• 제목/요약/키워드: Buffer layer

검색결과 1,103건 처리시간 0.026초

표면온도 및 조도분포가 있는 경우 난류경계층의 완충층 거동에 관한 연구 (A Study on the Behavior of Buffer Layer in Turbulent Boundary Layer with Variation of Surface Temperature and Roughness)

  • 정동빈
    • 수산해양기술연구
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    • 제35권1호
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    • pp.83-92
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    • 1999
  • In this paper, the wind tunnel test was carried to investigate the behavior of buffer layer in turbulent boundary layer with variation of surface temperature and roughness. The results were as follows; 1. The velocity in turbulent boundary layer was increased when the roughness height within viscous sublayer thickness was increased. 2. When the surface temperature was increased, the density of air was decreased and the velocity in turbulent boundary layer was increased. Thus, the thickness of turbulent boundary layer was decreased. 3. When the roughness height and surface temperature was increased simultaneously, the thickness of turbulent boundary layer was decreased. 4. The decrement of the thickness of turbulent boundary layer was more effected by the increment of the roughness height rather than the increment of surface temperature. 5. In this study, it was found that the condition of the highest velocity n turbulent boundary layer was the temperature 333K and roughness #100.

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Effect of ZnO Buffer Layers on the Crystallization of ITO Thin Film at Low Temperature

  • Seong, Chung-Heon;Shin, Yong-Jun;Jang, Gun-Eik
    • Transactions on Electrical and Electronic Materials
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    • 제13권4호
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    • pp.208-211
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    • 2012
  • In the present study, a ZnO thin film, as a buffer layer of ITO (indium tin oxide) film was deposited on glass substrates by RF magnetron sputtering at low temperature of $150^{\circ}C$. In order to estimate the optical characteristics and compare with the experimental results in Glass/ZnO(100 nm)/ITO(35 nm) multilayered film, the simulation program, EMP (Essential Macleod Program) was adopted. The sheet resistance and optical transmittance of the films were measured using the four-point probe method and spectrophotometer, respectively. From X-ray diffraction patterns, all the films deposited at $150^{\circ}C$ demonstrated only the amorphous phase. Optical transmittance was the highest at a ZnO thickness of 100 nm. The ITO(35 nm)/ZnO(100 nm) film exhibits an optical transmittance of >92% at 550 nm. The multilayered film showed an electrical sheet resistance of 407 ${\Omega}/sq.$, which is significantly better than that of a single-layer ITO film without a ZnO buffer layer (815 ${\Omega}/sq.$).

Properties of IZTO Thin Films Deposited on PET Substrates with The SiO2 Buffer Layer

  • Park, Jong-Chan;Kang, Seong-Jun;Chang, Dong-Hoon;Yoon, Yung-Sup
    • 한국세라믹학회지
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    • 제52권1호
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    • pp.72-76
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    • 2015
  • 150-nm-thick In-Zn-Tin-Oxide (IZTO) films were deposited by RF magnetron sputtering after a 10 to 50-nm-thick $SiO_2$ buffer layer was deposited by plasma enhanced chemical vapor deposition (PECVD) on polyethylene terephthalate (PET) substrates. The electrical, structural, and optical properties of the IZTO/$SiO_2$/PET films were analyzed with respect to the thickness of the $SiO_2$ buffer layer. The mechanical properties were outstanding at a $SiO_2$ thickness of 50 nm, with a resistivity of $1.45{\times}10^{-3}{\Omega}-cm$, carrier concentration of $8.84{\times}10^{20}/cm^3$, hall mobility of $4.88cm^2/Vs$, and average IZTO surface roughness of 12.64 nm. Also, the transmittances were higher than 80%, and the structure of the IZTO films were amorphous, regardless of the $SiO_2$ thickness. These results indicate that these films are suitable for use as a transparent conductive oxide for transparency display devices.

$ITO/PEDOT:PSS/TPD/Alq_3/Cathode$ 소자 구조에서 PEDOT:PSS 층과 음전극의 영향 (Effects of PEDOT:PSS Buffer Layer and Cathode in a Device Structure of $ITO/PEDOT:PSS/TPD/Alq_3/Cathode$)

  • 김상걸;정동회;이헌돈;오현석;조현남;이원재;김태완
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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    • pp.1003-1006
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    • 2003
  • We have investigated the effect of hole-injection buffer layer and cathodes in organic light-emitting diodes u sing poly (3,4-ethylenedioxythiophene) : poly (stylenesulfonate) (PEDOT: PSS) in a device structure of $ITO/PEDOT:PSS/TPD/Alq_3/Cathode$. Polymer PEDOT:PSS buffer layer was made using spin casting method. Current-voltage, luminance-voltage characteristics and efficiency of device were measured at room temperature with a variation of cathode materials. The device with LiF/Al cathode shows an improvement of external quantum efficiency approximately by a factor of ten compared to that of Al cathode only device. Our observation shows that the energy barrier-height in cathode side is important in improving the efficiency of the organic light-emitting diodes.

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초고주파 응용을 위한 MgO 버퍼층을 이용한 PST(100) 박막의 유전적 특성 (Dielectric properties of highly (100) oriented (Pb0.5, Sr0.5)TiO3thin films grown on Si with MgO buffer layer)

  • 엄준철;이성갑;김창일
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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    • pp.768-771
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    • 2004
  • Pb0.5,Sr0.5TiO3(PST) thin films were deposited on Si with MgO (100) buffer layer by the alkoxide-based sol-gel method. Structural and dielectric properties of PST thin films for the tunable microwave device applications were investigated. For the MgO/Si buffer layer, the PST thin films exhibited highly (100) orientation. The MgO buffer layer affects the stress state of the (100)-oriented PST thin films. The dielectric constant, tunability, and FOM of the highly (100)-oriented PST thin film increased with increasing annealing temperature due to the decrease in lattice distortion. The differences in dielectric properties may be attributed to the change in the film stress. The dielectric constants, dielectric loss and tunability of the PST thin films deposited on the MgO/Si substrates measured at 10 kHz were 822, 0.025, and 80.1%, respectively.

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SiC 버퍼충위 스퍼터링법으로 증착된 극한 환경용 AlN박막의 SAW 특성 (SAW characteristics of AlN films sputtered on SiC buffer layer for harsh environment applications)

  • 황시홍;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.273-273
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    • 2008
  • This paper describes the frequency response of two-port surface acoustic wave (SAW) resonator made of 002-polycrystalline aluminum nitride (AlN) thin film on 111-poly 3C-SiC buffer layer. In there, Polycrystalline AlN thin films were deposited on polycrystalline 3C-SiC buffer layer by pulsed reactive magnetron sputtering system, the polycrystalline 3C-SiC was grown on $SiO_2$/Si sample by CVD. The obtained results such as the temperature coefficient of frequency (TCF) of the device is about from 15.9 to 18.5 ppm/$^{\circ}C$, the change in resonance frequency is approximately linear (30-$150^{\circ}C$), which resonance frequency of AlN/3C-SiC structure has high temperature stability. The characteristics of AlN thin films grown on 3C-SiC buffer layer are also evaluated by using the XRD, and AFM images.

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Decalcomanie of flat-tubular segmented SOFC cell bytranscription-method and output characteristics according to buffer Layer

  • 구자빈;최병현;지미정;이미재;안용태;황해진
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2012년도 춘계학술발표대회
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    • pp.93.2-93.2
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    • 2012
  • 연료전지는 전기화학반응을 이용한 발전 장치로서 기존 장치에 비하여 발전 효율이 높아 화석연료를 사용하면서 현재 당면 과제인 $CO_2$ 배출량 절감이 가능하고, 환경 보전성이 우수하여 미래의 전원으로 많은 연구개발이 진행되고 있다. 특히 제3세대 연료전지라 불리는 고체산화물 연료전지(Solid Oxide Fuel Cell이하 SOFC)는 고가의 외부 개질 장치 없이도 연료가 갖는 화학에너지를 연소과정 없이, 공기와 $H_2$, CO, $CH_4$와 같은 환원성 가스를 공급받아 $600{\sim}1000^{\circ}C$에서 전기화학적 반응을 통하여 직접 전기를 얻는 방식이며, 낮은 소음과 진동으로 인하여 온 사이트(On-site) 발전이 가능한 장점이 있는 연료전지이다. Decalcomanie는 전사용지에 Screen printing하여 건조 후 coating하는 방법으로 기존의 여러 coating 방법보다 다전지셀 제작이나 Buffer layer의 적용이 용이하고, 소재의 크기나 두께조절이 간편하며, 구성층의 표면조도나 굴곡에 대응이 용이한 방법이다. 새로운 Decalcomanie를 사용하여 평관형 다전지식 SOFC Cell 제작 및 각 Buffer layer에 적용, Screen printing법과 동일한 Cell 제조 후 MPD와 Impedance 분석을 통하여 Support 위에 전사지를 이용, 적층한 Cell의 전기화학적 특성에 관하여 분석하였다.

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Properties of Infrared Detector and Growth for HgCdTe Epilayers

  • 홍광준;유상하
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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    • pp.116-119
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    • 2003
  • [ $Hg_{1-x}Cd_xTe$ ] (MCT) was grown by hot wall epitaxy method. Prior to the MCT growth, the CdTe (111) buffer layer was grown on the GaAs substrate at the temperature of 590 C for 15 min. When the thickness of the CdTe buffer layer was 5 m or thicker, the full width at half maximum values obtained from the x-ray rocking curves were found to significantly decrease. After a good quality CdTe buffer layer was grown, the MCT epilayers were grown on the CdTe (111) /GaAs substrate at various temperature in situ. The crystal quality for those epilayers was investigated by means of the x-ray rocking curves and the photocurrent experiment. The photoconductor characterization for the epilayers was also measured. The energy band gap of MCT was determined from the photocurrent measurement and the x composition rates from the temperature dependence of the energy band gap were turned out.

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Structural suitability of GdFeO3 as a magnetic buffer layer for GdBa2Cu3O7-x superconducting thin films

  • Park, H.S.;Oh, J.Y.;Song, B.H.;Kang, B.
    • 한국초전도ㆍ저온공학회논문지
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    • 제23권2호
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    • pp.14-18
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    • 2021
  • We investigated the structural suitability of GdFeO3 (GdFO) as a buffer layer for the GdBa2xCu3O7-x (GdBCO) superconducting films. GdFO films with different thicknesses and GdBCO thin films were all prepared by using a pulsed laser deposition technique. The analyses of X-ray diffraction and EXAFS data indicates that the c-axis parameter increases and the Fe-O bond length decreases with the GdFO thickness due to the compressive stain induced by the lattice mismatch between GdFO and STO substrate and as a result, the Debye-Waller factor, an index of disorder in the local structure near the Fe-O bond, increases with the GdFO thickness. However, for the GdBCO/GdFO bilayer structure, the Debye-Waller factor decreases as the GdFO thickness increases indicating a diminished disorder by the structural coupling between GdFO and GdBCO. These results indicate that an appropriate thickness of GdFO is required to be utilized as a magnetic buffer layer for the GdBCO superconducting films.

CeO$_2$ 완충층이 사파이어 기판에 성장된 YBCO 박막의 임계전류에 미치는 영향 (Effects of CeO$_2$ Buffer Layer on Critical Current of YBCO Thin Films grown on Sapphire Substrate)

  • 임해용;김인선;김동호;박용기;박종철
    • 한국초전도학회:학술대회논문집
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    • 한국초전도학회 1999년도 High Temperature Superconductivity Vol.IX
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    • pp.142-146
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    • 1999
  • CeO$_2$ buffer layers and in-situ YSa$_2Cu_3O_{7-{\delta}}$ (YBCO) thin films were grown by pulsed laser deposition method on R-plane sapphire substrates. Superconducting properties and surface morphologies of YBCO thin films exhibit strong dependence on the crystallinity of CeO$_2$ buffer layer. The best a-axis oriented CeO$_2$ buffer layers could be grown at 800 $^{\circ}C$ of deposition temperature, 1.5 J/ cm$^2$ of laser energy density and 50 mTorr of oxygen pressure. The YBCO thin films on the a-axis CeO$_2$ buffer layer have Tc (R=0) ${\ge}$ 89.5 K, ${\delta}$Tc ${\sim}$ 0.5 K, and Jc ${\ge}$ 3.2 ${\times}$ 10$^6$ A/ cm$^2$ at 77 K.

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