• 제목/요약/키워드: All-optical OR logic gate

검색결과 425건 처리시간 0.038초

All-Optical Binary Full Adder Using Logic Operations Based on the Nonlinear Properties of a Semiconductor Optical Amplifier

  • Kaur, Sanmukh;Kaler, Rajinder-Singh;Kamal, Tara-Singh
    • Journal of the Optical Society of Korea
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    • 제19권3호
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    • pp.222-227
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    • 2015
  • We propose a new and potentially integrable scheme for the realization of an all-optical binary full adder employing two XOR gates, two AND gates, and one OR gate. The XOR gate is realized using a Mach-Zehnder interferometer (MZI) based on a semiconductor optical amplifier (SOA). The AND and OR gates are based on the nonlinear properties of a semiconductor optical amplifier. The proposed scheme is driven by two input data streams and a carry bit from the previous less-significant bit order position. In our proposed design, we achieve extinction ratios for Sum and Carry output signals of 10 dB and 12 dB respectively. Successful operation of the system is demonstrated at 10 Gb/s with return-to-zero modulated signals.

Ultrahigh Speed Reconfigurable Logic Operations Based on Single Semiconductor Optical Amplifier

  • Kaur, Sanmukh;Kaler, Rajinder-Singh
    • Journal of the Optical Society of Korea
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    • 제16권1호
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    • pp.13-16
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    • 2012
  • We demonstrate an optical gate architecture using a single SOA to perform AND, OR and NOT logic functions. Simple reconfigurable all-optical logic operations are implemented using RZ modulated signals at 40 Gb/s. Contrast ratio and extinction ratio values have been analysed for the different types of logic gates. Maximum extinction ratio and contrast ratio achieved are 19dB and 17.2 dB respectively. Simple structure and potential for integration makes this architecture an interesting approach in photonic computing and optical signal processing.

반도체 광증폭기를 이용한 다기능 전광 논리 소자의 설계 및 측정 (Design and Demonstration of All-Optical XOR, AND, OR Gate in Single Format by Using Semiconductor Optical Amplifiers)

  • 손창완;윤태훈;김상헌;전영민;변영태;이석;우덕하;김선호
    • 한국광학회지
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    • 제17권6호
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    • pp.564-568
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    • 2006
  • 반도체 광증폭기에 기반을 둔 이득포화특성을 이용하여 XOR, AND, OR 논리 게이트를 동시에 구현하는 다기능 전광 논리소자를 설계하고 구현하였다. 상용화된 프로그램인 VPI Component $Maker^{TM}$을 사용하여 시뮬레이션을 수행하였고 10 Gbit/s의 입력 신호를 사용하여 XOR, AND, OR 논리동작을 동시에 구현하는 다기능 전광 논리소자를 구현하였다.

반도체 광증폭기를 이용한 10 Gb/s 전광 AND논리소자 (10 Gb/s all optical AND gate by using semiconductor optical amplifiers)

  • 김재헌;김병채;변영태;전영민;이석;우덕하;김선호
    • 한국광학회지
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    • 제14권2호
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    • pp.166-168
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    • 2003
  • 반도체 광증폭기의 이득포화원리를 이용한 전광 AND논리소자가 10 Gb/s에서 처음으로 구현되었다. 먼저 첫 번째 반도체 광증폭기에 B 신호를 입력시켜 반전된 신호인 Boolean (equation omitted)이 얻어졌다. 이와 같이 반전된 신호는 두 번째 반도체 광증폭기에 A신호와 함께 동시 입력되어 AND논리소자의 특성이 얻어졌다.

프탈로시안 박막소자를 이용한 순광학적 AND Logic Gate (All-Optical AND Logic Gates using Metal-Free Phthalocyanine Films)

  • 유연석;오세권;신정록;김동균
    • 한국광학회:학술대회논문집
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    • 한국광학회 2001년도 제12회 정기총회 및 01년도 동계학술발표회
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    • pp.150-151
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    • 2001
  • 광컴퓨터에 있어서 비선형 물질의 역할은 매우 중요하다. 그러한 비선형 물질들은 빛과 상호작용하고 빛의 성질을 변조시킨다. 광컴퓨터의 몇몇 구성 성분들은 그들이 작용하는데 있어서 중요한 비선형물질을 필요로 한다. 하지만 모든 광학적 장치들의 사용이 사실상 제한되는 것은 현재 이용할 수 있는 비선형 광물질이 비효과적이고 응답과 스위칭에 대해서 많은 에너지를 필요로 하기 때문이다. (중략)

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굽은 비선형 도파로를 이용한 완전 광 신호 처리 소자 (All-optical signal processing in a bent nonlinear waveguide)

  • 김찬기;정준영;장형욱;송준혁;정제명
    • 한국광학회지
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    • 제8권6호
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    • pp.492-499
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    • 1997
  • 굽은 비선형 도파로를 이용한 완전 광 스위치와 굽은 비선형 Y 분기각을 갖는 도파로를 이용한 완전 광 논리 연산소자를 제안하였다. 제안된 완전 광 스위치와 완전 광 논리 연산소자는 굽은 비선형 도파로를 따라가는 비선형파의 전파에 기초를 두고 있다. 빔의 전파특성은 도파로의 비선형성과 입력 파워, 도파로의 굽은 각도 등의 파라미터에 의해 좌우되므로 파라미터를 변화시켜 가면서 파워의 출력 특성을 계산해 보았다. 또한, 비선형 물질로 빠져 나오는 파워를 다양한 위치의 검출기에서 계산함으로써 특정한 검출기의 위치에서 가장 이상적인 디지털 스위칭 특성을 찾았고 도파로 끝과 비선형 물질로 빠져 나오는 파워의 비율에 의해 다양한 논리 함수(AND, OR, XOR)를 구현해 보았다.

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All-Optical AND Gate Using XPM Wavelength Converter

  • Kim, Jae-Hun;Kang, Byoung-Kwon;Park, Yoon-Ho;Byun, Young-Tae;Lee, Seok;Woo, Deok-Ha;Kim, Sun-Ho
    • Journal of the Optical Society of Korea
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    • 제5권1호
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    • pp.25-28
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    • 2001
  • By using an XPM (Cross Phase Modulation) wavelength converter, an all-optical AND gate, which is one of six fundamental logic gates, has been demonstrated. The wavelengths for probe and pump signals are 1553.8 and 1545 nm, respectively. First, characteristics of the XPM wavelength converter have been studied. When both probe and pump signals are driven by high power, the output power of the XPM wavelength is high. Based on this fact and the experiment, the all-optical AND gate has been porved. Probe and pump signals are transformed to pulse signals by using Mach-Zehnder modulator, which is induced by a pulse generator. Square pulse signals that are similar to the format of NRZ signals have been generated. By coupling two pulse signals into the XPM wavelength converter, AND characteristics in substantiated.

Performance Analysis of a High-Speed All-Optical Subtractor using a Quantum-Dot Semiconductor Optical Amplifier-Based Mach-Zehnder Interferometer

  • Salehi, Mohammad Reza;Taherian, Seyed Farhad
    • Journal of the Optical Society of Korea
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    • 제18권1호
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    • pp.65-70
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    • 2014
  • This paper presents the simulation and design of an all-optical subtractor using a quantum-dot semiconductor optical amplifier Mach-Zehnder interferometer (QD-SOA MZI) structure consisting of two cascaded switches, the first of which produces the differential bit. Then the second switch produces the borrow bit by using the output of the first switch and the subtrahend data stream. Simulation results were obtained by solving the rate equations of the QD-SOA. The effects of QD-SOA length, peak power and current density have been investigated. The designed gate can operate at speeds of over 250 Gb/s. The simulation results demonstrate a high extinction ratio and a clear and wide-opening eye diagram.

신경회로망을 이용한 조합 논리회로의 테스트 생성 (Test Generation for Combinational Logic Circuits Using Neural Networks)

  • 김영우;임인칠
    • 전자공학회논문지A
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    • 제30A권9호
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    • pp.71-79
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    • 1993
  • This paper proposes a new test pattern generation methodology for combinational logic circuits using neural networks based on a modular structure. The CUT (Circuit Under Test) is described in our gate level hardware description language. By conferring neural database, the CUT is compiled to an ATPG (Automatic Test Pattern Generation) neural network. Each logic gate in CUT is represented as a discrete Hopfield network. Such a neual network is called a gate module in this paper. All the gate modules for a CUT form an ATPG neural network by connecting each module through message passing paths by which the states of modules are transferred to their adjacent modules. A fault is injected by setting the activation values of some neurons at given values and by invalidating connections between some gate modules. A test pattern for an injected fault is obtained when all gate modules in the ATPG neural network are stabilized through evolution and mutual interactions. The proposed methodology is efficient for test generation, known to be NP-complete, through its massive paralelism. Some results on combinational logic circuits confirm the feasibility of the proposed methodology.

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