• 전자공학회논문지A
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• 제32A권4호
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• pp.75-84
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• 1995

Fault simulators are used for accurate evaluation of fault coverages of digital circuits. But fault simulation becomes time and memory consuming job because computation time is proportional to wquare of size of circuits. Recently, several approximate algorithms for testability analysis have been published to cope with the problems. COP is very fast but cannot be used for sequential circuits, while STAFAN can ve used for sequential circuits but requires large amount of computation because it utilizes logic simulation results. In this paper EXTASEC(An Extension of Testability Analysis for Sequential Circuits) is proposed. It is an extension of COP in the sense that it is the same as COP for combinational circuits, but it can handle sequential circuits, Xicontrollability and backward line analysis are key concept for EXTASEC. Performance of EXTASEC is proven by comparing EXTASEC with a falut simulator, STAFAN, and COP for ISCAS circuits, and the result is demonstated.

• 산업기술연구
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• 제18권
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• pp.165-172
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• 1998

In recent years, various power factor correction(PFC) circuits for the electronic ballast have been proposed. And these circuits have difference characteristics each other. We have researched several PFC circuits of them. And operational principles and characteristics of PFC circuits are compared by the cost and the electrical performance. Finally, we established the reference for the evaluation of PFC circuits with performance and the price.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2000년도 ITC-CSCC -1
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• pp.179-182
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• 2000

Adiabatic dynamic CMOS logic circuits, which are called ADCL circuits, promise us to implement low power logic circuits. Since the power supply source for ADCL circuits had not been developed, we proposed a power supply circuit for them. It is shown experimentally that by using the power supply circuit ADCL circuits can work with lower power consumption than conventional static CMOS circuit. In this paper, the power supply circuit is improved so that the power consumption can be reduced. Also, it is shown by some experiments that by using the circuit, ADCL circuits can work with lower power consumption than before Improving.

• 대한전자공학회논문지
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• 제25권5호
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• pp.509-521
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• 1988

In the designs of integrated circuits, the buffer circuits used for driving a large capacitive load from minimum-structured logic circuit outputs have important effects upon system throughputs. Therefore it is important to optimize the buffer circuits. In this paper, the principle of designing CMOS buffer circuits which have the minimum delay and drive the given capacitive load is discussed. That is, the effects of load capacitance upon rise time, fall time, and delay of the CMOS inverter and the effects of parasitic capacitances are finely analysed to calculate the requested minimum-delay CMOS buffer condition. This is different from the method by C.A. Mead et. al.[2.3.4.]which deals with passive-load-nMOS buffers. Large channel width MOS transistor stages are necessary to drive a large capacitive load. The effects of polysilicon gate resistances of such large stages upon delay are also analysed.And, the area of buffer circuits designed by the proposed method is smaller than that of buffer circuits designed by C.A. Mead's method.

• 한국음향학회지
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• 제18권1호
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• pp.67-71
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• 1999

본 논문에서는 회로의 테스트 시간과 비용을 절감할 수 있는 BIST(Built-In Self Test)기법을 이용하여 메모리 테스트 알고리즘을 칩내에서 수행하는 회로를 설계하였다. 메모리 테스트에 사용되는 MSCAN, Marching, Checkerboard알고리즘을 수행하는 회로를 구현하기 위해 BIST회로에서 요구되는 구조를 파악하고 VHDL을 이용하여 각 블록별로 기술하였다. 그리고 CAD tool을 이용하여 각 블록에 대한 동작을 검증하고 회로합성기로써 각 알고리즘에 대한 BIST 회로를 추출하였다. 추출된 회로는 전체 메모리에 대해 무시할 정도의 오버헤드를 갖는다.

• 한국지능시스템학회:학술대회논문집
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• 한국퍼지및지능시스템학회 1993년도 Fifth International Fuzzy Systems Association World Congress 93
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• pp.929-932
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• 1993

A fuzzy microcontroller is presented implementing a simplified inference mechanism. Fuzzification, rule composition and defuzzification are carried out by means of (basically) analog current-mode CMOS circuits operating in strong inversion. Also a voltage interface is provided with the external world. Combining analog and digital techniques allow a programming capability.

• JSTS:Journal of Semiconductor Technology and Science
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• 제7권3호
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• pp.166-176
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• 2007

Radio frequency (RF) microelectromechanical systems (MEMS) have been pursued for more than a decade as a solution of high-performance on-chip fixed, tunable and reconfigurable circuits. This paper reviews our research work on RF MEMS switches and switching circuits in the past five years. The research work first concentrates on the development of lateral DC-contact switches and capacitive shunt switches. Low insertion loss, high isolation and wide frequency band have been achieved for the two types of switches; then the switches have been integrated with transmission lines to achieve different switching circuits, such as single-pole-multi-throw (SPMT) switching circuits, tunable band-pass filter, tunable band-stop filter and reconfigurable filter circuits. Substrate transfer process and surface planarization process are used to fabricate the above mentioned devices and circuits. The advantages of these two fabrication processes provide great flexibility in developing different types of RF MEMS switches and circuits. The ultimate target is to produce more powerful and sophisticated wireless appliances operating in handsets, base stations, and satellites with low power consumption and cost.

• Journal of information and communication convergence engineering
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• 제11권1호
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• pp.56-61
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• 2013

Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.

• 한국정보처리학회논문지
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• 제4권1호
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• pp.311-323
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• 1997

본 논문에서는 게이트 레벌 소자와 스위치 레벨 소자가 함께 사용한 혼합형 조합 회로에서의 고착 고장(stuck-at fault) 검출을 위한 고장 시뮬레이션에 대하여 기술 한다. 실용적인 혼합형 회로의 고장 검출용으로 사용하기 위하여 게이트 레벨 및 정 적 스위치 레벨 회로는 물론 동적 스위치 레벨의 회로들도 처리할 수 있도록 한다. 또한, wired 논리 소자에서의 다중 신호 충돌 현상을 해결하기 위하여 새로운 6치 논 리값과 연산 규칙을 정의하여 신호 세기의 정보와 함께 사용한다. 고장 시뮬레이션의 기본 알고리즘으로는 게이트 레벨 조합 회로에서 주로 사용되는 병렬 패턴 단일 고장 전달(PPSFP:parallel pattern single fault propagation) 기법을 스위치 레벨 소자에 확장 적용한다. 마지막으로 스위치 레벨 소자로 구현된 ISCAS85 벤치 마크 회로와 실 제 혼합형 설계 회로에 대한 실험 결과를 통하여 본 연구에서 개발된 시스템의 효율 성을 입증한다.

• 전자공학회논문지C
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• 제35C권4호
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• pp.30-37
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• 1998

In this paper, we propose a test generation method for large scale sequential circuits based on circuit partitioning to increase the size of circuits that the implicit product machine traversal (IPMT) method can handle. Our method paratitions a circuit under test into subset circuits with only single output, and performs a partial scan design using the state transtition cost that represents a degree of the connectivity of the subset circuit. The IPMT method is applied to the partitioned partial scan circuits in test generation. Experimental results for ISCAS89 benchmark circuits with more thatn 50 flip-flops show that our method has generated test patterns with almost 100% fault coverage at high speed by use of 34%-73% scanned flip-flops.