• Title/Summary/Keyword: Breakdown field

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Electrical Characteristics Analysis According to Electrode Shape and Distance Between Electrodes (전극 형태와 전극 간 거리에 따른 전기적 특성 분석)

  • Tae-Hee Kim;Soon-Hyung Lee;Mi-Yong Hwang;Yong-Sung Choi
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.36 no.4
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    • pp.408-412
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    • 2023
  • In this paper, in order to analyze high electrical insulation and cooling performance using mineral oil, the liquid insulating oil was changed in electrode shape and distance between electrodes to compare and analyze electrical characteristics according to equal electric field, quasi-equivalent electric field, and unequal electric field. As a result, the breakdown voltages were 36,875 V and 36,875 V in the form of sphere-sphere and plate-plate electrodes with equal electric fields. The breakdown voltage was 31,475 V in the sphere-plate electrode type, which is a quasi-equilibrium field, and the breakdown voltage was 28,592 V, 27,050 V, and 22,750 V in the needle-needle, sphere-needle, and needle-plate electrode types, which are unequal fields. Through this, it is possible to know the difference in breakdown voltage according to the type of electric field. The more equal the field, the higher the breakdown voltage, and the more unequal field, the lower the breakdown voltage. The difference in insulation breakdown voltage could be seen depending on the type of electric field, the insulation breakdown voltage was higher for the more equal electric field, and the insulation breakdown voltage was lower for the more unequal electric field. Also, it was confirmed that the closer the distance between the electrodes, the higher the insulation breakdown voltage, the higher the insulation breakdown current, and the insulation breakdown voltage and the insulation breakdown current were proportional.

Diamond Schottky Barrier Diodes With Field Plate (필드 플레이트가 설계된 다이아몬드 쇼트키 장벽 다이오드)

  • Chang, Hae Nyung;Kang, Dong-Won;Ha, Min-Woo
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.66 no.4
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    • pp.659-665
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    • 2017
  • Power semiconductor devices required the low on-resistance and high breakdown voltage. Wide band-gap materials opened a new technology of the power devices which promised a thin drift layer at an identical breakdown voltage. The diamond had the wide band-gap of 5.5 eV which induced the low power loss, high breakdown capability, low intrinsic carrier generation, and high operation temperature. We investigated the p-type pseudo-vertical diamond Schottky barrier diodes using a numerical simulation. The impact ionization rate was material to calculating the breakdown voltage. We revised the impact ionization rate of the diamond for adjusting the parallel-plane breakdown field at 10 MV/cm. Effects of the field plate on the breakdown voltage was also analyzed. A conventional diamond Schottky barrier diode without field plate exhibited the high forward current of 0.52 A/mm and low on-resistance of $1.71{\Omega}-mm$ at the forward voltage of 2 V. The simulated breakdown field of the conventional device was 13.3 MV/cm. The breakdown voltage of the conventional device and proposed devices with the $SiO_2$ passivation layer, anode field plate (AFP), and cathode field plate (CFP) was 680, 810, 810, and 1020 V, respectively. The AFP cannot alleviate the concentration of the electric field at the cathode edge. The CFP increased the breakdown voltage with evidences of the electric field and potential. However, we should consider the dielectric breakdown because the ideal breakdown field of the diamond is higher than that of the $SiO_2$, which is widely used as the passivation layer. The real breakdown voltage of the device with CFP decreased from 1020 to 565 V due to the dielectric breakdown.

A study on conduction current and D.C. breakdown characteristics in dielectric liquids (절연유의 도전전류와 직류절연파괴특성에 관한 연구)

  • 서국철
    • 전기의세계
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    • v.30 no.4
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    • pp.231-236
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    • 1981
  • It has been known that D.C. breakdown Voltage is lower than A.C. breakdown Voltage in insulatingoil, but there are still many unvivid points at electric conduction in breakdown or under of high electric field. This study measured the electric current-electric field characteristics (I-E characteristics) and the breakdown Voltage under of D.C. electric field of insulating oil using the system of electrodes that are near the Uniform electric field with a result. I can study, electric conduction in area of high electric field depends upon the Schottky effect. The liquidity of breakdown electric field takes place by the local concentration of electric field. The longer gap is and the more electric current is the more breakdown Voltage decreased. There are not almost the change of electric current-electric field characteristics by materials of electrode.

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A study on the repeated breakdown field strength of compressed $SF_{6}$ in uniform field perturbed by protrusion (교란된 평등전계에서 고기압 $SF_{6}$ 가스의 연속절연 파괴강도에 관한 연구)

  • 이동인
    • 전기의세계
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    • v.29 no.2
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    • pp.129-132
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    • 1980
  • For large gas-insulated systems, the conductor utilized possess some degree of surface roughness which locally enhances the applied field at highpressure in $SF_{6}$. In order to investigate the effect of field enhancement on the breakdown field strength, the spheric protrusion was employed which gives a quantitative analysis on field enhancement. For further investigations on the breakdown level and polarity effect in $SF_{6}$, the repeated breakdown tests were performed with d.c. voltage at pressures up to about 4 bar. The experimental results show that the breakdown level does vary noticeably due to successive voltage applications and the breakdown field strength measured for a test gap with the cathode protrusion is markedly lower than that determined from the identical anode protrusion.

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Influence of electrode surface conditions on breakdown field strength in pressurized $SF_{6}$ (고기압 $SF_{6}$가스에서 전극표면 상태가 절열파괴 강도에 미치는 영향)

  • 이동인
    • 전기의세계
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    • v.30 no.3
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    • pp.172-176
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    • 1981
  • The reduction in the breakdown field strength due to electrode surface roughness was calculated by applying the streamer breakdown criterion and the surface roughness factor, and measurements of static breakdown voltage for a gap with an artificial protrusion were made under the uniform field at pressures up to 4 bar in pressurized $SF_{6}$. The effect of polarity of highly stressed electrode on the breakdown field strength was also investigated. The measurements have shown that the measured breakdown levels for a protrusion located on the cathode agree with those calculated and the values measured with an identical anode protrusion are substantially higher and more scattered. This may be explained if it assumed that a high rate of production of initiatory electrons is maintained at the tip of a cathode protrusion by field emission. In practical point of view, the breakdown levels in pressurized $SF_{6}$ can be bereliably estimated from the values calculated.

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Effect on Metal Guard Ring in Breakdown Characteristics of SiC Schottky Barrier Diode (금속 가드 링이 SiC 쇼트키 다이오드의 항복전압에 미치는 영향)

  • Kim, Seong-Jin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.10
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    • pp.877-882
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    • 2005
  • In order to fabricate a high breakdown SiC-SBD (Schottky barrier diode), we investigate an effect on metal guard ring (MGR) in breakdown characteristics of the SiC-SBD. The breakdown characteristics of MGR-type SiC-SBD is significantly dependent on both the guard ring metal and the alloying time of guard ring metal. The breakdown characteristics of MGR-type SiC-SBDs are essentially improved as the alloying time of guard ring metal is increased. The SiC-SBD without MGR shows less than 200 V breakdown voltage, while the SiC-SBD with Al MGR shows approximately 700 V breakdown voltage. The improvement in breakdown characteristics is attributed to the field edge termination effect by the MGR, which is similar to an implanted guard ring-type SiC-SBD. There are two breakdown origins in the MGR-type SiC-SBD. One is due to a crystal defects, such as micropipes and stacking faults, in the Epi-layers and the SiC substrate, and occurs at a lower electric field. The other is due to the destruction of guard ring metal, which occurs at a higher electric field. The demolition of guard ring metal is due to the electric field concentration at an edge of Schottky contact metal.

Improving The Breakdown Characteristics of AlGaN/GaN HEMT by Optimizing The Gate Field Plate Structure (게이트 필드플레이트 구조 최적화를 통한 AlGaN/GaN HEMT 의 항복전압 특성 향상)

  • Son, Sung-Hun;Kim, Tae-Geun
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.5
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    • pp.1-5
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    • 2011
  • In this paper, we optimize the gate field plate structure to improve breakdown characteristics of AlGaN/GaN HEMT by two-dimensional device simulator. We have simulated using three parameters such as field-plate length, types of insulator, and insulator thickness and thereby we checked change of the electric field distribution and breakdown voltage characteristics. As optimizing field-plate structure, electric fields concentrated near the gate edge and field-plate edge are effectively dispersed. Therefore, avalanche effect is decresed, so breakdown voltage characteristic is increased. As a result breakdown characteristics of optimized gate field-plate structure are increased by about 300% compared to those of the standard structure.

Study on the Breakdown of the Transformer Insulating Oil in Nonuniform Electric Field (불평등 전계에서 변압기 절연유 절연파괴 연구)

  • Ha-Young Cho;Soon-Hyung Lee;Mi-Yong Hwang;Yong-Sung Choi
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.36 no.3
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    • pp.280-285
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    • 2023
  • A breakdown voltage and breakdown electric field of the transformer insulating oil of liquid dielectric were studied in uniform electric field and non-uniform electric field and the transformer insulating oil was observed by the process reached breakdown. Insulation performance evaluation of the liquid dielectric was evaluated at the electrode spacing of 2.5 mm under the conditions of domestic and international standards (KS C IEC 60156), so a comparative review was conducted at the electrode spacing of 2.5 mm. When the electrode spacing is 2.5 mm, the average breakdown voltage is 38.5 kV for sphere-sphere electrodes, 26.6 kV for plate-plate electrodes, 22.9 kV for needle-needle electrodes, and 24.3 kV for sphere-needle electrodes. 23.7 kV for the sphere-plate electrode, and 20.7 kV for the needle-plate electrode. From these results, it can be seen that the average value of the breakdown voltage at the electrode spacing of 2.5 mm, in ascending order, is sphere-sphere, plate-plate, sphere-needle, sphere-plate, needle-needle and needle-plate. It was found that the breakdown voltage of the unequal field was lower than that of the equal field.

FIELD LIMITING RING WITH IMPROVED CORNER BREAKDOWN

  • Lee, sangyong;Lho, Younghwan
    • Proceedings of the KIPE Conference
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    • 1998.10a
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    • pp.847-850
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    • 1998
  • This paper proposes a new scheme of FLR for improving corner breakdown voltage. The major difference from the conventional FLR is to build extra rings and floating field plates in the corner region. In this structure the additional field plate and ring have reduced th electric field at the junction in the corner region. Thus it improves the breakdown characteristics which are critical for obtaining high breakdown voltage.

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Study on Electrical Characteristics According Process Parameters of Field Plate for Optimizing SiC Shottky Barrier Diode

  • Hong, Young Sung;Kang, Ey Goo
    • Transactions on Electrical and Electronic Materials
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    • v.18 no.4
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    • pp.199-202
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    • 2017
  • Silicon carbide (SiC) is being spotlighted as a next-generation power semiconductor material owing to the characteristic limitations of the existing silicon materials. SiC has a wider band gap, higher breakdown voltage, higher thermal conductivity, and higher saturation electron mobility than those of Si. When using this material to implement Schottky barrier diode (SBD) devices, SBD-state operation loss and switching loss can be greatly reduced as compared to that of traditional Si. However, actual SiC SBDs exhibit a lower dielectric breakdown voltage than the theoretical breakdown voltage that causes the electric field concentration, a phenomenon that occurs on the edge of the contact surface as in conventional power semiconductor devices. Therefore in order to obtain a high breakdown voltage, it is necessary to distribute the electric field concentration using the edge termination structure. In this paper, we designed an edge termination structure using a field plate structure through oxide etch angle control, and optimized the structure to obtain a high breakdown voltage. We designed the edge termination structure for a 650 V breakdown voltage using Sentaurus Workbench provided by IDEC. We conducted field plate experiments. under the following conditions: $15^{\circ}$, $30^{\circ}$, $45^{\circ}$, $60^{\circ}$, and $75^{\circ}$. The experimental results indicated that the oxide etch angle was $45^{\circ}$ when the breakdown voltage characteristics of the SiC SBD were optimized and a breakdown voltage of 681 V was obtained.