• 제목/요약/키워드: Bonding method

검색결과 1,371건 처리시간 0.035초

비표면처리 강판을 사용한 iFLASH 시스템의 휨성능 평가 (Flexural Behavior of iFLASH System with No Blast Metal Cleaned Steel Plates)

  • 김용열;류재호;윤성원;주영규
    • 복합신소재구조학회 논문집
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    • 제6권4호
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    • pp.30-37
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    • 2015
  • iFLASH System is new structural floor system which consists of sandwich panels filled with nano-composite. The nano-composite has low specific gravity and high bonding strength with steel plates. The bonding strength is one of important factors for structural performance of iFLASH System and it can further be improved by surface preparation such as blast metal cleaning. However, using none blast steel plates is recommended since surface preparation generates additional fabrication time and cost. In this study, a bonding strength test and bending experiment were conducted to check feasibility of applying none blast steel plates to iFLASH System. Moreover, stress in bonding plane between steel plates and nano-composite was analytically evaluated by finite element method. Consequently, flexural capacity of the specimen was 11% higher than theoretically calibrated value and its flexural behavior was structurally efficient without defect of bonding.

Evaluation of different enamel conditioning techniques for orthodontic bonding

  • Turkoz, Cagri;Ulusoy, Cagri
    • 대한치과교정학회지
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    • 제42권1호
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    • pp.32-38
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    • 2012
  • Objective: The aim of this study was to compare the effects of different enamel conditioning techniques for bracket bonding. Methods: Ninety-one human premolars were randomly divided in six groups of 15 specimens each. The enamel surfaces of the teeth were etched with 35% orthophosphoric acid in Group 1, with a self-etching primer in Group 2, sandblasted in Group 3, sandblasted and etched with 35% orthophosphoric acid in Group 4, conditioned by Er:YAG laser in Group 5 and conditioned by Er:YAG laser and etched with 35% phosphoric acid gel respectively in Group 6. After enamel conditioning procedures, brackets were bonded and shear bonding test was performed. After debonding, adhesive remnant index scores were calculated for all groups. One tooth from each group were inspected by scanning electron microscope for evaluating the enamel surface characteristics. Results: The laser and acid etched group showed the highest mean shear bond strength (SBS) value ($13.61{\pm}1.14$ MPa) while sandblasted group yielded the lowest value ($3.12{\pm}0.61$ MPa). Conclusions: Although the SBS values were higher, the teeth in laser conditioned groups were highly damaged. Therefore, acid etching and self-etching techniques were found to be safer for orthodontic bracket bonding. Sandblasting method was found to generate inadequate bonding strength.

유리 기판과 패인 홈 모양의 홀을 갖는 웨이퍼를 이용한 웨이퍼 레벨 패키지 (Wafer Level Package Using Glass Cap and Wafer with Groove-Shaped Via)

  • 이주호;박해석;신제식;권종오;신광재;송인상;이상훈
    • 전기학회논문지
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    • 제56권12호
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    • pp.2217-2220
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    • 2007
  • In this paper, we propose a new wafer level package (WLP) for the RF MEMS applications. The Film Bulk Acoustic Resonator (FBAR) are fabricated and hermetically packaged in a new wafer level packaging process. With the use of Au-Sn eutectic bonding method, we bonded glass cap and FBAR device wafer which has groove-shaped via formed in the backside. The device wafer includes a electrical bonding pad and groove-shaped via for connecting to the external bonding pad on the device wafer backside and a peripheral pad placed around the perimeter of the device for bonding the glass wafer and device wafer. The glass cap prevents the device from being exposed and ensures excellent mechanical and environmental protection. The frequency characteristics show that the change of bandwidth and frequency shift before and after bonding is less than 0.5 MHz. Two packaged devices, Tx and Rx filters, are attached to a printed circuit board, wire bonded, and encapsulated in plastic to form the duplexer. We have designed and built a low-cost, high performance, duplexer based on the FBARs and presented the results of performance and reliability test.

구리-타이타늄 이중미세선재 번들압출의 공정지도 개발 (Development of A Process Map for Bundle Extrusion of Cu- Ti Bimetal Wires)

  • 김중식;이용신;윤상헌
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2005년도 추계학술대회 논문집
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    • pp.393-397
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    • 2005
  • A process map has been developed, which can identify the process conditions for weak mechanical bonding at the contact surface during the direct extrusion of a Cu-Ti bimetal wire bundle. Bonding mechanism between Cu and Ti is assumed as a cold pressure welding. Then, the plastic deformation at the contact zone causes mechanical bonding and a new bonding criterion fur pressure welding is developed as a function of the principal stretch ratio and normal pressure at the contact surface by analyzing micro local extrusion at the contact zone. The averaged deformation behavior of Cu-Ti bimetal wire is adopted as a constitutive behavior at a material point in the finite element analysis of Cu-Ti wire bundle extrusion. Various process conditions for bundle extrusions are examined. The deformation histories at the three points, near the surface, in the middle and near the center, in the cross section of a bundle are traced and the proposed new bonding criterion is applied to predict whether the mechanical bonding at the Cu-Ti contact surface happens. Finally, a process map for the direct extrusion of Cu-Ti bimetal wire bundle is proposed.

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개폐과전압 발생시 지중송전선로 편단접지 구간에서 SVL에 미치는 과도특성에 관한 연구 (A Study on SVL Transient Characteristics by Switching Overvoltage at Single Point Bonding Section in Underground Transmission Cables)

  • 정채균;강지원
    • 전기학회논문지
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    • 제63권6호
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    • pp.764-769
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    • 2014
  • This paper describes sheath voltage limiter(SVL) transient characteristics by switching overvoltage considering single point bonding in underground transmission cables. The crossbonding system is generally used for grounding methods of underground transmission system. However, the single point bonding system is used in selective area which is difficult to consist of crossbonding major section. The sheath voltage limiters are connected between joints in the single point bonding. Specially, the high overvoltage might be generated in that section as well as the aging of sheath voltage limiter might be progressed by various electrical stress including lightning overvoltage, switching overvoltage and power frequency overvoltage. Therefore, in this paper, the switching overvoltage characteristics in underground cables are firstly analysed using EMTP simulation. Then, the switching overvoltage of sheath voltage limiter is also studied in single point bonding. Finally, the reduction method of sheath voltage limiter switching overvoltage is proposed by various simulation studies including circuit breaker operating order.

스퍼터링 코팅층을 중간재로 사용한 동(Cu)의 저온 접합(제1보) (Low Temperature Bonding of Copper with Interlayers Coated by Sputtering(Part 1))

  • 김대훈
    • 연구논문집
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    • 통권24호
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    • pp.63-79
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    • 1994
  • This article reports a experimental study of the method to achieve a bond joint at lower temperature in a short time. DC magnetron sputtering of Sn, Sn/Pb, Sn/In and Sn/Cu on copper substrate was provided as an interlayer for Cu to Cu bonding under the air environment. Various examination was conducted and investigated on the effect of experimental parameters such as coating materials, coating time(or coating thickness), bonding temperature and bonding time etc. Bonding was performed at the temperature of $210^\circC-320^\circC$ for 0sec and interfacial reaction between the coated layer and copper substrate was examined using optical, scanning electron microscope and x-ray diffractometer. From the obtained results, it was found that intermetallic compounds layer consisted of $\eta-phase(Cu_6Sn_5)$ and $\beta-phase(Cu_3Sn)$ was formed at the joint interface for almost all coating materials. But the dominant phase formed in the preetched Cu substrate coated with Sn was $\beta-phase$. A characteristic morphology looks like a reaction ring, which was believed as the strong interconnecting regions between two substrates, was found to be formed on the reaction surface of copper substrates. The morphologies and compositions of the intermetallics, which depends on the regions of the reaction surface, was appeared as greatly different. Based on above results, the new bonding process to make the joint at lower temperature for short time can be admitted as a feasible process.

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유도 가열 접합 시스템을 이용한 대용량 이차전지 전극의 접합 방법 및 특성 (Electrode bonding method and characteristic of high density rechargeable battery using induction heating system)

  • 김은민;김신효;홍원희;조대권
    • Journal of Advanced Marine Engineering and Technology
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    • 제38권6호
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    • pp.688-697
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    • 2014
  • 본 연구에서는 최근, 전기자동차 및 소형 레저용 선박을 중심으로 연구가 진행 중인, 대용량 이차전지의 용량 증대를 위하여 필요한 내부 전극 접합 기술에 관하여 연구하였다. 종래의 초음파 용접으로 적층할 수 있는 적층 량의 한계를 극복하기 위한 방안으로 전극 소재에 직접 가열을 통한 용접 방법이 아닌 용가재 금속을 적용하여 전극을 접합시켜, 통전성과 인장강도를 증대시킴과 동시에 열적요인으로 인한 전극표면에 화학적 활성물질의 변성을 최소화 할 수 있는 저온 접합 방법에 대하여 연구하였다. 부연하여 현재 일반적으로 적용되고 있는 초음파 용접 및 저항 용접은 전극을 다량 적층 접합 시켰을 경우 일정한 전기 전도성과 접합 강도를 구현하기 힘들다. 용접을 위하여 무리하게 출력을 상승시킬 경우 용접열의 영향으로 전극의 변형 및 활성물질의 변성을 야기함과 동시에 최종 페키징(packaging) 이후 출력저하, 발열 등, 배터리의 안정성을 저하시키는 요인으로 작용한다. 따라서 본 연구에서는 고주파 유도가열을 통한 유도 가열 방식의 접합 방법과 용융 도금을 통한 용가재 금속의 전처리를 통한 종래와는 차별화된 전극접합 방법을 소개한다.

Benzalkonium Chloride가 BPDM/HEMA계 접착제의 상아질 접착에 미치는 영향 (EFFECT OF BENZALKONIUM CHLORIDE ON DENTIN BONDING WITH BPDM/HEMA SYSTEM)

  • 권병균;안식환;김성교
    • Restorative Dentistry and Endodontics
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    • 제21권2호
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    • pp.569-584
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    • 1996
  • The purpose of this study was to elucidate the effect of benzalkonium chloride on tensile bond strength of BPDM/HEMA dentin bonding. One hundred sixty dentin specimens from freshly extracted bovine mandibular incisors were used, and 0, 0.02, 0.1 or 0.5% benzalkonium chloride solution was applied to the dentin specimen with/after phosphoric acid. 32% phosphoric acid was used when the specimens were bonded with One-Step$^{TM}$, a BPDM/HEMA system and 10% was used when bonded with All-Bond$^{(R)}$ 2, a NTG-GMA/BPDM system. Aelitefil$^{TM}$ composite resin was bonded to the pretreated dentin specimen with the use of All-Bond$^{(R)}$ 2 or One-Step$^{TM}$ dentin bonding agent. After the bonded specimens were stored in $37^{\circ}C$ distilled water for 24 hours, tensile bond strength was measured. The fractured dentin specimens were examined under the scanning electron microscope. The results were as follows : Benzalkonium chloride application after acid-treatment resulted in decrease of dentin bond strength of One-Step$^{TM}$, a BPDM/HEMA system (p>0.05). Benzalkonium chloride application did not exert any influence on dentin bond strength of All-Bond$^{(R)}$ 2, a NTG-GMA/BPDM system (p>0.05). There was no relationship between the concentration or application method of benzalkonium chloride and the dentin bond strength of One-Step$^{TM}$ or All-Bon$^{(R)}$ 2 (p<0.05). On SEM examination of the fractured dentin-resin interface, while mixed failure was prominent in dentin bonding with One-Step$^{TM}$, adhesive and mixed failures were seen together in dentin bonding with All-Bond$^{(R)}$ 2 regardless of the concentration and application method of benzalkonium chloride.

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