• Proceedings of the Korean Geotechical Society Conference
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• 2009.03a
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• pp.977-986
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• 2009

Sampling disturbance can introduce considerable errors in the laboratory estimation of geotechnical properties of soils, and the results obtained from sophisticated sampling and careful laboratory testing are not matching with field behavior. Therefore, it is advantage to adopt in-situ testing techniques for the estimation of geotechnical parameters. Therefore, Screw plate loading test, one of new field test technologies, has been investigated in this study. This test can be utilized to find out important properties of soils such as load-displacement, elastic modulus, and shear strength. The screw plate loading test modified from the plate loading test is an experiment underneath ground by inserting a spiral type of auger screw. The structure and characteristics of the screw plate loading test device was examined in detail. In addition, The new screw plate loading test device was manufactured to refer the previous studies. The reliability of developing screw plate loading test was examined through the analysis of the laboratory test.

• Journal of the Korean Electrochemical Society
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• v.2 no.1
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• pp.38-45
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• 1999

Electrochemical lithium intercalation into a PECVD (plasma enhanced chemical vapour deposited) carbon film electrode was investigated in 1 M $LiPF_6-EC$ (ethylene carbonate) and DEC (diethyl carbonate) solution during lithium intercalation and deintercalation, by using cyclic voltammetry supplemented with ac-impedance spectroscopy. The size of the graphitic crystallite in the a- and c-axis directions obtained from the carbon film electrode was much smaller than those of the graphite one, indicating less-developed crystalline structure with hydrogen bonded to carbon, from the results of AES (Auger electron spectroscopy), powder XRD (X-ray diffraction) method, and FTIR(Fourier transform infra-red) spectroscopy. It was shown from the cyclic voltammograms and ac-impedance spectra of carbon film electrode that a threshold overpotential was needed to overcome an activation barrier to entrance of lithium into the carbon film electrode, such as the poor crystalline structure of the carbon film electrode showing disordered carbon and the presence of residual hydrogen in its structure. The experimental results were discussed in terms of the effect of host carbon structure on the lithium intercalation capability.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.407-410
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• 2002

Thermal oxidations of 3C-SiC thin-films grown on Si(100) by APCVD(atmospheric pressure chemical vapor deposition) were carried out. The oxidations of 3C-SiC were performed at $1100^{\circ}C$ for 1~6 hr in wet and dry $O_2$ ambient, respectively. Ellipsometry was used to determine the thickness and index of refraction of oxide films. The oxide thickness vs. the oxidation time follows the general relationship used for the thermal oxidation of Si. The surface roughness was analyzed by using AFM(atomic force microscopy). The surface roughness of oxidized 3C-SiC was rougher than before oxidation. The thermal oxide was found to be $SiO_2$ by XPS(X-ray photoelectron spectroscopy) analysis. Auger analysis showed them to be homogeneous with near stoichiometric composition.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.08a
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• pp.130-132
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• 2003

ALD(Atomic Layer Deposition) 법으로 박막 알루미나를 형성한 후 웨이퍼 접합과 박막화 공정으로 알루미나를 매몰절연막으로 하는 SOI 구조를 제조하고 그 특성을 조사하였다. 알루미나 박막의 유전 특성과 실리콘과의 계면 특성은 C-V 측정으로, 단면 분석은 SEM(Scanning Electron Microscope) 촬영으로 조사하였다. 알루미나와 실리콘을 접합하기 위하여 1100C에서 열처리를 행한 후 알루미나와 실리콘의 계면 상태 밀도는 $2.5{\times}10^{11}/cm^2-eV$였다. 그리고 SEM의 단연 분석과 AES(Auger Electron Spectroscope)의 깊이 방향 분석을 통해서 매몰 알루미나층의 존재를 확인하였다. 알루미나는 실리콘 산화막보다 높은 열전도성을 가지므로 이를 매몰절연막으로 하여 SOI 구조를 제조하면 기존의 실리콘산화막을 매몰절연막으로 하는 SOI를 기판으로 하여 제조되는 소자보다 selg heating 효과가 감소된 우수한 특성의 소자를 제조할 수 있다.

• Transactions on Electrical and Electronic Materials
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• v.13 no.6
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• pp.287-291
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• 2012

We investigated the etching characteristics of TaN thin films in an $O_2/BCl_3/Cl_2/Ar$ gas using a high density plasma (HDP) system. A maximum etch rate of the TaN thin films and the selectivity of TaN to $SiO_2$ were obtained as 172.7 nm/min and 6.27 in the $O_2/BCl_3/Cl_2/Ar$ (3:2:18:10 sccm) gas mixture, respectively. At the same time, the etch rate was measured as a function of the etching parameters, such as the RF power, DC-bias voltage, and process pressure. The chemical states on the surface of the etched TaN thin films were investigated using X-ray photoelectron spectroscopy. Auger electron spectroscopy was used for elemental analysis on the surface of the etched TaN thin films. These surface analyses confirm that the surface of the etched TaN thin film is formed with the nonvolatile by-product.

• Journal of the Korean Solar Energy Society
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• v.35 no.4
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• pp.9-15
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• 2015

Black cobalt solar selective coatings were prepared by using an electroplating method. The changes in the optical properties of the black cobalt selective coating due to thermal degradation were analyzed by using the Auger electron spectroscopy (AES) and spectrophotometer. The black cobalt selective coating was prepared on a copper substrate by using a synthesized electrolyte with $CoCl_2$ and KSCN at a current density of ${\sim}0.5A/dm^2$ for 45s ~ 60s. Its optical properties were a solar absorptance (${\alpha}$) of the order of 0.80 ~ 0.84 and a thermal emittance (${\epsilon}$) of 0.01. From the AES depth profile analysis of heated sample, thermal degradation of the black cobalt selective coating heated for 33 hours at temperature of $350^{\circ}C$ occurred primarily due to interdiffusion at interface of cobalt and copper substrate. This results were predictable that the ${\alpha}$ decreases due to the thermal oxidation and diffusion.

• Korean Journal of Materials Research
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• v.8 no.6
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• pp.551-559
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• 1998

장경비가 큰 탄화규소를 탄소와 규소간의 고온연소반응으로 제조하기 위하여 공정변수에 따른 연소거동과 미세조직의 변화를 조사하였다. 연소합성된 생성물은 주로 $\beta$-SiC이며 연소반응이 충분히 진행되지 못하였을 경우에는 미량의 잔류 반응물과 $\alpha$-SiC가 관찰되었다. 생성된 탄화규소의 평균입도는 약 5$\mu\textrm{m}$로 작았으며, $1300^{\circ}C$ 이상의 예열 조건에서 장경비가 30이상인 탄화규소를 합성할 수 있었다. 압분 강도가 69MPa인 분말의 성형체에서 평균 연소 온도와 평균 전파 속도는 각각 약 $1425^{\circ}C$와 2.1mm/sec 범위이며, 연소 온도는 흑연 분말을 사용하였을 경우가 탄소 섬유를 사용한 경우보다 약 $10^{\circ}C$ 높았다. 연소 반응을 임의로 중단시킨 시편의 계면을 EDX와 Auger 전자 현미경으로 분석한 결과 상호 확산층이 관찰되지 않았다. 이는 탄화규조의 연소합성이 용해-석출 모델에 의하여 진행됨을 시사한다. 예열 온도에 따른 연소 반응 중의 온도 분포를 유한 요소법으로 해석함으로써 $2500^{\circ}C$의 초기 연소 개시 온도에 대하여 예열 온도 $300^{\circ}C$에서는 연소파가 거의 전파할 수 없으며 예열 온도가 $1300^{\circ}C$에서는 시료 내부에 자체 전파가 가능한 $2000^{\circ}C$이상의 온도 구역이 존재함을 알았다.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.179-179
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• 2013

현재 자동차 분야에서 차량 경량화를 통해 연비 향상 및 에너지 효율 향상을 기대하고 있으며, 차량 경량화의 한 수단으로 자동차용 유리를 고강도 투명 플라스틱 소재인 PC (Polycarbonate)로 대체하고자 하는 연구가 활발히 이루어지고 있다. 그러나, PC의 낮은 내마모 특성과 자외선에 의한 열화 및 변색 현상은 해결하여야 할 중요한 문제점으로 지적되고 있다. 본 연구에서는, PC의 내마모 특성을 향상시키기 위하여 transmittance가 확보되고, 고경도 특성을 갖는 Al-Si-N 박막 증착에 대한 연구를 하였다. Al-Si-N 박막 증착을 위하여 ICP-assisted reactive magnetron sputtering 장비를 이용하였으며, 고경도 특성을 갖는 Al-Si-N 박막을 제조하였다. 분석 장비로는 박막의 chemical state와 crystallinity를 확인하기 위하여 XPS (X-ray Photoelectron Spectroscopy), AES (Auger electron spectrscopy)와 XRD (X-ray diffraction)를 이용하여 분석을 수행하였으며, Knoop ${\mu}$-hardness tester와 Pin-on-disk를 이용하여 경도 및 내마모 특성을 평가하였다. Al-Si-N 박막의 두께는 ~5,000 ${\AA}$을 증착하였으며, 가시광 영역에서 평균 92%의 transmittance를 나타내었다. 박막의 Si/(Al+Si) 비율에 따라 다른 경도 특성을 나타냈는데, Si/(Al+Si) 비율이 26~32% 부근에서 최대 31 GPa의 경도 값을 확인 할 수 있었다.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.1
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• pp.22-27
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• 2013

Detailed study on how the plasma process during the sidewall spacer formation suppresses the formation of silicide is done. In non-patterned wafer test, it is found that both fluorocarbon reactive ion etch (RIE) and TEOS plasma-enhanced deposition processes modify the Si surface so that the silicide reaction is chemically inhibited or suppressed. In order to investigate the cause of the chemical modification, we analyze the elements on the silicon surface through Auger Electron Spectroscopy (AES). From the AES result, it is found that the carbon induces chemical modification which blocks the reaction between silicon and nickel. Thus, protecting the surface from the carbon-containing plasma process prior to nickel deposition appears critical in successful silicide formation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.634-637
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• 1999

The amorphous vanadium oxide as a cathode material is very preferable for fabricating high performance micro-battery. The amorphous vanadium oxide cathode is preferred over the crystalline form because three times more lithium ions can be inserted into the amorphous cathode, thus making a battery that has a higher capacity. The electrochemical properties of sputtered films are strongly dependent on the oxygen partial pressure in the sputtering gas. The effect of different oxygen partial pressure on the electrochemical properties of vanadium oxide thin films formed by r.f. reactive sputtering deposition were investigated. The stoichiometry of the as-deposited films were investigated by Auger electro spectroscopy. X-ray diffraction and atomic force microscopy measurements were carried out to investigate structural properties and surface morphology, respectively. For high oxygen partial pressure(>30% ), the films were polycrystalline V$_2$O$_{5}$ while an amorphous vanadium oxide was obtained at the lower oxygen partial pressure(< 15%). Half-cell tests were conducted to investigate the electrochemical properties of the vanadium oxide film cathode. The cell capacity was about 60 $\mu$ Ah/$\textrm{cm}^2$ m after 200 cycle when oxygen partial pressure was 20%. These results suggested that the capacity of the thin film battery based on vanadium oxide cathode was strongly depends on crystallinity.y.