• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.33 no.12
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• pp.61-67
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• 2005

This paper presents the carrier phase DGPS method providing a stable navigation solution under the condition of frequent blockage of the GPS signals. The proposed algorithm reject the channels having large errors using a clock bias drift and then calculated the more accurate solution. By investigating the relation between visible satellites` elevation and their clock bias drift, a proper threshold is set. Simulation shows that the presented result is as good as that of commercial system with real data.

• Journal of Positioning, Navigation, and Timing
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• v.1 no.1
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• pp.51-57
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• 2012

In this paper, design of an error model is presented in which the bias characteristic of the MEMS IMU is taken into consideration for performance enhancement of the MEMS IMU-based GPS/INS integrated navigation system. The drift bias of the MEMS IMU is modeled as a 1st-order Gauss-Markov (GM) process, and the autocorrelation function is obtained from the collected IMU data, and the correlation time is estimated from this. Prior to obtaining the autocorrelation function, the noise of IMU data is eliminated based on wavelet. As a result of simulation, it is represented that the parameters of error model can be estimated correctly only when a proper denoising is performed according to dynamic behavior of drift bias, and that the integrated navigation system based on error model, in which the drift bias is considered, provides more correct navigation performance compared to the integrated navigation system based on error model in which the drift bias is not considered.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.11
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• pp.912-916
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• 2001

Fluxmeter is a measuring instrument the magnetic flux intensity by means of an integration of the voltage induced to a search coil to unit time. It also is required to a precise integrator since the voltage induced to a search coil has a differential value of the flux ${\Phi}$ to unit time. In this study, a bias current which is a main problem of the integrator in a drift troublesome depending on the temperature of a FET is investigated. We have confirmed that the temperature dependence of both the bias current of a integrator using the FET and the reversal saturated current of the minor carrier in a P-N junction of a semiconductor were the same. The property of a commercial integrator goes rapidly down with increasing temperature. The bias current of a FET is increased twice as much with 10$^{\circ}C$ increment. As a result, the low drift integrator could be developed by setting the lower temperature up with a pottier device.

• Journal of the Korean Magnetics Society
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• v.15 no.6
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• pp.332-335
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• 2005

Output voltage of the flux-meter has always drift due to the input bias current of non-ideal operational amplifier. In this study we have employed a digital sample and hold amplifier which has no voltage drop to compensate drift of the flux-meter automatically. The drift of the developed flux-meter was smaller than $5{\times}10^{-8}\;Wb/s$ for the integration time constant of $RC=10^{-3}$ s.

• Journal of Institute of Control, Robotics and Systems
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• v.22 no.6
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• pp.470-476
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• 2016

This paper proposes a practical algorithm for the reduction of measurement errors due to drift in a micro-electromechanical system (MEMS) gyros that are used for a mobile robot. Any drift in a MEMS gyro will cause an unbounded growth of errors in the estimation of heading, which makes it nearly useless in applications that require high accuracy over a long operating time. In proposed method, maneuvers of a cleaning robot are observed through encoders' measurement process and a decision to correct bias drift will be made if necessary. The method used in this paper is called the "heading estimation filter". To evaluate the accuracy of the proposed method, a comparison was made between the estimation of the heading of the cleaning robot and one from a motion capture system.

• Journal of Magnetics
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• v.8 no.4
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• pp.160-163
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• 2003

In magnetic flux measurement, output voltage drift of electronic integrator is an essential problem. In this work, we have developed a new kind of Miller type integrator using a sample and hold amplifier. Input bias current was measured and this value was hold in the sample and hold amplifier, after that input bias current of Miller integrator was compensated automatically using the value which holds in the sample and hold amplifier. Developed flux-meter shows the drift of flux-meter are smaller than 10$^{-5}$ Wb/min in full scale of 10$^{-2}$, and we could also measure multi-channel magnetic flux simultaneously.

• Bulletin of the Korean Space Science Society
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• 2010.04a
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• pp.27.5-28
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• 2010

The unexpected observation condition or insufficient measurement modeling can lead to uncertain measurement errors. The uncertain measurement error of orbit determination problem typically consists of noise, bias and drift. It must be removed by using a proper estimation process for better orbit accuracy. The estimation of noise and drift is not easy because of their random or unpredictable variation. On the other hand, bias is a constant difference between the mean of the measured values and the true value, so it can be simply removed. In this study, precision orbit determination with SLR observations considering range bias estimation is presented. The Yonsei Laser-ranging Precision Orbit Determination System (YLPODS) and SLR NP (Normal Point) observations of CHAMP satellite are used for this work. The SLR residual test is performed to estimate the range bias of each arc. The result shows that we can get better orbit accuracy through range bias estimation.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.2
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• pp.106-112
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• 2007

Advanced back-end processing requires the integration of low-k dielectrics and Cu. However, in the presence of an electric field and a temperature, positive Cu ions may drift rapidly through dielectric and causing reliability problems. Therefore, in this paper, Cu+ drift diffusion in two low-k materials and silicon oxide is evaluated. The drift diffusion is investigated by measuring shifts in the flat band voltage of capacitance-voltage measurements on Cu gate capacitors after bias thermal stressing. The Cu+ drift late in $SiO_{x}C_{y}\;(2.85{\pm}0.03)$ and Polyimide(2.7${\leq}k{\leq}3.0$) is Considerably lower than in thermal oxide.

• Journal of Sensor Science and Technology
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• v.24 no.6
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• pp.368-372
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• 2015

In this paper, we proposed a post-processing technique for improving classification performance of electronic nose (E-Nose) system which may be occurred drift signals from sensor array. An adaptive radial basis function network using stochastic gradient (SG) and singular value decomposition (SVD) is applied to process signals from sensor array. Due to drift from sensor's aging and poisoning problems, the final classification results may be showed bias and fluctuations. The predicted classification results with drift are quantized to determine which identification level each class is on. To mitigate sharp fluctuations moving-averaging (MA) technique is applied to quantized identification results. Finally, quantization and some edge correction process are used to decide levels of the fluctuation-smoothed identification results. The proposed technique has been indicated that E-Nose system was shown correct odor identification results even if drift occurred in sensor array. It has been confirmed throughout the experimental works. The enhancements have produced a very robust odor identification capability which can compensate for decision errors induced from drift effects with sensor array in electronic nose system.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.144-147
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• 2003

Cu+ ions drift diffusion in formal oxide film and SiOCH film for interlayer dielectric is evaluated. The diffusion is investigated by measuring shift in the flatband voltage of capacitance/voltage measurements on Cu gate capacitors after bias temperature stressing. At a field of 0.2MV/cm and temperature $200^{\circ}C,\;300^{\circ}C,\;400^{\circ}C,\;500^{\circ}C$ for 10min, 30min, 60min. The Cu+ ions drift rate of $SiOCH(k=2.85{\pm}0.03)$ film is considerable lower than termal oxide. As a result of the experiment, SiOCH film is higher than Thermal oxide film for Cu+ drift diffusion resistance. The important conclusion is that SiOCH film will solve a causing reliability problems aganist Cu+ drift diffuion in dielectric materials.