• Title/Summary/Keyword: C-축 배향

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Preparation and Pervaporative Alcohol Dehydration of Crystallographically b/c-axis Oriented Mordenite Zeolite Membranes (결정학적으로 b/c-축 방향으로 배향된 모데나이트 제올라이트 분리막의 제조 및 투과증발 알코올 탈수 거동)

  • Kim, Young-Mu;Lee, Du-Hyoung;Kim, Min-Zy;Cho, Churl-Hee
    • Membrane Journal
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    • v.28 no.5
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    • pp.340-350
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    • 2018
  • In the present study, crystallographically b- and c-axis oriented mordenite zeolite membranes were prepared and their pervaporative ethanol dehydration was investigated. The seed layer with a high coverage grew to be c-axis oriented dense layer, while the seed layer with a low coverage grew to be b-axis oriented layer. This phenomenon could be explained by the evolutionary selection growth mechanism. The b-axis grown membrane with 8-membered rings showed a high separation factor of above 1000 and a considerable total flux of around $0.2kg/m^2h$. The c-axis grown, columnar structured membrane with 8- and 12-membered rings showed a low separation factor of less than 200 and a relatively high total flux of around $0.25kg/m^2h$. The high performance of b-axis grown membrane was due to the relatively small opening of 8-membered rings. Water molecules can freely permeate through the openings, but ethanol molecules, difficultly. Therefore, in the present study, we introduced a new method to control crystallographic orientation of mordenite membrane by changing seeding amount of needle-like crystals, and elucidated that b-axis oriented mordenite membrane showed better performance than c-axis grown mordenite membrane.

Synthesis of zeolite MFI films on alumina and silicon supports using seed crystals (알루미나와 실리콘 지지체에 종자결정에 의한 제올라이트 MFI 필름의 합성)

  • Ko, Tae-Seog
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.18 no.1
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    • pp.38-44
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    • 2008
  • Contiuous c-oriented zeolite MFI films $(<35{\mu}m)$ were prepared by hydrothermal secondary growth of silicalite-1 seed crystal in the surface of alumina porous substrate and silicon substrate. The supported films were characterized with scanning electron microscopy and X-ray diffraction. Effect of substrate surface roughness were investigated and a mechanism for c-oriented film formation and characteristic dom-like defects formation which is observed after seeding growth was discussed. The roughness of substrate plays an important role.

수열합성법으로 성장된 ZnO 박막의 열처리에 따른 특성 변화

  • Kim, Min-Su;Im, Gwang-Guk;Kim, So-ARam;Nam, Gi-Ung;Lee, Jae-Yong;No, Geun-Tae;Lee, Dong-Yul;Kim, Jin-Su;Kim, Jong-Su;Lee, Ju-In;Im, Jae-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.78-78
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    • 2011
  • 수열합성법을 이용하여 Si(111) 기판에 ZnO 박막을 성장하였다. ZnO 박막의 성장을 위한 씨앗층은 plasma-assisted molecular beam epitaxy (PA-MBE)를 이용하였다. 씨앗층의 표면 거칠기(root-mean-square roughness)는 2.5 nm이고, 씨앗층 위에 성장된 ZnO 박막은 다양한 크기의 입자들로 이루어져 있었으며 두께는 약 $1.8{\mu}m$로 매우 일정하였다. 배향성을 알아보기 위하여 texture coefficient (TC)를 계산해 보았다. TC(100)과 TC(200)은 a-축 배향성을, TC(002)는 c-축 배향성을 나타내는데, c-축으로 더 우세한 배향성(99.5%)을 보였다. TC 비율(TCa-axis/TCc-axis)은 열처리 온도를 $700^{\circ}C$까지 올렸을 때, 점차적으로 증가하였고, 그 이상의 열처리 온도(< $900^{\circ}C$)에서는 급격히 감소하였다. 잔류응력과 Zn와 O의 bond length도 유사한 경향을 보였다. $700^{\circ}C$까지 열처리 온도가 증가함에 따라, 잔류응력은 증가하였고 bond length는 감소하였다. Near-band-edge emission (NBE)의 피크 강도는 열처리 온도가 $700^{\circ}C$까지 증가함에 따라 점차적으로 증가하였다. 열처리 온도가 $800^{\circ}C$ 이상 증가함에 따라 deep-level emission (DLE)가 적색편이(red-shift)하였다. $700^{\circ}C$로 열처리를 한 ZnO 박막이 가장 우세한 (002)방향의 배향성을 보였을 뿐만 아니라 가장 큰 발광효율 증가를 보였다.

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Preparation of a axis oriented $YBa_2Cu_3O_{7-\delta}$ thin films by RF magnetron sputtering (RF 마그네트론 스퍼터링법에 의한 a-축 배향 $YBa_2Cu_3O_{7-\delta}$박막의 제조)

  • Lee, J.J.;Kim, Y.H.;Shin, J.;Lee, K.H.;Choi, S.S.;Hahn, T.S.
    • Korean Journal of Materials Research
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    • v.4 no.4
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    • pp.459-465
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    • 1994
  • A-axis oriened YBCO thin flims were grown on $LaAIO_{3}$ single crystal substrate by off-axis rf magnetron sputtering method. We used two kinds of process to get a-axis oriented fi1ms;one-step process and two-step process. In one-step process, films are grown in single step in which substrate temperature( $T_s$) is in the range of $590^{\circ}C$ to $680^{\circ}C$. On the other hand, in two step process a-axis oriented thin film templates i f about 30nm thickness is deposited at low temperature first, and subsequently films are grown at elevated temperature to the final thickness of about 100nm. In the case of one step process($T_s$ ~)$600^{\circ}C$), prefered a-axis orientation is dominant and Cu-rich phases segregate at the surface. Segregations decrease and ($00 \ell$) peaks increase upon increasing $T_s$. The films prepared by two step method appeared to have strong(h00) peaks as the deposition rate increased. Microstructure shows pin holes resulted from mixed phases of a-axis and c-axis oriented films. In both cases of one step and two step process, as TS decreases, prepared films show stronger a-axis orientation. However electrical properties of the films are depressed with lower $T_c$ and wider $\Delta T$ as $T_s$ decreases.

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Study on control of orientation of multicomponent thin film by laser ablation (레이저 어블레이션에 의한 다성분 박막의 방향성 제어 연구)

  • Park, Joo-Hyung;Lee, Sang-Yeol
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1226-1228
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    • 1997
  • 펄스 레이저 증착법을 이용하여 MgO 기판 위에 YBCO 박막을 c 축으로 성장시켰다. 이를 위하여 다양한 두께의 YBCO 박막을 여러 온도에서 증착시킴으로서 두께와 온도에 따른 YBCO 박막의 방향성을 조사하였다. 레이저원으로는 Nd:YAG 레이저의 355 nm의 파장을 이용하였으며, 증착시 기판온도는 $700^{\circ}C$$750^{\circ}C$에서 박막의 두께를 $3,000{\AA}$, $10,000{\AA}$, $20,000{\AA}$ 등으로 변화시켜 증착하였다. 이렇게 증착되어진 박막의 표면은 SEM으로 관촬되어졌으며, Raman Spectrascopy로 박막을 분석하였고, XRD를 사용하여 그 박막의 배향성을 연구하였다. 본 논문에서는 이와 같은 분석과 연구를 통하여 증착되어진 다성분 박막의 배향성이 기판온도와 박막두께에 따라 민감하게 변화함을 체계적으로 분석하였으며, 그 결과 기판온도와 박막 두께에 따른 YBCO 박막의 a 축, c 축 성장의 의존성을 확인하였다.

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A Study on Preferred Orientation of ZnO Piezoelectric Thin Film Using Helped Seed Layer (보조씨드층을 이용한 ZnO 압전박막의 우선배향성에 관한 연구)

  • Park, In-Chul;Kim, Hong-Bae
    • Journal of the Korean Vacuum Society
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    • v.15 no.6
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    • pp.619-623
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    • 2006
  • The most important factor which determines resonance characteristics of FBAR(Film Bulk Acoustic Resonator) is the piezoelectricity of piezoelectric film. The piezoelectric properties of ZnO thin films which is strong as FBAR piezoelectric film is determined by the degree of c-axis preferred orientation with (002) plan. Therefore, many researchers have been interested in the study on the preferred orientation of the piezoelectric thin film. This paper has studied the preferred orientation of ZnO piezoelectric thin films using the helped seed layer of ZnO. The result shows that the c-axis ZnO thin films with columnar grains that the value of standard $deviation(\sigma)$ of XRD rocking curve is of $\sigma=1.15^{\circ}$ have the excellent piezoelectric property.