• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2003.12a
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• pp.26-30
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• 2003

안테나 내장형 유도결합 플라즈마를 마그네트론 스퍼터링 장치에 추가하고 플라즈마의 생성 조건을 제어함으로써 고품질의 박막을 증착할 수 있는 장치의 개발 연구를 수행하였다. 정확한 장치의 성능을 평가하고 앞으로의 개선점을 찾기 위하여 Langmuir probe, OES, RF impedance probe, QMS 등의 플라즈마 진단 도구들을 사용하여 기본 동작 특성 및 공정중 플라즈마의 전자 온도, 밀도, 방출 파장 분석을 통한 입자 상태 분석, 부하 임피던스와 시스템 임피던스 분석을 통한 파워 전달 특성을 평가하고 이에 따라서 장치의 구성 및 동작 조건을 변경 개선하였다. 실험 대상 박막계는 기본 물성 측정을 위한 Al, Ag, TiN, MgO, Si, $SiO_2$, 등이며 타겟의 크기는 2인치 직경의 원형, 12인치 원형, 5인치 * 25인치 사각형 3가지 이다.

• Journal of Hydrogen and New Energy
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• v.22 no.3
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• pp.319-325
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• 2011

The electrical properties of sputtered GDC thin films on $Al_2O_3$ substrates was studied. The electrical properties of the films were measured to evaluate the ion conductivity of GDC thin films for co-planar SOFC electrolytes. The impedance of the GDC thin films on $Al_2O_3$ substrates was affected by the film thickness and the impedance of thin film exhibited higher value than thick films. Similarly, the conductivity of the thick film showed much higher value than thin films. It indicated that the film thickness is the main factor affecting the conductivity and impedance of the GDC electrolyte for the co-planar SOFC.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.07a
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• pp.500-501
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• 2005

Aluminum doped zinc oxide films (ZnO:Al) were deposited on glass substrate by DC magnetron sputtering from a ZnO target mixed with 2 wt% $Al_2O_3$. The effects of substrate bias on the electrical properties and film structure were studied. Films deposited with positive bias have been annealed at $600^{\circ}C$ using rapid thermal anneal (RTA) process. The effects of RTA on the evolution of film microstructure are to be also studied using X-ray diffraction, transmission electron microscopy, and atomic force microscopy. Positive bias sputtering may induce lattice defects caused by electron bombardments during deposition. The as-deposited film microstructure evolves from the film with high defect density to more stable film condition. The electrical properties of the films after RTA process were also studied and the results were correlated with the evolution of film microstructures.

• Journal of the Korean Ceramic Society
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• v.28 no.3
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• pp.243-251
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• 1991

High-Tc YBa2Cu3O7-x superconducting thin films have been prepared by single-target off-axis RF magnetron sputtering. Optimal ratio of Y : Ba : Cu of the single-target was determined as 1 : 1.65 : 3.35 in order to obtain the stoichiometric films. Tc, crystalline phase, and microstructures of the surface and cross-section of the ex-situ YBa2Cu3O7-x thin films on MgO(100) had a Tc, zero of 80K, and the films on LaAlO3/Si had a Tc, on-set of 90 K and a Tc, zero of 70 K.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.585-585
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• 2012

$Cu(In_{1-x}Ga_x)Se_2$(CIGS) 박막 태양전지는 Chalcopyrite 계 박막 태양전지로 Cu, In, Ga, Se 각 원소의 조성을 적절히 조절하여 박막을 성장시킨다. 성장시킨 CIGS 박막은 광흡수계수가 $10^5cm^{-1}$로 다른 물질보다 뛰어나고 직접 천이형 반도체로서 얇은 두께로도 고효율의 박막 제작이 가능하다. CIGS 태양전지를 제조하는 방법은 3-stage 동시 증착법, 금속 전구체의 셀렌화 공정법, 전기 증착법 등이 있다. 그 중에 금속 전구체의 셀렌화 공정법은 다른 제조 방법에 비해 대면적 생산에 유리한 장점이 있다. 하지만 아직 상대적으로 3-stage 동시 증착법에 비해 낮은 에너지 변환 효율이 보고된다. 본 실험에서는 기존의 금속 전구체의 셀렌화 공정법과는 달리 전구체 증착과 셀렌화 공정을 동시에 하고, Se cracker를 통하여 Se 원료를 주입하는 방식인 반응성 스퍼터링 공정에서 reservoir zone의 온도 변화에 따른 특성을 분석하였다. Se cracker의 reservoir zone 온도가 증가할수록 Cu/(In+Ga) 비가 증가한다. CIGS 박막 태양전지의 구조는 Al/Ni/ITO/i-ZnO/CdS/CIGS/Mo/Soda lime glass이다. CIGS 박막의 조성비가 Cu/(In+Ga)=0.89, Ga/(In+Ga)=0.17인 박막 태양전지에서 개방전압 0.34 V, 단락전류밀도 $32.61mA/cm^2$, 충실도 56.2% 그리고 변환 효율 6.19%를 얻었다. 본 연구는 2011년도 지식경제부의 재원으로 한국에너지 기술평가원(KTEP)의 지원을 받아 수행한 연구 과제입니다(No.20093020010030).

• Journal of the Korean Vacuum Society
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• v.21 no.3
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• pp.142-150
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• 2012

In this Study, Mo back electrode were deposited as the functions of various working pressure, deposition time and plasma per-treatment on sodalime glass (SLG) for application to CIGS thin film solar cell using by DC sputtering method, and were analyzed Mo change to $MoSe_2$ layer through selenization processes. And finally Mo back electrode characteristics were evaluated as application to CIGS device after Al/AZO/ZnO/CdS/CIGS/Mo/SLG fabrication. Mo films fabricated as a function of the working pressure from 1.3 to 4.9mTorr are that physical thickness changed to increase from 1.24 to 1.27 ${\mu}m$ and electrical characteristics of sheet resistance changed to increase from 0.195 to 0.242 ${\Omega}/sq$ as according to the higher working pressure. We could find out that Mo film have more dense in lower working pressure because positive Ar ions have higher energy in lower pressure when ions impact to Mo target, and have dominated (100) columnar structure without working pressure. Also Mo films fabricated as a function of the deposition time are that physical thickness changed to increase from 0.15 to 1.24 ${\mu}m$ and electrical characteristics of sheet resistance changed to decrease from 2.75 to 0.195 ${\Omega}/sq$ as according to the increasing of deposition time. This is reasonable because more thick metal film have better electrical characteristics. We investigated Mo change to $MoSe_2$ layer through selenization processes after Se/Mo/SLG fabrication as a function of the selenization time from 5 to 40 minutes. $MoSe_2$ thickness were changed to increase as according to the increasing of selenization time. We could find out that we have to control $MoSe_2$ thickness to get ohmic contact characteristics as controlling of proper selenization time. And we fabricated and evaluated CIGS thin film solar cell device as Al/AZO/ZnO/CdS/CIGS/Mo/SLG structures depend on Mo thickness 1.2 ${\mu}m$ and 0.6 ${\mu}m$. The efficiency of CIGS device with 0.6 ${\mu}m$ Mo thickness is batter as 9.46% because Na ion of SLG can move to CIGS layer more faster through thin Mo layer. The adhesion characteristics of Mo back electrode on SLG were improved better as plasma pre-treatment on SLG substrate before Mo deposition. And we could expect better efficiency of CIGS thin film solar cell as controlling of Mo thickness and $MoSe_2$ thickness depend on Na effect and selenization time.

• Journal of the Semiconductor & Display Technology
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• v.6 no.3
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• pp.35-39
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• 2007

ITO(Indium Tin Oxide) is the most attractive TCO(Transparent Conducting Oxide) materials for LCD, PDP, OLEDs and solar cell, because of their high optical transparency and electrical conductivity. However due to the shortage of indium resource, hard processing at low temperature, and decrease of optical property during hydrogen plasma treatment, their applications to the display industries are limited. Thus, recently the Al-doped ZnO(AZO) has been studied to substitute ITO. In this study, we have investigated the effect of different substrate temperature(RT, $150^{\circ}C$, $225^{\circ}C$, $300^{\circ}C$) and working pressure(10 mTorr, 20 mTorr, 30 mTorr, 80 mTorr) on the characteristics of AZO(2 wt.% Al, 98 wt.% ZnO) films deposited by RF-magnetron sputtering. We have obtained AZO thin films deposited at low temperature and all the deposited AZO thin films are grown as colunmar. The average transmittance in the visible wavelength region is over 80% for all the films and transmittance improved with increasing substrate temperature. Electrical properties of the AZO films improved with increasing substrate temperature.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.263-266
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• 2001

In this paper, we investigated dielectric properies for BST thin films that was deposited on MgO/Si substrates using RF magnetron sputtering. In here, MgO film was used to perform that a diffusion b arrier between the BST film and Si substrate and a buffer layer to assist the BST film growth. A d eposition condition for MgO films was RF Power of 50W, substrate temperature of room temperature and the working gas ratio of Ar:O$_2$ were varied from 90:10 to 60:47. Finally we manufactured the cap acitor of Al/BST/MgO/Si/Al structure to know electrical properties of this capacitor through I-V, C-V measurement. In the results, C-V aha racteristic curves was shown a ferroelectric property so we measured P-E. A remanent poliazation and coerceive electric field was present 2$\mu$C/cm$^2$ and -27kV/cm respectively at Ar:O$_2$=90:10. And a va clue of dielectric constant was 86 at Ar:02=90:10.

• 전기의세계
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• v.27 no.5
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• pp.33-54
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• 1978

(차례) 1.산학협동심포지업 (1)우리나라에서의 연구개발과 산학협동 (2)산학협동과 산업계의 역할 (3)산학협동의 현황과 진로 2.학술회의A (1)전력게통의 계층구조와 협조원리에 관한 연구 (2)2중층괴상회전자 유도전동기의 이론해석 (3)초고주파가열장치에 사용하는 철공진변압기의 해석적 설계 (4)한국전기기시험연구소 대전력단락 시험설비설계 (5)직류전동기제어를 위한 Thyristor Chopper정류회로에 관한 연구 (6)선로의 개폐정보를 포함하는 전력계통의 상태추정 (7)단일신경세포에 대한 ITEM 신호 특성 3.학술회의B (1)MMM-1 Computer System의 설계 및 제작 (2)Adaptive Delta Modulation System의 성능비교 연구 (3)6GHZ FMD마이크로파 무선전송장치의 개발 (4)적선도에 의한 회로망함수의 결정 (5)동맥혈압의 해석과 그의 전기적 유사모델 (6)피부감각의 정보전달 특성에 관하여 (7)선형직접회로의 공정설계 및 그 특성 조성 (8)DH L.D의 전기적포화현상에 관한 이론적 해석 (9)Potocoupler를 이용한 Isolator 4.학술회의C (1)Al-Al$_{2}$O$_{3}$ -Al박막구조의 전기적 특성 (2)이종금속에 샌드위치된 고분자물질의 단락전조 (3)유전체가 일부체워진 직 6면체의 캐비티의 다중모오드 해석 (4)반도체 가스 검지소자의 제조 및 그의 전기적 특성 (5)실리콘 산화공정에 대한 실험적 고찰 (6)진공증착법에 의한 InSb 박막제도에서 열처리효과 (7)(Ba$_{1}$-xBix) Tio$_{3}$ PTC thermistor의 첨가량의 최적건안 (8)금속박막증착시 두께조절 5.특별강연회 (1)일본에 있어서의 절력계통공학연구 (2)Linear Motor의 최근개발동향량도 높았다. valine과 leucine 및 aspartic acid, glycine과 glutamic acid, leucine과 aspartic acid 간에는 고도의 정상관, glycine과 serine, valine과 phenylalanine, threonine과 proline, phenylalanine과 arginine, methionine과 glutamic acid, histidine과 lysine 간에는 유의 정상관, 그리고 isoleucine과 lysine 간에는 유의한 부상관이 있었다. 4. lysine 함량은 단백질 함량과 정산곤, isoleucine 함량은 단빅질 함량과 부상관을 보였으며, alanine, valine, leucine 함량은 지방함량과 각각 유의한 정산관을 보였다. 5. 대두 단백질은 7.5% acrylamide gel 전기영동에 의해 품종에 따라 12～16개의 구성분으로 분리되었으며, 이들중 주구성분들은 상대이동도가 0.06(a), 0.14(b). 0.24(d) 이었고, 구성분 b의 함량이 품종간에 가장 변이가 컸으며, 구성분 b는 그밖의 주요 구성분들의 함량과 부의 상관이 있었고, 구성분 a는 단백질 함량과 정상관이 있었다. 6. 종실단백질 구성분들의 조합 특성 면에서 공시 86품종은 11개 유형군으로 분류되었으며, 우리나라와 일본품종은 미국품종에 비해 단백질구성분 조성이 훨씬 다양하였다. 7. 이동도가 매우 빠른 단백질 구성분 o(Rm 0.77) p(Rm 0.81)를 모두 갖고 있는 품종은 3품종, 모두 갖고 있지 않은 품종은 1품종이었고, 나머지 82품종은 o나 p중 한 구성분을 갖고 있었으며 그 분포율은 30 : 65 이었는데 미국계 품종은 우리나라 품종에 비해 구성분 o를 간고 있는 비율이 현저히 적었다. 8. 대두 종실은 개화후 22일까지 완만히, 그 이후 20～30일간 급속히

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07a
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• pp.413-416
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• 2004

In this study, zinc oxide(ZnO) having large misfit(18.2%) with sapphire was tried to be grown on very thin nitride buffer layers. For the creation of various kinds of nitride buffer layer, sapphire surface was modified by an irradiation of nitrogen ion beam with low energy generated from stationary plasma thruster(SPT) at room temperature. After the irradiation of ion beam, Al-N and Al-O-N bonding was identified to be formed as nitride buffet layers. Surface morphology was measured by AFM and then ZnO growth was followed by pulsed laser deposition(PLD). Their properties are analyzed by XRD, AFM, TEM, and PL. We observed that surface morphology was improved and deep level emission related to defects was almost vanished in PL spectra from the ZnO grown on nitride buffer layer.