• Title/Summary/Keyword: Cu and Sn

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Growth and Properties of p-type Transparent Oxide Semiconductors

  • Heo, Young-Woo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.99-99
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    • 2014
  • Transparent oxide semiconductors (TOSs) are. currently attracting attention for application to transparent electrodes in optoelectronic devices and active channel layers in thin-film transistors. One of the key issues for the realization of next generation transparent electronic devices such as transparent complementary metal-oxide-semiconductor thin-film transistors (CMOS TFTs), transparent wall light, sensors, and transparent solar cell is to develop p-type TOSs. In this talks, I will introduce issues and status related to p-type TOSs such as LnCuOQ (Ln=lanthanide, Q=S, Se), $SrCu_2O_2$, $CuMO_2$ (M=Al, Ga, Cr, In), ZnO, $Cu_2O$ and SnO. The growth and properties of SnO and Cu-based oxides and their application to electronic devices will be discussed.

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Evolution of Interfacial Microstructure in Alumina and Ag-Cu-Zr-Sn Brazing Alloy (알루미나/Ag-Cu-Zr-Sn 브레이징 합금계면의 미세조직)

  • Kim, Jong-Heon;Yoo, Yeon-Chul
    • Transactions of Materials Processing
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    • v.7 no.5
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    • pp.481-488
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    • 1998
  • The active metal brazing was applied to bond Alumina and Ni-Cr steel by Ag-Cu-Zr-Sn alloy and the interfacial microstructure and reaction mechanism were investigated. Polycrystalline monoclinic $ZrO_2$ with a very fine grain of 100-150 nm formed at the alumina grain boundary contacted with Zr segregation layer at the interface. The $ZrO_2$ layer containing the inclusions and cracks were developed at the boundary of inclusion/$ZrO_2$ due to the difference in specific volume. The development of $ZrO_2$ at the interface was successfully explained by the preferential penetration of $ZrO_2$ at the interface was successfully explained by the preferential penetration of Zr atoms a higher concentration of oxygen and a high diffusion rate of Al ions into molten brazing alloy.

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On the Manufacturing Technology of some Koryo Bronze Artifacts (고려 청동기 유물의 제작기법에 관한 연구)

  • Choi, K.J.;Park, J.S.
    • Journal of the Korean Society for Heat Treatment
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    • v.17 no.1
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    • pp.2-9
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    • 2004
  • This study has examined the metallurgical microstructures and alloy compositions of 3 bronze artifacts, a vessel, a spoon and a chopstick, manufactured in the Koryo Dynasty. The results show that they were made from Cu-Sn alloys whose Sn content ranges from 22 to 24% by weight. It is of significant importance to find that they were all given special thermo-mechanical treatments during their manufacturing. It has been found that the Koryo bronze workers were well aware of the mechanical properties of ${\alpha}$, ${\beta}$, ${\gamma}$ and ${\delta}$ phases that appear in the Cu-Sn alloys. Knowing how to promote or suppress the formation of each phase, they were able to find proper alloy compositions and temperatures for the high Sn alloys to be successfully forged. The present study will detail the Koryo bronze technology as estimated from the microstructures of the 3 bronze artifacts. The results of the reproduction experiments with Cu-24%Sn will also be presented to explain how the microstructures develop and to estimate the mechanical properties of each phase.

Board level joint reliability of differently finished PWB pad (PCB Pad finish 방법에 따른 solder의 Board level joint reliability)

  • Lee W. J.;Moon H. J.;Kim Y. H.
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2004.02a
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    • pp.37-59
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    • 2004
  • In the case of Ni/Au finished pad on the package side, the solder joint of SnAgCu system can bring brittle fracture under impact load such as drop test. Therefore, it's difficult to prevent the brittle fracture of lead-free solder, by controlling Cu content. The failure locus existing on the interface between $(Ni,Cu)_3Sn_4\;and\;(Cu,Ni)_6Sn_5$ IMC layers must be changed to other site in order to avoid brittle fracture due to impact load. It was not found any clear evidence that there were two IMC layers exist. But it was strongly assumed these were two layers which have different Cu-Ni composition. From the above analysis it was assumed that Cu atom in the solder alloy or substrate seemed to affect IMC composition and cause to IMC brittle fracture.

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Grinding Steel and Iron Materials with Cu-Sn-co Bonded CBN Grinding Wheels (Cu-Sn-Co본드 CBN휠에 의한 철강재료 연삭)

  • Choe, Seong-Guk;Choe, Jeong-Cheol
    • Korean Journal of Materials Research
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    • v.5 no.4
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    • pp.490-500
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    • 1995
  • 다이아몬드와는 달리 CBN은 철족 재료 연삭시 화학적 마모가 거의 없다. 이러한 장점으로 인해 CBN휠이 철강 재료 연삭에 널리 사용되고 잇는 것이다. 그러나 CBN 휠의 성능은 CBN을 붙잡고 있는 결합제에 크게 의존한다. 오늘날 널리 사용되는 결합제인 주석 청동 합금은 내마모성에 한계가 있다. 주석 청동 합금의 내마모성을 증대시키기 위해 Co를 첨가하였다. 이러한 기지합금에 젖음성을 향사시키기위해 Co코팅 CBN을 사용하였다. 기지합금에 20%co를 첨가한 것이 입계에서 연속적인 $\delta$상생성, 취성 증가에 따라 자생작용이 활발하였다. 가장 높은 연삭비를 나타낸 것은 Cu-15wt%Sn, cu-33wt%Sn, co를 40:40:20으로 제작한 휠이었다.

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Creep Characteristic of QFP Solder Joint using Sn-3Ag-0.5Cu (Sn-3Ag-0.5Cu을 적용한 QFP 솔더 접합부의 크립특성에 관한 연구)

  • Jo, Yun-Seong;Han, Seong-Won;Kim, Jong-Min;Choe, Myeong-Gi;Park, Jae-Hyeon;Sin, Yeong-Ui
    • Proceedings of the KWS Conference
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    • 2006.10a
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    • pp.184-186
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    • 2006
  • Sn-3Ag-0.5Cu is one of candidate as an alternative approach to conventional lead-tin solder. In order to evaluate that creep characteristic of QFP, we used Sn-3Ag-0.5Cu where the operating temperature is $100^{\circ}C$. The specimens were loaded to failure at average pull strength in the range of 20% to 25%, X-ray machine is used to eliminate effect of void. In this paper, relation of time-displacement and steady state creep rate was studied, and used to analyze the experimental result.

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Effects of Nano-sized Diamond on Wettability and Interfacial Reaction for Immersion Sn Plating

  • Yu, A-Mi;Kang, Nam-Hyun;Lee, Kang;Lee, Jong-Hyun
    • Journal of the Microelectronics and Packaging Society
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    • v.17 no.3
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    • pp.59-63
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    • 2010
  • Immersion Sn plating was produced on Cu foil by distributing nano-sized diamonds (ND). The ND distributed on the coating surface broke the continuity of Sn-oxide layer, therefore leading to penetrate the molten solder through the oxide and retarding the wettability degradation during a reflow process. Furthermore, the ND in the Sn coating played a role of diffusion barrier for Sn atoms and decreased the growth rate of intermetallic compound ($Cu_6Sn_5$) layer during the solid-state aging. The study confirmed the importance of ND to improve the wettability and reliability of the Sn plating. Complete dispersion of the ND within the immersion Sn plating needs to be further developed for the electronic packaging applications.

The Fluxless Wetting Properties of TSM-coated Glass Substrate to the Pb-free Solders (TSM(Top Surface Metallurgy)이 증착된 유리기판의 Pb-free 솔더에 대한 무플럭스 젖음 특성)

  • 홍순민;박재용;박창배;정재필;강춘식
    • Journal of the Microelectronics and Packaging Society
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    • v.7 no.2
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    • pp.47-53
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    • 2000
  • The fluxless wetting properties of TSM-coated glass substrate were evaluated by the wetting balance method. We could estimate the wettability of the TSM with new parameters obtained from the wetting balance test for one side-coated specimen. It was more effective in wetting to use Cu as a wetting layer and Au as a protection layer than to use Au itself as a wetting layer. The SnSb solder showed better wettability than SnAg, SnBi, and SnIn solders. The contact angle of the one side-coated glass substrate to the Pb-free solders could be calculated from the farce balance equation by measuring the static force and the tilt angle.

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