• 제목/요약/키워드: Chemical energy

검색결과 8,933건 처리시간 0.042초

케미컬루핑 연소시스템을 위한 두 가지 산소전달입자들의 고체순환 특성 (Solid Circulation Characteristics of Two Oxygen Carriers for Chemical Looping Combustion System)

  • 류호정;이도연;남형석;조성호;백점인
    • 한국수소및신에너지학회논문집
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    • 제29권4호
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    • pp.393-400
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    • 2018
  • To confirm the operating range of two oxygen carriers for chemical looping combustion system, the effects of operating variables on solid circulation rate were measured and discussed using a two-interconnected circulating fluidized bed system at ambient temperature and pressure. Moreover, suitable operating ranges to avoid choking of the fast fluidized bed (air reactor) were confirmed for two oxygen carriers. A continuous long-term operation of steady-state solid circulation more than 24 hours was also demonstrated within the operating windows. Finally we could confirm that those two oxygen carriers are suitable for chemical looping combustion system with high solid circulation rate and smooth solid circulation.

Preparation of sulfonated reduced graphene oxide by radiation-induced chemical reduction of sulfonated graphene oxide

  • Jung, Chang-Hee;Hong, Ji-Hyun;Jung, Jin-Mook;Hwang, In-Tae;Jung, Chan-Hee;Choi, Jae-Hak
    • Carbon letters
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    • 제16권1호
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    • pp.41-44
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    • 2015
  • We report the preparation of sulfonated reduced graphene oxide (SRGO) by the sulfonation of graphene oxide followed by radiation-induced chemical reduction. Graphene oxide prepared by the well-known modified Hummer's method was sulfonated with the aryl diazonium salt of sulfanilic acid. Sulfonated graphene oxide (SGO) dispersed in ethanol was subsequently reduced by ${\gamma}$-ray irradiation at various absorbed doses to produce SRGO. The results of optical, chemical, and thermal analyses revealed that SRGO was successfully prepared by ${\gamma}$-ray irradiation-induced chemical reduction of the SGO suspension. Moreover, the electrical conductivity of SRGO was increased up to 2.94 S/cm with an increase of the absorbed dose.

Si (001) 표면 결함 원자힘 현미경 전산모사 (Atomic Force Microscopy Simulation for Si (001) Surface Defects)

  • 조준영;김대희;김유리;김기영;김영철
    • 반도체디스플레이기술학회지
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    • 제17권4호
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    • pp.1-5
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    • 2018
  • Atomic force microscopy (AFM) simulation for Si (001) surface defects was conducted by using density functional theory (DFT). Three major defects on the Si (001) surface are difficult to analyze due to external noises that are always present in the images obtained by AFM. Noise-free surface defects obtained by simulation can help identify the real surface defects on AFM images. The surface defects were first optimized by using a DFT code. The AFM tip was designed by using five carbon atoms and positioned on the surface to calculate the system's energy. Forces between tip and surface were calculated from the energy data and converted into an AFM image. The simulated AFM images are noise-free and, therefore, can help evaluate the real surface defects present on the measured AFM images.

Optimization fluidization characteristics conditions of nickel oxide for hydrogen reduction by fluidized bed reactor

  • Lee, Jae-Rang;Hasolli, Naim;Jeon, Seong-Min;Lee, Kang-San;Kim, Kwang-Deuk;Kim, Yong-Ha;Lee, Kwan-Young;Park, Young-Ok
    • Korean Journal of Chemical Engineering
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    • 제35권11호
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    • pp.2321-2326
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    • 2018
  • We evaluated the optimal conditions for fluidization of nickel oxide (NiO) and its reduction into high-purity Ni during hydrogen reduction in a laboratory-scale fluidized bed reactor. A comparative study was performed through structural shape analysis using scanning electron microscopy (SEM); variance in pressure drop, minimum fluidization velocity, terminal velocity, reduction rate, and mass loss were assessed at temperatures ranging from 400 to $600^{\circ}C$ and at 20, 40, and 60 min in reaction time. We estimated the sample weight with most active fluidization to be 200 g based on the bed diameter of the fluidized bed reactor and height of the stocked material. The optimal conditions for NiO hydrogen reduction were found to be height of sample H to the internal fluidized bed reactor diameter D was H/D=1, reaction temperature of $550^{\circ}C$, reaction time of 60 min, superficial gas velocity of 0.011 m/s, and pressure drop of 77 Pa during fluidization. We determined the best operating conditions for the NiO hydrogen reduction process based on these findings.