• Title/Summary/Keyword: Bonding parameters

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ISB Bonding Technology for TSV (Through-Silicon Via) 3D Package (TSV 기반 3차원 반도체 패키지 ISB 본딩기술)

  • Lee, Jae Hak;Song, Jun Yeob;Lee, Young Kang;Ha, Tae Ho;Lee, Chang-Woo;Kim, Seung Man
    • Journal of the Korean Society for Precision Engineering
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    • v.31 no.10
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    • pp.857-863
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    • 2014
  • In this work, we introduce various bonding technologies for 3D package and suggest Insert-Bump bonding (ISB) process newly to stack multi-layer chips successively. Microstructure of Insert-Bump bonding (ISB) specimens is investigated with respect to bonding parameters. Through experiments, we study on find optimal bonding conditions such as bonding temperature and bonding pressure and also evaluate in the case of fluxing and no-fluxing condition. Although no-fluxing bonding process is applied to ISB bonding process, good bonding interface at $270^{\circ}C$ is formed due to the effect of oxide layer breakage.

The optimization of processing condition of dissimilar material bonding using the 60 kHz ultrasonic transducer (60 kHz 초음파 공구 혼을 이용한 이종재료접합의 공정조건 최적화)

  • Lee, DongWook;Jeon, EuySick
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.14 no.3
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    • pp.991-996
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    • 2013
  • In this paper, the ultrasonic horn having the natural frequency with 60 [kHz] for the dissimilar material bonding of the glass and solder tried to be designed. The ultrasonic horn was designed through the relational formula including the aspect ratio of the input terminal and output terminal, length of the ultrasonic horn. The modal analysis was performed for the propriety analysis of the designed horn. The parameters and response was set through the basic experiment. The dissimilar material bonding strength analysis using the ultrasonic transducer was done. The optimal process parameters having maximum bonding strength was derived.

A Study on the Improvement of High Temperature Bonding Performance of LCD Panel Bonding Equipment (LCD 패널 압착장비의 고온압착성능 개선에 관한 연구)

  • Hwang, Il-Kwon;Kim, Dong-Min;Chae, Soo-Won
    • Journal of the Korean Society for Precision Engineering
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    • v.27 no.12
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    • pp.84-91
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    • 2010
  • The bonding process of LCD panel is attaching an inner lead to an outer lead in the production line of LCD panel module. It is composed of an OLB process and a PCB bonding process. Since bonding tool assembly is one of the core parts of the bonding equipment that determines the durability and performance of the final product, much design efforts to enhance uniformity and efficiency of the process have been made. In this paper, FE analyses have been employed to determine the bonding tool size. Bonding tool of long bar shape has been simplified as a piece with same heater pitch, and appropriate boundary conditions such as convection and radiation are considered. Thermal analysis results by the FEM have been validated by the experiments. With the use of FE analysis varies design parameters and the corresponding effects have been evaluated. It was observed that the approach presented in this paper could be employed for the design of LCD module bonding tool.

Ultrasonic Bonding of Au Flip Chip Bump for CMOS Image Sensor (CMOS 이미지 센서용 Au 플립칩 범프의 초음파 접합)

  • Koo, Ja-Myeong;Moon, Jung-Hoon;Jung, Seung-Boo
    • Journal of the Microelectronics and Packaging Society
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    • v.14 no.1
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    • pp.19-26
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    • 2007
  • This study was focused on the feasibility of ultrasonic bonding of Au flip chip bumps for a practical complementary metal oxide semiconductor (CMOS) image sensor with electroplated Au substrate. The ultrasonic bonding was carried out with different bonding pressures and times after the atmospheric pressure plasma cleaning, and then the die shear test was performed to optimize the ultrasonic bonding parameters. The bonding pressure and time strongly affected the bonding strength of the bumps. The Au flip chip bumps were successfully bonded with the electroplated Au substrate at room temperature, and the bonding strength reached approximate 73 MPa under the optimum conditions.

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Effect of universal adhesive pretreatments on the bond strength durability of conventional and adhesive resin cements to zirconia ceramic

  • Tae-Yub Kwon;Seung-Hee Han;Du-Hyeong Lee;Jin-Woo Park;Young Kyung Kim
    • The Journal of Advanced Prosthodontics
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    • v.16 no.2
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    • pp.105-114
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    • 2024
  • PURPOSE. This study aimed to evaluate the effect of pretreatment of three different universal adhesives (Single Bond Universal [SBU], All-Bond Universal [ABU], and Prime&Bond universal [PBU]) on the bonding durability of an adhesive (Panavia F 2.0, PF) and a conventional (Duo-Link, DL) resin cements to air-abraded zirconia. MATERIALS AND METHODS. Rectangular-shaped zirconia specimens were prepared. The chemical composition and surface energy parameters of the materials were studied by Fourier transform infrared spectroscopy and contact angle measurement, respectively. To evaluate resin bonding to the zirconia, all the bonding specimens were immersed in water for 24 h and the specimens to be aged were additionally thermocycled 10000 times before the shear bond strength (SBS) test. RESULTS. The materials showed different surface energy parameters, including the degree of hydrophilicity/hydrophobicity. While the DL/CON (no pretreatment) showed the lowest SBS and a significant decrease in the value after thermocycling (P < .001), the PF/CON obtained a higher SBS value than the DL/CON (P < .001) and no decrease even after thermocycling (P = .839). When the universal adhesives were used with DL, their SBS values were higher than the CON (P < .05), but the trend was adhesive-specific. In conjunction with PF, the PF/SBU produced the highest SBS followed by the PF/ABU (P = .002), showing no significant decrease after thermocycling (P > .05). The initial SBS of the PF/PBU was similar to the PF/CON (P = .999), but the value decreased after thermocycling (P < .001). CONCLUSION. The universal adhesive pretreatment did not necessarily show a synergistic effect on the bonding performance of an adhesive resin cement, whereas the pretreatment was beneficial to bond strength and durability of a conventional resin cement.

Design and Experimental Results for Cooling Tubes of Ultrasonic Bonding Equipment of Ultrasonic Bonding Equipment (초음파 접합 장치의 냉각관 설계 및 접합강도 실험)

  • Lee, DongWook;Jeon, EuySick
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.15 no.4
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    • pp.1879-1884
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    • 2014
  • Recently, the micro bonding technology comes into the spotlight as the miniaturization of the electronic product. The micro bonding technique can classify by way of laser welding and ultrasonic bonding and etc. However, the research on the micro bonding is much lacks. In this paper, carried out the cooling analysis of the 60 [kHz] ultrasonic bonding equipment to know heat effect of the piezoelectric element when the ultrasonic bonding equipment was operated. The ultrasonic horn having the natural frequency with 60 [kHz] for the dissimilar material bonding of the glass and solder tried to be designed. The parameters and response was set through the basic experiment. The dissimilar material bonding strength analysis using the 60 [kHz] ultrasonic bonding equipment was done. We carried out the bonding for improving bonding strength to using the silver paste. air thightness of bonding surface was confirmed by analysis of bonding interfaces.

The dispersion of the flexural waves in a compound hollow cylinder under imperfect contact between layers

  • Ipek, Cengiz
    • Structural Engineering and Mechanics
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    • v.55 no.2
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    • pp.335-348
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    • 2015
  • The influence of the interface imperfect bonding on the flexural wave dispersion in the bilayered hollow circular cylinder is studied with utilizing three-dimensional linear theory of elastodynamics. The shear-spring type model is used for describing the imperfect bonding on the interface between the layers and the degree of the imperfectness is estimated through the dimensionless shear-spring parameters which enter the mentioned model. The method for finding the analytical expressions for the sought values and dispersion equation are discussed and detailed. Numerical results on the lowest first and second modes are presented and analyzed. These results are obtained for various values of the shear-spring parameters. According to these results, in particular, it is established that as a results of the imperfection of the bonding between the layers the new branches of the dispersion related the first fundamental mode arise and the character of the dispersion curve related to the second mode becomes more complicated.

Solvatochromic Effects and Hydrogen Bonding Interactions of 4-(4-Nitrophenylazo)-1-naphthol Derivatives

  • 신동명;권오악
    • Bulletin of the Korean Chemical Society
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    • v.16 no.7
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    • pp.574-577
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    • 1995
  • Solvatochromic effect and hydrogen bonding interaction of NPNOH, NPNO- and NPNOR were investigated. Electronic transition energies of the dyes were plotted against empirical solvent polarity parameters, Taft's π* and Reichardt's ET(30). Good correlations were observed when the excitation energies were plotted against the energy calculated by multiple linear regression method which was developed by Taft. There is an intrinsic difference between betaine for ET(30) polarity scale and the azoderivative, which is derived from the specific hydrogen bond incurred with probe molecules and solvents. The hydrogen bonding plays a very important role for stabilization of an excited state molecule by solvents especially when a solute possesses a negative charge as with NPNO-.

The Effect of Bubble Generated during COG Bonding on the Joint Reliability (COG본딩 공정 중 형성된 기포가 접합 신뢰도에 미치는 영향)

  • Choi, Eun-Soo;Yun, Won-Soo;Jeong, Young-Hun;Kim, Bo-Sun;Jin, Song-Wan
    • Journal of the Korean Society for Precision Engineering
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    • v.27 no.7
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    • pp.21-27
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    • 2010
  • The effect of COG bonding parameters, especially the bonding temperature, on the bonding quality and reliability was investigated in this paper. We measured the bubble area formed in the ACF resin during the bonding process and tried to investigate the relationship between bubble area and bonding peel strength. 85/85 test which exposes a sample to a 85% humidity and $85^{\circ}C$ temperature condition was also carried out. The bubble area was dramatically increased under ~$10^{\circ}C$ lower than recommended bonding temperature. The bubble area formed at the edge of IC chip was larger than the other parts of IC chip. But the peel strength was not associated with the bubble area. High temperature and humid condition made the bubble area larger, but we could not find clear trend of change in the peel strength.