 솔더 모두 LED 칩 내부에서 파단이 일어나는 것을 관찰하였다. 반면 Au-Sn 열압착 본딩 샘플의 열저항은 SAC솔더 접합 샘플에 비해 낮았으며, SAC 솔더 접합부 내부의 기공에 의해 열저항이 커짐을 알 수 있었다.

Copper Interconnection and Flip Chip Packaging Laboratory Activity for Microelectronics Manufacturing Engineers

  • Moon, Dae-Ho;Ha, Tae-Min;Kim, Boom-Soo;Han, Seung-Soo;Hong, Sang-Jeen
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.431-432
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    • 2012
  • In the era of 20 nm scaled semiconductor volume manufacturing, Microelectronics Manufacturing Engineering Education is presented in this paper. The purpose of microelectronic engineering education is to educate engineers to work in the semiconductor industry; it is therefore should be considered even before than technology development. Three Microelectronics Manufacturing Engineering related courses are introduced, and how undergraduate students acquired hands-on experience on Microelectronics fabrication and manufacturing. Conventionally employed wire bonding was recognized as not only an additional parasitic source in high-frequency mobile applications due to the increased inductance caused from the wiring loop, but also a huddle for minimizing IC packaging footprint. To alleviate the concerns, chip bumping technologies such as flip chip bumping and pillar bumping have been suggested as promising chip assembly methods to provide high-density interconnects and lower signal propagation delay [1,2]. Aluminum as metal interconnecting material over the decades in integrated circuits (ICs) manufacturing has been rapidly replaced with copper in majority IC products. A single copper metal layer with various test patterns of lines and vias and $400{\mu}m$ by $400{\mu}m$ interconnected pads are formed. Mask M1 allows metal interconnection patterns on 4" wafers with AZ1512 positive tone photoresist, and Cu/TiN/Ti layers are wet etched in two steps. We employed WPR, a thick patternable negative photoresist, manufactured by JSR Corp., which is specifically developed as dielectric material for multi- chip packaging (MCP) and package-on-package (PoP). Spin-coating at 1,000 rpm, i-line UV exposure, and 1 hour curing at $110^{\circ}C$ allows about $25{\mu}m$ thick passivation layer before performing wafer level soldering. Conventional Si3N4 passivation between Cu and WPR layer using plasma CVD can be an optional. To practice the board level flip chip assembly, individual students draw their own fan-outs of 40 rectangle pads using Eagle CAD, a free PCB artwork EDA. Individuals then transfer the test circuitry on a blank CCFL board followed by Cu etching and solder mask processes. Negative dry film resist (DFR), Accimage$^{(R)}$, manufactured by Kolon Industries, Inc., was used for solder resist for ball grid array (BGA). We demonstrated how Microelectronics Manufacturing Engineering education has been performed by presenting brief intermediate by-product from undergraduate and graduate students. Microelectronics Manufacturing Engineering, once again, is to educating engineers to actively work in the area of semiconductor manufacturing. Through one semester senior level hands-on laboratory course, participating students will have clearer understanding on microelectronics manufacturing and realized the importance of manufacturing yield in practice.

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철심과 권선을 이용한 전류제한기에 적용시킨 안정화층이 다른 YBCO Coated Conductor의 전류제한 특성에 관한 연구 (The Study on the Current Limiting Characteristics of YBCO Coated Conductor with Different kinds of Stabilization Layer Applied to SFCL Using Iron Core and Coil)

  • 이동혁;두호익;김용진;한병성;임성우;한상철;이정필
    • 한국전기전자재료학회논문지
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    • 제23권10호
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    • pp.788-792
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    • 2010
  • The yttrium-barium-copper-oxide (YBCO) coated conductor, which supplement the fault of the existing superconducting current-limit materials YBCO thin film, bismuth-strontium-calcium-copper-oxide(BSCCO) wire and bulk, has been improved its mechanical weakness and has high index; hence, after quench YBCO coated conductor could limit the fault current effectively because of fast resistance occurrence speed. Furthermore, it has wide applicable area as an current limit material because it shows different resistance occurrence tendency by the thickness and kind of stabilization material sputtered on the superconducting layer. Therefore, many researchers are carrying out the study of application of YBCO coated conductor to superconducting fault current limiter (SFCL) for making high quality current limit element, based on resistance type. On the other hand, the study for other type except resistance type has been rarely conducted for the application of YBCO coated conductor to SFCL as an current limit element. Consequently, in this study, YBCO coated conductor with different stabilization layer Cu and Stainless steel, is applied to SFCL using iron core and coil, and examine the many index points as an current limit element, such as current limit characteristic, the tendency of resistance occurrence, response time, the temperature trend for stability.

인덕터 크기에 따른 솔레노이드 형 RF 칩 인덕터 특성 변화 (Variation of Characteristics of Solenoid-Type RF Chip Inductors on Inductor Size)

  • 윤의중;김재욱
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제55권7호
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    • pp.339-343
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    • 2006
  • In this study, the variations of the important characteristics of solenoid-type RF chip inductors utilizing a low-loss A1203 core material on inductor dimensions were investigated systematically. Four dimensions of the chip inductors fabricated in this work were $1.0\times0.5\times0.5mm^3,\;1.5\times1.0\times0.7mm^3,\;2.1\times1.5\times1.0mm^3,\;and\;2.4\times2.0\times1.4mm^3$ and copper (Cu) wire with $40{\mu}m$ diameter was used as the coils. High frequency characteristics of the inductance, quality factor, and impedance of developed inductors as a function of inductor dimensions were measured using an RF Impedance/Material Analyzer (HP4291B with HP16193A test fixture). It was observed that the developed inductors with the number of turns of 6 have the inductance (L) of 12 to 82 nH and exhibit the self-resonant frequency (SRE) of 3.6 to 1.2 GHz. The SRF of inductors decreases with increasing the inductor size while the L increases with the inductor size. The smallest inductors of $1.0\times0.5\times0.5mm^3$ exhibited the L of 12 nH, SRF of 3.6 GHz, and the quality factor of 67 near the frequency of 1.1 GHz. The calculated data predicted the high-frequency data of the L, and Q of the developed inductors well.

18K 레드 골드 정함량 솔더의 In 첨가에 따른 물성변화 (Properties of the 18K Red Gold Solder Alloys with Indium Contents)

  • 송정호;송오성
    • 한국재료학회지
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    • 제28권2호
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    • pp.89-94
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    • 2018
  • The properties of 18 K red gold solder alloys were investigated by changing the content of In up to 10.0 wt% in order to replace the hazardous Cd element. Cupellation and energy dispersive X-ray spectroscopy (EDS) were used to check the composition of each alloy, and FE-SEM and UV-VIS-NIR-Colormeter were employed for microstructure and color characterization. The melting temperature, hardness, and wetting angle of the samples were determined by TGA-DTA, the Vickers hardness tester, and the Wetting angle tester. The cupellation result confirmed that all the samples had 18K above 75.0wt%-Au. EDS results showed that Cu and In elements were alloyed with the intended composition without segregation. The microstructure results showed that the amount of In increased, and the grain size became smaller. The color analysis revealed that the proposed solders up to 10.0 wt% In showed a color similar to the reference 18 K substrate like the 10.0 wt% Cd solder with a color difference of less than 7.50. TGA-DTA results confirmed that when more than 5.0 wt% of In was added, the melting temperature decreased enough for the soldering process. The Vickers hardness result revealed that more than 5.0 wt% In solder alloys had greater hardness than 10.0 wt% Cd solder, which suggested that it was more favorable in making a wire type solder. Moreover, all the In solders showed a lower wetting angle than the 10.0 wt% Cd solder. Our results suggested that the In alloyed 18 K red gold solders might replace the conventional 10.0 wt% Cd solder with appropriate properties for red gold jewelry soldering.