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Ultimate Defect Detection Using Run Length Coding in Automatic Vision Inspection System  

Joo, Younjg-Bok (Korea University of Technology and Education)
Kwon, Oh-Young (Korea University of Technology and Education)
Huh, Kyung-Moo (Dept. of Electronic Engineering, Dankook University)
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Abstract
Automated Vision Inspection (AVI) systems automatically detect any defect feature in a surface image. The performance of the system can be measured under a special circumstances such as ultimate defect detection. In this situation, the defect signal level is similar to noise level and it becomes hard to make a solid decision with AVI systems. In this paper, we propose an effective preprocessing technique to enhance SNR (Signal to Noise Ratio). The method is motivated by some principles of HVS (Human Visual System) and RLC (Run Length Coding) techniques is used for this purpose. The proposed preprocessing technique enhances SNR under ultimate defect conditions and improves overall performance of AVI system.
Keywords
Automatic; Vision; Inspection; Defect; Detection; HVS; RLC;
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