• Journal of Korean Ophthalmic Optics Society
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• v.10 no.2
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• pp.119-126
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• 2005

The purpose of this study was analyzed to compare on the physical characters of two companies of color contact lenses. Artificial tear solution was used for measuring the rate of protein deposits and wettability. The surface roughness of lenses was measured by SEM(scanning electron microscope, Japan) and AFM(atomic force microscope, MultimodeTM, USA). As a results, The color contact lenses was not different from general soft contact lenses in a respect of other properties. However, the colored contact lenses showed a severe crack on the surface under SEM observation. There was no irregularity on the surface of the colored contact lenses in AFM photograph. The dyes were deposited in inside of lenses by microscope observation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.05b
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• pp.327-330
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• 2000

The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. The Scanning near-field optical / atomic force microscopy (SNOAM) is a new tool for surface imaging which was introduced as one application of the atomic force microscope (AFM). Operated with non-contact forces between the optical fiber and sample as well as equipped with the piezoscanners, the instrument reports on surface topology without damaging or modifying the surface for measuring of optical characteristic in the films. We report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films by SMM. Furthermore, we have illustrated the SNOAM image in obtaining the merocyanine dye films as well as the optical image.

• Journal of Institute of Control, Robotics and Systems
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• v.6 no.1
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• pp.57-65
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• 2000

In this paper, a model reference adaptive control for the atomic force microscope (AFM) of tapping mode is investigated. The dynamics between the AFM system and al sample is mathematically modeled as a second order spring-mass-damper system with oscillatory inputs. The attractive and repulsive forces between the tip of the AFM system and the sample are derived using the Lennard-Jones potential energy. By non-dimensionalizing the displacement of the tip and the input frequency, the chaotic behavior near a resonance frequency is better depicted through the non-dimensionalized equations. Four nonlinear analysis techniques, a phase portrait, sensitive dependence on initial conditions, a power spectral density function, and a Pomcare map are investigated. Because the equations of motion derived in this paper involve unknown parameter values such as the damping effect of the air and the interaction constants between materials, the standard model reference adaptive control is adopted. Two control objectives, the prevention of chaos and the tracking of reference signal, are pursued. Simulation results are included.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2000.11a
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• pp.489-493
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• 2000

Turbine blade has trouble of cracking at root region. Fracture surface of blade root is surveyed by SEM and AFM to clear relation between fracture mechanical parameter and surface parameter (striation width and surface roughness). Service stress is predicted by maximum height roughness $R_{max}$, on fractured surface and stress analysis on turbine blade. It is to thought that turbine blade is fractured by abnormal condition such as incorrect fittings between pin and pin hole but isn't fractured by normal service conditions such as steam pressure, centrifugal force and torsional force.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.10
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• pp.61-68
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• 2001

Turbine blade in nuclear plant is subject to cyclic bending fatigue by high steam pressure. Especially, fatigue fracture is caused by low stress below yielding stress. Photograph by SEM doesn't have striation but photograph by AFM has striation on the fatigue fractured surface of 12% Cr steel used in turbine blade. Surface roughness $R_q$ has the linear relation with respect to stress intensity factor range ΔK and is increased linearly according to load amplitude $\textit{\Delta}P$. In this study loading condition applied to turbine blade is predicted by the relation between the gradient of $R_q$ to $\textit{\Delta}K$ and load amplitude $\textit{\Delta}P$.

• Clean Technology
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• v.18 no.4
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• pp.355-359
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• 2012

For effectively photochemical hydrogen production, Ti ions (0.01, 0.10, 0.50 mol%) impregnated $WO_3$ ($Ti/WO_3$) nanometer sized particles were prepared using a impregnation method as a photocatalyst. The characteristics of the synthesized $Ti/WO_3$ photocatalysts were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), photoluminescence spectra (PL), atomic force microscope (AFM), and electrostatic force microscope (EFM). The evolution of $H_2$ from methanol/water (1/1) photo-splitting over $Ti/WO_3$ photocatalysts was enhanced compared to those over pure $TiO_2$ and $WO_3$ photocatalysts; 3.02 mL of $H_2$ gas was evolved after 8 h when 0.5 g of a 0.10 mol% $Ti/WO_3$ catalyst was used.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.645-648
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• 2005

Microscopy has enabled the development of many advanced technologies, and higher level microscopic techniques are required according to the increase of research in nano-technology and bio-technology fields. Therefore, in many applications, we need to measure the dimension of micro-scale parts accurately, not just to observe their shapes. To establish the meter-traceability in microscopy, gratings have been widely used as a magnification standard. KRISS provides the certification service of magnification standards using an optical diffractometer and a metrological AFM (MAFM). They are based on different measurement principles, and so can give complementary information for each other. In this paper, we describe the configuration of each system and measurement procedures to certificate grating pitch values of magnification standards. Several measurement results are presented, and the discussion about them are also given. Using the optical diffractometer, we can calibrate a grating specimen with uncertainty of less than 50 pm. The MAFM can measure a grating specimen of down to 100 nm pitch value, and the calibrated values usually have uncertainty less than 500 pm.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.13 no.5
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• pp.217-221
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• 2003

In this work, chemical-solution derived silicate fibers were prepared by mixing tetraethyl orthosilicate, ethanol, distilled water, and hydrochloric acid in order to investigate surface roughness of fiber. Silicate fibers were drawn by using a viscous solution after evaporation at $80^{\circ}C$. The dried gel fibers were finally annealed at $1000^{\circ}C$, $1100^{\circ}C$, $1200^{\circ}C$ and $^1300{\circ}C$ for 60 min in dried air (flow rate = ∼200 ml/min). The crystallinity of the heat-treated silica fiber was analyzed by the X-ray diffraction $\theta$-2$\theta$ scan. A field emission-scanning electron microscope and an atomic force microscope were used to evaluate surface properties. The silicate fiber annealed at $1300^{\circ}C$ showed high value of root mean square roughness and had a relatively inhomogeneous surface structure.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.05a
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• pp.289-290
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• 2006

In general, atomic force microscope (AFM) used for metrological purpose has measuring range less than a few hundred micrometers. We design and fabricate an AFM with long measuring range of $200mm{\times}200mm$ in X and Y axes. The whole stage system is composed of surface plate, global stage, microstage. By combining global stage and microstage, the fine and long movement can be provided. We measure the position of the stage and angular motions of the stage by laser interferometer. A piezoresistive type cantilever is used for compact and long term stability and a flexure structure with PZT and capacitive sensor is used for Z axis feedback control. Since the system is composed of various actuators and sensors, a real time control program is required for the implementation of AFM. Therefore, in this work, we designed a multi-axis control program using a FPGA module, which has various functions such as interferometer signal converting, PID control and data acquisition with triggering. The control program achieves a loop rate more than 500 kHz and will be applied for the measurement of grating pitch and step height.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.514-514
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• 2007

1차원 구조를 갖는 나노 와이어들은 나노 소자를 구현하기 위한 building-block으로 많은 과학자들의 주목을 받고 있고 또한 연구되고 있다. 하지만 그것을 정확하게 위치시키고 일정한 간격으로 정렬시키기 위한 기술 개발은 아직도 해결해야 할 큰 과제로 남아 있다. 이 논문에서, 우리는 ahsing 기술과 표면 패터닝 기술을 이용하여 대면적의 실리콘웨이퍼 위에 DNA(deoxyribonucleic acid)를 기반으로 한 금 나노 와이어를 정확하게 위치시키고 일정한 간격으로 정렬시킬 수 있는 새로운 제어 기술을 제안한다. 먼저 우리는 포토 리소그래피 공정과 $O_2$ 플라즈마 ashing 기술을 이용하여 선폭을 100 nm로 감소 시켰다. 그리고 자기조립단분자막 (self-assembled monolayers; SAMs) 방법과 lift-off 공정을 반복함으로서 1-octadecyltrichlorosilane(OTS) 층과 aminopropylethoxysilane(APS) 층을 형성하였다. 마지막으로 DNA 용액을 샘플 표면 위에 도포하고 분자 빗질 방법으로 DNA를 한 방향으로 정렬 시켰고 금 나노입자 용액을 처리하였다. 그 결과 금 나노 와이어는 $10{\mu}m$ 간격으로 일정하게 정열 되었고, APS 층에만 정확하게 정렬되었다. 우리는 금 나노 와이어를 관찰하기 위하여 원자간력 현미경 (Atomic Force Microscope AFM)을 사용하였다.