• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2000.05a
• /
• pp.850-853
• /
• 2000

최근에 초정밀 제조업 분야에서 볼의 이용에 관한 연구가 급속히 진행되고 있으며, 일부 반도체 분야에서는 BGA(Ball Grid Array)와 같은 용도로 이용되기도 하며, 볼 자체를 반도체 칩으로 응용하려는 시도가 제안되어 있다. 이러한 적용분야들에서 볼의 진구도, 정밀도 및 청정도 등을 만족시킬 수 있는 가공기술이 선결되어야 한다. 본 연구에서는 초정밀 볼의 가공기술 개발을 목적으로 하여 유리 볼을 대상으로 하고 $H_2O$와 CeO$_2$를 혼합한 연마재를 사용하여 부상회전에 의한 비접촉식 연마방법을 제안하고 가공특성을 조사하였다 연구 결과로서, 비 접촉식 볼의 가공에서는 가공에 앞서 $H_2O$와의 전처리 과정을 거침으로 해서 가공속도를 촉진시킬 수 있다는 사실이 확인되었다.

• Journal of Welding and Joining
• /
• v.18 no.4
• /
• pp.64-69
• /
• 2000

Reliability of PBGA(Plastic Ball Grid Array) package is very weak compared with normal plastic packages. The reliability are the lower resistance to popcorn cracking, which is reduced by moisture absorption in PCB(Printed Circuit Board). This paper adapts plasma treatment process and analyzes their effect. The contents of C and Cl decrease after plasma treatment but O, Ca and N relatively increase. The Plasma treatment to improve the adhesion between EMC(Epoxy Molding Compound) and PCB(solder mask). The degree of improvement was over 100% Max., which is depend on the properties of EMC. Ar+H$_2$as plasma gas show good result. There is a little difference in RF power and treatment time.

• Journal of Welding and Joining
• /
• v.18 no.2
• /
• pp.222-222
• /
• 2000

PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB baking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB baking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate. (Received November 19, 1999)

• Journal of Welding and Joining
• /
• v.18 no.2
• /
• pp.95-99
• /
• 2000

PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB banking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB banking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.47 no.11
• /
• pp.1-5
• /
• 2010

We developed a novel micro-electro mechanical systems (MEMS) test socket using silicon on insulator (SOI) substrate with the cantilever array structure. We designed the round shaped cantilevers with the maximum length of $350{\mu}m$, the maximum width of $200{\mu}m$ and the thickness of $10{\mu}m$ for $650{\mu}m$ pitch for 8 mm x 8 mm area and 121 balls square ball grid array (BGA) packages. The MEMS test socket was fabricated by MEMS technology using metal lift off process and deep reactive ion etching (DRIE) silicon etcher and so on. The MEMS test socket has a simple structure, low production cost, fine pitch, high pin count and rapid prototyping. We verified the performances of the MEMS test sockets such as deflection as a function of the applied force, path resistance between the cantilever and the metal pad and the contact resistance. Fabricated cantilever has 1.3 gf (gram force) at $90{\mu}m$ deflection. Total path resistance was less than $17{\Omega}$. The contact resistance was approximately from 0.7 to $0.75{\Omega}$ for all cantilevers. Therefore the test socket is suitable for BGA integrated circuit (IC) packages tests.

• Journal of the Microelectronics and Packaging Society
• /
• v.10 no.1
• /
• pp.45-50
• /
• 2003

Global full 3D finite element analysis fatigue models are constructed for flip-chip BGA on system board to predict the creep fatigue life of solder joints during the thermal cycling test. The fatigue model applied is based on Darveaux's empirical equation approach with non-linear viscoplastic analysis of solder joints. The creep life was estimated the creep life as the variations of the four kinds of thermal cycling test conditions, pad structure, composition and size of solder ball. The shortest fatigue life was obtained at the thermal cycling test condition from $-65^{\circ}C$ to $150^{\circ}C$. It was increased about 3.5 times in comparison with that from $0^{\circ}C$ to $100^{\circ}C$. At the same conditions, the fatigue life of SMD structure as the change of pad structure increased about 5.7% as compared with NSMD structure. Consequently, it was confirmed that the fatigue life became short as the creep strain energy density increased in solder joint.

• Journal of the Microelectronics and Packaging Society
• /
• v.22 no.1
• /
• pp.69-74
• /
• 2015

With difficulties during the cleaning of reflow flux residues due to the decrease of the part size and interconnection pitch in the advanced electronic devices, the need for the no-clean solder paste is increasing. In this study, an epoxy curable solder paste was made with SAC305 solder powder and the curable flux of which the main ingredient is epoxy resin and its reflow solderability, flux residue corrosivity and solder joint mechanical properties was investigated with comparison to the commercial rosin type solder paste. The fillet shape of the cured product around the reflowed solder joint revealed that the curing reaction occurred following the fluxing reaction and solder joint formation. The copper plate solderability test result also revealed that the wettability of the epoxy curable solder paste was comparable to those of the commercial rosin type solder pastes. In the highly accelerated temperature and humidity test, the cured product residue of the curable solder paste showed no corrosion of copper plate. From FT-IR analysis, it was considered to be resulted from the formation of tight bond through epoxy curing reaction. Ball shear, ball pull and die shear tests revealed that the adhesive bonding was formed with the solder surface and the increase of die shear strength of about 15~40% was achieved. It was considered that the epoxy curable solder paste could contribute to the improvement of the package reliability as well as the removal of the flux residue cleaning process.

• Proceedings of the KWS Conference
• /
• 2009.11a
• /
• pp.74-74
• /
• 2009

카본나노튜브(CNT) 복합체는 우수한 기계적 성질을 가지고 있어 다양한 분야에서 연구되고 있다. 본 연구에서는 카본나노튜브(CNT)를 간단한 볼밀공정을 사용하여 Sn3.5Ag solder ball과 SAC305 powder 표면에 혼합하고 이를 통해 접합부 특성을 관찰하였다. 볼밀을 실시하기 전 카본나노튜브(CNT)는 초음파을 이용하여 분산을 실시하였다. Sn3.5Ag solder ball의 직경은 450um이고 SAC305 powder의 직경은 약 30um이었으며 이때 사용한 볼밀볼의 직경은 각각 3mm, 1mm이다. 볼밀 회전속도는 약 300rpm이고 6, 12, 18, 24시간동안 볼밀을 실시하였다. 24시간 볼밀 후에도 solder ball과 solder powder의 모양은 크게 변하지 않았다. SEM을 통해 표면을 관찰한 결과 분산된 카본나노튜브(CNT)는 solder ball과 solder powder의 표면에서 관찰되었다. 카본나노튜브(CNT)가 삽입된 solder ball은 BGA coupon 위에 놓고 Reflow를 실시하여 접합하였고 solder powder은 flux를 첨가하여 paste로 제조하여 2012 chip에 대한 접합특성을 관찰하였다. 카본나노튜브(CNT)는 solder ball 내부의 표면근처에서 관찰되었으며 카본나노튜브(CNT)가 혼합된 solder ball은 Aging 실시 후에 IMC 두께가 카본나노튜브(CNT)가 혼합되지 않은 solder ball에 비해 두께가 작고 접합강도는 약 10% 증가하였다. 또한 카본나노튜브(CNT)가 혼합된 solder paste와 카본나노튜브(CNT)가 혼합되지 않은 solder paste를 비교한 결과 인쇄성은 모두 양호하였으며 카본나노튜브(CNT)가 혼합된 paste를 사용한 chip의 전단강도가 높게 나타났다.

• Journal of the Microelectronics and Packaging Society
• /
• v.16 no.2
• /
• pp.11-19
• /
• 2009

Thermo-mechanical behaviors of wire-bond plastic ball grid array (WB-PBGA) package assemblies are characterized by high-sensitivity moire interferometry. Using the real-time moire setup, fringe patterns are recorded and analyzed for several temperatures. Experiments are conducted for three types of WB-PBGA package that have full grid pattern and perimeter pattern with/without central connections. Bending deformations of the assemblies and average strains of the solder balls are investigated, with an emphasis on the effect of solder interconnection grid patterns, Thermal strain distributions and the location of the critical solder ball in package assemblies are quite different with the form of solder ball grid pattern. For the WB-PBGA-PC, The largest of effective strain occurred in the inner solder ball of perimeter closest to the chip solder balls. The critical solder ball is located at the edge of the chip for the WB-PBGA-FG, at the most outer solder ball of central connections for the WB-PBGA-P/C, and at the inner solder ball closest to the chip for the WB-PBGA-P.

• Journal of the Microelectronics and Packaging Society
• /
• v.8 no.3
• /
• pp.37-42
• /
• 2001

The concerns of the toxicity and health hazard of lead in solders have demanded the research to find suitable lead-free solder alloys. It was discussed that effect of the intermetallic formation and structure on the reliability of solder joints. In this study, lead-free solder alloys with compositions of Sn/3.5Ag/0.75Cu, Sn/2.0Ag/0.5Cu/2.0Bi were applied to the 48 $\mu$BGA packages. Also, the lead-free solder alloys compared with eutectic Sn/37Pb solder using shear test under various aging temperature. Common $\mu$BGA with solder components was aged at $130^{\circ}C$, $150^{\circ}C$ and $170^{\circ}C$. And the each temperature applied to 300, 600 and 900 hours. The thickness of the intermetallics was measured for each condition and the activation energy for their growth was computed. The fracture surfaces were analyzed using SEM (Scanning Electron Microscope) with EDS (Energy Dispersive Spectroscopy). These results for reliability of lead-free interconnections are discussed.