• 제목/요약/키워드: Copper Film

검색결과 567건 처리시간 0.026초

Zn-Al 아크 금속용사 피막을 적용한 구리분말 혼입 시멘트 모르타르의 전자파 차폐 성능 평가 (The Shielding Effectiveness of Zn-Al Arc Thermal Metal Film Coated Cement-Mortar Using Copper Powder)

  • 최현준;최현국;김형철;이한승
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2017년도 춘계 학술논문 발표대회
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    • pp.124-125
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    • 2017
  • In this study, the shielding effectiveness of the Zn-Al arc thermal metal film coated cement-mortar mixed with copper powder by reflection, absorption, multi-reflection loss in 2.25~2.65 GHz was reviewed. By enhancing the mixing ratio of copper powder, the shielding effectiveness by absorption and multi-reflection loss was increased, but shielding rate(%) based on 80 dB showed below 20%. The Zn-Al arc thermal metal film coated on specimen, the shielding rate increased 3.5 times by reflection loss.

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Copper-tetra-tert-butylphthalocyanine(CuTBP) LB 막의 NO$_2$ 가스탐지 특성에 관한 연구 (A study on the NO$_2$gas detection characteristics of the Copper - tetra - tert -butylphthatsocyanine (CuTBP ) LB Film)

  • 김형석;유병호;조형근;한영재;김태완;김정수
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1994년도 추계학술대회 논문집
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    • pp.118-121
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    • 1994
  • The NO$_2$ gas-detection characteristics were investigated using the functional organic Langmuir-Blodgett(LB) film of Copper-tetra-tert-butylphalocyanine(CUTBP). The optimum conditions for a film deposition were obtained through a study of $\pi$-A isotherm and the deposited film status was confirmed by ellipsometry measurements. In the NO$_2$ response experiments, first of all, the proper number of layer was obtained by a change of the electrical conductivities depending on the number of layer when the film is exposed to the gas. And response time, recovery time, and reproducibility were measured on it. On the other hand, how the NO$_2$ gas interacts to the LB film was studied by UV/visible absorption spectra.

Pitting Corrosion Inhibition of Sprinkler Copper Tubes via Forming of Cu-BTA Film on the Inner Surface of Corrosion pits

  • Suh, Sang Hee;Suh, Youngjoon;Kim, Sohee;Yang, Jun-Mo;Kim, Gyungtae
    • Corrosion Science and Technology
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    • 제18권2호
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    • pp.39-48
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    • 2019
  • The feasibility of using benzotriazole (BTAH) to inhibit pitting corrosion in the sprinkler copper tubes was investigated by filling the tubes with BTAH-water solution in 829 households at an eight-year-old apartment complex. The water leakage rate was reduced by approximately 90% following BTAH treatment during 161 days from the previous year. The leakage of one of the two sprinkler copper tubes was investigated with optical microscopy, scanning electron microscopy, energy dispersive spectroscopy, X-ray photoelectron spectroscopy, and X-ray diffraction analysis to determine the formation of Cu-BTA film inside the corrosion pits. All the inner components of the corrosion pits were coated with Cu-BTA films suggesting that BTAH molecules penetrated the corrosion products. The Cu-BTA film was about 2 nm in thickness at the bottom of a corrosion pit. A layer of CuCl and $Cu_2O$ phases lies under the Cu-BTA film. This complex structure effectively prevented the propagation of corrosion pits in the sprinkler copper tubes and reduced the water leakage.

UV 펄스 레이저 가공의 구리 박막 두께에 따른 열-구조 연성 해석 (Coupled Thermal-Structure Analysis of UV Laser Pulsing according to the Thickness of Copper Film on the Surface of Polyimide)

  • 신민재;신보성
    • 한국레이저가공학회지
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    • 제16권2호
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    • pp.7-11
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    • 2013
  • Recently advanced laser processing is widely introduced to improve the efficiency of micro part production and to reduce the rate of inferior goods. In this paper the trend of delamination of single layer with both thin copper and polyimide according to the variation of copper thickness was investigated using the coupled thermal-structural analysis of ANSYS. From these analyses results, some conclusions were obtained. Firstly, the maximum temperature was increasing with respect to decrease of copper thickness. Secondly the maximum strain which was in general estimation the main effect of the delamination was observed in case of the copper thickness of $5{\mu}m$. Finally the trend of the delamination was decreasing with increasing the thickness of copper layer.

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The Mechanical Property of Electroplated Cu Film

  • Cho, Chul-Ho;Ha, Seung-Mo;Ahn, Yoo-Min;Kim, Dae-Kun;Lee, Jae-Ho
    • 한국윤활학회:학술대회논문집
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    • 한국윤활학회 2002년도 proceedings of the second asia international conference on tribology
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    • pp.139-140
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    • 2002
  • This paper discusses the effect of plating condition on the mechanical property of electroplated Cu film. Current density, the amount of the organic additives was found to affect the residual stress of electroplated copper film. The result show that, in the case of residual stress, the copper film deposited at higher additive result in lower residual stress and plating current by $15mA/cm^2$ induced a better result than any other ones.

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산화 구리표면에서 액적의 막비등에 관한 실험적 연구 (Experimental Study on Film Boiling of Liquid Droplets on Oxidized Copper Surface)

  • 김영찬
    • 한국분무공학회지
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    • 제25권2호
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    • pp.68-73
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    • 2020
  • In the present study, experiments on the film boiling of liquid droplets on oxidized copper surface was conducted. The shape of pure water droplets was observed, and the evaporation rate of them was measured during the film boiling evaporation process. The droplet of initial volume 16 ~ 30 µl was applied onto the oxidized copper surface heated up to 300 ~ 500℃, then the shape of the droplet was analyzed during the film boiling evaporation. Experimental results showed that there was good correlation between dimensionless volume and dimensionless time. However, a significant difference in evaporation rate for small and large droplets discussed in previous study was not found.

Effect of Amine Functional Group on Removal Rate Selectivity between Copper and Tantalum-nitride Film in Chemical Mechanical Polishing

  • Cui, Hao;Hwang, Hee-Sub;Park, Jin-Hyung;Paik, Ungyu;Park, Jea-Gun
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.546-546
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    • 2008
  • Copper (Cu) Chemical mechanical polishing (CMP) has been an essential process for Cu wifing of DRAM and NAND flash memory beyond 45nm. Copper has been employed as ideal material for interconnect and metal line due to the low resistivity and high resistant to electro-migration. Damascene process is currently used in conjunction with CMP in the fabrication of multi-level copper interconnects for advanced logic and memory devices. Cu CMP involves removal of material by the combination of chemical and mechanical action. Chemicals in slurry aid in material removal by modifying the surface film while abrasion between the particles, pad, and the modified film facilitates mechanical removal. In our research, we emphasized on the role of chemical effect of slurry on Cu CMP, especially on the effect of amine functional group on removal rate selectivity between Cu and Tantalum-nitride (TaN) film. We investigated the two different kinds of complexing agent both with amine functional group. On the one hand, Polyacrylamide as a polymer affected the stability of abrasive, viscosity of slurry and the corrosion current of copper film especially at high concentration. At higher concentration, the aggregation of abrasive particles was suppressed by the steric effect of PAM, thus showed higher fraction of small particle distribution. It also showed a fluctuation behavior of the viscosity of slurry at high shear rate due to transformation of polymer chain. Also, because of forming thick passivation layer on the surface of Cu film, the diffusion of oxidant to the Cu surface was inhibited; therefore, the corrosion current with 0.7wt% PAM was smaller than that without PAM. the polishing rate of Cu film slightly increased up to 0.3wt%, then decreased with increasing of PAM concentration. On the contrary, the polishing rate of TaN film was strongly suppressed and saturated with increasing of PAM concentration at 0.3wt%. We also studied the electrostatic interaction between abrasive particle and Cu/TaN film with different PAM concentration. On the other hand, amino-methyl-propanol (AMP) as a single molecule does not affect the stability, rheological and corrosion behavior of the slurry as the polymer PAM. The polishing behavior of TaN film and selectivity with AMP appeared the similar trend to the slurry with PAM. The polishing behavior of Cu film with AMP, however, was quite different with that of PAM. We assume this difference was originated from different compactness of surface passivation layer on the Cu film under the same concentration due to the different molecular weight of PAM and AMP.

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Effect of the Calcination Temperature and Li(I) Doping on Ethanol Sensing Properties in p-Type CuO Thin Films

  • Choi, Yun-Hyuk
    • 한국재료학회지
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    • 제29권12호
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    • pp.764-773
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    • 2019
  • The gas response characteristic toward C2H5OH has been demonstrated in terms of copper-vacancy concentration, hole density, and microstructural factors for undoped/Li(I)-doped CuO thin films prepared by sol-gel method. For the films, both concentrations of intrinsic copper vacancies and electronic holes decrease with increasing calcination temperature from 400 to 500 to 600 ℃. Li(I) doping into CuO leads to the reduction of copper-vacancy concentration and the enhancement of hole density. The increase of calcination temperature or Li(I) doping concentration in the film increases both optical band gap energy and Cu2p binding energy, which are characterized by UV-vis-NIR and X-ray photoelectron spectroscopy, respectively. The overall hole density of the film is determined by the offset effect of intrinsic and extrinsic hole densities, which depend on the calcination temperature and the Li(I) doping amount, respectively. The apparent resistance of the film is determined by the concentration of the structural defects such as copper vacancies, Li(I) dopants, and grain boundaries, as well as by the hole density. As a result, it is found that the gas response value of the film sensor is directly proportional to the apparent sensor resistance.

의료용 도뇨관 표면의 도선용 구리 박막 증착을 위한 스퍼터링-열증착 연속공정장비의 설계 및 개발 (Design and Development of Sputter-evaporation System for Micro-wiring on Medical Catheter)

  • 장준근;정석
    • 한국정밀공학회지
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    • 제16권3호통권96호
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    • pp.62-71
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    • 1999
  • Integrating micro-machined sensors and actuators on the conventional devices with the copper power lines was incompatible to fabricate the mass produced micro electromechanical system (MEMS) devices. To achieve the compatibility of the wiring method between MEMS parts and devices, we developed the three-dimensional sputter-evaporation system that coats micropatterned thin copper films on the surface of the MEMS element. The system consists of a process chamber, two branch chambers, the substrate holder, and a linear-rotary motion feedthrough. Thin copper film was sputtered and evaporated on the biocompatible polymer, Pellethane$^{circed{R}}$ and silicone, catheter that is 2 mm in diameter and 700 mm in length. The metal film coating technique with three-dimensional thin film sputter-evaporation system was developed to apply the power and signal lines on the micro active endoscope. In this paper, we developed the three-dimensional metal film sputter-evaporation system operated on the low temperature for the biopolymeric substrates used in the medical MEMS devices.

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