• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.06a
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• pp.55-56
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• 2009

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2008.06a
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• pp.611-612
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• 2008

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.11a
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• pp.727-728
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• 2010

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.07a
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• pp.236-237
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• 2005

To measure surface roughness and smoothness of semiconducting materials in power cable, we have investigated the formation and growth process of carbon black showed by changing the content of carbon black. The specimens were primarily kneaded in material samples of pellet form for 5 minutes on rollers ranging between 70[$^{\circ}C$] and 100[$^{\circ}C$]. Then they were produced as sheets after pressing for 20 minutes at 180[$^{\circ}C$] with a pressure of 200[kg/cm]. The contents of conductive carbon black were the variable, and their contents were 20, 30 and 40[wt%], respectively. The surface roughness and smoothness of specimens were measured by SEM and AFM. From SEM experimental result, carbon black in specimens formed matrix as a particles. Also we showed growth process of carbon black according to an increment of the content of carbon black. From AFM experimental result, surface roughness of specimens decreased according to an increment of the content of carbon black.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.264-267
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• 2003

Pitch measurements of 150 nm pitch one-dimensional grating standards were carried out using an contact mode atomic force microscopy(C-AFM) with a high resolution three-axis laser interferometer. It was called as 'Nano-metrological AFM' In Nano-metrological AFM, Three laser interferometers were aligned well to the end of AFM tip. Laser sources of the three-axis laser interferometer in the nano-metrological AFM were calibrated with an I$_2$-stablilzed He-Ne laser at a wavelength of 633 nm. So, the Abbe error was minimized and the result of the pitch measurement using the nano-metrological AFM has a traceability to the length standard directly. The uncertainty in the pitch measurement was estimated in accordance with the Guide to the Expression of Uncertainty in Measurement(GUM). The Primary source of uncertainty in the pitch-measurements was derived from repeatability of pitch-measurement, and its value was approx 0.186 nm. Expanded uncertainty(k=2) of less than 5.23 nm was obtained. It is suggested that the metrological AFM is a useful tool for the nano-metrological standard calibration.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.11a
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• pp.346-346
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• 2015

대기압 플라즈마를 이용해 methyl methacrylate($C_5H_8O_2$) 모노머를 폴리머로 합성했으며, 그 결과를 FTIR, AFM, XRD 등으로 분석하고 특성을 평가했다. FTIR의 결과, C-O, C-H, C=O 등의 피크를 확인할 수 있었다. 그리고 XRD의 관찰결과 C 1s 및 O 1s의 각 binding energy가 reference[1]에서 제시하는 것과 일치하는 것을 확인할 수 있었다. 이렇게 확인된 시료를 AFM으로 관찰한 결과 폴리머 코팅층을 확인할 수 있었다.

• Journal of the Korea Concrete Institute
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• v.27 no.1
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• pp.85-92
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• 2015

The chloride ions, responsible for the initiation of the corrosion mechanism, intrude from the external medium into the concrete. A part of the intruding chloride ions will be retained by the hydration products of the binder in concrete, either through chemical adsorption or by physical adsorption. Since the hydration products of cement are responsible for the chloride binding in concrete, this study focused on the chloride binding in individual hydrate. The purpose of this study is to explore the time dependant behaviors of chloride ions adsorption with cement hydrates, focused on its mechanism. AFt phase and CH phase were not able to absorb chloride ion, however, C-S-H phase and AFm phase had a significant chloride adsorption capacity. In particular, AFm phase showed a chemical adsorption with slow rate in 40 days, while C-S-H phase showed binding behaviors with 3 stages including momentary physical adsorption, physico-chemical adsorption, and chemical adsorption. Based on the results, this study suggested theoretical approach to depict chloride adsorption behavior with elapsed time of C-S-H phase and AFm phase effectively. It is believed that the approach suggested in this study can provide us with a good solution to understand the mechanism on chloride adsorption with hydrates and to calculate a rate of chloride penetration with original source of chloride ions, for example, marine sand at initial time or sea water penetration later on.

• Progress in Superconductivity
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• v.9 no.2
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• pp.127-135
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• 2008

We study the effects of phonon interaction on the superconducting pairing in the high $T_c$ superconductors (HTSC). Using coupled BCS gap equations, we found that phonon interaction can induce a s-wave component to the d-wave gap, mediated by Antiferromagnetic (AFM) spin fluctuations, in the (D+iS) form. However, $T_c$ is not enhanced compared to the pure d-wave pairing without phonon interaction. On the other hand, anisotropic phonon interaction can dramatically enhance the d-wave pairing and $T_c$ itself, together with the AFM spin fluctuation interaction. This ($D_{AFM}+D_{ph}$) type pairing exhibits strongly reduced isotope coefficient despite the large enhancement of $T_c$ by phonon interaction.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.367-370
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• 2000

In this study, thin films of 70/30 and 80/20 mol% P(VDF-TrFE) copolymers were fabricated by physical vapor deposition method. In order to determine the optimum deposition condition, the copolymer thin films were fabricated in the heating temperature of 260$^{\circ}C$, 280$^{\circ}C$, and 300$^{\circ}C$. The deposition rate was measured in a real time by thickness monitor. The surface image of prepared thin films was analyzed by using AFM. From the results of TG-DTA,70/30 and 80/20 mol% P(VDF-TrFE) copolymers were observed the Curie transition point below the melting point. As the results of AFM and FT-IR analysis, we determined that the optimum deposition temperature was 300$^{\circ}C$.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.05a
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• pp.551-552
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• 2010