• Journal of Korean Society for Quality Management
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• v.29 no.3
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• pp.66-78
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• 2001

This paper deals with problem of determining process target value under automated visual inspection(AVI) system. Three independent error sources - digitizing error, illumination error, and positional error - which have a close relationship with the performance of the AVI system, are considered. Assuming that digitizing error is uniformly or normally distributed and illumination and positional errors are normally distributed, respectively, the distribution function for the error of measured lengths is derived when the length of a product is measured by the AVI system. Then, Optimal target values under two error models of AVI system are obtained by minimizing the total expected cost function which consists of give away, rework and penalty cost. To validate two process setting models, AVI system for drinks filling process is made up and test results are discussed.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.49 no.1
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• pp.8-11
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• 2012

Automated Vision Inspection (AVI) systems automatically detect any defect feature in a surface image. The performance of the system can be measured under a special circumstances such as ultimate defect detection. In this situation, the defect signal level is similar to noise level and it becomes hard to make a solid decision with AVI systems. In this paper, we propose an effective preprocessing technique to enhance SNR (Signal to Noise Ratio). The method is motivated by some principles of HVS (Human Visual System) and RLC (Run Length Coding) techniques is used for this purpose. The proposed preprocessing technique enhances SNR under ultimate defect conditions and improves overall performance of AVI system.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.21 no.1
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• pp.1-11
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• 1997

Austomated visual inspection(AVI) capability has become an important key component in the automated manufacturing system. In such a visual inspection system an intensity(or color) image of a scene is quickly affected by optical property of objects, condition and roughness of surface, lens and filters, image sensor property and lighting system. In particular, the lighting system disign is the most important factor, since it affects overall performance of the visual system. For fast and cheap automated visual inspection system it is important to obtain the good image quality which results from careful attention to the design of the lighting system. In this paper, the lighting subsystem of AVI system is analysed for the inspection of printed circuit board(PCB) patterns. The spectral reflectance of materials, which are composed of PCB, is measured for choosing the light source. The reflection property is theoretically obtained by a reflection model and also obtained by experiments which measure intensity with varying the viewing direction of image sensor and the lighting direction of illuminator. The illumination uniformity of a ring-type illuminator. The lighting system is designed based upon the experimental results and theoretial analysis.

• International journal of advanced smart convergence
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• v.1 no.1
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• pp.57-60
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• 2012

In this paper, we have performed a safety analysis on an automotive evaporator inspection system. We performed the bi-directional analysis on the manufacturing line. Software Fault Tree Analysis (SFTA) as backward analysis and Software Failure Modes, Effects, & Criticality Analysis (SFMECA) as forward analysis are performed alternately to detect potential cause-to-effect relations. The analysis results indicate the possibility of searching and summarizing fault patterns for future reusability.

• IE interfaces
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• v.11 no.3
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• pp.15-22
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• 1998

A new improved algorithm in edge location to subpixel accuracy using decent-based weight to spatial information is proposed in this paper and applied to automated visual inspection(AVI) system. An application of the new edge operator as an edge detector is also provided and compared with Tabatabai and Lyvers edge detectors. The existing algorithms located edger to subpixel accuracy using least-square or moment-based methods. The algorithms also use only spatial information or grey-level values to locate edges. However, the proposed algorithm consider the weighted sum of grey-levels values of each edge pattern. The results show that the proposed algorithm is relatively less biased and has smaller standard deviation than the edge operations developed by Tabatabai and Lyvers in the presence of noise.

• Journal of Institute of Control, Robotics and Systems
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• v.4 no.3
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• pp.384-391
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• 1998

When a device is mounted on the PCB, it is impossible to have zero defects due to many unpredictable problems. Among these problems, devices with bent corner leads due to mis-handling and which are not placed at a given point measured along the axis are principal problem in SMT(Surface Mounting Technology). It is obvious that given the complexity of the inspection task, the efficiency of a human inspection is questionable. Thus, new technologies for inspection of SMD(Surface Mounting Device) should be explored. An example of such technologies is the Automated Visual Inspection(AVI), wherein the vision system plays a key role to correct this problem. In implementing vision system, high-speed and high-precision are indispensable for practical purposes. In this paper, a new algorithm based on the Radon transform which uses a projection technique to inspect the FIC(Flat Integrated Circuit) device is proposed. The proposed algorithm is compared with other algorithms by measuring the position error(center and angle) and the processing time for the device image, characterized by line scan camera.