• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.7
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• pp.81-88
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• 2002

A new pattern generator of BIST based on the pattern clustering is developed. The proposed technique embeds a pre-computed deterministic test set with low hardware overhead for test-per-clock environments. The test control logic is simple and can be synthesized automatically. Experimental results for the ISCAS benchmark circuits show that the effectiveness of the new pattern generator compared to the previous methods.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.8 s.338
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• pp.7-14
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• 2005

This paper presents a new low power BIST TPG scheme. It uses a transition monitoring window (TMW) that is comprised of a transition monitoring window block and a MUX. When random test patterns are generated by an LFSR, transitions of those patterns satisfy pseudo-random gaussian distribution. The Proposed technique represses transitions of patterns using a k-value which is a standard that is obtained from the distribution of U to observe over transitive patterns causing high power dissipation in a scan chain. Experimental results show that the Proposed BIST TPG schemes can reduce scan transition by about $60\%$ without performance loss in ISCAS'89 benchmark circuits that have large number scan inputs.